| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
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PDF |
English, French |
Active |
12/4/2015 |
€92.00 |
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Details
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
Additional Info
| Author | International Electrotechnical Commission (IEC) |
|---|---|
| Committee | TC 91 |
| Published by | IEC |
| Document type | Standard |
| Edition | 1.0 |
| ICS | 31.180 : Printed circuits and boards
31.190 : Electronic component assemblies |
| Number of pages | 29 |
| Keyword | IEC62878-2-2,IEC TR 62878-2-2:2015,IEC/TR 62878-2-2,TC 91 |
