IEC 63011-2:2018

IEC 63011-2:2018

IEC 63011-2:2018 Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect

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Details

IEC 63011-2:2018 provides specifications of initial alignment and alignment maintenance between multiple stacked integrated circuits during the die bonding process. These specifications define the alignment keys and operating procedures of the keys. These specifications apply only if electrical coupling method of die-to-die alignment is used in the die stacking.

Additional Info

Author International Electrotechnical Commission (IEC)
Committee TC 47/SC 47A
Published by IEC
Document type Standard
Edition 1.0
ICS 31.200 : Integrated circuits. Microelectronics
Number of pages 28
Keyword IEC63011-2,IEC 63011-2:2018,IEC 63011-2,TC 47/SC 47A