| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
|
PDF |
English |
Active |
5/27/2020 |
€92.00 |
|
||
Details
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
Additional Info
| Author | International Electrotechnical Commission (IEC) |
|---|---|
| Committee | TC 119 |
| Published by | IEC |
| Document type | Standard |
| Edition | 1.0 |
| ICS | 29.045 : Semiconducting materials
31.080.30 : Transistors |
| Number of pages | 15 |
| Keyword | IEC62899-503-1,IEC 62899-503-1:2020,IEC 62899-503-1,TC 119 |
