| Name | Support | Language | Availability | Edition date | Price | ||
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PDF |
English, French |
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5/2/2019 |
€311.00 |
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Details
IEC 62812:2019 specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements. The methods described in this document are applicable for the individual measurements of the resistance of individual resistors, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer.
The contents of the corrigendum of March 2020 have been included in this copy.
Additional Info
| Author | International Electrotechnical Commission (IEC) |
|---|---|
| Committee | TC 40 |
| Published by | IEC |
| Document type | Standard |
| Edition | 1.0 |
| ICS | 31.040.01 : Resistors in general
|
| Number of pages | 92 |
| Keyword | IEC62812,IEC 62812:2019,IEC 62812,TC 40 |
