31 : Electronics
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JIS C 5101-9:2018
Fixed capacitors for use in electronic equipment - Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, Class 2
2/20/2018 - PDF - Japanese -
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JIS C 5160-1:2018
Fixed electric double-layer capacitors for use in electric and electronic equipment - Part 1: Generic specification
2/20/2018 - PDF - Japanese -
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JIS C 5101-25:2018
Fixed capacitors for use in electronic equipment - Part 25: Sectional specification - Fixed aluminium electrolytic surface mount capacitors with conductive polymer solid electrolyte
2/20/2018 - PDF - Japanese -
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JIS C 5101-23:2018
Fixed capacitors for use in electronic equipment - Part 23: Sectional specification - Fixed metallized polyethylene naphthalate film dielectric surface mount d.c. capacitors
2/20/2018 - PDF - Japanese -
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JIS C 5402-17-3:2018
Connectors for electronic equipment - Tests and measurements - Part 17-3: Cable clamping tests - Test 17c: Cable clamp resistance to cable pull (tensile)
2/20/2018 - PDF - Japanese -
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€32.50
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JIS C 5101-8:2018
Fixed capacitors for use in electronic equipment - Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, Class 1
2/20/2018 - PDF - Japanese -
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JIS C 5101-24:2018
Fixed capacitors for use in electronic equipment - Part 24: Sectional specification - Fixed tantalum electrolytic surface mount capacitors with conductive polymer solid electrolyte
2/20/2018 - PDF - Japanese -
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JIS C 5101-20:2018
Fixed capacitors for use in electronic equipment - Part 20: Sectional specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors
2/20/2018 - PDF - Japanese -
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JIS C 8160:2017
Non-integrated linear LED lamps with GX16t-5 cap for general lighting services
12/20/2017 - PDF - Japanese -
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JIS C 8158:2017
Self-ballasted LED-lamps for general lighting services by voltage > 50 V
12/20/2017 - PDF - Japanese -
Learn More€36.27 -
JIS B 9704-2:2017
Safety of machinery - Electro-sensitive protective equipment - Part 2: Particular requirements for equipment using active opto-electronic protective devices (AOPDs)
11/25/2017 - PDF - Japanese -
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JIS C 5630-26:2017
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
10/20/2017 - PDF - Japanese -
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€50.18
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JIS C 6803/AMENDMENT 1:2017
Safety of laser products - Safety of optical fiber communication systems (Amendment 1)
10/20/2017 - PDF - Japanese -
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JIS C 5630-1:2017
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
3/21/2017 - PDF - Japanese -
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JIS C 5948:2017
Fiber optic active components and devices - Reliability standards - Laser modules used for telecommunication
3/21/2017 - PDF - Japanese -
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JIS C 5402-12-5:2016
Connectors for electronic equipment - Tests and measurements - Part 12-5: Soldering tests - Test 12e: Resistance to soldering heat, soldering iron method
12/20/2016 - PDF - Japanese -
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JIS C 5402-12-2:2016
Connectors for electronic equipment - Tests and measurements - Part 12-2: Soldering tests - Test 12b: Solderability, wetting, soldering iron method
12/20/2016 - PDF - Japanese -
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JIS C 5402-8-2:2016
Connectors for electronic equipment - Tests and measurements - Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, axial
12/20/2016 - PDF - Japanese -
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JIS C 5402-22-1:2016
Connectors for electronic equipment - Tests and measurements - Part 22-1: Capacitance tests - Test 22a: Capacitance
12/20/2016 - PDF - Japanese -
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JIS C 61760-4:2016
Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices
12/20/2016 - PDF - Japanese -
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JIS C 5402-12-4:2016
Connectors for electronic equipment - Tests and measurements - Part 12-4: Soldering tests - Test 12d: Resistance to soldering heat, solder bath method
12/20/2016 - PDF - Japanese -
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JIS C 60068-2-58:2016
Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
12/20/2016 - PDF - Japanese -
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JIS C 5402-12-1:2016
Connectors for electronic equipment - Tests and measurements - Part 12-1: Soldering tests - Test 12a: Solderability, wetting, solder bath method
12/20/2016 - PDF - Japanese -
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JIS C 62813:2016
Lithium ion capacitors for use in electric and electronic equipment - Test methods for electrical characteristics
12/20/2016 - PDF - Japanese -
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€0.00
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€0.00
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€0.00
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€0.00
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JIS C 5402-7-1:2016
Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated)
3/22/2016 - PDF - Japanese -
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JIS C 62137-4:2016
Electronics assembly technology - Part 4: Endurance test methods for solder joint of area array type package surface mount devices
3/22/2016 - PDF - Japanese -
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JIS C 5402-14-4:2016
Connectors for electronic equipment - Tests and measurements - Part 14-4: Sealing tests - Test 14d: Immersion - Waterproof
3/22/2016 - PDF - Japanese -
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JIS C 5402-9-1:2016
Connectors for electronic equipment - Tests and measurements - Part 9-1: Endurance tests - Test 9a: Mechanical operation
3/22/2016 - PDF - Japanese -
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JIS C 5402-8-1:2016
Connectors for electronic equipment - Tests and measurements - Part 8-1: Static load tests (fixed connectors) - Test 8a: Static load, transverse
3/22/2016 - PDF - Japanese -
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JIS C 5402-14-5:2016
Connectors for electronic equipment - Tests and measurements - Part 14-5: Sealing tests - Test 14e: Immersion at low air pressure
3/22/2016 - PDF - Japanese -
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JIS C 5402-14-2:2016
Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage
3/22/2016 - PDF - Japanese -
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JIS C 5402-8-3:2016
Connectors for electronic equipment - Tests and measurements - Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever
3/22/2016 - PDF - Japanese -
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JIS C 5402-14-6:2016
Connectors for electronic equipment - Tests and measurements - Part 14-6: Sealing tests - Test 14f: Interfacial sealing
3/22/2016 - PDF - Japanese -
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JIS C 6790:2016
Load test of a bolt-clamped Langevin vibrator using wattmeter method
3/22/2016 - PDF - Japanese -
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JIS C 6011-1:2015
Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 series - Part 1: Environmental requirements, test set-up and safety aspects for cabinets, racks, subracks and chassis under indoor conditions
11/20/2015 - PDF - Japanese -
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JIS C 2570-1:2015
Directly heated negative temperature coefficient thermistors - Part 1: Generic specification
11/20/2015 - PDF - Japanese -
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JIS C 61191-1:2015
Printed board assemblies - Part 1: Generic specification - Requirements for soldered electrical and electronic assemblies using surface mount and related assembly technologies
11/20/2015 - PDF - Japanese -
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JIS C 6012-3-100:2015
Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482.6 mm (19 in) series - Part 3-100: Basic dimensions of front panels, subracks, chassis, racks and cabinets
11/20/2015 - PDF - Japanese -
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JIS C 5401-1:2015
Connectors for electronic equipment - Product requirements - Part 1: Generic specification
11/20/2015 - PDF - Japanese -
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€55.77
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JIS C 6011-2:2015
Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 2: Seismic tests for cabinets and racks
11/20/2015 - PDF - Japanese -
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JIS C 2570-2:2015
Directly heated negative temperature coefficient thermistors - Part 2: Sectional specification - Surface mount negative temperature coefficient thermistors
11/20/2015 - PDF - Japanese -
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JIS C 5630-20:2015
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
11/20/2015 - PDF - Japanese -
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JIS C 61191-2:2015
Printed board assemblies - Part 2: Sectional specification - Requirements for surface mount soldered assemblies
11/20/2015 - PDF - Japanese -
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TS C 62610-2:2015
Mechanical structures for electronic equipment - Thermal management for cabinets with IEC 60297 (all parts) and JIS C 6010 (all parts) - Design guide: Method for the determination of forced air-cooling structure
11/20/2015 - PDF - Japanese -
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JIS C 5402-13-1:2015
Connectors for electronic equipment - Tests and measurements - Part 13-1: Mechanical operation tests - Test 13a: Engaging and separating forces
11/20/2015 - PDF - Japanese -
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JIS C 6011-3:2015
Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 3: Electromagnetic shielding performance tests for cabinets and subracks
11/20/2015 - PDF - Japanese -
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JIS C 5402-17-1:2015
Connectors for electronic equipment - Tests and measurements - Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness
4/20/2015 - PDF - Japanese -
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JIS C 5402-16-9:2015
Connectors for electronic equipment - Tests and measurements - Part 16-9: Mechanical tests on contacts and terminations - Test 16i: Grounding contact spring holding force
4/20/2015 - PDF - Japanese -
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JIS C 5402-17-2:2015
Connectors for electronic equipment - Tests and measurements - Part 17-2: Cable clamping tests - Test 17b: Cable clamp resistance to cable rotation
4/20/2015 - PDF - Japanese -
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JIS C 5402-16-13:2015
Connectors for electronic equipment - Tests and measurements - Part 16-13: Mechanical tests on contacts and terminations - Test 16m: Un-wrapping, solderless wrapped connections
4/20/2015 - PDF - Japanese -
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JIS C 5402-16-8:2015
Connectors for electronic equipment - Tests and measurements - Part 16-8: Mechanical tests on contacts and terminations - Test 16h: Insulating grip effectiveness (crimped connections)
4/20/2015 - PDF - Japanese -
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JIS C 5402-17-4:2015
Connectors for electronic equipment - Tests and measurements - Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion
4/20/2015 - PDF - Japanese -
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JIS C 8121-2-3:2015
Miscellaneous lampholders - Part 2-3: Particular requirements - Lampholders for double-capped linear LED lamps
3/20/2015 - PDF - Japanese -
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JIS R 1697:2015
Absolute measurement of internal quantum efficiency of phosphors for white light emitting diodes using an integrating sphere
3/20/2015 - PDF - Japanese -
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JIS E 5012-3:2015
Rolling stock - Capacitors for power electronics - Part 3: Electric double-layer capacitors
1/20/2015 - PDF - Japanese -
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JIS E 5012-1:2015
Rolling stock - Capacitors for power electronics - Part 1: Paper and plastic film capacitors
1/20/2015 - PDF - Japanese -
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JIS E 5012-2:2015
Rolling stock - Capacitors for power electronics - Part 2: Aluminium electrolytic capacitors with non-solid electrolyte
1/20/2015 - PDF - Japanese -
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JIS C 5630-19:2014
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
12/22/2014 - PDF - Japanese -
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JIS C 5630-18:2014
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
12/22/2014 - PDF - Japanese -
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JIS C 5201-2:2014
Fixed resistors for use in electronic equipment - Part 2: Sectional specification: Leaded fixed low power film resistors
11/20/2014 - PDF - Japanese -
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JIS C 5201-8-1:2014
Fixed resistors for use in electronic equipment - Part 8-1: Blank detail specification: Fixed surface mount (SMD) low power film resistors for general electronic equipment, classification level G
11/20/2014 - PDF - Japanese -
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JIS C 5101-11:2014
Fixed capacitors for use in electronic equipment - Part 11: Sectional specification - Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors
9/22/2014 - PDF - Japanese -
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€58.50
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JIS C 5101-11-1:2014
Fixed capacitors for use in electronic equipment - Part 11-1: Blank detail specification - Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors - Assessment level EZ
9/22/2014 - PDF - Japanese -
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JIS C 62137-3:2014
Electronics Assembly Technology - Part 3: Selection guidance of environmental and endurance test methods for solder joints
9/22/2014 - PDF - Japanese -
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JIS C 61188-7:2014
Printed boards and printed board assemblies - Design and use - Part 7: Electronic component zero orientation for CAD library construction
9/22/2014 - PDF - Japanese -
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JIS C 5101-14:2014
Fixed capacitors for use in electronic equipment - Part 14: Sectional specification - Fixed capacitors for electromagnetic interference suppression and connection to the supply mains
9/22/2014 - PDF - Japanese -
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JIS C 5260-1:2014
Potentiometers for use in electronic equipment - Part 1: Generic specification
9/22/2014 - PDF - Japanese -
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JIS C 5402-16-3:2014
Connectors for electronic equipment - Tests and measurements - Part 16-3: Mechanical tests on contacts and terminations - Test 16c: Contact-bending strength
6/20/2014 - PDF - Japanese -
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JIS Z 3198-1:2014
Test methods for lead-free solders - Part 1: Methods for measuring of melting temperature ranges
6/20/2014 - PDF - Japanese -
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JIS C 5402-15-4:2014
Connectors for electronic equipment - Tests and measurements - Part 15-4: Connector tests (mechanical tests) - Test 15d: Contact insertion, release and extraction force
6/20/2014 - PDF - Japanese -
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€33.33
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JIS C 6760:2014
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
6/20/2014 - PDF - Japanese -
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JIS Z 3284-4:2014
Solder paste - Part 4: Test methods for wettability, solderball and spread
6/20/2014 - PDF - Japanese -
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JIS C 5402-13-5:2014
Connectors for electronic equipment - Tests and measurements - Part 13-5: Mechanical operation tests - Test 13e: Polarizing and keying method
6/20/2014 - PDF - Japanese -
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JIS C 5402-1-100:2014
Connectors for electronic equipment - Tests and measurements - Part 1-100: General - Applicable publications
6/20/2014 - PDF - Japanese -
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JIS Z 3284-2:2014
Solder paste - Part 2: Test methods for solder particle shape, surface condition judgment, and particle size distribution
6/20/2014 - PDF - Japanese -
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JIS C 5402-15-6:2014
Connectors for electronic equipment - Tests and measurements - Part 15-6: Connector tests (mechanical tests) - Test 15f: Effectiveness of connector coupling devices
6/20/2014 - PDF - Japanese -
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JIS C 5402-15-1:2014
Connectors for electronic equipment - Tests and measurements - Part 15-1: Connector tests (mechanical) - Test 15a: Contact retention in insert
6/20/2014 - PDF - Japanese -
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JIS Z 3284-3:2014
Solder paste - Part 3: Test methods for printability, viscosity, slump and tackiness
6/20/2014 - PDF - Japanese -
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JIS C 8152-1/AMENDMENT 1:2014
Photometry of white light emitting diode for general lighting - Part 1: LED packages (Amendment 1)
3/20/2014 - PDF - Japanese -
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JIS C 8152-2/AMENDMENT 1:2014
Photometry of white light emitting diode for general lighting - Part 2: LED modules and LED light engines (Amendment 1)
3/20/2014 - PDF - Japanese -
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JIS C 5201-8:2014
Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors
2/20/2014 - PDF - Japanese -
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JIS C 5101-21:2014
Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
2/20/2014 - PDF - Japanese -
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JIS C 5402-16-1:2014
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
2/20/2014 - PDF - Japanese -
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JIS C 5630-13:2014
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
2/20/2014 - PDF - Japanese -
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JIS C 9912:2014
The marking for identification of plastic parts for electrical and electronic equipment
2/20/2014 - PDF - Japanese -
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JIS C 5402-15-3:2014
Connectors for electronic equipment - Tests and measurements - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional)
2/20/2014 - PDF - Japanese -
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JIS C 5101-22:2014
Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
2/20/2014 - PDF - Japanese -
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JIS C 5402-16-6:2014
Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations
2/20/2014 - PDF - Japanese -
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JIS C 5402-15-5:2014
Connectors for electronic equipment - Tests and measurements - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation
2/20/2014 - PDF - Japanese -
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JIS C 5630-12:2014
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
2/20/2014 - PDF - Japanese -
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JIS C 0806-3:2014
Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes
2/20/2014 - PDF - Japanese -
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JIS C 5402-15-2:2014
Connectors for electronic equipment - Tests and measurements - Part 15-2: Connector tests (mechanical) - Test 15b: Insert retention in housing (axial)
2/20/2014 - PDF - Japanese -
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JIS C 6803:2013
Safety of laser products - Safety of optical fiber communication systems
9/20/2013 - PDF - Japanese -
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JIS C 8152-3:2013
Photometry of white light emitting diode for general lighting - Part 3: measurement methods for lumen maintenance
7/22/2013 - PDF - Japanese -
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€50.18
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JIS C 8159-1:2013
Non-integrated linear LED lamps with GX16t-5 cap for general lighting services - Part 1: Safety specifications
4/22/2013 - PDF - Japanese -
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JIS H 3510:2012 (R2017)
Oxygen free copper sheets, plates, strips, seamless pipes and tubes, rods, bars and wires for electron devices
10/22/2012 - PDF - Japanese -
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JIS C 5445:2012 (R2017)
Electromechanical switches for use in electrical and electronic equipment - Part 1: Generic specification
10/22/2012 - PDF - Japanese -
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JIS C 5101-26:2012 (R2017)
Fixed capacitors for use in electronic equipment - Part 26: Sectional specification - Fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte
6/20/2012 - PDF - Japanese -
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JIS C 5402-16-5:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)
6/20/2012 - PDF - Japanese -
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JIS C 5402-16-2:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-2: Mechanical tests on contacts and terminations - Test 16b: Restricted entry
6/20/2012 - PDF - Japanese -
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JIS C 5101-26-1:2012 (R2017)
Fixed capacitors for use in electronic equipment - Part 26-1: Blank detail specification - Fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ
6/20/2012 - PDF - Japanese -
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JIS C 8152-1:2012
Photometry of white light emitting diode for general lighting - Part 1: LED packages
6/20/2012 - PDF - Japanese -
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JIS C 5402-16-7:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping
6/20/2012 - PDF - Japanese -
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JIS C 5402-16-4:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-4: Mechanical tests on contacts and terminations - Test 16d:Tensile strength (crimped connections)
6/20/2012 - PDF - Japanese -
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JIS C 8152-2:2012
Photometry of white light emitting diode for general lighting - Part 2: LED modules and LED light engines
6/20/2012 - PDF - Japanese -
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JIS C 5402-13-2:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 13-2: Mechanical operation tests - Test 13b: Insertion and withdrawal forces
6/20/2012 - PDF - Japanese -
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JIS B 9960-33:2012 (R2017)
Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
5/21/2012 - PDF - Japanese -
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€58.50
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€64.10
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JIS C 62137-1-5:2011 (R2016)
Surface mounting technology - Environmental and endurance test methods for surface mount solder joints - Part 1-5: Mechanical shear fatigue test
12/20/2011 - PDF - Japanese -
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JIS C 62137-1-3:2011 (R2016)
Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-3: Cyclic drop test
12/20/2011 - PDF - Japanese -
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JIS C 61191-6:2011 (R2016)
Printed board assemblies - Part 6: Evaluation criteria for voids in soldered joints of BGA and LGA and measurement method
12/20/2011 - PDF - Japanese -
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JIS C 8157:2011 (R2016)
Self-ballasted LED-lamps for general lighting services > 50 V - Performance requirements
12/20/2011 - PDF - Japanese -
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JIS C 62137-1-4:2011 (R2016)
Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-4: Cyclic bending test
12/20/2011 - PDF - Japanese -
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JIS C 5630-6:2011 (R2016)
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
8/22/2011 - PDF - Japanese -
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JIS C 5270:2011 (R2016)
Capacitors and resistors for use in electronic equipment - Preferred dimensions of shaft ends, bushes and for the mounting of single-hole, bush-mounted, shaft-operated electronic components
8/22/2011 - PDF - Japanese -
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JIS B 9704-3:2011 (R2016)
Safety of machinery - Electro-sensitive protective equipment - Part 3: Particular requirements for Active Opto-electronic Protective Devices responsive to Diffuse Reflection (AOPDDR)
4/25/2011 - PDF - Japanese -
Learn More€52.91 -
JIS C 9910:2011 (R2015)
Environmentally conscious design for electrical and electronic products
3/22/2011 - PDF - Japanese -
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JIS C 5201-1:2011 (R2015)
Fixed resistors for use in electronic equipment - Part 1: Generic specification
1/20/2011 - PDF - Japanese -
Learn More€62.66 -
€25.00
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€0.00
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JIS C 5101-3-1:2010 (R2015)
Fixed capacitors for use in electronic equipment - Part 3-1: Blank detail specification - Surface mount fixed tantalum electrolytic capacitors with manganese dioxide solid electrolyte - Assessment level EZ
6/21/2010 - PDF - Japanese -
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JIS C 5101-4-1:2010 (R2015)
Fixed capacitors for use in electronic equipment - Part 4-1: Blank detail specification - Fixed aluminium electrolytic capacitors with non-solid electrolyte - Assessment level EZ
6/21/2010 - PDF - Japanese -
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JIS C 5101-18-2:2010 (R2015)
Fixed capacitors for use in electronic equipment - Part 18-2: Blank detail specification - Fixed aluminium electrolytic surface mount capacitors with non-solid electrolyte - Assessment level EZ
6/21/2010 - PDF - Japanese -
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JIS C 5101-3:2010 (R2015)
Fixed capacitors for use in electronic equipment - Part 3: Sectional specification - Surface mount fixed tantalum electrolytic capacitors with manganese dioxide solid electrolyte
6/21/2010 - PDF - Japanese -
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JIS C 5101-4-2:2010 (R2015)
Fixed capacitors for use in electronic equipment - Part 4-2: Blank detail specification - Fixed aluminium electrolytic capacitors with solid (MnO2) electrolyte - Assessment level EZ
6/21/2010 - PDF - Japanese -
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JIS C 5101-18-1:2010 (R2015)
Fixed capacitors for use in electronic equipment - Part 18-1: Blank detail specification - Fixed aluminium electrolytic surface mount capacitors with solid (MnO2) electrolyte - Assessment level EZ
6/21/2010 - PDF - Japanese -
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JIS C 5101-20-1:2010 (R2015)
Fixed capacitors for use in electronic equipment - Part 20-1:Blank detail specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors - Assessment level EZ
6/21/2010 - PDF - Japanese -
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JIS C 62137-1-1:2010 (R2015)
Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-1: Pull strength test
5/20/2010 - PDF - Japanese -
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JIS C 5942:2010 (R2015)
General rules of laser diodes used for recording and playback
5/20/2010 - PDF - Japanese -
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JIS C 62137-1-2:2010 (R2015)
Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-2: Shear strength test
5/20/2010 - PDF - Japanese -
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JIS C 5943:2010 (R2015)
Measuring methods of laser diodes used for recording and playback
5/20/2010 - PDF - Japanese -
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JIS C 5005-2:2010 (R2015)
Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
5/20/2010 - PDF - Japanese -
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JIS C 4902-2:2010 (R2014)
High voltage power capacitors and attached apparatus - Part 2: Series reactors
1/20/2010 - PDF - Japanese -
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JIS C 4902-3:2010 (R2014)
High voltage power capacitors and attached apparatus - Part 3: Discharge coils
1/20/2010 - PDF - Japanese -
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JIS C 4902-1:2010 (R2014)
High voltage power capacitors and attached apparatus - Part 1: Capacitors
1/20/2010 - PDF - Japanese -
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JIS C 5101-25-1:2009 (R2014)
Fixed capacitors for use in electronic equipment - Part 25-1: Blank detail specification - Surface mount fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ
12/21/2009 - PDF - Japanese -
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JIS C 5070:2009 (R2014)
Surface mounting technology - Part 2: Transportation and storage conditions of surface mounting devices (SMD) - Application guide
12/21/2009 - PDF - Japanese -
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JIS C 5101-24-1:2009 (R2014)
Fixed capacitors for use in electronic equipment - Part 24-1: Blank detail specification - Surface mount fixed tantalum electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ
12/21/2009 - PDF - Japanese -
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JIS C 5160-2-1:2009 (R2014)
Fixed electric double-layer capacitors for use in electronic equipment - Part 2-1: Blank detail specification - Electric double-layer capacitors for power application - Assessment level EZ
7/20/2009 - PDF - Japanese -
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JIS C 5160-2:2009 (R2014)
Fixed electric double-layer capacitors for use in electronic equipment - Part 2: Sectional specification - Electric double-layer capacitors for power application
7/20/2009 - PDF - Japanese -
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JIS C 5630-2:2009 (R2013)
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
3/20/2009 - PDF - Japanese -
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JIS C 5630-3:2009 (R2013)
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
3/20/2009 - PDF - Japanese -
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€25.00
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JIS C 5101-16-1:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 16-1: Blank detail specification: Fixed metallized polypropylene film dielectric d.c. capacitors - Assessment levels E and EZ
2/20/2009 - PDF - Japanese -
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JIS C 5101-17:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors
2/20/2009 - PDF - Japanese -
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JIS C 5101-13:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 13: Sectional specification - Fixed polypropylene film dielectric metal foil d.c. capacitors
2/20/2009 - PDF - Japanese -
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JIS C 5101-14-2:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 14-2: Blank detail specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains - Safety tests only
2/20/2009 - PDF - Japanese -
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JIS C 5101-2:2009 (R2014)
Fixed capacitors for use in electronic equipment - Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors
2/20/2009 - PDF - Japanese -
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JIS C 5101-17-1:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 17-1: Blank detail specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors - Assessment levels E and EZ
2/20/2009 - PDF - Japanese -
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JIS C 5101-16:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c. capacitors
2/20/2009 - PDF - Japanese -
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JIS C 5101-13-1:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 13-1: Blank detail specification - Fixed polypropylene film dielectric metal foil d.c. capacitors - Assessment levels E and EZ
2/20/2009 - PDF - Japanese -
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JIS C 5101-14-3:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 14-3: Blank detail specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains - Assessment level DZ
2/20/2009 - PDF - Japanese -
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JIS C 5101-2-1:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 2-1: Blank detail specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors - Assessment levels E and EZ
2/20/2009 - PDF - Japanese -
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JIS C 5101-14-1:2009 (R2013)
Fixed capacitors for use in electronic equipment - Part 14-1: Blank detail specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains - Assessment level D
2/20/2009 - PDF - Japanese -
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JIS C 5101-8-1:2008 (R2014)
Fixed capacitors for use in electronic equipment - Part 8-1: Blank detail specification: Fixed capacitors of ceramic dielectric, Class 1 Assessment level EZ
12/20/2008 - PDF - Japanese -
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JIS C 5101-9-1:2008 (R2013)
Fixed capacitors for use in electronic equipment - Part 9-1: Blank detail specification: Fixed capacitors of ceramic dielectric, Class 2 Assessment level EZ
12/20/2008 - PDF - Japanese -
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JIS C 6804:2008 (R2013)
Safety of laser products - Safety of free space optical communication systems used for transmission of information
10/20/2008 - PDF - Japanese -
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JIS C 6485:2008 (R2017)
Base materials for printed circuits - Paper base, phenolic resin
8/20/2008 - PDF - Japanese -
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JIS B 9960-1:2008
Safety of machinery - Electrical equipment of machines - Part 1: General requirements
5/25/2008 - PDF - Japanese -
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JIS C 5101-23-1:2008 (R2017)
Fixed capacitors for use in electronic equipment - Part 23-1: Blank detail specification - Fixed surface mount metallized polyethylene naphthalate film dielectric DC capacitors - Assessment level EZ
5/20/2008 - PDF - Japanese -
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€41.86
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JIS C 5750-4-1:2008 (R2017)
Dependability management - Part 4-1: Application guide - Dependability of products containing reused parts - Requirements for functionality and test
3/20/2008 - PDF - Japanese -
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€55.77
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€50.18
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JIS B 0090-17:2007 (R2016)
Preparation of drawings for optical elements and systems - Part 17: Laser irradiation damage threshold
9/20/2007 - PDF - Japanese -
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€55.77
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€46.02
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€0.00
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JIS R 1641:2007 (R2016)
Measurement method for dielectric of fine ceramic plates at microwave frequency
2/20/2007 - PDF - Japanese -
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JIS C 5381-331:2006 (R2016)
Components for low-voltage surge protective devices - Part 331: Specification for metal oxide varistors (MOV)
11/20/2006 - PDF - Japanese -
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JIS C 5750-3-5:2006 (R2015)
Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
3/25/2006 - PDF - Japanese -
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JIS C 5201-9:2006 (R2015)
Fixed resistors for use in electronic equipment - Part 9: Sectional specification: Fixed surface mount resistor networks with individually measurable resistors
3/25/2006 - PDF - Japanese -
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JIS C 5101-21-1:2006 (R2015)
Fixed capacitors for use in electronic equipment - Part 21-1: Blank detail specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1 - Assessment level EZ
3/25/2006 - PDF - Japanese -
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JIS C 61191-4:2006 (R2015)
Printed board assemblies - Part 4: Sectional specification - Requirements for terminal soldered assemblies
3/25/2006 - PDF - Japanese -
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JIS C 5402-11-14:2006 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test
3/25/2006 - PDF - Japanese -
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JIS C 0806-6:2006 (R2015)
Packaging of components for automatic handling - Part 6: Bulk case packaging for surface mounting components
3/25/2006 - PDF - Japanese -
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JIS C 5201-9-1:2006 (R2015)
Fixed resistors for use in electronic equipment - Part 9-1: Blank detail specification: Fixed surface mount resistor networks with individually measurable resistors - Assessment level EZ
3/25/2006 - PDF - Japanese -
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JIS C 5402-23-4:2006 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests - Test 23d: Transmission line reflections in the time domain
3/25/2006 - PDF - Japanese -
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JIS C 5101-22-1:2006 (R2015)
Fixed capacitors for use in electronic equipment - Part 22-1: Blank detail specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 - Assessment level EZ
3/25/2006 - PDF - Japanese -
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JIS C 61191-3:2006 (R2015)
Printed board assemblies - Part 3: Sectional specification - Requirements for through-hole mount soldered assemblies
3/25/2006 - PDF - Japanese -
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JIS C 5402-10-4:2006 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests - Test 10d: Electrical overload (connectors)
3/25/2006 - PDF - Japanese -
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€36.27
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€25.00
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€25.00
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€25.00
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JIS C 5401-2:2005 (R2015)
Connectors for electronic equipment - Part 2: Circular connectors with assessed quality - Sectional specification
12/20/2005 - PDF - Japanese -
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JIS C 5401-2-001:2005 (R2015)
Connectors for electronic equipment - Part 2-001: Circular connectors - Blank detail specification
12/20/2005 - PDF - Japanese -
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JIS C 5402-4-1:2005 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof
12/20/2005 - PDF - Japanese -
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JIS C 5402-2-2:2005 (R2014)
Connectors for electrical equipment - Tests and measurements - Part 2-2: Electrical continuity and contact resistance tests - Test 2b: Contact resistance - Specified test current method
12/20/2005 - PDF - Japanese -
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