31 : Electronics
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IEEE 1241:2023
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
10/6/2023 - PDF - English - IEEE
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IEEE 1241:2023
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
10/6/2023 - Paper - English - IEEE
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IEEE 2999:2023
IEEE Guide for Technical Requirements and Test Methods for Industrial Ultrashort Pulse Lasers
9/29/2023 - PDF - English - IEEE
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IEEE 2999:2023
IEEE Guide for Technical Requirements and Test Methods for Industrial Ultrashort Pulse Lasers
9/29/2023 - Paper - English - IEEE
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IEEE 2716:2022
IEEE Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding
5/29/2023 - PDF - English - IEEE
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IEEE 2716:2022
IEEE Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding
5/29/2023 - Paper - English - IEEE
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IEEE 2715:2023
IEEE Guide for the Characterization of the Shielding Effectiveness of Planar Materials
5/5/2023 - PDF - English - IEEE
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IEEE 2715:2023
IEEE Guide for the Characterization of the Shielding Effectiveness of Planar Materials
5/5/2023 - Paper - English - IEEE
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€194.00
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€243.00
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IEEE 1500:2022
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
10/12/2022 - PDF - English - IEEE
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IEEE 1500:2022
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
10/12/2022 - Paper - English - IEEE
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IEEE 287.2:2021
IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 2: Test Procedures
9/16/2022 - PDF - English - IEEE
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IEEE 287.2:2021
IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 2: Test Procedures
9/16/2022 - Paper - English - IEEE
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IEEE 287.3:2021
IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeteter-wave Frequencies-Part 3: Connector Effects, Uncertainty Specifications, and Recommendations for Performance
9/16/2022 - PDF - English - IEEE
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IEEE 287.3:2021
IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeteter-wave Frequencies-Part 3: Connector Effects, Uncertainty Specifications, and Recommendations for Performance
9/16/2022 - Paper - English - IEEE
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IEEE 287.1:2021
IEEE Standard for Precision Coaxial
Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 1: General Requirements, Definitions, and Detailed Specifications
9/16/2022 - PDF - English - IEEE
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IEEE 287.1:2021
IEEE Standard for Precision Coaxial
Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 1: General Requirements, Definitions, and Detailed Specifications
9/16/2022 - Paper - English - IEEE
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IEEE 1573:2021
IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
5/9/2022 - PDF - English - IEEE
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IEEE 1573:2021 Redline
IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
5/9/2022 - PDF - English - IEEE
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IEEE 1573:2021
IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
5/9/2022 - Paper - English - IEEE
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IEEE 2065:2020
IEEE Guide for Parameter Requirements and Test Method for Industrial Fiber Laser
3/23/2021 - PDF - English - IEEE
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IEEE 2065:2020
IEEE Guide for Parameter Requirements and Test Method for Industrial Fiber Laser
3/23/2021 - Paper - English - IEEE
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€101.00
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€140.00
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IEEE 1036:2020
IEEE Guide for the Application of Shunt Power Capacitors
3/5/2021 - Paper - English - IEEE
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IEEE 1531:2020
IEEE Guide for the Application and Specification of Harmonic Filters
1/26/2021 - PDF - English - IEEE
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IEEE 1531:2020 Redline
IEEE Guide for the Application and Specification of Harmonic Filters
1/26/2021 - PDF - English - IEEE
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IEEE 1531:2020
IEEE Guide for the Application and Specification of Harmonic Filters
1/26/2021 - Paper - English - IEEE
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IEEE 370:2020
IEEE Standard for Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz
1/8/2021 - PDF - English - IEEE
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IEEE 370:2020
IEEE Standard for Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz
1/8/2021 - Paper - English - IEEE
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IEEE 1838:2019
IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
3/13/2020 - PDF - English - IEEE
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IEEE 1838:2019
IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
3/13/2020 - Paper - English - IEEE
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IEEE 1481:2019
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - PDF - English - IEEE
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IEEE 1481:2019 Redline
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - PDF - English - IEEE
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IEEE 1481:2019
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - Paper - English - IEEE
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IEEE 2401:2019
IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - PDF - English - IEEE
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IEEE 2401:2019 Redline
IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - PDF - English - IEEE
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IEEE 2401:2019
IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - Paper - English - IEEE
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IEEE C62.59:2019
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
10/31/2019 - PDF - English - IEEE
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IEEE C62.59:2019
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
10/31/2019 - Paper - English - IEEE
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IEEE 1505.1:2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
8/20/2019 - PDF - English - IEEE
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IEEE 1505.1:2019 Redline
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
8/20/2019 - PDF - English - IEEE
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IEEE 1505.1:2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
8/20/2019 - Paper - English - IEEE
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IEEE 2416:2019
IEEE Standard for Power Modeling to Enable System-Level Analysis
7/31/2019 - PDF - English - IEEE
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IEEE 2416:2019
IEEE Standard for Power Modeling to Enable System-Level Analysis
7/31/2019 - Paper - English - IEEE
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IEEE 1801:2018
IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems
3/29/2019 - Paper - English - IEEE
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IEEE C37.116:2018
IEEE Guide for Protective Relay Application to Transmission-Line Series Capacitor Banks
10/19/2018 - PDF - English - IEEE
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IEEE C37.116:2018 Redline
IEEE Guide for Protective Relay Application to Transmission-Line Series Capacitor Banks
10/19/2018 - PDF - English - IEEE
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IEEE C37.116:2018
IEEE Guide for Protective Relay Application to Transmission-Line Series Capacitor Banks
10/19/2018 - Paper - English - IEEE
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IEEE 1641.1a:2018
IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
8/15/2018 - PDF - English - IEEE
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IEEE 1641.1a:2018
IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
8/15/2018 - Paper - English - IEEE
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IEEE C37.248:2017
IEEE Guide for Common Format for Naming Intelligent Electronic Devices (COMDEV)
5/25/2018 - PDF - English - IEEE
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IEEE C37.248:2017
IEEE Guide for Common Format for Naming Intelligent Electronic Devices (COMDEV)
5/25/2018 - Paper - English - IEEE
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IEEE 1804:2017
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
1/31/2018 - PDF - English - IEEE
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IEEE 1804:2017
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
1/31/2018 - Paper - English - IEEE
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IEEE 2700:2017
IEEE Standard for Sensor Performance Parameter Definitions
1/31/2018 - PDF - English - IEEE
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IEEE 2700:2017
IEEE Standard for Sensor Performance Parameter Definitions
1/31/2018 - Paper - English - IEEE
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IEEE 1149.10:2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
7/28/2017 - PDF - English - IEEE
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IEEE 1149.10:2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
7/28/2017 - Paper - English - IEEE
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IEEE 1505.3:2015
IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
1/20/2016 - PDF - English - IEEE
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IEEE 1505.3:2015
IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
1/20/2016 - Paper - English - IEEE
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IEEE/IEC 63003:2015
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
12/30/2015 - PDF - English - IEEE
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IEEE/IEC 63003:2015
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
12/30/2015 - Paper - English - IEEE
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IEEE/IEC 63004:2015
IEC/IEEE International standard for receiver fixture interface
12/30/2015 - PDF - English - IEEE
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IEEE/IEC 63004:2015
IEC/IEEE International standard for receiver fixture interface
12/30/2015 - Paper - English - IEEE
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IEEE 1687:2014
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
12/5/2014 - PDF - English - IEEE
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IEEE 1687:2014
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
12/5/2014 - Paper - English - IEEE
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IEEE 1726:2013
IEEE Guide for the Functional Specification of Fixed-Series Capacitor Banks for Transmission System Applications
3/7/2014 - PDF - English - IEEE
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IEEE 1726:2013
IEEE Guide for the Functional Specification of Fixed-Series Capacitor Banks for Transmission System Applications
3/7/2014 - Paper - English - IEEE
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IEEE/IEC 62860:2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
7/30/2013 - PDF - English - IEEE
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IEEE/IEC 62860:2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
7/30/2013 - Paper - English - IEEE
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IEEE/IEC 62860-1:2013
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
7/30/2013 - PDF - English - IEEE
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IEEE/IEC 62860-1:2013
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
7/30/2013 - Paper - English - IEEE
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IEEE 1641.1:2013
IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
6/7/2013 - PDF - English - IEEE
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IEEE 1641.1:2013
IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
6/7/2013 - Paper - English - IEEE
Learn More€362.00 -
IEEE 1149.1:2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
5/13/2013 - PDF - English - IEEE
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IEEE 1149.1:2013 Redline
IEEE Standard for Test Access Port and Boundary-Scan Architecture
5/13/2013 - PDF - English - IEEE
Learn More€406.00 -
IEEE 1149.1:2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
5/13/2013 - Paper - English - IEEE
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IEEE C62.37.1:2012
IEEE Guide for the Application of Thyristor Surge Protective Device Components
4/26/2013 - PDF - English - IEEE
Learn More€131.00 -
IEEE C62.37.1:2012 Redline
IEEE Guide for the Application of Thyristor Surge Protective Device Components
4/26/2013 - PDF - English - IEEE
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IEEE C62.37.1:2012
IEEE Guide for the Application of Thyristor Surge Protective Device Components
4/26/2013 - Paper - English - IEEE
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IEEE/IEC 62529:2012
IEC 62529:2012(E) Standard for Signal and Test Definition
7/16/2012 - PDF - English - IEEE
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IEEE/IEC 62529:2012 Redline
IEC 62529:2012(E) Standard for Signal and Test Definition
7/16/2012 - PDF - English - IEEE
Learn More€469.00 -
IEEE/IEC 62529:2012
IEC 62529:2012(E) Standard for Signal and Test Definition
7/16/2012 - Paper - English - IEEE
Learn More€576.00 -
IEEE 1031:2011
IEEE Guide for the Functional Specification of Transmission Static Var Compensators
6/17/2011 - PDF - English - IEEE
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IEEE 1031:2011 Redline
IEEE Guide for the Functional Specification of Transmission Static Var Compensators
6/17/2011 - PDF - English - IEEE
Learn More€230.00 -
IEEE 1031:2011
IEEE Guide for the Functional Specification of Transmission Static Var Compensators
6/17/2011 - Paper - English - IEEE
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IEEE/ANSI N42.31:2003
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
8/20/2003 - PDF - English - IEEE
Learn More€97.00 -
IEEE/ANSI N42.31:2003
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
8/20/2003 - Paper - English - IEEE
Learn More€113.00 -
IEEE N42.30:2002
American National Standard for Performance Specification for Tritium Monitors
11/25/2002 - PDF - English - IEEE
Learn More€119.00 -
IEEE N42.30:2002
American National Standard for Performance Specification for Tritium Monitors
11/25/2002 - Paper - English - IEEE
Learn More€136.00 -
IEEE/ANSI C63.13:1991
American National Standard Guide on the Application and Evaluation of EMI Power-Line Filters for Commercial Use
8/7/1991 - PDF - English - IEEE
Learn More€142.00 -
IEEE/ANSI C63.13:1991
American National Standard Guide on the Application and Evaluation of EMI Power-Line Filters for Commercial Use
8/7/1991 - Paper - English - IEEE
Learn More€204.00