31 : Electronics

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  • IEEE 1241:2023

    IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
    10/6/2023 - PDF - English - IEEE
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    €151.00

  • IEEE 1241:2023

    IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
    10/6/2023 - Paper - English - IEEE
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    €188.00

  • IEEE 2999:2023

    IEEE Guide for Technical Requirements and Test Methods for Industrial Ultrashort Pulse Lasers
    9/29/2023 - PDF - English - IEEE
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    €56.00

  • IEEE 2999:2023

    IEEE Guide for Technical Requirements and Test Methods for Industrial Ultrashort Pulse Lasers
    9/29/2023 - Paper - English - IEEE
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    €69.00

  • IEEE 2716:2022

    IEEE Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding
    5/29/2023 - PDF - English - IEEE
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    €66.00

  • IEEE 2716:2022

    IEEE Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding
    5/29/2023 - Paper - English - IEEE
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    €82.00

  • IEEE 2715:2023

    IEEE Guide for the Characterization of the Shielding Effectiveness of Planar Materials
    5/5/2023 - PDF - English - IEEE
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    €74.00

  • IEEE 2715:2023

    IEEE Guide for the Characterization of the Shielding Effectiveness of Planar Materials
    5/5/2023 - Paper - English - IEEE
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    €92.00

  • IEEE 1641:2022

    IEEE Standard for Signal and Test Definition
    2/10/2023 - PDF - English - IEEE
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    €194.00

  • IEEE 1641:2022

    IEEE Standard for Signal and Test Definition
    2/10/2023 - Paper - English - IEEE
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    €243.00

  • IEEE 1500:2022

    IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
    10/12/2022 - PDF - English - IEEE
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    €156.00

  • IEEE 1500:2022

    IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
    10/12/2022 - Paper - English - IEEE
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    €194.00

  • IEEE 287.2:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 2: Test Procedures
    9/16/2022 - PDF - English - IEEE
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    €58.00

  • IEEE 287.2:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 2: Test Procedures
    9/16/2022 - Paper - English - IEEE
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    €72.00

  • IEEE 287.3:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeteter-wave Frequencies-Part 3: Connector Effects, Uncertainty Specifications, and Recommendations for Performance
    9/16/2022 - PDF - English - IEEE
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    €84.00

  • IEEE 287.3:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeteter-wave Frequencies-Part 3: Connector Effects, Uncertainty Specifications, and Recommendations for Performance
    9/16/2022 - Paper - English - IEEE
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    €105.00

  • IEEE 287.1:2021

    IEEE Standard for Precision Coaxial
    Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 1: General Requirements, Definitions, and Detailed Specifications
    9/16/2022 - PDF - English - IEEE
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    €124.00

  • IEEE 287.1:2021

    IEEE Standard for Precision Coaxial
    Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 1: General Requirements, Definitions, and Detailed Specifications
    9/16/2022 - Paper - English - IEEE
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    €155.00

  • IEEE 1573:2021

    IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
    5/9/2022 - PDF - English - IEEE
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    €122.00

  • IEEE 1573:2021 Redline

    IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
    5/9/2022 - PDF - English - IEEE
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    €165.00

  • IEEE 1573:2021

    IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
    5/9/2022 - Paper - English - IEEE
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    €200.00

  • IEEE 2065:2020

    IEEE Guide for Parameter Requirements and Test Method for Industrial Fiber Laser
    3/23/2021 - PDF - English - IEEE
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    €56.00

  • IEEE 2065:2020

    IEEE Guide for Parameter Requirements and Test Method for Industrial Fiber Laser
    3/23/2021 - Paper - English - IEEE
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    €69.00

  • IEEE 1036:2020

    IEEE Guide for the Application of Shunt Power Capacitors
    3/5/2021 - PDF - English - IEEE
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    €101.00

  • IEEE 1036:2020 Redline

    IEEE Guide for the Application of Shunt Power Capacitors
    3/5/2021 - PDF - English - IEEE
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    €140.00

  • IEEE 1036:2020

    IEEE Guide for the Application of Shunt Power Capacitors
    3/5/2021 - Paper - English - IEEE
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    €170.00

  • IEEE 1531:2020

    IEEE Guide for the Application and Specification of Harmonic Filters
    1/26/2021 - PDF - English - IEEE
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    €85.00

  • IEEE 1531:2020 Redline

    IEEE Guide for the Application and Specification of Harmonic Filters
    1/26/2021 - PDF - English - IEEE
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    €115.00

  • IEEE 1531:2020

    IEEE Guide for the Application and Specification of Harmonic Filters
    1/26/2021 - Paper - English - IEEE
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    €140.00

  • IEEE 370:2020

    IEEE Standard for Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz
    1/8/2021 - PDF - English - IEEE
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    €152.00

  • IEEE 370:2020

    IEEE Standard for Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz
    1/8/2021 - Paper - English - IEEE
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    €189.00

  • IEEE 1838:2019

    IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
    3/13/2020 - PDF - English - IEEE
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    €99.00

  • IEEE 1838:2019

    IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
    3/13/2020 - Paper - English - IEEE
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    €124.00

  • IEEE 1481:2019

    IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
    3/13/2020 - PDF - English - IEEE
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    €345.00

  • IEEE 1481:2019 Redline

    IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
    3/13/2020 - PDF - English - IEEE
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    €466.00

  • IEEE 1481:2019

    IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
    3/13/2020 - Paper - English - IEEE
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    €561.00

  • IEEE 2401:2019

    IEEE Standard Format for LSI-Package-Board Interoperable Design
    1/27/2020 - PDF - English - IEEE
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    €194.00

  • IEEE 2401:2019 Redline

    IEEE Standard Format for LSI-Package-Board Interoperable Design
    1/27/2020 - PDF - English - IEEE
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    €271.00

  • IEEE 2401:2019

    IEEE Standard Format for LSI-Package-Board Interoperable Design
    1/27/2020 - Paper - English - IEEE
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    €326.00

  • IEEE C62.59:2019

    IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
    10/31/2019 - PDF - English - IEEE
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    €63.00

  • IEEE C62.59:2019

    IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
    10/31/2019 - Paper - English - IEEE
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    €79.00

  • IEEE 1505.1:2019

    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    8/20/2019 - PDF - English - IEEE
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    €152.00

  • IEEE 1505.1:2019 Redline

    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    8/20/2019 - PDF - English - IEEE
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    €208.00

  • IEEE 1505.1:2019

    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    8/20/2019 - Paper - English - IEEE
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    €255.00

  • IEEE 2416:2019

    IEEE Standard for Power Modeling to Enable System-Level Analysis
    7/31/2019 - PDF - English - IEEE
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    €79.00

  • IEEE 2416:2019

    IEEE Standard for Power Modeling to Enable System-Level Analysis
    7/31/2019 - Paper - English - IEEE
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    €100.00

  • IEEE 1801:2018

    IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems
    3/29/2019 - Paper - English - IEEE
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    €431.00

  • IEEE C37.116:2018

    IEEE Guide for Protective Relay Application to Transmission-Line Series Capacitor Banks
    10/19/2018 - PDF - English - IEEE
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    €99.00

  • IEEE C37.116:2018 Redline

    IEEE Guide for Protective Relay Application to Transmission-Line Series Capacitor Banks
    10/19/2018 - PDF - English - IEEE
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    €137.00

  • IEEE C37.116:2018

    IEEE Guide for Protective Relay Application to Transmission-Line Series Capacitor Banks
    10/19/2018 - Paper - English - IEEE
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    €168.00

  • IEEE 1641.1a:2018

    IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
    8/15/2018 - PDF - English - IEEE
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    €54.00

  • IEEE 1641.1a:2018

    IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
    8/15/2018 - Paper - English - IEEE
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    €68.00

  • IEEE C37.248:2017

    IEEE Guide for Common Format for Naming Intelligent Electronic Devices (COMDEV)
    5/25/2018 - PDF - English - IEEE
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    €63.00

  • IEEE C37.248:2017

    IEEE Guide for Common Format for Naming Intelligent Electronic Devices (COMDEV)
    5/25/2018 - Paper - English - IEEE
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    €78.00

  • IEEE 1804:2017

    IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
    1/31/2018 - PDF - English - IEEE
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    €54.00

  • IEEE 1804:2017

    IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
    1/31/2018 - Paper - English - IEEE
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    €68.00

  • IEEE 2700:2017

    IEEE Standard for Sensor Performance Parameter Definitions
    1/31/2018 - PDF - English - IEEE
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    €79.00

  • IEEE 2700:2017

    IEEE Standard for Sensor Performance Parameter Definitions
    1/31/2018 - Paper - English - IEEE
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    €100.00

  • IEEE 1149.10:2017

    IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
    7/28/2017 - PDF - English - IEEE
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    €99.00

  • IEEE 1149.10:2017

    IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
    7/28/2017 - Paper - English - IEEE
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    €122.00

  • IEEE 1505.3:2015

    IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
    1/20/2016 - PDF - English - IEEE
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    €53.00

  • IEEE 1505.3:2015

    IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
    1/20/2016 - Paper - English - IEEE
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    €67.00

  • IEEE/IEC 63003:2015

    IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
    12/30/2015 - PDF - English - IEEE
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    €311.00

  • IEEE/IEC 63003:2015

    IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
    12/30/2015 - Paper - English - IEEE
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    €385.00

  • IEEE/IEC 63004:2015

    IEC/IEEE International standard for receiver fixture interface
    12/30/2015 - PDF - English - IEEE
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    €301.00

  • IEEE/IEC 63004:2015

    IEC/IEEE International standard for receiver fixture interface
    12/30/2015 - Paper - English - IEEE
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    €374.00

  • IEEE 1687:2014

    IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
    12/5/2014 - PDF - English - IEEE
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    €269.00

  • IEEE 1687:2014

    IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
    12/5/2014 - Paper - English - IEEE
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    €337.00

  • IEEE 1726:2013

    IEEE Guide for the Functional Specification of Fixed-Series Capacitor Banks for Transmission System Applications
    3/7/2014 - PDF - English - IEEE
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    €192.00

  • IEEE 1726:2013

    IEEE Guide for the Functional Specification of Fixed-Series Capacitor Banks for Transmission System Applications
    3/7/2014 - Paper - English - IEEE
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    €234.00

  • IEEE/IEC 62860:2013

    IEC/IEEE Test methods for the characterization of organic transistors and materials
    7/30/2013 - PDF - English - IEEE
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    €197.00

  • IEEE/IEC 62860:2013

    IEC/IEEE Test methods for the characterization of organic transistors and materials
    7/30/2013 - Paper - English - IEEE
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    €248.00

  • IEEE/IEC 62860-1:2013

    IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
    7/30/2013 - PDF - English - IEEE
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    €139.00

  • IEEE/IEC 62860-1:2013

    IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
    7/30/2013 - Paper - English - IEEE
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    €167.00

  • IEEE 1641.1:2013

    IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
    6/7/2013 - PDF - English - IEEE
    Learn More
    €302.00

  • IEEE 1641.1:2013

    IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
    6/7/2013 - Paper - English - IEEE
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    €362.00

  • IEEE 1149.1:2013

    IEEE Standard for Test Access Port and Boundary-Scan Architecture
    5/13/2013 - PDF - English - IEEE
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    €302.00

  • IEEE 1149.1:2013 Redline

    IEEE Standard for Test Access Port and Boundary-Scan Architecture
    5/13/2013 - PDF - English - IEEE
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    €406.00

  • IEEE 1149.1:2013

    IEEE Standard for Test Access Port and Boundary-Scan Architecture
    5/13/2013 - Paper - English - IEEE
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    €487.00

  • IEEE C62.37.1:2012

    IEEE Guide for the Application of Thyristor Surge Protective Device Components
    4/26/2013 - PDF - English - IEEE
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    €131.00

  • IEEE C62.37.1:2012 Redline

    IEEE Guide for the Application of Thyristor Surge Protective Device Components
    4/26/2013 - PDF - English - IEEE
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    €181.00

  • IEEE C62.37.1:2012

    IEEE Guide for the Application of Thyristor Surge Protective Device Components
    4/26/2013 - Paper - English - IEEE
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    €224.00

  • IEEE/IEC 62529:2012

    IEC 62529:2012(E) Standard for Signal and Test Definition
    7/16/2012 - PDF - English - IEEE
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    €345.00

  • IEEE/IEC 62529:2012 Redline

    IEC 62529:2012(E) Standard for Signal and Test Definition
    7/16/2012 - PDF - English - IEEE
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    €469.00

  • IEEE/IEC 62529:2012

    IEC 62529:2012(E) Standard for Signal and Test Definition
    7/16/2012 - Paper - English - IEEE
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    €576.00

  • IEEE 1031:2011

    IEEE Guide for the Functional Specification of Transmission Static Var Compensators
    6/17/2011 - PDF - English - IEEE
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    €165.00

  • IEEE 1031:2011 Redline

    IEEE Guide for the Functional Specification of Transmission Static Var Compensators
    6/17/2011 - PDF - English - IEEE
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    €230.00

  • IEEE 1031:2011

    IEEE Guide for the Functional Specification of Transmission Static Var Compensators
    6/17/2011 - Paper - English - IEEE
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    €288.00

  • IEEE/ANSI N42.31:2003

    American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
    8/20/2003 - PDF - English - IEEE
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    €97.00

  • IEEE/ANSI N42.31:2003

    American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
    8/20/2003 - Paper - English - IEEE
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    €113.00

  • IEEE N42.30:2002

    American National Standard for Performance Specification for Tritium Monitors
    11/25/2002 - PDF - English - IEEE
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    €119.00

  • IEEE N42.30:2002

    American National Standard for Performance Specification for Tritium Monitors
    11/25/2002 - Paper - English - IEEE
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    €136.00

  • IEEE/ANSI C63.13:1991

    American National Standard Guide on the Application and Evaluation of EMI Power-Line Filters for Commercial Use
    8/7/1991 - PDF - English - IEEE
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    €142.00

  • IEEE/ANSI C63.13:1991

    American National Standard Guide on the Application and Evaluation of EMI Power-Line Filters for Commercial Use
    8/7/1991 - Paper - English - IEEE
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    €204.00

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