31.260 : Optoelectronics. Laser equipment
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DIN EN ISO 15367-1:2004-02
Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003); German version EN ISO 15367-1:2003
2/1/2004 - PDF - German - DIN
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DIN EN ISO 15367-1:2004-02
Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003); German version EN ISO 15367-1:2003
2/1/2004 - PDF - English - DIN
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ISO/TR 11146-3:2004 (R2007)
Lasers and laser-related equipment
Test methods for laser beam widths, divergence angles and beam propagation ratios
1/22/2004 - Paper - English - ISO
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€219.00
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€219.00
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BS EN 60264-2-1:1996
Packaging for winding wires Cylindrical barrelled delivery spools Basic dimensions
11/26/2003 - PDF - English - BSI
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BS EN ISO 15367-1:2003
Lasers and laser-related equipment. Test methods for determination of the shape a laser beam wavefront Terminology fundamental aspects
11/24/2003 - PDF - English - BSI
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NBN EN ISO 15367-1:2003
Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003)
10/28/2003 - PDF - French - NBN
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NBN EN ISO 15367-1:2003
Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003)
10/28/2003 - PDF - German - NBN
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NBN EN ISO 15367-1:2003
Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003)
10/28/2003 - PDF - English - NBN
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DIN EN ISO 11670:2003-10
Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability (ISO 11670:2003); German version EN ISO 11670:2003
10/1/2003 - PDF - German - DIN
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DIN EN ISO 11670:2003-10
Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability (ISO 11670:2003); German version EN ISO 11670:2003
10/1/2003 - PDF - English - DIN
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DIN EN ISO 17526:2003-10
Optic and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003); German version EN ISO 17526:2003
10/1/2003 - PDF - German - DIN
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DIN EN ISO 17526:2003-10
Optic and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003); German version EN ISO 17526:2003
10/1/2003 - PDF - English - DIN
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BS EN ISO 17526:2003
Optics and optical instruments. Lasers and laser-related equipment. Lifetime of lasers
8/20/2003 - PDF - English - BSI
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NBN EN ISO 17526:2003
Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)
8/14/2003 - PDF - French - NBN
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NBN EN ISO 17526:2003
Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)
8/14/2003 - PDF - German - NBN
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NBN EN ISO 17526:2003
Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)
8/14/2003 - PDF - English - NBN
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ISO 17526:2003 (R2020)
Optics and optical instruments
Lasers and laser-related equipment
6/20/2003 - Paper - French - ISO
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ISO 17526:2003 (R2020)
Optics and optical instruments
Lasers and laser-related equipment
6/20/2003 - Paper - English - ISO
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NBN EN ISO 11670:2003
Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability (ISO 11670:2003)
5/26/2003 - PDF - French - NBN
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NBN EN ISO 11670:2003
Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability (ISO 11670:2003)
5/26/2003 - PDF - German - NBN
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NBN EN ISO 11670:2003
Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability (ISO 11670:2003)
5/26/2003 - PDF - English - NBN
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ISO 11670:2003 (R2020)
Lasers and laser-related equipment
Test methods for laser beam parameters
4/17/2003 - Paper - French - ISO
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ISO 11670:2003 (R2020)
Lasers and laser-related equipment
Test methods for laser beam parameters
4/17/2003 - Paper - English - ISO
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BS 6493-1.5:1992
Semiconductor devices. Discrete devices Recommendations for optoelectronic Section 5:
3/27/2003 - PDF - English - BSI
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BS EN ISO 15616-1:2003
Acceptance tests for CO2- laser beam machines high quality welding and cutting General principles, acceptance conditions
3/19/2003 - PDF - English - BSI
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BS EN ISO 15616-3:2003
Acceptance tests for CO2- laser beam machines high quality welding and cutting Calibration of instruments measurement gas flow pressure
3/19/2003 - PDF - English - BSI
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BS EN ISO 15616-2:2003
Acceptance tests for CO2- laser beam machines high quality welding and cutting Measurement of static dynamic accuracy
3/19/2003 - PDF - English - BSI
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NF EN 60747-5-2/A1, C96-005-2/A1 (02/2003)
Discrete semiconductor devices and integrated circuits - Partie 5-2 : optoelectronic devices - Essential ratings and characteristics
2/1/2003 - Paper - French - AFNOR
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BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic Measuring methods
1/20/2003 - PDF - English - BSI
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BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic Essential ratings characteristics
1/17/2003 - PDF - English - BSI
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BS EN 60747-5-1:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic General
1/15/2003 - PDF - English - BSI
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DIN EN 60747-5-2 VDE 0884-2:2003-01
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices, Essential ratings and characteristics (IEC 60747-5-2:1997 + A1:2002), German version EN 60747-5-2:2001 + A1:2002
1/1/2003 - Paper - German - VDE
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DIN EN 60747-5-3 VDE 0884-3:2003-01
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices, Measuring methods (IEC 60747-5-3:1997 + A1:2002), German version EN 60747-5-3:2001 + A1:2002
1/1/2003 - Paper - German - VDE
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DIN EN 60747-5-1 VDE 0884-1:2003-01
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices, General (IEC 60747-5-1:1997 + A1:2001 + A2:2002), German version EN 60747-5-1:2001 + A1:2002 + A2:2002
1/1/2003 - Paper - German - VDE
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ASTM F1364-03(2022)
Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
1/1/2003 - PDF - English - ASTM
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ASTM F1364-03(2022) + Redline
Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
1/1/2003 - PDF - English - ASTM
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NF EN 60747-5-1/A2, C96-005-1/A2 (12/2002)
Discrete semiconductor devices and integrated circuits - Partie 5-1 : optoelectronic devices - General
12/1/2002 - Paper - French - AFNOR
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NF EN 60747-5-3/A1, C96-005-3/A1 (12/2002)
Discrete semiconductor devices and integrated circuits - Partie 5-3 : optoelectronic devices - Measuring methods
12/1/2002 - Paper - French - AFNOR
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DIN VDE 0884-2/A2 VDE 0884-2/A2:2002-11
Changes for IEC 60747-5-2:1997 + A1:2002, Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices, Essential ratings and characteristics
11/1/2002 - Paper - German - VDE
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DIN IEC 62088:2002-09
Nuclear instrumentation - Photodiodes for scintillation detectors - Test procedures (IEC 62088:2001)
9/1/2002 - PDF - German - DIN
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UNE-EN 60747-16-1:2002
Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by AENOR in July of 2002.)
7/1/2002 - PDF - English - AENOR
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NF EN 60747-5-1/A1, C96-005-1/A1 (06/2002)
Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
6/1/2002 - Paper - French - AFNOR
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NF EN 60747-5-1, C96-005-1 (10/2001)
Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
10/1/2001 - Paper - French - AFNOR
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NF EN 60747-5-2, C96-005-2 (10/2001)
Discrete semiconductor devices and integrated circuits - Part 5-2 : optoelectronic devices - Essential ratings and characteristics
10/1/2001 - Paper - French - AFNOR
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NF EN 60747-5-3, C96-005-3 (10/2001)
Discrete semiconductor devices and integrated circuits - Part 5-3 : optoelectronic devices - Measuring methods
10/1/2001 - Paper - French - AFNOR
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NF S10-140 (12/1999)
Optics and optical instruments - Lasers and laser-related equipments Electromagnetic compatibility (EMC) - Requirements and tests - Optique et instruments d'optique
12/1/1999 - Paper - French - AFNOR
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BS EN 60068-2-77:1999
Environmental testing. Test methods Body strength and impact shock
9/15/1999 - PDF - English - BSI
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DIN 56912:1999-04
Safety requirements for Lightshow lasers and laser lightshow systems
4/1/1999 - PDF - German - DIN
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DIN EN 61751:1998-11
Laser modules used for telecommunication - Reliability assessment (IEC 61751:1998), German version EN 61751:1998
11/1/1998 - PDF - German - DIN
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BS EN 61751:1998
Laser modules used for telecommunication. Reliability assessment
9/15/1998 - PDF - English - BSI
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BS ISO TR 11552:1997
Lasers and laser-related equipment. Laser materials-processing machines. Performance specifications and benchmarks for cutting of metals
4/15/1998 - PDF - English - BSI
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JIS C 5940:1997 (R2013)
General rules of laser diodes for fiber optic transmission
8/20/1997 - PDF - Japanese - JSA
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JIS C 5941:1997 (R2013)
Measuring methods of laser diodes for fiber optic transmission
8/20/1997 - PDF - Japanese - JSA
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JIS C 5950:1997 (R2013)
General rules of light emitting diodes for fiber optic transmission
8/20/1997 - PDF - Japanese - JSA
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JIS C 5951:1997 (R2013)
Measuring methods of light emitting diodes for fiber optic transmission
8/20/1997 - PDF - Japanese - JSA
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JIS C 5990:1997 (R2013)
General rules of photodiodes for fiber optic transmission
8/20/1997 - PDF - Japanese - JSA
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JIS C 5991:1997 (R2013)
Measuring methods of photodiodes for fiber optic transmission
8/20/1997 - PDF - Japanese - JSA
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DIN EN 120002:1997-02
Blank detail specification: Infrared emitting diodes, infrared emitting diode arrays; German version EN 120002:1992
2/1/1997 - PDF - German - DIN
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DIN EN 120004:1997-02
Blank detail specification: Ambient rated photocouplers with phototransistor output; German version EN 120004:1992
2/1/1997 - PDF - German - DIN
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DIN EN 120003:1996-11
Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
11/1/1996 - PDF - German - DIN
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DIN EN 120005:1996-11
Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992
11/1/1996 - PDF - German - DIN
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DIN EN 61173:1996-10
Overvoltage protection for photovoltaic (PV) power generating systems - Guide (IEC 61173:1992); German version EN 61173:1994
10/1/1996 - PDF - German - DIN
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BS EN 120000:1996
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
9/15/1996 - PDF - English - BSI
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UNE-EN 120003:1992
BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)
9/1/1996 - PDF - English - AENOR
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UNE-EN 120004:1992
BDS: AMBIENT RATED PHOTOCOUPLERS WITH PHOTOTRANSISTORS OUTPUT. (Endorsed by AENOR in September of 1996.)
9/1/1996 - PDF - English - AENOR
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BS EN 61194:1996
Characteristic parameters of stand-alone photovoltaic (PV) systems
8/15/1996 - PDF - English - BSI
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EIA/TIA-455-129:1996 (R2014)
Procedures for Applying Human Body Model Electrostatic Discharge Stress to Package Optoelectronic Components
7/1/1996 - PDF sécurisé - English - EIA
Learn More€104.32 -
BS EN 61727:1996
Photovoltaic (PV) systems. Characteristics of the utility interface
1/15/1996 - PDF - English - BSI
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JIS C 6181:1995 (R2015)
Power and energy measuring detectors, instruments and equipment for laser radiation
1/1/1995 - PDF - Japanese - JSA
Learn More€25.00 -
€25.00
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BS EN 61040:1993
Specification for power and energy measuring detectors, instruments and equipment for laser radiation
10/15/1993 - PDF - English - BSI
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DIN EN 61040 VDE 0835:1993-08
Power and energy measuring detectors, instruments and equipment for laser radiation (IEC 61040:1990); German version EN 61040:1992
8/1/1993 - Paper - German - VDE
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DIN EN 120001:1993-06
Blank detail specification: light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor; German version EN 120001:1992
6/1/1993 - PDF - German - DIN
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NF EN 120004, C93-120-004 (07/1992)
Blank detail specification : ambient rated photocouplers with phototransistor output
7/1/1992 - Paper - French - AFNOR
Learn More€103.00 -
NF EN 120005, C93-120-005 (07/1992)
Blank detail specification : photodiodes, photodiode arrays (not intended for fibre optic applications)
7/1/1992 - Paper - French - AFNOR
Learn More€88.00 -
NF EN 120002, C93-120-002 (07/1992)
Blank Detail Specification : Infrared emitting diodes, infrared emitting diode arrays
7/1/1992 - Paper - French - AFNOR
Learn More€88.00 -
NF EN 120001, C93-120-001 (05/1992)
Blank detail specification : light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
5/1/1992 - Paper - French - AFNOR
Learn More€88.33 -
NF EN 120007, C93-120-007 (05/1992)
Blank Detail Specification : Liquid cristal displays - Monochrome LCDs without electronic circuit
5/1/1992 - Paper - French - AFNOR
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€62.00
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BS EN 120001:1993
Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
11/15/1991 - PDF - English - BSI
Learn More€180.00 -
€25.00
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€25.00
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UTE C86-509, C86-509U (09/1988)
Electronic components. Optical laser module with pigtail. Blank detail specification and measuring methods. - Composants électroniques
9/1/1988 - Paper - French - AFNOR
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BS EN 120002:1993
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays
6/15/1988 - PDF - English - BSI
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BS EN 120005:1993
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications)
11/15/1986 - PDF - English - BSI
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BS CECC 20000:1983
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
6/30/1983 - PDF - English - BSI
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EIA LEB 3:1976
Interpretations of HEW BRH Guide for Submission of Laser Equipment Reports
1/1/1976 - PDF sécurisé - English - EIA
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IEC 60528:1975
IEC 60528:1975 Expression of performance of air quality infra-red analyzers
1/1/1975 - PDF - English, French - IEC
Learn More€132.00 -
IEC 60306-4:1971
IEC 60306-4:1971 Measurement of photosensitive devices. Part 4: Methods of measurement for photo-multipliers
1/1/1971 - PDF - English, French - IEC
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IEC 60306-3:1970
IEC 60306-3:1970 Measurement of photosensitive devices. Part 3: Methods of measurement of photoconductive cells for use in the visible spectrum
- PDF - English, French - IEC
Learn More€23.00 -
EIA LEB 2:1970
Guidance for Laser Record Keeping and Reporting under the Radiation Control for Health and Safety Act of 1968
- PDF sécurisé - English - EIA
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EIA LEB 1:1970
Safety Classification of Laser Equipment and Installations
- PDF sécurisé - English - EIA
Learn More€70.35 -
IEC 60306-1:1969
IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
1/1/1969 - PDF - Russian - IEC
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IEC 60306-1:1969
IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
1/1/1969 - PDF - English, French - IEC
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IEC 60306-2:1969
IEC 60306-2:1969 Measurement of photosensitive devices. Part 2: Methods of measurement of phototubes
1/1/1969 - PDF - English, French - IEC
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UNE-EN IEC 62471-6:2023
Photobiological safety of lamps and lamp systems - Part 6: Ultraviolet lamp products (Endorsed by Asociación Española de Normalización in December of 2023.)
3/28/2024 - PDF - English - AENOR
Learn More€94.00