31.220 : Electromechanical components for electronic and telecommunications equipment
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JIS C 5402-17-3:2018
Connectors for electronic equipment - Tests and measurements - Part 17-3: Cable clamping tests - Test 17c: Cable clamp resistance to cable pull (tensile)
2/20/2018 - PDF - Japanese - JSA
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JIS C 5630-26:2017
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
10/20/2017 - PDF - Japanese - JSA
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JIS C 5402-8-2:2016
Connectors for electronic equipment - Tests and measurements - Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, axial
12/20/2016 - PDF - Japanese - JSA
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JIS C 5402-12-1:2016
Connectors for electronic equipment - Tests and measurements - Part 12-1: Soldering tests - Test 12a: Solderability, wetting, solder bath method
12/20/2016 - PDF - Japanese - JSA
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JIS C 5402-12-2:2016
Connectors for electronic equipment - Tests and measurements - Part 12-2: Soldering tests - Test 12b: Solderability, wetting, soldering iron method
12/20/2016 - PDF - Japanese - JSA
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JIS C 5402-12-4:2016
Connectors for electronic equipment - Tests and measurements - Part 12-4: Soldering tests - Test 12d: Resistance to soldering heat, solder bath method
12/20/2016 - PDF - Japanese - JSA
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JIS C 5402-12-5:2016
Connectors for electronic equipment - Tests and measurements - Part 12-5: Soldering tests - Test 12e: Resistance to soldering heat, soldering iron method
12/20/2016 - PDF - Japanese - JSA
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JIS C 5402-22-1:2016
Connectors for electronic equipment - Tests and measurements - Part 22-1: Capacitance tests - Test 22a: Capacitance
12/20/2016 - PDF - Japanese - JSA
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JIS C 5402-7-1:2016
Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated)
3/22/2016 - PDF - Japanese - JSA
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JIS C 5402-8-1:2016
Connectors for electronic equipment - Tests and measurements - Part 8-1: Static load tests (fixed connectors) - Test 8a: Static load, transverse
3/22/2016 - PDF - Japanese - JSA
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JIS C 5402-8-3:2016
Connectors for electronic equipment - Tests and measurements - Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever
3/22/2016 - PDF - Japanese - JSA
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JIS C 5402-9-1:2016
Connectors for electronic equipment - Tests and measurements - Part 9-1: Endurance tests - Test 9a: Mechanical operation
3/22/2016 - PDF - Japanese - JSA
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JIS C 5402-14-2:2016
Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage
3/22/2016 - PDF - Japanese - JSA
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JIS C 5402-14-4:2016
Connectors for electronic equipment - Tests and measurements - Part 14-4: Sealing tests - Test 14d: Immersion - Waterproof
3/22/2016 - PDF - Japanese - JSA
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JIS C 5402-14-5:2016
Connectors for electronic equipment - Tests and measurements - Part 14-5: Sealing tests - Test 14e: Immersion at low air pressure
3/22/2016 - PDF - Japanese - JSA
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JIS C 5402-14-6:2016
Connectors for electronic equipment - Tests and measurements - Part 14-6: Sealing tests - Test 14f: Interfacial sealing
3/22/2016 - PDF - Japanese - JSA
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JIS C 5401-1:2015
Connectors for electronic equipment - Product requirements - Part 1: Generic specification
11/20/2015 - PDF - Japanese - JSA
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JIS C 5402-13-1:2015
Connectors for electronic equipment - Tests and measurements - Part 13-1: Mechanical operation tests - Test 13a: Engaging and separating forces
11/20/2015 - PDF - Japanese - JSA
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€55.77
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JIS C 5402-16-8:2015
Connectors for electronic equipment - Tests and measurements - Part 16-8: Mechanical tests on contacts and terminations - Test 16h: Insulating grip effectiveness (crimped connections)
4/20/2015 - PDF - Japanese - JSA
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JIS C 5402-16-9:2015
Connectors for electronic equipment - Tests and measurements - Part 16-9: Mechanical tests on contacts and terminations - Test 16i: Grounding contact spring holding force
4/20/2015 - PDF - Japanese - JSA
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JIS C 5402-16-13:2015
Connectors for electronic equipment - Tests and measurements - Part 16-13: Mechanical tests on contacts and terminations - Test 16m: Un-wrapping, solderless wrapped connections
4/20/2015 - PDF - Japanese - JSA
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JIS C 5402-17-1:2015
Connectors for electronic equipment - Tests and measurements - Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness
4/20/2015 - PDF - Japanese - JSA
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JIS C 5402-17-2:2015
Connectors for electronic equipment - Tests and measurements - Part 17-2: Cable clamping tests - Test 17b: Cable clamp resistance to cable rotation
4/20/2015 - PDF - Japanese - JSA
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JIS C 5402-17-4:2015
Connectors for electronic equipment - Tests and measurements - Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion
4/20/2015 - PDF - Japanese - JSA
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JIS C 8121-2-3:2015
Miscellaneous lampholders - Part 2-3: Particular requirements - Lampholders for double-capped linear LED lamps
3/20/2015 - PDF - Japanese - JSA
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JIS C 5630-18:2014
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
12/22/2014 - PDF - Japanese - JSA
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JIS C 5630-19:2014
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
12/22/2014 - PDF - Japanese - JSA
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JIS C 5402-13-5:2014
Connectors for electronic equipment - Tests and measurements - Part 13-5: Mechanical operation tests - Test 13e: Polarizing and keying method
6/20/2014 - PDF - Japanese - JSA
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JIS C 5402-15-1:2014
Connectors for electronic equipment - Tests and measurements - Part 15-1: Connector tests (mechanical) - Test 15a: Contact retention in insert
6/20/2014 - PDF - Japanese - JSA
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JIS C 5402-15-4:2014
Connectors for electronic equipment - Tests and measurements - Part 15-4: Connector tests (mechanical tests) - Test 15d: Contact insertion, release and extraction force
6/20/2014 - PDF - Japanese - JSA
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JIS C 5402-15-6:2014
Connectors for electronic equipment - Tests and measurements - Part 15-6: Connector tests (mechanical tests) - Test 15f: Effectiveness of connector coupling devices
6/20/2014 - PDF - Japanese - JSA
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JIS C 5402-16-3:2014
Connectors for electronic equipment - Tests and measurements - Part 16-3: Mechanical tests on contacts and terminations - Test 16c: Contact-bending strength
6/20/2014 - PDF - Japanese - JSA
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JIS C 5402-1-100:2014
Connectors for electronic equipment - Tests and measurements - Part 1-100: General - Applicable publications
6/20/2014 - PDF - Japanese - JSA
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JIS C 5630-12:2014
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
2/20/2014 - PDF - Japanese - JSA
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JIS C 5630-13:2014
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
2/20/2014 - PDF - Japanese - JSA
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JIS C 5402-15-2:2014
Connectors for electronic equipment - Tests and measurements - Part 15-2: Connector tests (mechanical) - Test 15b: Insert retention in housing (axial)
2/20/2014 - PDF - Japanese - JSA
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JIS C 5402-15-3:2014
Connectors for electronic equipment - Tests and measurements - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional)
2/20/2014 - PDF - Japanese - JSA
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JIS C 5402-15-5:2014
Connectors for electronic equipment - Tests and measurements - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation
2/20/2014 - PDF - Japanese - JSA
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JIS C 5402-16-1:2014
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
2/20/2014 - PDF - Japanese - JSA
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JIS C 5402-16-6:2014
Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations
2/20/2014 - PDF - Japanese - JSA
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JIS C 5445:2012 (R2017)
Electromechanical switches for use in electrical and electronic equipment - Part 1: Generic specification
10/22/2012 - PDF - Japanese - JSA
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JIS C 5402-13-2:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 13-2: Mechanical operation tests - Test 13b: Insertion and withdrawal forces
6/20/2012 - PDF - Japanese - JSA
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JIS C 5402-16-2:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-2: Mechanical tests on contacts and terminations - Test 16b: Restricted entry
6/20/2012 - PDF - Japanese - JSA
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JIS C 5402-16-4:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-4: Mechanical tests on contacts and terminations - Test 16d:Tensile strength (crimped connections)
6/20/2012 - PDF - Japanese - JSA
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JIS C 5402-16-5:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)
6/20/2012 - PDF - Japanese - JSA
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JIS C 5402-16-7:2012 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping
6/20/2012 - PDF - Japanese - JSA
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JIS C 5630-6:2011 (R2016)
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
8/22/2011 - PDF - Japanese - JSA
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JIS C 5630-3:2009 (R2013)
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
3/20/2009 - PDF - Japanese - JSA
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JIS C 5630-2:2009 (R2013)
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
3/20/2009 - PDF - Japanese - JSA
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JIS C 5402-10-4:2006 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests - Test 10d: Electrical overload (connectors)
3/25/2006 - PDF - Japanese - JSA
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JIS C 5402-11-14:2006 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test
3/25/2006 - PDF - Japanese - JSA
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JIS C 5402-23-4:2006 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests - Test 23d: Transmission line reflections in the time domain
3/25/2006 - PDF - Japanese - JSA
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JIS C 5401-2:2005 (R2015)
Connectors for electronic equipment - Part 2: Circular connectors with assessed quality - Sectional specification
12/20/2005 - PDF - Japanese - JSA
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JIS C 5402-2-2:2005 (R2014)
Connectors for electrical equipment - Tests and measurements - Part 2-2: Electrical continuity and contact resistance tests - Test 2b: Contact resistance - Specified test current method
12/20/2005 - PDF - Japanese - JSA
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JIS C 5402-2-5:2005 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
12/20/2005 - PDF - Japanese - JSA
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JIS C 5402-4-1:2005 (R2015)
Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof
12/20/2005 - PDF - Japanese - JSA
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JIS C 5401-3:2005 (R2015)
Connectors for electronic equipment - Part 3: Rectangular connectors with assessed quality - Sectional specification
12/20/2005 - PDF - Japanese - JSA
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JIS C 5401-2-001:2005 (R2015)
Connectors for electronic equipment - Part 2-001: Circular connectors - Blank detail specification
12/20/2005 - PDF - Japanese - JSA
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JIS C 5401-3-001:2005 (R2015)
Connectors for electronic equipment - Part 3-001: Rectangular connectors with assessed quality - Blank detail specification
12/20/2005 - PDF - Japanese - JSA
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JIS C 5402-12-7:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 12-7: Soldering tests - Test 12g: Solderability, wetting balance method
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-20-2:2005 (R2014)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2: Test 20b - Flammability tests - Fireproofness
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-1-1:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-1-2:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 1-2: General examination - Test 1b: Examination of dimension and mass
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-2-3:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 2-3: Electrical continuity and contact resistance tests - Test 2c: Contact resistance variation
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-2-6:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests - Test 2f: Housing (shell) electrical continuity
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-3-1:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-4-2:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial discharge
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-4-3:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests - Test 4c: Voltage proof of pre-insulated crimp barrels
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-5-1:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-5-2:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-6-1:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-6-2:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-6-3:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: Shock
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-6-4:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal)
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-2:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-2: Climatic tests - Test 11b: Combined/sequential cold, low air pressure and damp heat
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-3:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-3: Climatic tests - Test 11c: Damp heat, steady state
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-4:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-4: Climatic tests - Test 11d: Rapid change of temperature
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-5:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-5: Climatic tests - Test 11e: Mould growth
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-6:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-6: Climatic tests - Test 11f: Corrosion, salt mist
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-9:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-9: Climatic tests - Test 11i: Dry heat
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-10:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests - Test 11j: Cold
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-11:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-11: Climatic tests - Test 11k: Low air pressure
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-12:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-11-13:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 11-13: Climatic tests - Test 11n: Gas tightness, solderless wrapped connections
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-23-3:2005 (R2014)
Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-2-1:2005 (R2014)
Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method
3/20/2005 - PDF - Japanese - JSA
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JIS C 5401-4:2005 (R2014)
Connectors for electronic equipment - Part 4: Printed board connectors with assessed quality - Sectional specification
3/20/2005 - PDF - Japanese - JSA
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JIS C 5401-4-001:2005 (R2014)
Connectors for electronic equipment - Part 4-001: Printed Board Connectors with assessed quality - Blank Detail Specification
3/20/2005 - PDF - Japanese - JSA
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JIS C 5402-1-3:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 1-3: General examination - Test 1c: Electrical engagement length
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-1-4:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 1-4: General examination - Test 1d: Contact protection effectiveness (scoop-proof)
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-11-1:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 11-1: Climatic tests - Test 11a: Climatic sequence
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-11-8:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 11-8: Climatic tests - Test 11h: Sand and dust
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-12-6:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 12-6: Soldering tests - Test 12f: Sealing against flux and cleaning solvents in machine soldering
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-19-3:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 19-3: Chemical resistance tests - Test 19c: Fluid resistance
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-1:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 1: General
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-14-7:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 14-7: Sealing tests - Test 14g: Impacting water
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-15-8:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 15-8: Connector tests (mechanical) - Test 15h: Contact retention system, resistance to tool application
3/20/2002 - PDF - Japanese - JSA
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JIS C 5402-16-20:2002 (R2017)
Connectors for electronic equipment - Tests and measurements - Part 16-20: Mechanical tests on contacts and terminations - Test 16t: Mechanical strength (wired termination of solderless connections)
3/20/2002 - PDF - Japanese - JSA
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JIS H 4460:2002 (R2017)
General rules for test of tungsten and molybdenum materials for lighting and electronic equipments
3/20/2002 - PDF - Japanese - JSA
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€32.50
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JIS H 4463:2002 (R2017)
Thoriated tungsten wires and rods for lighting and electronic equipment
3/20/2002 - PDF - Japanese - JSA
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€25.00
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JIS C 5432:1994 (R2015)
Type R01 cylindrical connectors for use in electronic equipment
3/1/1994 - PDF - Japanese - JSA
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€25.00
