31.220.10 : Plug-and-socket devices. Connectors

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  • IEEE 287.3:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeteter-wave Frequencies-Part 3: Connector Effects, Uncertainty Specifications, and Recommendations for Performance
    9/16/2022 - PDF - English -
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    €84.00

  • IEEE 287.1:2021

    IEEE Standard for Precision Coaxial
    Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 1: General Requirements, Definitions, and Detailed Specifications
    9/16/2022 - Paper - English -
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    €155.00

  • IEEE 287.2:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 2: Test Procedures
    9/16/2022 - PDF - English -
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    €58.00

  • IEEE 287.3:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeteter-wave Frequencies-Part 3: Connector Effects, Uncertainty Specifications, and Recommendations for Performance
    9/16/2022 - Paper - English -
    Learn More
    €105.00

  • IEEE 287.2:2021

    IEEE Recommended Practice for Precision Coaxial Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 2: Test Procedures
    9/16/2022 - Paper - English -
    Learn More
    €72.00

  • IEEE 287.1:2021

    IEEE Standard for Precision Coaxial
    Connectors at RF, Microwave, and Millimeter-Wave Frequencies--Part 1: General Requirements, Definitions, and Detailed Specifications
    9/16/2022 - PDF - English -
    Learn More
    €124.00

  • IEEE 1505.1:2019

    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    8/20/2019 - Paper - English -
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    €255.00

  • IEEE 1505.1:2019

    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    8/20/2019 - PDF - English -
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    €152.00

  • IEEE 1505.1:2019 Redline

    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
    8/20/2019 - PDF - English -
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    €208.00

  • IEEE 1505.3:2015

    IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
    1/20/2016 - PDF - English -
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    €53.00

  • IEEE 1505.3:2015

    IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
    1/20/2016 - Paper - English -
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    €67.00

  • IEEE/IEC 63004:2015

    IEC/IEEE International standard for receiver fixture interface
    12/30/2015 - Paper - English -
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    €374.00

  • IEEE/IEC 63003:2015

    IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
    12/30/2015 - Paper - English -
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    €385.00

  • IEEE/IEC 63004:2015

    IEC/IEEE International standard for receiver fixture interface
    12/30/2015 - PDF - English -
    Learn More
    €301.00

  • IEEE/IEC 63003:2015

    IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
    12/30/2015 - PDF - English -
    Learn More
    €311.00

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