31.200 : Integrated circuits. Microelectronics
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DIN EN IEC 62228-1 VDE 0847-28-1:2018-12
Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 62228-1:2018), German version EN IEC 62228-1:2018
12/1/2018 - Paper - German -
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DIN EN 62435-3 VDE 0884-135-3:2018-02
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data (IEC 47/2430/CD:2017)
2/1/2018 - Paper - German -
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DIN EN 61967-1 VDE 0847-21-1:2017-11
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 47A/1022/CD:2017)
11/1/2017 - Paper - German -
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DIN EN 62433-6 VDE 0847-33-6:2017-11
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)
11/1/2017 - Paper - German -
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DIN EN 62433-1 VDE 0847-33-1:2017-10
Integrated circuits - EMC IC modelling - Part 1: General modelling framework (IEC 47A/1011/CD:2017)
10/1/2017 - Paper - German -
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DIN EN 62433-2 VDE 0847-33-2:2017-10
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017), German version EN 62433-2:2017
10/1/2017 - Paper - German -
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DIN EN 62435-2 VDE 0884-135-2:2017-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017), German version EN 62435-2:2017
10/1/2017 - Paper - German -
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DIN EN 62433-3 VDE 0847-33-3:2017-10
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (IEC 62433-3:2017), German version EN 62433-3:2017
10/1/2017 - Paper - German -
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DIN EN 62435-5 VDE 0884-135-5:2017-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017), German version EN 62435-5:2017
10/1/2017 - Paper - German -
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DIN EN 62435-1 VDE 0884-135-1:2017-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017), German version EN 62435-1:2017
10/1/2017 - Paper - German -
Learn More€91.70 -
DIN EN 62228-2 VDE 0847-28-2:2017-09
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers (IEC 62228-2:2016), German version EN 62228-2:2017
9/1/2017 - Paper - German -
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DIN EN 62228-3 VDE 0847-28-3:2017-06
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC 47A/1004/CD:2017)
6/1/2017 - Paper - German -
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DIN EN 62433-4 VDE 0847-33-4:2017-05
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) (IEC 62433-4:2016), German version EN 62433-4:2016
5/1/2017 - Paper - German -
Learn More€183.01 -
DIN EN 62132-1 VDE 0847-22-1:2016-09
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 62132-1:2015), German version EN 62132-1:2016
9/1/2016 - Paper - German -
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DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
8/1/2015 - Paper - German -
Learn More€81.46 -
DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
8/1/2015 - Paper - German -
Learn More€69.60 -
DIN EN 62215-3 VDE 0847-23-3:2014-04
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013), German version EN 62215-3:2013
4/1/2014 - Paper - German -
Learn More€84.90 -
DIN EN 62132-8 VDE 0847-22-8:2013-03
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012), German version EN 62132-8:2012
3/1/2013 - Paper - German -
Learn More€65.60 -
DIN EN 61967-8 VDE 0847-21-8:2012-04
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011), German version EN 61967-8:2011
4/1/2012 - Paper - German -
Learn More€61.54 -
DIN EN 62132-2 VDE 0847-22-2:2011-07
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010), German version EN 62132-2:2011
7/1/2011 - Paper - German -
Learn More€74.10
