31.200 : Integrated circuits. Microelectronics
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UNE-EN IEC 62228-3:2019/AC:2023-07
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in August of 2023.)
8/2/2023 - PDF - English - AENOR
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UNE-EN IEC 61967-8:2023
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)
7/26/2023 - PDF - English - AENOR
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UNE-EN 160000/A1:1995
GENERIC SPECIFICATION: MODULAR ELECTRONIC UNITS (Endorsed by AENOR in November of 1996.)
3/31/2023 - PDF - English - AENOR
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UNE-EN IEC 62228-6:2022
Integrated circuit - EMC Evaluation of transceivers - Part 6: PSI5 transceivers (Endorsed by Asociación Española de Normalización in January of 2023.)
10/12/2022 - PDF - English - AENOR
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UNE-EN IEC 62228-7:2022
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers (Endorsed by Asociación Española de Normalización in May of 2022.)
5/1/2022 - PDF - English - AENOR
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UNE-EN IEC 62228-5:2021
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers (Endorsed by Asociación Española de Normalización in July of 2021.)
7/1/2021 - PDF - English - AENOR
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UNE-EN IEC 61967-4:2021
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method (Endorsed by Asociación Española de Normalización in June of 2021.)
6/1/2021 - PDF - English - AENOR
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UNE-EN IEC 62433-6:2020
EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) (Endorsed by Asociación Española de Normalización in January of 2021.)
1/1/2021 - PDF - English - AENOR
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UNE-EN IEC 62433-1:2019/AC:2020-07
EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in September of 2020.)
9/1/2020 - PDF - English - AENOR
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UNE-EN IEC 62433-1:2019
EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in June of 2019.)
6/1/2019 - PDF - English - AENOR
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UNE-EN IEC 62228-3:2019
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in June of 2019.)
6/1/2019 - PDF - English - AENOR
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UNE-EN IEC 61967-1:2019
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in March of 2019.)
3/1/2019 - PDF - English - AENOR
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UNE-EN IEC 62228-1:2018
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in July of 2018.)
7/1/2018 - PDF - English - AENOR
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UNE-EN 61967-4:2002/AC:2017-07
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by Asociación Española de Normalización in September of 2017.)
9/1/2017 - PDF - English - AENOR
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UNE-EN 62090:2017
Product package labels for electronic components using bar code and two- dimensional symbologies (Endorsed by Asociación Española de Normalización in August of 2017.)
8/1/2017 - PDF - English - AENOR
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UNE-EN 62433-3:2017
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (Endorsed by Asociación Española de Normalización in July of 2017.)
7/1/2017 - PDF - English - AENOR
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UNE-EN 62433-2:2017
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (Endorsed by Asociación Española de Normalización in June of 2017.)
6/1/2017 - PDF - English - AENOR
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UNE-EN 62228-2:2017
Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers (Endorsed by Asociación Española de Normalización in March of 2017.)
3/1/2017 - PDF - English - AENOR
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UNE-EN 62433-4:2016
EMC IC modelling - Part 4: Models of Integrated Circuits for RF Immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI) (Endorsed by AENOR in December of 2016.)
12/1/2016 - PDF - English - AENOR
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UNE-EN 62132-1:2016
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (Endorsed by AENOR in April of 2016.)
4/1/2016 - PDF - English - AENOR
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UNE-EN 62215-3:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (Endorsed by AENOR in November of 2013.)
11/1/2013 - PDF - English - AENOR
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UNE-EN 62132-8:2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)
11/1/2012 - PDF - English - AENOR
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UNE-EN 61967-8:2011
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by AENOR in January of 2012.)
1/1/2012 - PDF - English - AENOR
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UNE-EN 62132-2:2011
Integrated circuits - Measurement of electromagnetic immunity -- Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (Endorsed by AENOR in July of 2011.)
7/1/2011 - PDF - English - AENOR
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UNE-EN 61967-6:2002/A1:2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
9/1/2008 - PDF - English - AENOR
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UNE-EN 62132-4:2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz -- Part 4: Direct RF power injection method (IEC 62132-4:2006) (Endorsed by AENOR in August of 2006.)
8/1/2006 - PDF - English - AENOR
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UNE-EN 62132-5:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz -- Part 5: Workbench Faraday cage method (Endorsed by AENOR in April of 2006.)
4/1/2006 - PDF - English - AENOR
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UNE-EN 61967-4:2002/A1:2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by AENOR in April of 2006.)
4/1/2006 - PDF - English - AENOR
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UNE-EN 61086-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 1: Definitions, classification and general requirements
7/30/2004 - PDF - Spanish - AENOR
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UNE-EN 61086-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 1: Definitions, classification and general requirements
7/30/2004 - PDF - English - AENOR
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UNE-EN 61086-3-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 3-1: Specifications for individual materials - Coatings for general purpose (Class 1), high reliability (Class 2) and aerospace (Class 3)
7/23/2004 - PDF - Spanish - AENOR
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UNE-EN 61086-3-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 3-1: Specifications for individual materials - Coatings for general purpose (Class 1), high reliability (Class 2) and aerospace (Class 3)
7/23/2004 - PDF - English - AENOR
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UNE-EN 61967-5:2003
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method (Endorsed by AENOR in July of 2003.)
7/1/2003 - PDF - English - AENOR
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UNE-EN 61967-4:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kKHz to 1 GHz -- Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by AENOR in November of 2002.)
11/1/2002 - PDF - English - AENOR
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UNE-EN 61967-6:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
11/1/2002 - PDF - English - AENOR
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UNE-EN 61964:1999
Integrated circuits - Memory devices pin configurations. (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
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UNE-EN 61943:1999
INTEGRATED CIRCUITS. MANUFACTURING LINE APPROVAL APPLICATION GUIDELINE (Endorsed by AENOR in November of 1999.)
11/1/1999 - PDF - English - AENOR
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UNE-EN 160000:1993
GS: MODULAR ELECTRONIC UNITS. (Endorsed by AENOR in September of 1996.)
9/1/1996 - PDF - English - AENOR
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UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
6/15/1978 - PDF - Spanish - AENOR
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