31.200 : Integrated circuits. Microelectronics
-
UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
6/15/1978 - PDF - Spanish - AENOR
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BS CECC 90101:1980
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84
4/15/1980 - PDF - English - BSI
Learn More€180.00 -
BS EN 190102:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S
4/15/1980 - PDF - English - BSI
Learn More€180.00 -
BS CECC 90103:1980
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
4/15/1980 - PDF - English - BSI
Learn More€180.00 -
BS CECC 90104:1981
Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB
11/15/1981 - PDF - English - BSI
Learn More€180.00 -
BS EN 190103:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS
1/15/1983 - PDF - English - BSI
Learn More€180.00 -
BS CECC 90000:Addendum No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection
7/29/1983 - PDF - English - BSI
Learn More€331.00 -
NF C96-001 (07/1984) (R2014)
Electronic components. Semiconductor devices. Discrete devices and integrated circuits. Part 1 : general.
7/1/1984 - Paper - French - AFNOR
Learn More€153.67 -
NF C96-411 (10/1984)
Hybrid microcircuits. Film deposit resistive integrated circuits. General requirements.
10/1/1984 - Paper - French - AFNOR
Learn More€116.33 -
BS CECC 63101:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
1/15/1985 - PDF - English - BSI
Learn More€180.00 -
BS CECC 63100:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
1/31/1985 - PDF - English - BSI
Learn More€180.00 -
BS CECC 63201:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval)
6/15/1985 - PDF - English - BSI
Learn More€180.00 -
BS CECC 63200:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits (capability approval)
6/28/1985 - PDF - English - BSI
Learn More€449.00 -
BS CECC 90203:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits
8/15/1985 - PDF - English - BSI
Learn More€180.00 -
NF C86-114 (09/1985)
Harmonized system of quality assessment for electronic components. Integrated analogue switching circuits. Blank detail specification
9/1/1985 - Paper - French - AFNOR
Learn More€88.33 -
NF C86-901 (09/1985)
Harmonized system of quality assessment for electronic components. Integrated line transmitters and/or receivers. Blank detail specification
9/1/1985 - Paper - French - AFNOR
Learn More€103.33 -
BS CECC 90301:1985
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers
9/15/1985 - PDF - English - BSI
Learn More€250.00 -
BS CECC 90000:1985
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
11/29/1985 - PDF - English - BSI
Learn More€449.00 -
IEC 60748-3:1986
IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
1/1/1986 - PDF - Russian - IEC
Learn More€460.00 -
IEC 60748-3:1986
IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
1/1/1986 - PDF - English, French - IEC
Learn More€460.00 -
BS EN 190109:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU
11/15/1986 - PDF - English - BSI
Learn More€250.00 -
BS CECC 90109:1986
Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU
11/15/1986 - PDF - English - BSI
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BS EN 190100:1993
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
12/31/1986 - PDF - English - BSI
Learn More€348.00 -
BS 6493-2.3:1987
Semiconductor devices. Integrated circuits Recommendations for analogue integrated
1/30/1987 - PDF - English - BSI
Learn More€449.00 -
BS CECC 90105:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits
5/15/1987 - PDF - English - BSI
Learn More€180.00 -
BS CECC 90111:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits
5/15/1987 - PDF - English - BSI
Learn More€250.00 -
BS CECC 90113:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits
5/15/1987 - PDF - English - BSI
Learn More€250.00 -
NF C86-251 (06/1987) (R2012)
Harmonized system of quality assessment for electronic components. Fusible link programmable read only memories. Blank detail specification.
6/1/1987 - Paper - French - AFNOR
Learn More€103.33 -
BS CECC 90103:1983
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
6/2/1987 - PDF - English - BSI
Learn More€151.00 -
BS CECC 90112:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
8/15/1987 - PDF - English - BSI
Learn More€180.00 -
BS EN 190106:1994
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced low power SCHOTTKY digital integrated circuits series 54 ALS, 74 ALS
9/15/1987 - PDF - English - BSI
Learn More€180.00 -
BS EN 190107:1994
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F
9/15/1987 - PDF - English - BSI
Learn More€180.00 -
BS CECC 90200:1988
Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits
2/29/1988 - PDF - English - BSI
Learn More€377.00 -
BS EN 190108:1994
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced SCHOTTKY digital integrated circuits series 54 AS, 74 AS
4/15/1988 - PDF - English - BSI
Learn More€180.00 -
IEC TR 60828:1988
IEC TR 60828:1988 Pin allocations for microprocessor systems using the IEC 60603-2 connector
5/15/1988 - PDF - English, French - IEC
Learn More€12.00 -
BS CECC 90300:1988
Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
6/30/1988 - PDF - English - BSI
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IEC 60748-20:1988
IEC 60748-20:1988 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
6/30/1988 - PDF - English, French - IEC
Learn More€311.00 -
IEC 60824:1988
IEC 60824:1988 Terminology related to microprocessors
7/30/1988 - PDF - English, French - IEC
Learn More€23.00 -
NF C86-112 (02/1990)
Harmonized system of quality assessment for electronic components integrated voltage regulators. Bank detail specification
2/1/1990 - Paper - French - AFNOR
Learn More€103.33 -
BS QC 760000:1990
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
4/30/1990 - PDF - English - BSI
Learn More€293.00 -
BS EN 190101:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
7/15/1990 - PDF - English - BSI
Learn More€180.00 -
BS CECC 90114:1990
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA)
7/15/1990 - PDF - English - BSI
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IEC 60748-11:1990
IEC 60748-11:1990 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
12/20/1990 - PDF - English, French - IEC
Learn More€270.00 -
BS CECC 63000:1990
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
12/31/1990 - PDF - English - BSI
Learn More€348.00 -
BS CECC 90000:1991
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
3/29/1991 - PDF - English - BSI
Learn More€449.00 -
IEC 60748-3-1:1991
IEC 60748-3-1:1991 Semiconductor devices. Integrated circuits - Part 3: Analogue integrated circuits - Section one: Blank detail specification for monolithic integrated operational amplifiers
8/2/1991 - PDF - English, French - IEC
Learn More€132.00 -
IEC 60748-2-1:1991
IEC 60748-2-1:1991 Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
10/1/1991 - PDF - English, French - IEC
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IEC 60748-2-1:1991
IEC 60748-2-1:1991 Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
10/1/1991 - PDF - Russian - IEC
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IEC 60748-2-6:1991
IEC 60748-2-6:1991 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section Six: Blank detail specification for microprocessor integrated circuits
11/15/1991 - PDF - English, French - IEC
Learn More€173.00 -
IEC 60748-3:1986/AMD1:1991
IEC 60748-3:1986/AMD1:1991 Amendment 1 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
11/15/1991 - PDF - English, French - IEC
Learn More€270.00 -
BS QC 790202:1991
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers
12/31/1991 - PDF - English - BSI
Learn More€180.00 -
NF C96-045 (01/1992) (R2012)
Semiconductors devices. Integrated circuits. Part 11 : sectional specification for semiconducteur integrated circuits excluding hybrid circuits - Dispositifs à semiconducteurs - Circuits intégrés
1/1/1992 - Paper - French - AFNOR
Learn More€116.33 -
IEC 60748-2-4:1992
IEC 60748-2-4:1992 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section four: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB
1/30/1992 - PDF - English, French - IEC
Learn More€92.00 -
BS QC 790132:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
1/31/1992 - PDF - English - BSI
Learn More€180.00 -
IEC 60748-2-5:1992
IEC 60748-2-5:1992 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section five: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
1/31/1992 - PDF - English, French - IEC
Learn More€92.00 -
BS QC 790105:1993
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
2/15/1992 - PDF - English - BSI
Learn More€180.00 -
IEC 60748-2-3:1992
IEC 60748-2-3:1992 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
2/20/1992 - PDF - English, French - IEC
Learn More€92.00 -
IEC 60748-2-2:1992
IEC 60748-2-2:1992 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
2/29/1992 - PDF - English, French - IEC
Learn More€173.00 -
IEC 60748-11-1:1992
IEC 60748-11-1:1992 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
4/1/1992 - PDF - Russian - IEC
Learn More€270.00 -
IEC 60748-11-1:1992
IEC 60748-11-1:1992 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
4/1/1992 - PDF - English, French - IEC
Learn More€270.00 -
BS QC 790131:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
5/1/1992 - PDF - English - BSI
Learn More€180.00 -
BS QC 790104:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
5/15/1992 - PDF - English - BSI
Learn More€180.00 -
BS QC 790110:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits
5/15/1992 - PDF - English - BSI
Learn More€180.00 -
BS QC 790130:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
5/15/1992 - PDF - English - BSI
Learn More€151.00 -
BS QC 790109:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU
5/15/1992 - PDF - English - BSI
Learn More€250.00 -
BS QC 790101:1992
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
8/15/1992 - PDF - English - BSI
Learn More€250.00 -
IEC 60748-2-7:1992
IEC 60748-2-7:1992 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
10/23/1992 - PDF - English, French - IEC
Learn More€173.00 -
IEC 60748-2-8:1993
IEC 60748-2-8:1993 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section Eight: Blank detail specification for integrated circuit static read/write memories
7/29/1993 - PDF - English, French - IEC
Learn More€132.00 -
BS QC 790111:1993
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
9/15/1993 - PDF - English - BSI
Learn More€180.00 -
IEC 60748-4-1:1993
IEC 60748-4-1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Blank detail specification for linear digital-to-analogue converters (DAC)
11/11/1993 - PDF - English, French - IEC
Learn More€173.00 -
IEC 60748-4-2:1993
IEC 60748-4-2:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue-to-digital converters (ADC)
11/11/1993 - PDF - English, French - IEC
Learn More€132.00 -
BS EN 190110:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits
12/15/1993 - PDF - English - BSI
Learn More€250.00 -
IEC 60748-3:1986/AMD2:1994
IEC 60748-3:1986/AMD2:1994 Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
2/8/1994 - PDF - English, French - IEC
Learn More€92.00 -
BS QC 790303:1994
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
2/15/1994 - PDF - English - BSI
Learn More€250.00 -
BS QC 790304:1994
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
2/15/1994 - PDF - English - BSI
Learn More€250.00 -
IEC 60748-20-1:1994
IEC 60748-20-1:1994 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
3/1/1994 - PDF - English, French - IEC
Learn More€219.00 -
BS EN 190116:1994
Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits
3/15/1994 - PDF - English - BSI
Learn More€293.00 -
BS CECC 90115:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
5/15/1994 - PDF - English - BSI
Learn More€180.00 -
IEC 60748-2-2:1992/AMD1:1994
IEC 60748-2-2:1992/AMD1:1994 Amendment 1 - Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
6/7/1994 - PDF - English, French - IEC
Learn More€12.00 -
DD ENV 190000-6:1994
Generic specification: monolithic integrated circuits Procedure for approval and quality management
8/15/1994 - PDF - English - BSI
Learn More€180.00 -
BS CECC 90104:1990
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB
8/15/1994 - PDF - English - BSI
Learn More€250.00 -
DIN EN 60821:1994-09
IEC-821-VMEbus - Microprocessor system bus for 1 byte to 4 byte data (IEC 60821:1991, modified); German version EN 60821:1994
9/1/1994 - PDF - German - DIN
Learn More€297.38 -
BS QC 760001:1994
Harmonized system of quality assessment for electronic components. Film and hybrid integrated circuits. Generic specification. Requirements for internal visual inspection
10/15/1994 - PDF - English - BSI
Learn More€250.00 -
IEC 60748-2-10:1994
IEC 60748-2-10:1994 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories
12/21/1994 - PDF - English, French - IEC
Learn More€173.00 -
IEC 60748-2-9:1994
IEC 60748-2-9:1994 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories
12/21/1994 - PDF - English, French - IEC
Learn More€173.00 -
DIN EN 190100:1995-02
Sectional specification: Digital monolithic integrated circuits; German version EN 190100:1993
2/1/1995 - PDF - German - DIN
Learn More€115.33 -
BS QC 790106:1995
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only memories
5/15/1995 - PDF - English - BSI
Learn More€250.00 -
BS QC 790107:1995
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories
5/15/1995 - PDF - English - BSI
Learn More€250.00 -
DIN EN 190116:1995-06
Family specification: AC MOS digital integrated circuits; German version EN 190116:1993
6/1/1995 - PDF - German - DIN
Learn More€92.62 -
IEC 60748-11:1990/AMD1:1995
IEC 60748-11:1990/AMD1:1995 Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
6/6/1995 - PDF - English, French - IEC
Learn More€23.00 -
IEC 60748-20:1988/AMD1:1995
IEC 60748-20:1988/AMD1:1995 Amendment 1 - Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
9/22/1995 - PDF - English, French - IEC
Learn More€12.00 -
BS EN 190000:1996
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
3/15/1996 - PDF - English - BSI
Learn More€449.00 -
DIN EN 190000:1996-05
Generic specification: Monolithic integrated circuits, German version EN 190000:1995
5/1/1996 - PDF - English - DIN
Learn More€99.35 -
€25.00
-
UNE-EN 160000:1993
GS: MODULAR ELECTRONIC UNITS. (Endorsed by AENOR in September of 1996.)
9/1/1996 - PDF - English - AENOR
Learn More€70.00 -
BS EN 165000-4:1996
Film and hybrid integrated circuits Customer information, product assessment level schedules blank detail specification
10/15/1996 - PDF - English - BSI
Learn More€348.00 -
BS EN 165000-3:1996
Film and hybrid integrated circuits Self-audit checklist report for film circuit manufacturers
10/15/1996 - PDF - English - BSI
Learn More€398.00 -
BS EN 165000-2:1996
Film and hybrid integrated circuits Internal visual inspection special tests
10/15/1996 - PDF - English - BSI
Learn More€250.00 -
BS EN 165000-1:1996
Film and hybrid integrated circuits Generic specification. Capability approval procedure
10/15/1996 - PDF - English - BSI
Learn More€348.00 -
IEC 61739:1996
IEC 61739:1996 Integrated circuits - Part 1: Procedures for manufacturing line approval and quality management
10/30/1996 - PDF - English, French - IEC
Learn More€132.00 -
DIN EN 165000-1:1996-11
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure; German version EN 165000-1:1996
11/1/1996 - PDF - German - DIN
Learn More€115.33 -
DIN EN 190101:1996-11
Family specification - Digital integrated TTL circuits - Series 54, 64, 74, 84; German version EN 190101:1994
11/1/1996 - PDF - German - DIN
Learn More€52.90 -
DIN EN 190102:1996-11
Family specification - TTL Schottky digital integrated circuits - Series 54 S, 64 S, 74 S, 84 S; German version EN 190102:1994
11/1/1996 - PDF - German - DIN
Learn More€52.90 -
DIN EN 190103:1996-11
Family specification - Digital integrated TTL low power Schottky circuits - Series 54 LS, 64 LS, 74 LS, 84 LS; German version EN 190103:1994
11/1/1996 - PDF - German - DIN
Learn More€65.89 -
DIN EN 190106:1996-11
Family specification - TTL Advanced Low Power Schottky digital integrated circuits - Series 54 ALS, 74 ALS; German version EN 190106:1994
11/1/1996 - PDF - German - DIN
Learn More€52.90 -
DIN EN 190107:1996-11
Family specification - TTL FAST digital integrated circuits - Series 54 F, 74 F; German version EN 190107:1994
11/1/1996 - PDF - German - DIN
Learn More€52.90 -
DIN EN 190108:1996-11
Family specification - TTL advanced Schottky digital integrated circuits - Series 54 AS, 74 AS; German version EN 190108:1994
11/1/1996 - PDF - German - DIN
Learn More€52.90 -
DIN EN 190109:1996-11
Family specification - Digital integrated HC MOS circuits - Series HC/HCT/HCU; German version EN 190109:1994
11/1/1996 - PDF - German - DIN
Learn More€92.62 -
DIN EN 190110:1996-11
Blank detail specification - Digital microprocessor integrated circuits; German version EN 190110:1994
11/1/1996 - PDF - German - DIN
Learn More€72.80 -
DIN EN 165000-2:1996-11
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests, German version EN 165000-2:1996
11/1/1996 - PDF - German - DIN
Learn More€85.79 -
DIN EN 165000-3:1996-11
Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers, German version EN 165000-3:1996
11/1/1996 - PDF - German - DIN
Learn More€169.25 -
DIN EN 165000-4:1996-11
Film and hybrid integrated circuits - Part 4: Customer information, product assessment level schedules and blank detail specification, German version EN 165000-4:1996
11/1/1996 - PDF - German - DIN
Learn More€110.00 -
IEC 60748-21:1997
IEC 60748-21:1997 Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
4/10/1997 - PDF - English, French - IEC
Learn More€173.00 -
IEC 60748-22:1997
IEC 60748-22:1997 Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
4/10/1997 - PDF - English, French - IEC
Learn More€397.00 -
IEC 60748-21-1:1997
IEC 60748-21-1:1997 Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approva lprocedures
4/10/1997 - PDF - English, French - IEC
Learn More€92.00 -
IEC 60748-22-1:1997
IEC 60748-22-1:1997 Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
4/10/1997 - PDF - English, French - IEC
Learn More€92.00 -
IEC 60748-4:1997
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
4/23/1997 - PDF - English, French - IEC
Learn More€489.00 -
IEC 60748-5:1997
IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
5/30/1997 - PDF - English, French - IEC
Learn More€173.00 -
BS QC 760100:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
8/15/1997 - PDF - English - BSI
Learn More€250.00 -
BS QC 760101:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
8/15/1997 - PDF - English - BSI
Learn More€180.00 -
BS QC 760200:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
8/15/1997 - PDF - English - BSI
Learn More€348.00 -
BS QC 760201:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
8/15/1997 - PDF - English - BSI
Learn More€180.00 -
BS IEC 60748-5:1997
Semiconductor devices. Integrated circuits Semicustom integrated
8/15/1997 - PDF - English - BSI
Learn More€250.00 -
JIS C 5950:1997 (R2013)
General rules of light emitting diodes for fiber optic transmission
8/20/1997 - PDF - Japanese - JSA
Learn More€25.00 -
BS IEC 60748-4:1997
Semiconductor devices. Integrated circuits Interface integrated
9/15/1997 - PDF - English - BSI
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€0.00
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IEC 60748-2:1997
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
12/22/1997 - PDF - English, French - IEC
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BS EN 165000-5:1998
Film and hybrid integrated circuits Procedure for qualification approval
3/15/1998 - PDF - English - BSI
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BS IEC 60748-2:1997
Semiconductor devices. Integrated circuits Digital integrated
4/15/1998 - PDF - English - BSI
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DIN EN 165000-5:1998-09
Film and hybrid integrated circuits - Part 5: Procedure for qualification approval, German version EN 165000-5:1997
9/1/1998 - PDF - German - DIN
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IEC 61943:1999
IEC 61943:1999 Integrated circuits - Manufacturing line approval application guideline
3/19/1999 - PDF - English, French - IEC
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IEC 60748-2-11:1999
IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
4/12/1999 - PDF - English, French - IEC
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IEC 60748-11:1990/AMD2:1999
IEC 60748-11:1990/AMD2:1999 Amendment 2 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
4/16/1999 - PDF - English, French - IEC
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IEC 61964:1999
IEC 61964:1999 Integrated circuits - Memory devices pin configurations
4/30/1999 - PDF - English, French - IEC
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BS IEC 60748-2-11:1999
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for single supply circuit, electrically erasable, and programmable read-only memory
8/15/1999 - PDF - English - BSI
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€250.00
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UNE-EN 61943:1999
INTEGRATED CIRCUITS. MANUFACTURING LINE APPROVAL APPLICATION GUIDELINE (Endorsed by AENOR in November of 1999.)
11/1/1999 - PDF - English - AENOR
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JIS H 0609:1999 (R2014)
Test methods of crystalline defects in silicon by preferential etch techniques
11/20/1999 - PDF - Japanese - JSA
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BS EN 61943:1999
Integrated circuits. Manufacturing line approval application guideline
12/15/1999 - PDF - English - BSI
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DIN EN 61964:2000-01
Integrated circuits - Memory devices pin configurations (IEC 61964:1999), German version EN 61964:1999
1/1/2000 - PDF - German - DIN
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IEC TS 61944:2000
IEC TS 61944:2000 Integrated circuits - Manufacturing line approval - Demonstration vehicles
1/31/2000 - PDF - English, French - IEC
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IEC TS 61945:2000
IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
3/10/2000 - PDF - English, French - IEC
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IEC 60748-2-12:2001
IEC 60748-2-12:2001 Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)
1/30/2001 - PDF - English, French - IEC
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UNE-EN 61964:1999
Integrated circuits - Memory devices pin configurations. (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
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BS IEC 60748-2-12:2001
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
6/15/2001 - PDF - English - BSI
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DIN EN 61943:2001-10
Integrated circuits - Manufacturing line approval application guideline (IEC 61943:1999), German version EN 61943:1999
10/1/2001 - PDF - German - DIN
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BS EN 60684-3-145 to 147:2001
Specification for flexible insulating sleeving. requirements individual types of sleeving Extruded PTFE
12/21/2001 - PDF - English - BSI
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IEC 60748-1:2002
IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
5/8/2002 - PDF - English, French - IEC
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IEC 60748-23-1:2002
IEC 60748-23-1:2002 Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
5/15/2002 - PDF - English - IEC
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IEC 60748-23-4:2002
IEC 60748-23-4:2002 Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification
5/17/2002 - PDF - English - IEC
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IEC 60748-23-3:2002
IEC 60748-23-3:2002 Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report
5/17/2002 - PDF - English - IEC
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IEC 60748-23-2:2002
IEC 60748-23-2:2002 Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
5/23/2002 - PDF - English - IEC
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BS IEC 60748-23-1:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification
6/7/2002 - PDF - English - BSI
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BS IEC 60748-23-3:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist report
6/18/2002 - PDF - English - BSI
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BS IEC 60748-23-4:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification
6/18/2002 - PDF - English - BSI
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BS IEC 60748-23-2:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Internal visual inspection special tests
6/21/2002 - PDF - English - BSI
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IEC 61967-6:2002
IEC 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
6/25/2002 - PDF - English, French - IEC
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€250.00
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NF EN 61967-4, C96-260-4 (10/2002)
Integrated circuits - Measurement of Electromagnetic Emissions, 150 kHz - 1 GHz - Part 4 : measurement of conducted emission - 1 ohm/150 ohm direct coupling method - Circuits intégrés
10/1/2002 - Paper - French - AFNOR
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DIN EN 61523-1:2002-10
Delay and power calculation standards - Part 1: Integrated circuit delay and power calculation systems (IEC 61523-1:2001), German version EN 61523-1:2002, text in English
10/1/2002 - PDF - English - DIN
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DIN EN 62014-1:2002-11
Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2) (IEC 62014-1:2001), German version EN 62014-1:2002
11/1/2002 - PDF - English - DIN
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UNE-EN 61967-4:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kKHz to 1 GHz -- Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by AENOR in November of 2002.)
11/1/2002 - PDF - English - AENOR
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UNE-EN 61967-6:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
11/1/2002 - PDF - English - AENOR
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EIA-945:2002
Surface Mount Inductor Qualification Specification
11/1/2002 - PDF sécurisé - English - EIA
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NF EN 61967-6, C96-260-6 (01/2003)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz - 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method - Circuits intégrés
1/1/2003 - Paper - French - AFNOR
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IEC 61967-5:2003
IEC 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
2/13/2003 - PDF - English, French - IEC
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DIN EN 61523-2:2003-06
Delay and power calculation standards - Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries (IEC 61523-2:2002); German version EN 61523-2:2002, text in English
6/1/2003 - PDF - English, German - DIN
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BS EN 61967-5:2003
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Workbench Faraday Cage method
6/17/2003 - PDF - English - BSI
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UNE-EN 61967-5:2003
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method (Endorsed by AENOR in July of 2003.)
7/1/2003 - PDF - English - AENOR
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DIN EN 61967-5:2003-10
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003
10/1/2003 - PDF - German - DIN
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IEC 60748-23-5:2003
IEC 60748-23-5:2003 Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval
10/3/2003 - PDF - English - IEC
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BS IEC 60748-23-5:2003
Semiconductor devices. Integrated circuits Hybrid integrated and film structures. Manufacturing line certification. Procedure for qualification approval
4/28/2004 - PDF - English - BSI
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IEC 60747-16-10:2004
IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
7/15/2004 - PDF - English, French - IEC
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IEC 60747-16-10:2004
IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
7/15/2004 - PDF - English - IEC
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UNE-EN 61086-3-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 3-1: Specifications for individual materials - Coatings for general purpose (Class 1), high reliability (Class 2) and aerospace (Class 3)
7/23/2004 - PDF - Spanish - AENOR
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UNE-EN 61086-3-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 3-1: Specifications for individual materials - Coatings for general purpose (Class 1), high reliability (Class 2) and aerospace (Class 3)
7/23/2004 - PDF - English - AENOR
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UNE-EN 61086-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 1: Definitions, classification and general requirements
7/30/2004 - PDF - Spanish - AENOR
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UNE-EN 61086-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 1: Definitions, classification and general requirements
7/30/2004 - PDF - English - AENOR
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BS EN 60747-16-10:2004
Semiconductor devices Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
11/9/2004 - PDF - English - BSI
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NF EN 60747-16-4, C96-016-4 (12/2004)
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
12/1/2004 - Paper - English - AFNOR
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IEC TR 61967-4-1:2005
IEC TR 61967-4-1:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 O/150 O direct coupling method - Application guidance to IEC 61967-4
2/7/2005 - PDF - English - IEC
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DIN EN 60747-16-10:2005-03
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
3/1/2005 - PDF - German - DIN
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IEC 62132-5:2005
IEC 62132-5:2005 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
10/10/2005 - PDF - English, French - IEC
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JIS C 0807:2005 (R2015)
Product package labels for electronic components using bar code and two-dimensional symbologies
12/20/2005 - PDF - Japanese - JSA
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€90.00
-
€30.00
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€30.00
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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz radiated emissions. TEM cell and wideband method
1/23/2006 - PDF - English - BSI
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PD IEC/TR 61967-4-1:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Ohm/150 Ohm direct coupling method. Application guidance IEC 61967-4
1/30/2006 - PDF - English - BSI
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IEC 62132-4:2006
IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
2/21/2006 - PDF - English, French - IEC
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DIN EN 61967-2:2006-03
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005
3/1/2006 - PDF - German - DIN
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BS EN 62132-5:2006
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Workbench Faraday cage method
3/31/2006 - PDF - English - BSI
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UNE-EN 62132-5:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz -- Part 5: Workbench Faraday cage method (Endorsed by AENOR in April of 2006.)
4/1/2006 - PDF - English - AENOR
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UNE-EN 61967-4:2002/A1:2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by AENOR in April of 2006.)
4/1/2006 - PDF - English - AENOR
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DIN EN 62132-5:2006-05
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method (IEC 62132-5:2005); German version EN 62132-5:2006
5/1/2006 - PDF - German - DIN
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NF EN 61967-4/A1, C96-260-4/A1 (05/2006)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4 : measurement of conducted emissions - 1 ohm/150 ohm direct coupling method - Circuits intégrés
5/1/2006 - Paper - French - AFNOR
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€348.00
-
IEC TR 61352:2006
IEC TR 61352:2006 Mnemonics and symbols for integrated circuits
7/17/2006 - PDF - English, French - IEC
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BS EN 62132-4:2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
7/31/2006 - PDF - English - BSI
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UNE-EN 62132-4:2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz -- Part 4: Direct RF power injection method (IEC 62132-4:2006) (Endorsed by AENOR in August of 2006.)
8/1/2006 - PDF - English - AENOR
Learn More€69.00