31.200 : Integrated circuits. Microelectronics

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  • PR NF EN IEC 63287-1, C96-287-1PR (05/2020)


    5/1/2020 - Paper - English, French - AFNOR
    Learn More
    €108.39

  • 20/30416273 DC:2020

    BS EN IEC 61967-4. Integrated circuits. Measurement of electromagnetic emissions Part 4. conducted emissions, 1 ohm/150 ohm direct coupling method
    4/3/2020 - PDF - English - BSI
    Learn More
    €23.70

  • PR NF EN IEC 62433-6, C96-070-6PR (04/2020)


    4/1/2020 - Paper - English, French - AFNOR
    Learn More
    €116.51

  • IEEE 1838:2019

    IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
    3/13/2020 - PDF - English - IEEE
    Learn More
    €93.06

  • IEEE 1481:2019

    IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
    3/13/2020 - PDF - English - IEEE
    Learn More
    €93.06

  • IEEE 1481:2019

    IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
    3/13/2020 - Paper - English - IEEE
    Learn More
    €116.56

  • IEEE 1838:2019

    IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
    3/13/2020 - Paper - English - IEEE
    Learn More
    €116.56

  • 20/30414411 DC:2020

    BS EN 60747-16-7. Semiconductor devices Part 16-7. Microwave integrated circuits. Attenuators
    3/5/2020 - PDF - English - BSI
    Learn More
    €23.70

  • 20/30414415 DC:2020

    BS EN 60747-16-8. Semiconductor devices Part 16-8. Microwave integrated circuits. Limiters
    3/5/2020 - PDF - English - BSI
    Learn More
    €23.70

  • BS EN IEC 61967-1:2019 + Redline

    Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
    2/24/2020 - PDF - English - BSI
    Learn More
    €280.37

  • 20/30414125 DC:2020

    BS EN IEC 62228-5. Integrated circuits. EMC evaluation of transceivers Part 5. Ethernet
    2/19/2020 - PDF - English - BSI
    Learn More
    €23.70

  • ASTM E1855-20

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
    2/1/2020 - PDF - English - ASTM
    Learn More
    €47.00

  • ASTM E1855-20 + Redline

    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
    2/1/2020 - PDF - English - ASTM
    Learn More
    €56.00

  • IEEE 2401:2019

    IEEE Standard Format for LSI-Package-Board Interoperable Design
    1/27/2020 - PDF - English - IEEE
    Learn More
    €182.36

  • IEEE 2401:2019 + Redline

    IEEE Standard Format for LSI-Package-Board Interoperable Design
    1/27/2020 - PDF - English - IEEE
    Learn More
    €253.80

  • IEEE 2401:2019

    IEEE Standard Format for LSI-Package-Board Interoperable Design
    1/27/2020 - Paper - English - IEEE
    Learn More
    €305.50

  • 19/30407001 DC:2019

    BS EN 61386-23. Conduit systems for cable management Part 23. Particular requirements. Flexible conduit
    12/6/2019 - PDF - English - BSI
    Learn More
    €23.70

  • PR NF EN 60747-16-5/A1, C96-016-5/A1PR (11/2019)


    11/1/2019 - Paper - English, French - AFNOR
    Learn More
    €42.59

  • IEEE 2416:2019

    IEEE Standard for Power Modeling to Enable System-Level Analysis
    7/31/2019 - PDF - English - IEEE
    Learn More
    €74.26

  • IEEE 2416:2019

    IEEE Standard for Power Modeling to Enable System-Level Analysis
    7/31/2019 - Paper - English - IEEE
    Learn More
    €94.00

  • 19/30376552 DC:2019

    BS EN 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
    6/19/2019 - PDF - English - BSI
    Learn More
    €23.70

  • UNE-EN IEC 62228-3:2019

    Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in June of 2019.)
    6/1/2019 - PDF - English - AENOR
    Learn More
    €116.00

  • UNE-EN IEC 62433-1:2019

    EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in June of 2019.)
    6/1/2019 - PDF - English - AENOR
    Learn More
    €72.00

  • BS EN IEC 62228-3:2019

    Integrated circuits. EMC evaluation of transceivers CAN
    5/8/2019 - PDF - English - BSI
    Learn More
    €324.69

  • BS EN IEC 62433-1:2019

    EMC IC modelling General framework
    5/3/2019 - PDF - English - BSI
    Learn More
    €300.99

  • NF EN IEC 62228-3, C96-228-3 (05/2019)

    Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3 : émetteurs-récepteurs CAN - Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3 : Émetteurs-récepteurs CAN
    5/1/2019 - Paper - French - AFNOR
    Learn More
    €154.83

  • IEEE 1801:2018

    IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems
    3/29/2019 - Paper - English - IEEE
    Learn More
    €404.20

  • IEC 62228-3:2019

    IEC 62228-3:2019 Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
    3/11/2019 - PDF - English, French - IEC
    Learn More
    €315.00

  • IEC 62433-1:2019

    IEC 62433-1:2019 EMC IC modelling - Part 1: General modelling framework
    3/8/2019 - PDF - English - IEC
    Learn More
    €284.00

  • UNE-EN IEC 61967-1:2019

    Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in March of 2019.)
    3/1/2019 - PDF - English - AENOR
    Learn More
    €71.00

  • 19/30392352 DC:2019

    BS EN 62433-6. EMC IC modelling Part 6. Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Immunity (ICIM-CPI)
    2/26/2019 - PDF - English - BSI
    Learn More
    €23.70

  • BS EN IEC 61967-1:2019

    Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
    2/21/2019 - PDF - English - BSI
    Learn More
    €215.67

  • NF EN IEC 61967-1, C96-260-1 (02/2019)

    Integrated circuits - Measurement of electromagnetic emissions - Part 1 : general conditions and definitions - Circuits intégrés - Mesure des émissions électromagnétiques - Partie 1 : Conditions générales et définitions
    2/1/2019 - Paper - French - AFNOR
    Learn More
    €98.42

  • BS IEC 63011-2:2018

    Integrated circuits. Three dimensional integrated circuits Alignment of stacked dies having fine pitch interconnect
    1/24/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 63011-1:2018

    Integrated circuits. Three dimensional integrated circuits Terminology
    1/24/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 63011-3:2018

    Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via
    1/24/2019 - PDF - English - BSI
    Learn More
    €154.05

  • 19/30386593 DC:2019

    BS EN IEC 61967-4. Integrated circuits. Measurement of electromagnetic emissions Part 4. conducted emissions, 1 ohm/150 ohm direct coupling method
    1/3/2019 - PDF - English - BSI
    Learn More
    €23.70

  • ANSI/VITA 46.0:2019

    VPX Baseline Standard
    1/1/2019 - PDF - English - VITA
    Learn More
    €120.00

  • 18/30378233 DC:2018

    BS EN 62228-5 Ed.1.0. Integrated circuits. EMC evaluation of transceivers Part 5. Ethernet
    12/18/2018 - PDF - English - BSI
    Learn More
    €23.70

  • IEC 61967-1:2018 + Redline

    IEC 61967-1:2018 (Redline version) Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
    12/12/2018 - PDF - English - IEC
    Learn More
    €231.00

  • IEC 61967-1:2018

    IEC 61967-1:2018 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
    12/12/2018 - PDF - English, French - IEC
    Learn More
    €178.00

  • DIN EN IEC 62228-1 VDE 0847-28-1:2018-12

    Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 62228-1:2018); German version EN IEC 62228-1:2018
    12/1/2018 - Paper - German - VDE
    Learn More
    €42.45

  • IEC 63011-3:2018

    IEC 63011-3:2018 Integrated circuits - Three dimensional integrated circuits - Part 3: Model and measurement conditions of through-silicon via
    11/28/2018 - PDF - English, French - IEC
    Learn More
    €71.00

  • IEC 63011-1:2018

    IEC 63011-1:2018 Integrated circuits - Three dimensional integrated circuits - Part 1: Terminology
    11/28/2018 - PDF - English, French - IEC
    Learn More
    €71.00

  • IEC 63011-2:2018

    IEC 63011-2:2018 Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
    11/28/2018 - PDF - English, French - IEC
    Learn More
    €71.00

  • JEDEC JESD 22-B112B:2018

    Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature
    8/1/2018 - PDF sécurisé - English - JEDEC
    Learn More
    €79.20

  • 18/30361563 DC:2018

    BS EN 62433-6. EMC IC modelling Part 6. Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Immunity (ICIM-CPI)
    7/20/2018 - PDF - English - BSI
    Learn More
    €23.70

  • UNE-EN IEC 62228-1:2018

    Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in July of 2018.)
    7/1/2018 - PDF - English - AENOR
    Learn More
    €58.00

  • MIL-M-38510/112:2018

    Microcircuits, Linear, Voltage Comparators, Monolithic Silicon
    6/20/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/115:2018

    Microcircuits, Linear, Negative, Voltage Regulators, Monolithic Silicon
    6/20/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/116:2018

    Microcircuits, Linear, CMOS Analog Switch with Driver, Monolithic Silicon
    6/20/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/171:2018

    Microcircuits, Digital, CMOS, or Gates, Monolithic Silicon, Positive Logic
    6/20/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/338:2018

    Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Arithmetic Logic Units,Monolithic Silicon
    6/20/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • BS EN IEC 62228-1:2018

    Integrated circuits. EMC evaluation of transceivers General conditions and definitions
    6/12/2018 - PDF - English - BSI
    Learn More
    €130.35

  • MIL-M-38510/111:2018

    Microcircuits, Analog Switch with Driver, Monolithic and Multi-Chip Silicon
    6/6/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/330:2018

    Microcircuits, Digital, Bipolar Advanced Schottky TTL, Nand Gates, Monolithic Silicon
    6/6/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/337:2018

    Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Decoders, Monolithic Silicon
    6/6/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/131:2018

    Microcircuits, Linear, Low Noise Operational Amplifiers, Monolithic Silicon
    6/5/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/333:2018

    Microcircuits, Digital, Bipolar Advanced Schottky TTL, Nor Gates, Monolithic Silicon
    6/5/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/334:2018

    Microcircuits, Digital, Bipolar Advanced Schottky TTL, AND-OR-INVERT Gates, Monolithic Silicon
    6/5/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/335:2018

    Microcircuits, Digital, Bipolar Advanced Schottky TTL, Quadruple, 2 Input or Gates, Monolithic Silicon
    6/5/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-M-38510/336:2018

    Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Shift Registers, Cascadable, Monolithic Silicon
    6/5/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • NF EN IEC 62228-1, C96-228-1 (06/2018)

    Circuits intégrés - Évaluation CEM des émetteurs-récepteurs - Partie 1 : conditions générales et définitions - Circuits intégrés - Évaluation CEM des émetteurs-récepteurs - Partie 1 : Conditions générales et définitions
    6/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • PR NF EN 62433-1, C96-070-2PR (05/2018)

    EMC IC modelling - Part 1: General modelling framework - Modèles de circuits intégrés pour la CEM - Partie 1 : Cadre de modèle général
    5/1/2018 - Paper - French - AFNOR
    Learn More
    €90.98

  • PR NF C96-271-1, PR NF EN 63011-1 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 1: General conditions and definitions
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • PR NF C96-271-2, PR NF EN 63011-2 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • BS EN 60747-16-1:2002+A2:2017

    Semiconductor devices Microwave integrated circuits. Amplifiers
    4/10/2018 - PDF - English - BSI
    Learn More
    €324.69

  • BS EN 61967-4:2002+A1:2006

    Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. ohm/150 ohm direct coupling method
    4/6/2018 - PDF - English - BSI
    Learn More
    €253.59

  • DIN EN 60747-16-3:2018-04

    Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017); German version EN 60747-16-3:2002 + A1:2009 + A2:2017
    4/1/2018 - PDF - German - DIN
    Learn More
    €141.90

  • JEDEC JESD 8-31:2018

    1.8 V HIGH-SPEED LVCMOS (HS LVCMOS) INTERFACE
    3/1/2018 - PDF sécurisé - English - JEDEC
    Learn More
    €52.80

  • DIN EN 62435-3 VDE 0884-135-3:2018-02

    Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data (IEC 47/2430/CD:2017)
    2/1/2018 - Paper - German - VDE
    Learn More
    €18.19

  • IEEE 1804:2017

    IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
    1/31/2018 - PDF - English - IEEE
    Learn More
    €50.76

  • IEEE 1804:2017

    IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
    1/31/2018 - Paper - English - IEEE
    Learn More
    €63.92

  • IEC 62228-1:2018

    IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
    1/9/2018 - PDF - English, French - IEC
    Learn More
    €20.00

  • IEC 62228-1:2018

    IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
    1/9/2018 - PDF - English - IEC
    Learn More
    €20.00

  • JEDEC JEP 176:2018

    ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES
    1/1/2018 - PDF sécurisé - English - JEDEC
    Learn More
    €61.60

  • ANSI/VITA 46.9:2018

    PMC/XMC Rear I/O Fabric Signal Mapping on 3U and 6U VPX Modules Standard
    1/1/2018 - PDF - English - VITA
    Learn More
    €90.00

  • IPC 7094A:2017

    Design and Assembly Process Implementation for Flip Chip and Die-Size Components
    1/1/2018 - Paper - English - IPC
    Learn More
    €184.80

  • BS EN 62433-3:2017

    EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions (ICEM-RE)
    12/13/2017 - PDF - English - BSI
    Learn More
    €324.69

  • DIN EN 62090:2017-12

    Product package labels for electronic components using bar code and two- dimensional symbologies (IEC 62090:2017); German version EN 62090:2017
    12/1/2017 - PDF - German - DIN
    Learn More
    €119.60

  • BS EN 62433-2:2017

    EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions (ICEM-CE)
    11/14/2017 - PDF - English - BSI
    Learn More
    €346.02

  • DIN EN 61967-1 VDE 0847-21-1:2017-11

    Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 47A/1022/CD:2017)
    11/1/2017 - Paper - German - VDE
    Learn More
    €29.12

  • DIN EN 62433-6 VDE 0847-33-6:2017-11

    EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)
    11/1/2017 - Paper - German - VDE
    Learn More
    €53.63

  • DIN EN 62435-1 VDE 0884-135-1:2017-10

    Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017); German version EN 62435-1:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €91.70

  • DIN EN 62435-2 VDE 0884-135-2:2017-10

    Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €65.60

  • DIN EN 62435-5 VDE 0884-135-5:2017-10

    Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €69.60

  • DIN EN 62433-2 VDE 0847-33-2:2017-10

    EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017); German version EN 62433-2:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €192.57

  • DIN EN 62433-3 VDE 0847-33-3:2017-10

    EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (IEC 62433-3:2017); German version EN 62433-3:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €169.34

  • DIN EN 62433-1 VDE 0847-33-1:2017-10

    Integrated circuits - EMC IC modelling - Part 1: General modelling framework (IEC 47A/1011/CD:2017)
    10/1/2017 - Paper - German - VDE
    Learn More
    €61.54

  • PR NF C96-271-3, PR NF EN 63011-3 (09/2017)

    Integrated circuits - Three dimensional integrated circuits - Part 3 : a model and measurement conditions of through silicon via
    9/29/2017 - Paper - French - AFNOR
    Learn More
    €54.48

  • DIN EN 62228-2 VDE 0847-28-2:2017-09

    Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers (IEC 62228-2:2016); German version EN 62228-2:2017
    9/1/2017 - Paper - German - VDE
    Learn More
    €104.79

  • UNE-EN 61967-4:2002/AC:2017-07

    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by Asociación Española de Normalización in September of 2017.)
    9/1/2017 - PDF - English - AENOR
    Learn More
    €0.00

  • NF C96-070-3, NF EN 62433-3 (08/2017)

    EMC IC modelling - Part 3 : models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    8/5/2017 - PDF - English - UTE
    Learn More
    €173.47

  • NF EN 62433-3, C96-070-3 (08/2017)

    EMC IC modelling - Part 3 : models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) - Modèles de circuits intégrés pour la CEM - Partie 3 : modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques - Modélisation des émissions rayonnées (ICEM-RE)
    8/1/2017 - Paper - French - AFNOR
    Learn More
    €166.44

  • UNE-EN 62090:2017

    Product package labels for electronic components using bar code and two- dimensional symbologies (Endorsed by Asociación Española de Normalización in August of 2017.)
    8/1/2017 - PDF - English - AENOR
    Learn More
    €72.00

  • BS EN 62090:2017

    Product package labels for electronic components using bar code and two- dimensional symbologies
    7/31/2017 - PDF - English - BSI
    Learn More
    €253.59

  • NF C96-070-2, NF EN 62433-2 (07/2017)

    EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    7/28/2017 - PDF - English - UTE
    Learn More
    €193.11

  • IEEE 1149.10:2017

    IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
    7/28/2017 - PDF - English - IEEE
    Learn More
    €93.06

  • IEEE 1149.10:2017

    IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
    7/28/2017 - Paper - English - IEEE
    Learn More
    €114.68

  • NF EN 62433-2, C96-070-2 (07/2017)

    EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) - Modèles de circuits intégrés pour la CEM - Partie 2 : modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques - Modélisation des émissions conduites (ICEM-CE)
    7/1/2017 - Paper - French - AFNOR
    Learn More
    €185.29

  • UNE-EN 62433-3:2017

    EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (Endorsed by Asociación Española de Normalización in July of 2017.)
    7/1/2017 - PDF - English - AENOR
    Learn More
    €124.00

  • NF EN 62090, C90-530 (07/2017)


    7/1/2017 - Paper - French - AFNOR
    Learn More
    €98.42

  • DIN EN 62228-3 VDE 0847-28-3:2017-06

    Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC 47A/1004/CD:2017)
    6/1/2017 - Paper - German - VDE
    Learn More
    €57.53

  • UNE-EN 62433-2:2017

    EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (Endorsed by Asociación Española de Normalización in June of 2017.)
    6/1/2017 - PDF - English - AENOR
    Learn More
    €137.00

  • DIN EN 62433-4 VDE 0847-33-4:2017-05

    EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) (IEC 62433-4:2016); German version EN 62433-4:2016
    5/1/2017 - Paper - German - VDE
    Learn More
    €183.01

  • IEC 62090:2017

    IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
    4/11/2017 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC 62090:2017

    IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
    4/11/2017 - PDF - English - IEC
    Learn More
    €208.00

  • NF C96-228-2, NF EN 62228-2 (03/2017)

    Integrated circuits - EMC evaluation of transceivers - Part 2 : LIN transceivers
    3/22/2017 - PDF - English - UTE
    Learn More
    €124.52

  • NF EN 62228-2, C96-228-2 (03/2017)

    Integrated circuits - EMC evaluation of transceivers - Part 2 : LIN transceivers - Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 2 : émetteurs-récepteurs LIN
    3/1/2017 - Paper - French - AFNOR
    Learn More
    €119.48

  • UNE-EN 62228-2:2017

    Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers (Endorsed by Asociación Española de Normalización in March of 2017.)
    3/1/2017 - PDF - English - AENOR
    Learn More
    €78.00

  • BS EN 62228-2:2017

    Integrated circuits. EMC evaluation of transceivers LIN
    2/28/2017 - PDF - English - BSI
    Learn More
    €284.40

  • IEC 62433-3:2017

    IEC 62433-3:2017 EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    1/27/2017 - PDF - English, French - IEC
    Learn More
    €335.00

  • IEC 62433-2:2017

    IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    1/27/2017 - PDF - English, French - IEC
    Learn More
    €335.00

  • ANSI/VITA 68.0:2017

    VPX Compliance Channel Standard
    1/1/2017 - PDF - English - VITA
    Learn More
    €30.00

  • NF C96-070-4, NF EN 62433-4 (12/2016)

    EMC IC modelling - Part 4 : Models of Integrated Circuits for RF immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI)
    12/23/2016 - PDF - English - UTE
    Learn More
    €199.43

  • NF EN 62433-4, C96-070-4 (12/2016)

    EMC IC modelling - Part 4 : Models of Integrated Circuits for RF immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI) - Modèles de circuits intégrés pour la CEM - Partie 4 : modèles de circuits intégrés pour la simulation du comportement d'immunité aux radiofréquences - Modélisation de l'immunité conduite (ICIM-CI)
    12/1/2016 - Paper - French - AFNOR
    Learn More
    €191.35

  • UNE-EN 62433-4:2016

    EMC IC modelling - Part 4: Models of Integrated Circuits for RF Immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI) (Endorsed by AENOR in December of 2016.)
    12/1/2016 - PDF - English - AENOR
    Learn More
    €140.00

  • BS EN 62433-4:2016

    EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted (ICIM-CI)
    11/30/2016 - PDF - English - BSI
    Learn More
    €346.02

  • BS IEC 63055:2016

    Format for LSI-Package-Board interoperable design
    11/30/2016 - PDF - English - BSI
    Learn More
    €405.27

  • IEC 62228-2:2016

    IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
    11/18/2016 - PDF - English, French - IEC
    Learn More
    €249.00

  • IEC 63055:2016

    IEC 63055:2016 Format for LSI-Package-Board Interoperable design
    11/8/2016 - PDF - English - IEC
    Learn More
    €355.00

  • JEDEC JEP 130B:2016

    Guidelines for Packing and Labeling of Integrated Circuits in Unit Container Packing (Tubes, Trays, and Tape and Reel)
    11/1/2016 - PDF sécurisé - English - JEDEC
    Learn More
    €59.40

  • JEDEC JESD 217.01:2016

    Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages
    10/1/2016 - PDF sécurisé - English - JEDEC
    Learn More
    €95.70

  • DIN EN 62132-1 VDE 0847-22-1:2016-09

    Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 62132-1:2015); German version EN 62132-1:2016
    9/1/2016 - Paper - German - VDE
    Learn More
    €74.10

  • IEC 62433-4:2016

    IEC 62433-4:2016 EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
    5/25/2016 - PDF - English, French - IEC
    Learn More
    €335.00

  • NF EN 62132-1, C96-261-1 (05/2016)

    Integrated circuits - Measurement of electromagnetic immunity - Part 1 : general conditions and definitions - Circuits intégrés - Méthode de l'immunité électromagnétique - Partie 1 : conditions générales et définitions
    5/1/2016 - Paper - French - AFNOR
    Learn More
    €87.39

  • ASTM F773M-16

    Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €47.00

  • ASTM F773M-16 + Redline

    Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €56.00

  • ASTM F744M-16

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €47.00

  • ASTM F744M-16 + Redline

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
    5/1/2016 - PDF - English - ASTM
    Learn More
    €56.00

  • NF EN 16602-60-02, L90-200-60-02 (04/2016)

    Space product assurance - ASIC and FPGA development - Assurance produit des projets spatiaux - Développement des ASIC et FPGA
    4/1/2016 - Paper - English, French - AFNOR
    Learn More
    €156.84

  • UNE-EN 62132-1:2016

    Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (Endorsed by AENOR in April of 2016.)
    4/1/2016 - PDF - English - AENOR
    Learn More
    €69.00

  • BS EN 62132-1:2016

    Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
    3/31/2016 - PDF - English - BSI
    Learn More
    €215.67

  • NEMA ABP 1:2016

    Selective Coordination of Low-Voltage Circuit Breakers
    1/1/2016 - PDF sécurisé - English - NEMA
    Learn More
    €23.00

  • JEDEC JESD 241:2015

    Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
    12/1/2015 - PDF sécurisé - English - JEDEC
    Learn More
    €81.40

  • IEC 62132-1:2015

    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    10/29/2015 - PDF - English, French - IEC
    Learn More
    €147.00

  • PD IEC/TR 61967-1-1:2015

    Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
    9/30/2015 - PDF - English - BSI
    Learn More
    €300.99

  • JEDEC JEP 163:2015

    Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
    9/1/2015 - PDF sécurisé - English - JEDEC
    Learn More
    €79.20

  • IEC TR 61967-1-1:2015

    IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
    8/28/2015 - PDF - English - IEC
    Learn More
    €315.00

  • DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08

    Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
    8/1/2015 - Paper - German - VDE
    Learn More
    €81.46

  • DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08

    Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
    8/1/2015 - Paper - German - VDE
    Learn More
    €69.60

  • GEIA-STD-0001-2015

    IBIS Interconnect Modeling Specification
    7/1/2015 - PDF - English - TECHAMERICA
    Learn More
    €97.52

  • IPC T-50M:2015

    Terms and Definitions for Interconnecting and Packaging Electronic Circuits
    5/1/2015 - Paper - English - IPC
    Learn More
    €184.80

  • IEEE/IEC 61523-4:2015

    IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
    3/24/2015 - PDF - English - IEEE
    Learn More
    €286.70

  • IEEE/IEC 61523-4:2015

    IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
    3/24/2015 - Paper - English - IEEE
    Learn More
    €360.96

  • NF C96-500-5, NF EN 165000-5 (02/2015)

    Film and hybrid integrated circuits - Part 5 : procedure for qualification approval
    2/7/2015 - PDF - English - UTE
    Learn More
    €102.58

  • NF EN 165000-5, C96-500-5 (02/2015)

    Film and hybrid integrated circuits - Part 5 : procedure for qualification approval
    2/1/2015 - Paper - French - AFNOR
    Learn More
    €98.42

  • ESD SP 14.5:2015

    ESD Association Standard Practice for Electrostatic Discharge Sensitivity Testing - Near Field Immunity Scanning - Component/Module/PCB Level
    1/1/2015 - PDF - English - ESD
    Learn More
    €136.62

  • ANSI/VITA 46.11:2015

    System Management on VPX
    1/1/2015 - PDF - English - VITA
    Learn More
    €120.00

  • ANSI/VITA 78:2015

    SpaceVPX System Specification
    1/1/2015 - PDF - English - VITA
    Learn More
    €120.00

  • IEEE 1687:2014

    IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
    12/5/2014 - PDF - English - IEEE
    Learn More
    €251.92

  • IEEE 1687:2014

    IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
    12/5/2014 - Paper - English - IEEE
    Learn More
    €315.84

  • PD IEC/TS 61967-3:2014

    Integrated circuits. Measurement of electromagnetic emissions radiated emissions. Surface scan method
    9/30/2014 - PDF - English - BSI
    Learn More
    €253.59

  • PD IEC/TS 62132-9:2014

    Integrated circuits. Measurement of electromagnetic immunity radiated immunity. Surface scan method
    9/30/2014 - PDF - English - BSI
    Learn More
    €215.67

  • IEC TS 61967-3:2014

    IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
    8/25/2014 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC TS 62132-9:2014

    IEC TS 62132-9:2014 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
    8/21/2014 - PDF - English, French - IEC
    Learn More
    €178.00

  • 14/30310478 DC:2014

    BS EN 62433-3. EMC IC modelling. Part 3. Models of Integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
    7/17/2014 - PDF - English - BSI
    Learn More
    €23.70

  • ASTM F1262M-14

    Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
    6/1/2014 - PDF - English - ASTM
    Learn More
    €47.00

  • DIN EN 62215-3 VDE 0847-23-3:2014-04

    Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013); German version EN 62215-3:2013
    4/1/2014 - Paper - German - VDE
    Learn More
    €84.90

  • IPC J-STD-030A:2014

    Selection and Application of Board Level Underfill Materials
    3/24/2014 - Paper - English - IPC
    Learn More
    €184.80

  • JEDEC JESD 237:2014

    Reliability Qualification of Power Amplifier Modules
    3/1/2014 - PDF sécurisé - English - JEDEC
    Learn More
    €73.70

  • NF EN 62215-3, C96-215-3 (03/2014)

    Integrated circuits - Measurement of impulse immunity - Part 3 : non-synchronous transient injection method - Circuits intégrés
    3/1/2014 - Paper - French - AFNOR
    Learn More
    €98.42

  • NF EN 60747-16-5, C96-016-5 (02/2014)

    Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
    2/1/2014 - Paper - French - AFNOR
    Learn More
    €107.86

  • ATIS 0600020:2014

    Test Requirements for Pb-Free Circuit Packs
    1/1/2014 - PDF sécurisé - English - ATIS
    Learn More
    €110.00

  • EIA-944:2013

    Surface Mount Ferrite Chip Bead Qualification Specification
    12/1/2013 - PDF sécurisé - English - EIA
    Learn More
    €85.80

  • UNE-EN 62215-3:2013

    Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (Endorsed by AENOR in November of 2013.)
    11/1/2013 - PDF - English - AENOR
    Learn More
    €74.00

  • BS EN 62215-3:2013

    Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
    10/31/2013 - PDF - English - BSI
    Learn More
    €253.59

  • DIN 51456:2013-10

    Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
    10/1/2013 - PDF - German - DIN
    Learn More
    €68.30

  • JEDEC JESD 49A.01:2013

    Procurement Standard for Semiconductor Die Products Including Known Good Die (KGD)
    10/1/2013 - PDF sécurisé - English - JEDEC
    Learn More
    €66.00

  • NF EN 62433-2, C96-070-2 (09/2013)

    EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    9/1/2013 - Paper - French - AFNOR
    Learn More
    €129.98

  • IEC 62215-3:2013

    IEC 62215-3:2013 Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
    7/17/2013 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEEE 1149.1:2013

    IEEE Standard for Test Access Port and Boundary-Scan Architecture
    5/13/2013 - PDF - English - IEEE
    Learn More
    €282.94

  • IEEE 1149.1:2013

    IEEE Standard for Test Access Port and Boundary-Scan Architecture
    5/13/2013 - Paper - English - IEEE
    Learn More
    €456.84

  • IEEE 1149.1:2013 + Redline

    IEEE Standard for Test Access Port and Boundary-Scan Architecture
    5/13/2013 - PDF - English - IEEE
    Learn More
    €380.70

  • NF C86-218, NF EN 190107 (04/2013)

    Family Specification : TTL FAST Digital Integrated Circuits - Series 54F, 74F
    4/6/2013 - PDF - English - UTE
    Learn More
    €91.08

  • NF C86-020, NF EN 190000 (04/2013)

    Generic Specification : monolithic integrated circuits
    4/6/2013 - PDF - English - UTE
    Learn More
    €270.93

  • NF C86-219, NF EN 190108 (04/2013)

    Family Specification : TTL Advanced Schottky Digital Integrated Circuits - Series 54AS, 74AS
    4/6/2013 - PDF - English - UTE
    Learn More
    €91.08

  • NF C86-222, NF EN 190109 (04/2013)

    Family specification : Digital Integrated HC MOS Circuits - Series HC/HCT/HCU
    4/6/2013 - PDF - English - UTE
    Learn More
    €124.52

  • NF C86-213, NF EN 190101 (04/2013)

    Family Specification : Digital Integrated TTL Circuits - Series 54, 64, 74, 84
    4/6/2013 - PDF - English - UTE
    Learn More
    €91.08

  • NF C86-216, NF EN 190102 (04/2013)

    Family Specification : TTL Schottky Digital Integrated Circuits - Series 54S, 64S, 74S, 84S
    4/6/2013 - PDF - English - UTE
    Learn More
    €77.83

  • NF C86-226, NF EN 190116 (04/2013)

    Family specification : AC MOS Digital Integrated Circuits
    4/6/2013 - PDF - English - UTE
    Learn More
    €102.58

  • NF C86-241, NF EN 190110 (04/2013)

    Blank Detail Specification : Digital Microprocessor Integrated Circuits
    4/6/2013 - PDF - English - UTE
    Learn More
    €91.08

  • NF EN 190101, C86-213 (04/2013)

    Family Specification : Digital Integrated TTL Circuits - Series 54, 64, 74, 84 - Spécification de famille : circuits intégrés digitaux TTL
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 190102, C86-216 (04/2013)

    Family Specification : TTL Schottky Digital Integrated Circuits - Series 54S, 64S, 74S, 84S - Spécification de famille : circuits intégrés logiques TTL Schottky
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €74.67

  • NF EN 190000, C86-020 (04/2013)

    Generic Specification : monolithic integrated circuits
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €259.96

  • NF EN 190108, C86-219 (04/2013)

    Family Specification : TTL Advanced Schottky Digital Integrated Circuits - Series 54AS, 74AS - Spécification de famille : circuits intégrés logiques TTL Schottky avancée
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 190109, C86-222 (04/2013)

    Family specification : Digital Integrated HC MOS Circuits - Series HC/HCT/HCU
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €119.48

  • NF EN 190110, C86-241 (04/2013)

    Blank Detail Specification : Digital Microprocessor Integrated Circuits
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 190116, C86-226 (04/2013)

    Family specification : AC MOS Digital Integrated Circuits
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €98.42

  • NF EN 190107, C86-218 (04/2013)

    Family Specification : TTL FAST Digital Integrated Circuits - Series 54F, 74F - Spécification de famille : circuits intégrés logiques TTL FAST
    4/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF C86-212, NF EN 190103 (03/2013)

    Family Specification : digital Integrated TTL Low Power Schottky Circuits - Series 54LS, 64LS, 74LS, 84LS
    3/6/2013 - PDF - English - UTE
    Learn More
    €102.58

  • NF C86-217, NF EN 190106 (03/2013)

    Family specification : TTL Advanced Low Power Schottky Digital Integrated Circuits - Series 54ALS, 74ALS
    3/6/2013 - PDF - English - UTE
    Learn More
    €91.08

  • NF C86-200, NF EN 190100 (03/2013)

    Sectional specification : digital monolithic integrated circuits
    3/6/2013 - PDF - English - UTE
    Learn More
    €149.88

  • DIN EN 62132-8 VDE 0847-22-8:2013-03

    Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012
    3/1/2013 - Paper - German - VDE
    Learn More
    €65.60

  • NF EN 190100, C86-200 (03/2013)

    Sectional specification : digital monolithic integrated circuits
    3/1/2013 - Paper - French - AFNOR
    Learn More
    €143.80

  • NF EN 190103, C86-212 (03/2013)

    Family Specification : digital Integrated TTL Low Power Schottky Circuits - Series 54LS, 64LS, 74LS, 84LS - Spécification de famille : circuits intégrés digitaux TTL low power Schottky
    3/1/2013 - Paper - French - AFNOR
    Learn More
    €98.42

  • NF EN 190106, C86-217 (03/2013)

    Family specification : TTL Advanced Low Power Schottky Digital Integrated Circuits - Series 54ALS, 74ALS
    3/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 62132-8, C96-261-8 (02/2013)

    Integrated circuits - Measurement of electromagnetic immunity - Part 8 : measurement of radiated immunity - IC stripline method - Circuits intégrés
    2/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • JEDEC JEP 170:2013

    Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
    1/1/2013 - PDF sécurisé - English - JEDEC
    Learn More
    €64.90

  • JEDEC JESD 226:2013

    RF BIASED LIFE (RFBL) TEST METHOD
    1/1/2013 - PDF sécurisé - English - JEDEC
    Learn More
    €66.00

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