31.140 : Piezoelectric devices
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EIA RS-192-A:1967 (R1981)
Holdes Qutlines and Pin Connections for Quartz Crystal Units
2/1/1967 - PDF sécurisé - English - EIA
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DIN 40148-3:1971-11
Transmission systems and two-ports, measures for attenuation
11/1/1971 - PDF - German - DIN
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UTE C93-611, C93-611U (11/1975)
Components for electric equipment. Piezoelectric devices. Quartz crystal units for oscillators.
11/1/1975 - Paper - French - AFNOR
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IEC 60483:1976
IEC 60483:1976 Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
1/1/1976 - PDF - English, French - IEC
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IEC 60483:1976
IEC 60483:1976 Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
1/1/1976 - PDF - Russian - IEC
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€52.90
-
€32.34
-
IEC 60642:1979
IEC 60642:1979 Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
1/1/1979 - PDF - English, French - IEC
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IEC 60642:1979
IEC 60642:1979 Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
1/1/1979 - PDF - Russian - IEC
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UTE C93-613, C93-613U (03/1979)
Components for electric equipment. Piezoelectric devices. Piezoelectric filters. Guide to the use of crystal filters.
3/1/1979 - Paper - French - AFNOR
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UTE C93-611/A1, C93-611/A1U (03/1979)
COMPONENTS FOR ELECTRIC EQUIPMENT. PIEZOELECTRIC DEVICES. QUARTZ CRYSTAL UNITS FOR OSCILLATORS. RELEVANT ARTICLE SHEETS.
3/1/1979 - Paper - French - AFNOR
Learn More€170.00 -
IEC 60444-2:1980
IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
1/1/1980 - PDF - English, French - IEC
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IEC 60444-2:1980
IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
1/1/1980 - PDF - Russian - IEC
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IEC 60679-2:1981
IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
1/1/1981 - PDF - English, French - IEC
Learn More€219.00 -
IEC 60679-2:1981
IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
1/1/1981 - PDF - Russian - IEC
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UTE C93-611/A2, C93-611/A2U (01/1982)
Additif 2 à la publication UTE C 93-611 de novembre 1975 - (Complété par le RECTIFICATIF DE JUIN 1982)
1/1/1982 - Paper - French - AFNOR
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ISA-RP37.2:1982 (R1995)
Guide for Specifications and Tests for Piezoelectric Acceleration Transducers for Aerospace Testing
1/1/1982 - PDF sécurisé - English - ISA
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IEC 60122-2:1983
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
1/1/1983 - PDF - Russian - IEC
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IEC 60122-2:1983
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
1/1/1983 - PDF - English, French - IEC
Learn More€311.00 -
DIN 40148-2:1984-01
Transmission systems and two-ports, symmetry characteristics of linear two-ports
1/1/1984 - PDF - German - DIN
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EIA-512:1985
STANDARD METH0DS FOR MEASUREMENT OF THE EQUIVALENT ELECTRICAL PARAMETERS OF QUARTZ CRYSTAL UNITS, 1 kHz to 1 GHz
4/1/1985 - PDF sécurisé - English - EIA
Learn More€109.20 -
IEC 60444-1:1986
IEC 60444-1:1986 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
8/15/1986 - PDF - English, French - IEC
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IEC 60444-1:1986
IEC 60444-1:1986 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
8/15/1986 - PDF - Russian - IEC
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UTE C93-611/A3, C93-611/A3U (11/1986)
Additif 3 à la publication UTE C 93-611 de novembre 1975
11/1/1986 - Paper - French - AFNOR
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EIA CB-6-A:1987
Guide for the Use of Quartz Crystal Units for Frequency Control
10/1/1987 - PDF sécurisé - English - EIA
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DIN IEC 60642:1988-04
Piezoelectric ceramic resonators and resonator units for frequency control and selection; standard values and conditions; measuring and test conditions; identical with IEC 60642, edition 1979
4/1/1988 - PDF - German - DIN
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DIN IEC 60483:1988-04
Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling; identical with IEC 60483, edition 1976
4/1/1988 - PDF - German - DIN
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IEC TR 60444-4:1988
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
6/30/1988 - PDF - English, French - IEC
Learn More€92.00 -
IEC 60368-2-1:1988
IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
6/30/1988 - PDF - English, French - IEC
Learn More€270.00 -
IEC 60368-2-1:1988
IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
6/30/1988 - PDF - Russian - IEC
Learn More€270.00 -
IEC TR 60444-4:1988
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
6/30/1988 - PDF - Russian - IEC
Learn More€92.00 -
€88.20
-
EIA-512-1:1990
Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1 kHz to 1 GHz
11/12/1990 - PDF sécurisé - English - EIA
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BS EN 168101:1997
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
12/31/1990 - PDF - English - BSI
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BS CECC 68100:1991
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
1/31/1991 - PDF - English - BSI
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
5/31/1991 - PDF - English - BSI
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IEC 60122-2-1:1991
IEC 60122-2-1:1991 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply
7/22/1991 - PDF - English, French - IEC
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IEC TR 61088:1991
IEC TR 61088:1991 Characteristics and measurements of ultrasonic piezoceramic transducers
9/1/1991 - PDF - English, French - IEC
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IEC 61019-3:1991
IEC 61019-3:1991 Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
12/24/1991 - PDF - English, French - IEC
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IEC 61080:1991
IEC 61080:1991 Guide to the measurement of equivalent electrical parameters of quartz crystal units
12/31/1991 - PDF - English, French - IEC
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IEC 60642-3:1992
IEC 60642-3:1992 Piezoelectric ceramic resonators - Part 3: Standard outlines
3/15/1992 - PDF - English, French - IEC
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UNE 21302-561:1992 (R2015)
ELECTROTECHNICAL VOCABULARY. PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION.
3/24/1992 - PDF - Spanish - AENOR
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DIN IEC 60122-2-1:1992-08
Quartz crystal units for frequency control and selection; part 2: guide to use of quartz crystal units for frequency control and selection; Section one: quartz crystal units for microprocessor clock supply; identical with IEC 60122-2-1:1991
8/1/1992 - PDF - German - DIN
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DIN EN 168101:1992-09
Blank detail specification; quartz crystal units (capability approval); german version EN 168101:1992
9/1/1992 - PDF - German - DIN
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DIN EN 168201:1992-09
Blank detail specification; quartz crystal units (qualification approval); german version EN 168201:1992
9/1/1992 - PDF - German - DIN
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IEC 60642:1979/AMD1:1992
IEC 60642:1979/AMD1:1992 Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
9/30/1992 - PDF - English, French - IEC
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BS 4727-3:Group 14:1992
Glossary of electrotechnical, power, telecommunication, electronics, lighting and colour terms. Terms particular to telecommunications electronics Oscillations, signals related devices
10/15/1992 - PDF - English - BSI
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DIN IEC 61080:1993-02
Guide to the measurement of equivalent electrical parameters of quartz crystal units; identical with IEC 61080:1991
2/1/1993 - PDF - German - DIN
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IEC 61178-2:1993
IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
3/31/1993 - PDF - English, French - IEC
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IEC 61178-2-1:1993
IEC 61178-2-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
3/31/1993 - PDF - English, French - IEC
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IEC 61178-3:1993
IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
3/31/1993 - PDF - English, French - IEC
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IEC 61178-3-1:1993
IEC 61178-3-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
3/31/1993 - PDF - English, French - IEC
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DIN EN 168100:1993-06
Sectional specification: quartz crystal units (capability approval) (includes amendments A1 and A2:1993); German version EN 168100:1993
6/1/1993 - PDF - German - DIN
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DIN IEC 60368-2-1:1993-07
Piezoelectric filters; part 2: guide to the use of piezoelectric filters; section 1: quartz crystal filters; identical with IEC 60368-2-1:1988
7/1/1993 - PDF - German - DIN
Learn More€92.62 -
BS EN 169100:1993
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
8/15/1993 - PDF - English - BSI
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BS EN 60444-4:1997
Measurement of quartz crystal unit parameters Method for the measurement load resonance frequency fL, resistance RL and calculation other derived values units, up to 30 MHz
8/15/1993 - PDF - English - BSI
Learn More€180.00 -
BS EN 169000:1993
Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
8/15/1993 - PDF - English - BSI
Learn More€348.00 -
DIN IEC 60122-2:1993-09
Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; identical with IEC 60122-2:1983
9/1/1993 - PDF - German - DIN
Learn More€92.62 -
IEC 60122-2-1:1991/AMD1:1993
IEC 60122-2-1:1991/AMD1:1993 Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply
9/6/1993 - PDF - English, French - IEC
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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement motional capacitance units
9/15/1993 - PDF - English - BSI
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BS EN 60444-3:1997
Measurement of quartz crystal unit parameters Basic method for the measurement two-terminal units up to 200 MHz by phase technique in a p-network with compensation parallel capacitance C0
9/15/1993 - PDF - English - BSI
Learn More€180.00 -
DIN EN 168200:1993-10
Sectional specification; quartz crystal units (qualification approval); German version EN 168200:1993
10/1/1993 - PDF - German - DIN
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IEC 61253-1:1993
IEC 61253-1:1993 Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
12/17/1993 - PDF - English, French - IEC
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IEC 61253-2:1993
IEC 61253-2:1993 Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
12/17/1993 - PDF - English, French - IEC
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IEC 61253-2-1:1993
IEC 61253-2-1:1993 Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
12/17/1993 - PDF - English, French - IEC
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IEC 60642-2:1994
IEC 60642-2:1994 Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units
2/8/1994 - PDF - English, French - IEC
Learn More€219.00 -
IEC 61261-2:1994
IEC 61261-2:1994 Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
3/11/1994 - PDF - English, French - IEC
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IEC 61261-2-1:1994
IEC 61261-2-1:1994 Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
3/11/1994 - PDF - English, French - IEC
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IEC 61261-1:1994
IEC 61261-1:1994 Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
3/24/1994 - PDF - English, French - IEC
Learn More€219.00 -
DIN IEC 61253-1:1994-12
Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification; qualification approval; identical with IEC 61253-1:1993
12/1/1994 - PDF - German - DIN
Learn More€65.89 -
DIN IEC 61253-2:1994-12
Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification; qualification approval; identical with IEC 61253-2:1993
12/1/1994 - PDF - German - DIN
Learn More€65.89 -
DIN IEC 61253-2-1:1994-12
Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification; qualification approval; section 1: Blank detail specification; assessment level E; identical with IEC 61253-2-1:1993
12/1/1994 - PDF - German - DIN
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DIN IEC 61178-2:1995-02
A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 2: Sectional specification, capability approval; identical with IEC 61178-2:1993
2/1/1995 - PDF - German - DIN
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DIN IEC 61178-2-1:1995-02
A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 2: Sectional specification, capability approval; section 1: Blank detail specification; identical with IEC 61178-2-1:1993
2/1/1995 - PDF - German - DIN
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DIN IEC 61178-3:1995-02
A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 3: Sectional specification, qualification approval; identical with IEC 61178-3:1993
2/1/1995 - PDF - German - DIN
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DIN IEC 61178-3-1:1995-02
A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 3: Sectional specification, qualification approval; section 1: Blank detail specification; identical with IEC 61178-3-1:1993
2/1/1995 - PDF - German - DIN
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IEC 60444-5:1995
IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
4/7/1995 - PDF - English, French - IEC
Learn More€311.00 -
BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
4/15/1995 - PDF - English - BSI
Learn More€250.00 -
BS EN 169101:1995
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval)
5/15/1995 - PDF - English - BSI
Learn More€151.00 -
BS EN 60444-5:1997
Measurement of quartz crystal unit parameters Methods for the determination equivalent electrical using automatic network analyzer techniques and error correction
10/15/1995 - PDF - English - BSI
Learn More€348.00 -
BS EN 168201:1996
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval)
4/15/1996 - PDF - English - BSI
Learn More€180.00 -
DIN EN 169200:1996-05
Sectional specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169200:1995
5/1/1996 - PDF - German - DIN
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DIN EN 169201:1996-05
Blank detail specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169201:1995
5/1/1996 - PDF - German - DIN
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IEC 60368-2-2:1996
IEC 60368-2-2:1996 Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
7/25/1996 - PDF - English, French - IEC
Learn More€173.00 -
UNE-EN 168100:1993
SS: QUARTZ CRYSTAL UNITS. (Endorsed by AENOR in November of 1996.)
11/1/1996 - PDF - English - AENOR
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EIA-699:1997
Test Method for the Visual Inspection of Quartz Crystal Resonator Blanks
2/1/1997 - PDF sécurisé - English - EIA
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DIN IEC 60679-2:1997-09
Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
9/1/1997 - PDF - German - DIN
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DIN EN 60444-2:1997-10
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
10/1/1997 - PDF - German - DIN
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DIN EN 60444-3:1997-10
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance Co (IEC 60444-3:1986); German version EN 60444-3:1997
10/1/1997 - PDF - German - DIN
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DIN EN 60444-4:1997-10
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz (IEC 60444-4:1988); German version EN 60444-4:1997
10/1/1997 - PDF - German - DIN
Learn More€59.63 -
DIN EN 60444-5:1997-10
Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyser techniques and error correction (IEC 60444-5:1995); German version EN 60444-5:1997
10/1/1997 - PDF - German - DIN
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UNE-EN 60444-1:1997
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK. PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK (Endorsed by AENOR in October of 1997.)
10/1/1997 - PDF - English - AENOR
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UNE-EN 60444-2:1997
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE IN A PI-NETWORK. PART 2: PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS (Endorsed by AENOR in October of 1997.)
10/1/1997 - PDF - English - AENOR
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UNE-EN 60444-4:1997
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK. PART 4 METHOD FOR THE MEASUREMENT OF THE LOAD RESONANCE FREQUENCY FL, LOAD RESONANCE RESISTANCE RL AND THE CALCULATION OF OTHER DERIVED VALUES OF QUARTZ CRYSTAL UNITS, UP TO 30 MHZ. (Endorsed by AENOR in October of 1997.)
10/1/1997 - PDF - English - AENOR
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UNE-EN 60444-5:1997
MEASUREMENT QUARTZ CRYSTAL UNIT PARAMETERS. PART 5: METHODS FOR THE DETERMINATION OF EQUIVALENT ELECTRICAL PARAMETERS USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION (Endorsed by AENOR in October of 1997.)
10/1/1997 - PDF - English - AENOR
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UNE-EN 168101:1992
BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPATIBILITY APPROVAL). (Endorsed by AENOR in November of 1997.)
11/1/1997 - PDF - English - AENOR
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UNE-EN 168201:1992
BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in November of 1997.)
11/1/1997 - PDF - English - AENOR
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IEC 60679-4:1997
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
11/28/1997 - PDF - English, French - IEC
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IEC 60679-4-1:1998
IEC 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
2/19/1998 - PDF - English, French - IEC
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IEC 60679-5:1998
IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
4/15/1998 - PDF - English, French - IEC
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IEC 60679-5-1:1998
IEC 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
4/29/1998 - PDF - English, French - IEC
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BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
5/15/1998 - PDF - English - BSI
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UNE-EN 60679-4:1998
QUARZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 4: SECTORIAL SPECIFICATION. CAPABILITY APPROVAL. (Endorsed by AENOR in June of 1998.)
6/1/1998 - PDF - English - AENOR
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BS EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
6/15/1998 - PDF - English - BSI
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UNE-EN 60679-4-1:1998
QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 4-1: BLANK DETAIL SPECIFICATION. CAPABILITY APPROVAL (Endorsed by AENOR in July of 1998.)
7/1/1998 - PDF - English - AENOR
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DIN EN 60679-4:1998-11
Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997), German version EN 60679-4:1998
11/1/1998 - PDF - German - DIN
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UNE-EN 60679-5:1998
QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5: SECTIONAL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.)
11/1/1998 - PDF - English - AENOR
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UNE-EN 60679-5-1:1998
QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5-1: BLANK DETAIL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.)
11/1/1998 - PDF - English - AENOR
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BS EN 60679-5:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Qualification approval
11/15/1998 - PDF - English - BSI
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BS EN 60679-5-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Qualification approval
11/15/1998 - PDF - English - BSI
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DIN EN 60679-4-1:1998-12
Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification, capability approval (IEC 60679-4-1:1998), German version EN 60679-4-1:1998.
12/1/1998 - PDF - German - DIN
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DIN EN 60679-5:1999-05
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification, qualification approval (IEC 60679-5:1998), German version EN 60679-5:1998
5/1/1999 - PDF - German - DIN
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DIN EN 60679-5-1:1999-05
Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification, qualification approval (IEC 60679-5-1:1998), German version EN 60679-5-1:1998.
5/1/1999 - PDF - German - DIN
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UNE-EN 60368-2-2:1999
PIEZOELECTRIC FILTERS. PART 2: GUIDE TO THE USE OF PIEZOELECTRIC FILTERS. SECTION 2: PIEZOELECTRIC CERAMIC FILTERS (Endorsed by AENOR in June of 1999.)
6/1/1999 - PDF - English - AENOR
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DIN EN 60368-2-2:1999-08
Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters (IEC 60368-2-2:1996), German version EN 60368-2-2:1999
8/1/1999 - PDF - German - DIN
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IEC 60444-1:1986/AMD1:1999
IEC 60444-1:1986/AMD1:1999 Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
8/13/1999 - PDF - English, French - IEC
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BS EN 60368-2-2:1999
Piezoelectric filters. Guide to the use of piezoelectric filters ceramic
10/15/1999 - PDF - English - BSI
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IEC 60368-1:2000
IEC 60368-1:2000 Piezoelectric filters of assessed quality - Part 1: Generic specification
3/10/2000 - PDF - English, French - IEC
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NF EN 60679-5-1, C93-620-5-1 (04/2000)
Quartz crystal controlled oscillators of assessed quality - Part 5-1 : Blank detail specification qualification approval
4/1/2000 - Paper - French - AFNOR
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BS EN 61338-1-3:2000
Waveguide type dielectric resonators. General information and test conditions. Measurement method of complex relative permittivity for resonator materials at microwave frequency
6/15/2000 - PDF - English - BSI
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UNE-EN 60368-1:2000
Piezoelectric filters of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in August of 2000.)
8/1/2000 - PDF - English - AENOR
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IEC 60368-4:2000
IEC 60368-4:2000 Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
8/10/2000 - PDF - English, French - IEC
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BS EN 60444-1:1997
Measurement of quartz crystal unit parameters Basic method for the measurement resonance frequency and resistance units by zero phase technique in a p-network
8/15/2000 - PDF - English - BSI
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DIN EN 60444-1:2000-09
Measurement of quartz crystal unit parameters by zero phase technique in a-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network (IEC 60444-1:1986 + A1:1999), German version EN 60444-1:1997 + A1:1999.
9/1/2000 - PDF - German - DIN
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DIN EN 61338-1-3:2000-10
Waveguide type dielectric resonators - Part 1-3: General information and test conditions, Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency (IEC 61338-1-3:1999), German version EN 61338-1-3:2000
10/1/2000 - PDF - German - DIN
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IEC 60368-4-1:2000
IEC 60368-4-1:2000 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
11/9/2000 - PDF - English, French - IEC
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UNE-EN 60444-1/A1:1999
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network. (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
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UNE-EN 60368-1:2000 CORR:2001
Piezoelectric filters of assessed quality -- Part 1: Generic specification. (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
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UNE-EN 60368-4:2000
Piezoelectric filters of assessed quality -- Part 4: Sectional specification - Capability approval. (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
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UNE-EN 60368-4:2000 CORR: 2001
Piezoelectric filters of assessed quality -- Part 4: Sectional specification - Capability approval. (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
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UNE-EN 60368-4-1:2000
Piezoelectric filters of assessed quality -- Part 4-1: Blank detail specification - Capability approval (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
Learn More€57.00 -
UNE-EN 60368-4-1:2000 CORR:2001
Piezoelectric filters of assessed quality -- Part 4-1: Blank detail specification - Capability approval (Endorsed by AENOR in April of 2001.)
4/1/2001 - PDF - English - AENOR
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BS EN 60368-4:2001
Piezoelectric filters Sectional specification. Capability approval
6/15/2001 - PDF - English - BSI
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BS EN 60368-4-1:2001
Piezoelectric filters. Blank detail specification. Capability approval
6/15/2001 - PDF - English - BSI
Learn More€151.00 -
DIN EN 60368-4-1:2001-07
Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification, Capability approval (IEC 60368-4-1:2000), German version EN 60368-4-1:2000 + Corrigendum:2001.
7/1/2001 - PDF - German - DIN
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DIN EN 60368-4:2001-07
Piezoelectric filters of assessed quality - Part 4: Sectional specification, Capability approval (IEC 60368-4:2000), German version EN 60368-4:2000 + Corrigendum:2001.
7/1/2001 - PDF - German - DIN
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UNE 21302-561/1M:2001 (R2015)
Electrotechnical vocabulary. Chapter 561: Piezoelectric devices for frequency control and selection.
9/14/2001 - PDF - Spanish - AENOR
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BS EN 170100:2001
Harmonized system of quality assessment for electronic components. Sectional specification: Waveguide type dielectric resonators
9/21/2001 - PDF - English - BSI
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UNE-EN 170100:2001
Sectional Specification: Waveguide type dielectric resonators. (Endorsed by AENOR in November of 2001.)
11/1/2001 - PDF - English - AENOR
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BS EN 170101:2001
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval
11/26/2001 - PDF - English - BSI
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UNE-EN 170101:2001
Blank detail Specification: Waveguide type dielectric resonators - Capability approval (Endorsed by AENOR in December of 2001.)
12/1/2001 - PDF - English - AENOR
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DIN EN 170100:2002-02
Sectional specification - Waveguide type dielectric resonators, German version EN 170100:2001
2/1/2002 - PDF - German - DIN
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DIN EN 170101:2002-02
Blank detail specification - Waveguide type dielectric resonators - Capability approval, German version EN 170101:2001
2/1/2002 - PDF - German - DIN
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UNE-EN 50324-1:2002
Piezoelectric properties of ceramic materials and components -- Part 1: Terms and definitions (Endorsed by AENOR in August of 2002.)
8/1/2002 - PDF - English - AENOR
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UNE-EN 50324-2:2002
Piezoelectric properties of ceramic materials and components -- Part 2: Methods of measurement - Low power (Endorsed by AENOR in August of 2002.)
8/1/2002 - PDF - English - AENOR
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UNE-EN 50324-3:2002
Piezoelectric properties of ceramic materials and components -- Part 3: Methods of measurement - High power (Endorsed by AENOR in August of 2002.)
8/1/2002 - PDF - English - AENOR
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IEC 60122-1:2002
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
8/9/2002 - PDF - English, French - IEC
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BS EN 50324-1:2002
Piezoelectric properties of ceramic materials and components Terms definitions
10/10/2002 - PDF - English - BSI
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BS EN 50324-3:2002
Piezoelectric properties of ceramic materials and components Methods measurement. High power
10/10/2002 - PDF - English - BSI
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BS EN 50324-2:2002
Piezoelectric properties of ceramic materials and components Methods measurement. Low power
10/10/2002 - PDF - English - BSI
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DIN EN 50324-1 VDE 0336-1:2002-12
Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions; German version EN 50324-1:2002
12/1/2002 - Paper - German - VDE
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DIN EN 50324-2 VDE 0336-2:2002-12
Piezoelectric properties of ceramic materials and components - Part 2: Methods of measurement; Low power; German version EN 50324-2:2002
12/1/2002 - Paper - German - VDE
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DIN EN 50324-3 VDE 0336-3:2002-12
Piezoelectric properties of ceramic materials and components - Part 3: Methods of measurement; High power; German version EN 50324-3:2002
12/1/2002 - Paper - German - VDE
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DIN 1304-9:2003-01
Letter symbols for physical quantities - Part 9: Symbols for equivalent circuits of piezoelectric crystals
1/1/2003 - PDF - German - DIN
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UNE-EN 60122-1:2002
Quartz crystal units of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in March of 2003.)
3/1/2003 - PDF - English - AENOR
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IEC 60862-3:2003
IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
10/8/2003 - PDF - English, French - IEC
Learn More€92.00 -
BS EN 60862-3:2003
Surface acoustic wave (SAW) filters of assessed quality Standard outlines
2/16/2004 - PDF - English - BSI
Learn More€180.00 -
IEC 60444-7:2004
IEC 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
4/5/2004 - PDF - English, French - IEC
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IEC 60444-7:2004
IEC 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
4/5/2004 - PDF - English - IEC
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IEC 61338-2:2004
IEC 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
5/27/2004 - PDF - English, French - IEC
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IEC 61338-2:2004
IEC 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
5/27/2004 - PDF - English - IEC
Learn More€270.00 -
IEC 61337-2:2004
IEC 61337-2:2004 Filters using waveguide type dielectric resonators - Part 2: Guidance for use
7/6/2004 - PDF - English, French - IEC
Learn More€219.00 -
IEC 61337-2:2004
IEC 61337-2:2004 Filters using waveguide type dielectric resonators - Part 2: Guidance for use
7/6/2004 - PDF - English - IEC
Learn More€219.00 -
IEC 60368-1:2000/AMD1:2004
IEC 60368-1:2000/AMD1:2004 Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
8/17/2004 - PDF - English - IEC
Learn More€23.00 -
IEC 60368-1:2000/AMD1:2004
IEC 60368-1:2000/AMD1:2004 Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
8/17/2004 - PDF - English, French - IEC
Learn More€23.00 -
UNE-EN 60444-7:2004
Measurement of queartz crystal unit parameters -- Part 7: Measurement of activity and frequency dips of quartz crystal units (Endorsed by AENOR in September of 2004.)
9/1/2004 - PDF - English - AENOR
Learn More€38.00 -
BS EN 60444-7:2004
Measurement of quartz crystal unit parameters activity and frequency dips units
9/3/2004 - PDF - English - BSI
Learn More€151.00 -
BS EN 61338-2:2004
Waveguide type dielectric resonators Guidelines for oscillator and filter applications
10/20/2004 - PDF - English - BSI
Learn More€293.00 -
DIN EN 60444-7:2004-11
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004
11/1/2004 - PDF - German - DIN
Learn More€52.90 -
UNE-EN 60368-1:2000/A1:2004
Piezoelectric filters of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in November of 2004.)
11/1/2004 - PDF - English - AENOR
Learn More€38.00 -
IEC 61019-1:2004
IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
11/2/2004 - PDF - English - IEC
Learn More€270.00 -
IEC 61337-1:2004
IEC 61337-1:2004 Filters using waveguide type dielectric resonators - Part 1: Generic specification
11/2/2004 - PDF - English - IEC
Learn More€173.00 -
IEC 61338-1:2004
IEC 61338-1:2004 Waveguide type dielectric resonators - Part 1: Generic specification
11/2/2004 - PDF - English - IEC
Learn More€270.00 -
IEC 61338-1:2004
IEC 61338-1:2004 Waveguide type dielectric resonators - Part 1: Generic specification
11/2/2004 - PDF - English, French - IEC
Learn More€270.00 -
IEC 61337-1:2004
IEC 61337-1:2004 Filters using waveguide type dielectric resonators - Part 1: Generic specification
11/2/2004 - PDF - English, French - IEC
Learn More€173.00 -
IEC 61019-1:2004
IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
11/2/2004 - PDF - English, French - IEC
Learn More€270.00 -
BS EN 61337-2:2004
Filters using waveguide type dielectric resonators Guide for use
11/16/2004 - PDF - English - BSI
Learn More€250.00 -
€293.00
-
UNE-EN 61337-2:2004
Filters using waveguide type dielectric resonators -- Part 2: Guidance for use (Endorsed by AENOR in January of 2005.)
1/1/2005 - PDF - English - AENOR
Learn More€70.00 -
DIN EN 61338-2:2005-02
Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
2/1/2005 - PDF - German - DIN
Learn More€104.95 -
DIN EN 61337-2:2005-03
Filters using waveguide type dielectric resonators - Part 2: Guidance for use (IEC 61337-2:2004); German version EN 61337-2:2004
3/1/2005 - PDF - German - DIN
Learn More€99.35 -
BS EN 61019-1:2005
Surface acoustic wave (SAW) resonators Generic specification
3/10/2005 - PDF - English - BSI
Learn More€293.00 -
BS EN 61337-1:2004
Filters using waveguide type dielectric resonators Generic specification
3/10/2005 - PDF - English - BSI
Learn More€250.00 -
BS EN 61338-1:2005
Waveguide type dielectric resonators Generic specification
3/10/2005 - PDF - English - BSI
Learn More€293.00 -
IEC 61338-4-1:2005
IEC 61338-4-1:2005 Waveguide type dielectric resonators - Part 4-1: Blank detail specification
3/23/2005 - PDF - English, French - IEC
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IEC 61338-4:2005
IEC 61338-4:2005 Waveguide type dielectric resonators - Part 4: Sectional specification
3/23/2005 - PDF - English, French - IEC
Learn More€132.00 -
IEC 61338-4:2005
IEC 61338-4:2005 Waveguide type dielectric resonators - Part 4: Sectional specification
3/23/2005 - PDF - English - IEC
Learn More€132.00 -
IEC 61338-4-1:2005
IEC 61338-4-1:2005 Waveguide type dielectric resonators - Part 4-1: Blank detail specification
3/23/2005 - PDF - English - IEC
Learn More€23.00 -
UNE-EN 60862-3:2005
Surface acoustic wave (SAW) filters of assessed quality -- Part 3: Standard outlines
3/30/2005 - PDF - Spanish - AENOR
Learn More€60.00 -
UNE-EN 60862-3:2005
Surface acoustic wave (SAW) filters of assessed quality -- Part 3: Standard outlines
3/30/2005 - PDF - English - AENOR
Learn More€72.00 -
DIN EN 60368-1:2005-04
Piezoelectric filters of assessed quality - Part 1: Generic specification (IEC 60368-1:2000 + A1:2004); German version EN 60368-1:2000 + A1:2004
4/1/2005 - PDF - German - DIN
Learn More€110.00 -
UNE-EN 61019-1:2005
Surface acoustic wave (SAW) resonators of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in April of 2005.)
4/1/2005 - PDF - English - AENOR
Learn More€75.00 -
IEC 61019-2:2005
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
5/12/2005 - PDF - English - IEC
Learn More€219.00 -
IEC 61019-2:2005
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
5/12/2005 - PDF - English, French - IEC
Learn More€219.00 -
DIN EN 61019-1:2005-06
Surface acoustic wave (SAW) resonators - Part 1: Generic specification (IEC 61019-1:2004); German version EN 61019-1:2005
6/1/2005 - PDF - German - DIN
Learn More€110.00 -
DIN EN 61337-1:2005-07
Filters using waveguide type dielectric resonators - Part 1:Generic specification (IEC 61337-1:2004); German version EN 61337-1:2004
7/1/2005 - PDF - German - DIN
Learn More€99.35 -
DIN EN 61338-1:2005-07
Waveguide type dielectric resonators - Part 1: Generic specification (IEC 61338-1:2004), German version EN 61338-1:2005.
7/1/2005 - PDF - German - DIN
Learn More€104.95 -
UNE-EN 61338-4:2005
Waveguide type dielectric resonators -- Part 4: Sectional specification (Endorsed by AENOR in September of 2005.)
9/1/2005 - PDF - English - AENOR
Learn More€64.00 -
UNE-EN 61338-4-1:2005
Waveguide type dielectric resonators -- Part 4-1: Blank detail specification (Endorsed by AENOR in September of 2005.)
9/1/2005 - PDF - English - AENOR
Learn More€38.00 -
UNE-EN 61019-2:2005
Surface acoustic wave (SAW) resonators -- Part 2: Guide to the use (Endorsed by AENOR in September of 2005.)
9/1/2005 - PDF - English - AENOR
Learn More€70.00