31.140 : Piezoelectric devices

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  • PR NF EN IEC 63041-3, C93-041-3PR (03/2020)


    3/1/2020 - Paper - English, French - AFNOR
    Learn More
    €61.17

  • PD IEC TS 61994-4-1:2018:2020 + Redline

    Tracked Changes. Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Synthetic quartz crystal
    2/27/2020 - PDF - English - BSI
    Learn More
    €169.46

  • PD IEC TS 61994-4-4:2018:2020 + Redline

    Tracked Changes. Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Single crystal wafers surface acoustic wave (SAW)
    2/27/2020 - PDF - English - BSI
    Learn More
    €200.27

  • BS EN 60758:2016:2020 + Redline

    Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
    2/26/2020 - PDF - English - BSI
    Learn More
    €391.29

  • BS EN 60793-1-33:2017:2020 + Redline

    Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
    2/25/2020 - PDF - English - BSI
    Learn More
    €369.72

  • 20/30404083 DC:2020

    BS IEC 62047-38. Semiconductor devices. Micro-electromechanical devices Part 38. Test method for adhesion strength of metal powder paste in MEMS interconnection
    2/7/2020 - PDF - English - BSI
    Learn More
    €23.70

  • PR NF EN IEC 63155, C93-155PR (09/2019)


    9/1/2019 - Paper - English, French - AFNOR
    Learn More
    €75.51

  • UNE-EN IEC 62884-4:2019

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (Endorsed by Asociación Española de Normalización in August of 2019.)
    8/1/2019 - PDF - English - AENOR
    Learn More
    €69.00

  • PD IEC TS 61994-5:2019

    Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric sensors
    7/17/2019 - PDF - English - BSI
    Learn More
    €130.35

  • BS EN IEC 62884-4:2019

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
    7/15/2019 - PDF - English - BSI
    Learn More
    €215.67

  • NF EN IEC 62884-4, C93-684-4 (07/2019)


    7/1/2019 - Paper - French - AFNOR
    Learn More
    €74.67

  • IEC TS 61994-5:2019

    IEC TS 61994-5:2019 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
    6/26/2019 - PDF - English - IEC
    Learn More
    €20.00

  • 19/30364437 DC:2019

    BS EN IEC 63041-3. Piezoelectric sensors Part 3. Physical
    6/25/2019 - PDF - English - BSI
    Learn More
    €23.70

  • IEC 62884-4:2019

    IEC 62884-4:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods
    5/6/2019 - PDF - English, French - IEC
    Learn More
    €107.00

  • UNE-EN IEC 60122-4:2019

    Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (Endorsed by Asociación Española de Normalización in May of 2019.)
    5/1/2019 - PDF - English - AENOR
    Learn More
    €64.00

  • BS IEC 62047-36:2019

    Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    4/24/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 62047-33:2019

    Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
    4/18/2019 - PDF - English - BSI
    Learn More
    €215.67

  • BS IEC 62047-34:2019

    Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    4/16/2019 - PDF - English - BSI
    Learn More
    €154.05

  • IEC 62047-33:2019

    IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
    4/5/2019 - PDF - English - IEC
    Learn More
    €147.00

  • IEC 62047-34:2019

    IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    4/5/2019 - PDF - English - IEC
    Learn More
    €71.00

  • IEC 62047-36:2019

    IEC 62047-36:2019 Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    4/5/2019 - PDF - English - IEC
    Learn More
    €71.00

  • BS EN IEC 60122-4:2019

    Quartz crystal units of assessed quality Crystal with thermistors
    3/28/2019 - PDF - English - BSI
    Learn More
    €154.05

  • NF EN IEC 60122-4, C93-618-4 (03/2019)

    Résonateurs à quartz sous assurance de la qualité Partie 4 : résonateurs à quartz équipés de thermistances
    3/1/2019 - Paper - French - AFNOR
    Learn More
    €74.67

  • IEC 60122-4:2019

    IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
    1/24/2019 - PDF - English, French - IEC
    Learn More
    €71.00

  • 19/30390372 DC:2019

    BS EN 63155. Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications.
    1/21/2019 - PDF - English - BSI
    Learn More
    €23.70

  • PD IEC TS 61994-4-1:2018

    Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Synthetic quartz crystal
    11/22/2018 - PDF - English - BSI
    Learn More
    €130.35

  • PD IEC TS 61994-4-4:2018

    Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Single crystal wafers surface acoustic wave (SAW)
    11/22/2018 - PDF - English - BSI
    Learn More
    €154.05

  • IEC TS 61994-4-4:2018

    IEC TS 61994-4-4:2018 (Redline version) Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    11/16/2018 - PDF - English - IEC
    Learn More
    €92.00

  • IEC TS 61994-4-4:2018

    IEC TS 61994-4-4:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
    11/16/2018 - PDF - English - IEC
    Learn More
    €71.00

  • IEC TS 61994-4-1:2018

    IEC TS 61994-4-1:2018 (Redline version) Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
    11/16/2018 - PDF - English - IEC
    Learn More
    €53.00

  • IEC TS 61994-4-1:2018

    IEC TS 61994-4-1:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
    11/16/2018 - PDF - English - IEC
    Learn More
    €41.00

  • DIN EN 63155:2018-11

    Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications (IEC 49/1280/CD:2018); Text in German and English
    11/1/2018 - PDF - English, German - DIN
    Learn More
    €103.00

  • IEEE 1549-2011/Cor 1-2017:2018

    IEEE Standard for Microwave Filter Definitions-Corrigendum 1
    11/1/2018 - PDF - English - IEEE
    Learn More
    €0.00

  • DIN EN IEC 62884-3:2018-10

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods (IEC 62884-3:2018); German version EN IEC 62884-3:2018
    10/1/2018 - PDF - German - DIN
    Learn More
    €89.00

  • BS EN IEC 61837-2:2018

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Ceramic enclosures
    8/8/2018 - PDF - English - BSI
    Learn More
    €346.02

  • DIN EN IEC 63041-1:2018-08

    Piezoelectric sensors - Part 1: Generic specifications (IEC 63041-1:2017); German version EN IEC 63041-1:2018
    8/1/2018 - PDF - German - DIN
    Learn More
    €108.80

  • DIN EN 60122-1:2018-08

    Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002 + A1:2017); German version EN 60122-1:2002 + A1:2018
    8/1/2018 - PDF - German - DIN
    Learn More
    €141.90

  • DIN EN IEC 63041-2:2018-08

    Piezoelectric sensors - Part 2: Chemical and biochemical sensors (IEC 63041-2:2017); German version EN IEC 63041-2:2018
    8/1/2018 - PDF - German - DIN
    Learn More
    €96.00

  • DIN EN IEC 62604-2:2018-08

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 62604-2:2017); German version EN IEC 62604-2:2018
    8/1/2018 - PDF - German - DIN
    Learn More
    €108.80

  • UNE-EN IEC 61837-2:2018

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by Asociación Española de Normalización in August of 2018.)
    8/1/2018 - PDF - English - AENOR
    Learn More
    €137.00

  • NF EN IEC 61837-2, C93-628-2 (07/2018)

    Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence - Encombrements normalisés et connexions des sorties - Partie 2 : enveloppes en céramique - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence - Encombrements normalisés et connexions des sorties - Partie 2 : Enveloppes en céramique
    7/1/2018 - Paper - French - AFNOR
    Learn More
    €166.44

  • NF C93-616, NF EN 62276 (06/2018)

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    6/30/2018 - PDF - English - UTE
    Learn More
    €112.42

  • NF C93-632, NF EN 60758 (06/2018)

    Synthetic quartz crystal - Specifications and guidelines for use
    6/30/2018 - PDF - English - UTE
    Learn More
    €135.47

  • NF C93-614, NF EN 61240 (06/2018)

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    6/16/2018 - PDF - English - UTE
    Learn More
    €77.83

  • NF EN 60758, C93-632 (06/2018)

    Synthetic quartz crystal - Specifications and guidelines for use - Cristal de quartz synthétique - Spécifications et lignes directrices d'utilisation
    6/1/2018 - Paper - French - AFNOR
    Learn More
    €129.98

  • NF EN 62276, C93-616 (06/2018)

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods - Tranches monocristallines pour applications utilisant des dispositifs à ondes acoustiques de surface (OAS) - Spécifications et méthodes de mesure
    6/1/2018 - Paper - French - AFNOR
    Learn More
    €107.86

  • NF EN 61240, C93-614 (06/2018)

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules - Dispositifs piézoélectriques - Préparation des dessins d'encombrement des dispositifs pour montage en surface pour la commande et le choix de la fréquence - Règles générales
    6/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • UNE-EN IEC 62884-3:2018

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods (Endorsed by Asociación Española de Normalización in June of 2018.)
    6/1/2018 - PDF - English - AENOR
    Learn More
    €64.00

  • BS EN IEC 62884-3:2018

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
    5/30/2018 - PDF - English - BSI
    Learn More
    €154.05

  • BS EN 60122-1:2002+A1:2018

    Quartz crystal units of assessed quality Generic specification
    5/21/2018 - PDF - English - BSI
    Learn More
    €284.40

  • IEC 61837-2:2018

    IEC 61837-2:2018 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    5/8/2018 - PDF - English, French - IEC
    Learn More
    €335.00

  • IEC 61837-2:2018

    IEC 61837-2:2018 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
    5/8/2018 - PDF - English - IEC
    Learn More
    €335.00

  • DIN EN 62884-2:2018-05

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017); German version EN 62884-2:2017
    5/1/2018 - PDF - German - DIN
    Learn More
    €108.80

  • NF EN IEC 62884-3, C93-684-3 (05/2018)

    Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques Partie 3 : méthodes d'essai de vieillissement en fréquence - Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 3 : Méthodes d'essai de vieillissement en fréquence
    5/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • UNE-EN 60122-1:2002/A1:2018

    Quartz crystal units of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in May of 2018.)
    5/1/2018 - PDF - English - AENOR
    Learn More
    €60.00

  • 18/30366383 DC:2018

    BS EN 63155. Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
    4/10/2018 - PDF - English - BSI
    Learn More
    €23.70

  • DIN EN 60679-1:2018-04

    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2017); German version EN 60679-1:2017
    4/1/2018 - PDF - German - DIN
    Learn More
    €125.30

  • UNE-EN IEC 62604-2:2018

    Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (Endorsed by Asociación Española de Normalización in April of 2018.)
    4/1/2018 - PDF - English - AENOR
    Learn More
    €71.00

  • UNE-EN IEC 63041-1:2018

    Piezoelectric Sensors - Part 1: Generic Specifications (Endorsed by Asociación Española de Normalización in April of 2018.)
    4/1/2018 - PDF - English - AENOR
    Learn More
    €71.00

  • UNE-EN IEC 63041-2:2018

    Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors (Endorsed by Asociación Española de Normalización in April of 2018.)
    4/1/2018 - PDF - English - AENOR
    Learn More
    €65.00

  • IEC 62884-3:2018

    IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
    3/22/2018 - PDF - English, French - IEC
    Learn More
    €71.00

  • IEC 62884-3:2018

    IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
    3/22/2018 - PDF - English - IEC
    Learn More
    €71.00

  • BS EN IEC 63041-2:2018

    Piezoelectric sensors Chemical and biochemical
    3/21/2018 - PDF - English - BSI
    Learn More
    €154.05

  • BS EN IEC 62604-2:2018

    Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Guidelines for the use
    3/20/2018 - PDF - English - BSI
    Learn More
    €215.67

  • BS EN IEC 63041-1:2018

    Piezoelectric sensors Generic specifications
    3/15/2018 - PDF - English - BSI
    Learn More
    €215.67

  • NF EN 60122-1/A1, C93-618-1/A1 (03/2018)


    3/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • NF EN IEC 62604-2, C93-604-2 (03/2018)


    3/1/2018 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN IEC 63041-1, C93-041-1 (03/2018)


    3/1/2018 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN IEC 63041-2, C93-041-2 (03/2018)


    3/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • DIN EN 62884-1:2018-02

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017
    2/1/2018 - PDF - German - DIN
    Learn More
    €169.80

  • DIN EN 60122-4:2018-01

    Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 49/1244/CD:2017)
    1/1/2018 - PDF - English, German - DIN
    Learn More
    €82.60

  • UNE-EN 62884-2:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (Endorsed by Asociación Española de Normalización in January of 2018.)
    1/1/2018 - PDF - English - AENOR
    Learn More
    €69.00

  • BS EN 60679-1:2017

    Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
    12/13/2017 - PDF - English - BSI
    Learn More
    €253.59

  • IEC 63041-2:2017

    IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    12/13/2017 - PDF - English, French - IEC
    Learn More
    €71.00

  • IEC 63041-1:2017

    IEC 63041-1:2017 Piezoelectric sensors - Part 1: Generic specifications
    12/13/2017 - PDF - English, French - IEC
    Learn More
    €147.00

  • IEC 63041-1:2017

    IEC 63041-1:2017 Piezoelectric sensors - Part 1: Generic specifications
    12/13/2017 - PDF - English - IEC
    Learn More
    €147.00

  • IEC 63041-2:2017

    IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    12/13/2017 - PDF - English - IEC
    Learn More
    €71.00

  • BS EN 62884-2:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
    12/8/2017 - PDF - English - BSI
    Learn More
    €215.67

  • IEC 60122-1:2002/AMD1:2017

    IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
    12/8/2017 - PDF - English, French - IEC
    Learn More
    €41.00

  • IEC 60122-1:2002+AMD1:2017 Edition 3.1

    IEC 60122-1:2002+AMD1:2017 (Consolidated version) Quartz crystal units of assessed quality - Part 1: Generic specification
    12/8/2017 - PDF - English, French - IEC
    Learn More
    €305.00

  • IEC 60122-1:2002/AMD1:2017

    IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
    12/8/2017 - PDF - English - IEC
    Learn More
    €41.00

  • IEC 60122-1:2002+AMD1:2017 Edition 3.1

    IEC 60122-1:2002+AMD1:2017 (Consolidated version) Quartz crystal units of assessed quality - Part 1: Generic specification
    12/8/2017 - PDF - English - IEC
    Learn More
    €305.00

  • BS EN 60793-1-33:2017

    Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
    12/7/2017 - PDF - English - BSI
    Learn More
    €284.40

  • UNE-EN 60679-1:2017

    Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in December of 2017.)
    12/1/2017 - PDF - English - AENOR
    Learn More
    €75.00

  • NF EN 62884-2, C93-684-2 (12/2017)


    12/1/2017 - Paper - French - AFNOR
    Learn More
    €87.39

  • IEC 62604-2:2017

    IEC 62604-2:2017 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
    11/29/2017 - PDF - English, French - IEC
    Learn More
    €147.00

  • IEC 62604-2:2017

    IEC 62604-2:2017 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
    11/29/2017 - PDF - English - IEC
    Learn More
    €147.00

  • DIN EN 60444-8:2017-11

    Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017
    11/1/2017 - PDF - German - DIN
    Learn More
    €96.00

  • UNE-EN 62884-1:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (Endorsed by Asociación Española de Normalización in November of 2017.)
    11/1/2017 - PDF - English - AENOR
    Learn More
    €98.00

  • NF EN 60679-1, C93-620-1 (11/2017)


    11/1/2017 - Paper - French - AFNOR
    Learn More
    €113.54

  • JIS C 6704:2017

    Synthetic quartz crystal
    10/20/2017 - PDF - Japanese - JSA
    Learn More
    €50.18

  • BS IEC 62047-30:2017

    Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics MEMS piezoelectric thin film
    10/9/2017 - PDF - English - BSI
    Learn More
    €215.67

  • BS EN 62884-1:2017

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
    10/4/2017 - PDF - English - BSI
    Learn More
    €300.99

  • NF C93-621-8, NF EN 60444-8 (09/2017)

    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    9/23/2017 - PDF - English - UTE
    Learn More
    €77.83

  • IEC 62047-30:2017

    IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
    9/15/2017 - PDF - English - IEC
    Learn More
    €107.00

  • NF EN 60444-8, C93-621-8 (09/2017)

    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units - Mesure des paramètres des résonateurs à quartz - Partie 8 : dispositif d'essai pour les résonateurs à quartz montés en surface
    9/1/2017 - Paper - French - AFNOR
    Learn More
    €74.67

  • NF EN 62884-1, C93-684-1 (09/2017)


    9/1/2017 - Paper - French - AFNOR
    Learn More
    €143.80

  • IEC 62884-2:2017

    IEC 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
    8/30/2017 - PDF - English, French - IEC
    Learn More
    €147.00

  • IEC 62884-2:2017

    IEC 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
    8/30/2017 - PDF - English - IEC
    Learn More
    €147.00

  • DIN EN 61240:2017-08

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2016); German version EN 61240:2017)
    8/1/2017 - PDF - German - DIN
    Learn More
    €96.00

  • DIN EN 62276:2017-08

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016
    8/1/2017 - PDF - German - DIN
    Learn More
    €141.90

  • IEC 60679-1:2017

    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    7/26/2017 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC 60679-1:2017

    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    7/26/2017 - PDF - English - IEC
    Learn More
    €208.00

  • IEC 62884-1:2017

    IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    6/8/2017 - PDF - English, French - IEC
    Learn More
    €315.00

  • IEC 62884-1:2017

    IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    6/8/2017 - PDF - English - IEC
    Learn More
    €315.00

  • BS EN 60444-8:2017

    Measurement of quartz crystal unit parameters Test fixture for surface mounted units
    5/26/2017 - PDF - English - BSI
    Learn More
    €154.05

  • UNE-EN 60444-8:2017

    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)
    5/1/2017 - PDF - English - AENOR
    Learn More
    €62.00

  • DIN EN 60758:2017-04

    Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016
    4/1/2017 - PDF - German - DIN
    Learn More
    €163.80

  • UNE-EN 61240:2017

    Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (Endorsed by Asociación Española de Normalización in March of 2017.)
    3/1/2017 - PDF - English - AENOR
    Learn More
    €68.00

  • BS EN 61240:2017

    Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
    1/31/2017 - PDF - English - BSI
    Learn More
    €215.67

  • UNE-EN 62276:2016

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)
    1/1/2017 - PDF - English - AENOR
    Learn More
    €76.00

  • BS EN 62276:2016

    Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
    12/31/2016 - PDF - English - BSI
    Learn More
    €284.40

  • IEC 60050-561:2014/AMD1:2016

    IEC 60050-561:2014/AMD1:2016 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    12/16/2016 - PDF - English, French - IEC
    Learn More
    €10.00

  • IEC 60444-8:2016

    IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    12/15/2016 - PDF - English, French - IEC
    Learn More
    €71.00

  • IEC 60444-8:2016

    IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    12/15/2016 - PDF - English - IEC
    Learn More
    €71.00

  • UNE-EN 60758:2016

    Synthetic Quartz Crystal - Specifications and guidelines for use (Endorsed by AENOR in November of 2016.)
    11/1/2016 - PDF - English - AENOR
    Learn More
    €98.00

  • IEC 62276:2016

    IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    10/24/2016 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC 61240:2016

    IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    10/24/2016 - PDF - English, French - IEC
    Learn More
    €107.00

  • IEC 62276:2016

    IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    10/24/2016 - PDF - English - IEC
    Learn More
    €208.00

  • IEC 61240:2016

    IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    10/24/2016 - PDF - English - IEC
    Learn More
    €107.00

  • BS EN 60758:2016

    Synthetic quartz crystal. Specifications and guidelines for use
    9/30/2016 - PDF - English - BSI
    Learn More
    €300.99

  • DIN EN 62575-1:2016-09

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015); German version EN 62575-1:2016
    9/1/2016 - PDF - German - DIN
    Learn More
    €125.30

  • DIN EN 62884-4:2016-08

    Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4: Short-term frequency stability test methods (IEC 49/1182/CD)
    8/1/2016 - PDF - English, German - DIN
    Learn More
    €103.00

  • IEC 60758:2016

    IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    5/18/2016 - PDF - English, French - IEC
    Learn More
    €284.00

  • IEC 60758:2016

    IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    5/18/2016 - PDF - English - IEC
    Learn More
    €284.00

  • DIN EN 61338-1-5:2016-04

    Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015); German version EN 61338-1-5:2015
    4/1/2016 - PDF - German - DIN
    Learn More
    €103.00

  • DIN EN 62604-1:2016-04

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2015); German version EN 62604-1:2015
    4/1/2016 - PDF - German - DIN
    Learn More
    €119.60

  • NF EN 62575-1, C93-617-1 (04/2016)

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1 : generic specification - Filtres radiofréquences (RF) à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 1 : spécification générique
    4/1/2016 - Paper - French - AFNOR
    Learn More
    €107.86

  • UNE-EN 62575-1:2016

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in April of 2016.)
    4/1/2016 - PDF - English - AENOR
    Learn More
    €75.00

  • BS EN 62575-1:2016

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
    3/31/2016 - PDF - English - BSI
    Learn More
    €253.59

  • NF EN 61837-3, C93-628-3 (01/2016)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3 : metal enclosure - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence
    1/1/2016 - Paper - French - AFNOR
    Learn More
    €87.39

  • UNE-EN 60862-1:2015

    Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in January of 2016.)
    1/1/2016 - PDF - English - AENOR
    Learn More
    €81.00

  • UNE-EN 61837-3:2015

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures (Endorsed by AENOR in January of 2016.)
    1/1/2016 - PDF - English - AENOR
    Learn More
    €66.00

  • BS EN 61837-3:2015

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Metal enclosures
    12/31/2015 - PDF - English - BSI
    Learn More
    €215.67

  • NF EN 60862-1, C93-631-1 (12/2015)

    Surface acoustic wave (SAW) filters of assessed quality - Part 1 : generic specification - Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité - Partie 1 : spécification générique
    12/1/2015 - Paper - French - AFNOR
    Learn More
    €119.48

  • BS EN 60862-1:2015

    Surface acoustic wave (SAW) filters of assessed quality Generic specification
    11/30/2015 - PDF - English - BSI
    Learn More
    €300.99

  • NF EN 61338-1-5, C96-627-1-5 (11/2015)

    Waveguide type dielectric resonators - Part 1-5 : general information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency - Résonateurs diélectriques à modes guidés - Partie 1-5 : informations générales et conditions d'essais - Méthode de mesure de la conductivité au niveau de l'interface entre une couche conductrice et un substrat diélectrique fonctionnant aux hyperfréquences
    11/1/2015 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 62604-1, C93-604-1 (11/2015)

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1 : generic specification - Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 1 : spécification générique
    11/1/2015 - Paper - French - AFNOR
    Learn More
    €98.42

  • IEC 62575-1:2015

    IEC 62575-1:2015 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
    10/29/2015 - PDF - English, French - IEC
    Learn More
    €208.00

  • UNE-EN 62604-1:2015

    Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (Endorsed by AENOR in October of 2015.)
    10/1/2015 - PDF - English - AENOR
    Learn More
    €72.00

  • UNE-EN 61338-1-5:2015

    Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Endorsed by AENOR in October of 2015.)
    10/1/2015 - PDF - English - AENOR
    Learn More
    €66.00

  • BS EN 62604-1:2015

    Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Generic specification
    9/30/2015 - PDF - English - BSI
    Learn More
    €253.59

  • BS EN 61338-1-5:2015

    Waveguide type dielectric resonators General information and test conditions. Measurement method of conductivity at interface between conductor layer substrate microwave frequency
    9/30/2015 - PDF - English - BSI
    Learn More
    €215.67

  • IEC 60862-1:2015

    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    8/20/2015 - PDF - English, French - IEC
    Learn More
    €249.00

  • NF EN 61837-4, C93-628-4 (08/2015)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outline and terminal lead connections - Part 4 : hybrid enclosure outline - Dispositifs piezoélectriques à montage en surface pour la commande et le choix de la fréquence
    8/1/2015 - Paper - French - AFNOR
    Learn More
    €74.67

  • IEC 62604-1:2015

    IEC 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    7/16/2015 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC 61338-1-5:2015

    IEC 61338-1-5:2015 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
    6/25/2015 - PDF - English, French - IEC
    Learn More
    €107.00

  • UNE-EN 61837-4:2015

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines (Endorsed by AENOR in June of 2015.)
    6/1/2015 - PDF - English - AENOR
    Learn More
    €59.00

  • BS EN 61837-4:2015

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Hybrid enclosure
    5/31/2015 - PDF - English - BSI
    Learn More
    €154.05

  • IEC 61837-3:2015

    IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
    4/15/2015 - PDF - English, French - IEC
    Learn More
    €107.00

  • IEC 61837-4:2015

    IEC 61837-4:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
    3/27/2015 - PDF - English, French - IEC
    Learn More
    €71.00

  • DIN EN 62761:2014-12

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (IEC 62761:2014); German version EN 62761:2014
    12/1/2014 - PDF - German - DIN
    Learn More
    €108.80

  • IEC 60050-561:2014

    IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    11/7/2014 - PDF - English, French - IEC
    Learn More
    €345.00

  • NF EN 61837-2/A1, C93-628-2/A1 (08/2014)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2 : ceramic enclosures - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence
    8/1/2014 - Paper - French - AFNOR
    Learn More
    €46.44

  • NF EN 62761, C93-671 (07/2014)

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    7/1/2014 - Paper - French - AFNOR
    Learn More
    €87.39

  • UNE-EN 62761:2014

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (Endorsed by AENOR in July of 2014.)
    7/1/2014 - PDF - English - AENOR
    Learn More
    €68.00

  • UNE-EN 61837-2:2011/A1:2014

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by AENOR in July of 2014.)
    7/1/2014 - PDF - English - AENOR
    Learn More
    €16.00

  • BS EN 62761:2014

    Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    6/30/2014 - PDF - English - BSI
    Learn More
    €215.67

  • NF C93-640-101, NF EN 168101 (06/2014)

    Blank detail specification : quartz crystal units (Capacity approval)
    6/21/2014 - PDF - English - UTE
    Learn More
    €63.42

  • NF C93-640-201, NF EN 168201 (06/2014)

    Blank detail specification: quartz crystal units (Qualification approval)
    6/21/2014 - PDF - English - UTE
    Learn More
    €77.83

  • JIS C 6760:2014

    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    6/20/2014 - PDF - Japanese - JSA
    Learn More
    €41.86

  • NF EN 168101, C93-640-101 (06/2014)

    Blank detail specification : quartz crystal units (Capacity approval) - Spécification particulière-cadre : résonateurs à quartz (AGrément de savoir-faire)
    6/1/2014 - Paper - French - AFNOR
    Learn More
    €60.85

  • NF EN 168201, C93-640-201 (06/2014)

    Blank detail specification: quartz crystal units (Qualification approval) - Spécification particulière-cadre : Résonateurs à quartz (Homologation)
    6/1/2014 - Paper - French - AFNOR
    Learn More
    €74.67

  • NF EN 60444-9, C93-621-9 (05/2014)

    Measurement of quartz crystal unit parameters - Part 9 : measurement of spurious resonances of piezoelectric crystal units
    5/1/2014 - Paper - French - AFNOR
    Learn More
    €74.67

  • NF EN 60689, C93-610 (05/2014)

    Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    5/1/2014 - Paper - French - AFNOR
    Learn More
    €87.39

  • IEC 62761:2014

    IEC 62761:2014 Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
    2/19/2014 - PDF - English, French - IEC
    Learn More
    €147.00

  • DIN EN 60444-6:2014-02

    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2013); German version EN 60444-6:2013
    2/1/2014 - PDF - German - DIN
    Learn More
    €103.00

  • NF EN 60444-6, C93-621-6 (02/2014)

    Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependence (DLD)
    2/1/2014 - Paper - French - AFNOR
    Learn More
    €87.39

  • DIN EN 60679-3:2014-01

    Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2012); German version EN 60679-3:2013
    1/1/2014 - PDF - German - DIN
    Learn More
    €108.80

  • NF C93-640-100, NF EN 168100 (11/2013)

    Sectional specification : quartz crystal units (Capability Approval)
    11/9/2013 - PDF - English - UTE
    Learn More
    €102.58

  • NF C93-640-200, NF EN 168200 (11/2013)

    Sectionnal specification : quartz crystal units (Qualification approval)
    11/9/2013 - PDF - English - UTE
    Learn More
    €91.08

  • NF EN 60679-3, C93-620-3 (11/2013)

    Quartz crystal controlled oscillators of assessed quality - Part 3 : standard outlines and lead connections
    11/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 168100, C93-640-100 (11/2013)

    Sectional specification : quartz crystal units (Capability Approval)
    11/1/2013 - Paper - French - AFNOR
    Learn More
    €98.42

  • NF EN 168200, C93-640-200 (11/2013)

    Sectionnal specification : quartz crystal units (Qualification approval)
    11/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • UNE-EN 60444-6:2013

    Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by AENOR in November of 2013.)
    11/1/2013 - PDF - English - AENOR
    Learn More
    €65.00

  • BS EN 60444-6:2013

    Measurement of quartz crystal unit parameters drive level dependence (DLD)
    10/31/2013 - PDF - English - BSI
    Learn More
    €215.67

  • UNE-EN 60679-3:2013

    Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (Endorsed by AENOR in August of 2013.)
    8/1/2013 - PDF - English - AENOR
    Learn More
    €69.00

  • BS EN 60679-3:2013

    Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections
    7/31/2013 - PDF - English - BSI
    Learn More
    €215.67

  • IEC 60444-6:2013

    IEC 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    6/19/2013 - PDF - English, French - IEC
    Learn More
    €107.00

  • IEC 60368-1:2000+AMD1:2004 Edition 4.1

    IEC 60368-1:2000+AMD1:2004 (Consolidated version) Piezoelectric filters of assessed quality - Part 1: Genericspecification
    5/28/2013 - PDF - English, French - IEC
    Learn More
    €305.00

  • DIN EN 62575-2:2013-05

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use (IEC 62575-2:2012); German version EN 62575-2:2012
    5/1/2013 - PDF - German - DIN
    Learn More
    €103.00

  • NF EN 60679-1, C93-620-1 (05/2013)

    Quartz crystal controlled oscillators of assessed quality - Part 1 : generic specification
    5/1/2013 - Paper - French - AFNOR
    Learn More
    €154.83

  • NF EN 61837-1, C93-628-1 (02/2013)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1 : plastic moulded enclosure outlines - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence
    2/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 62604-2, C93-604-2 (01/2013)

    Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2 : guidelines for the use
    1/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN 62575-2, C93-617-2 (01/2013)

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2 : guidelines for the use
    1/1/2013 - Paper - French - AFNOR
    Learn More
    €87.39

  • IEC 60679-3:2012

    IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
    12/14/2012 - PDF - English, French - IEC
    Learn More
    €147.00

  • NF EN 61837-2, C93-628-2 (12/2012)

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2 : ceramic enclosures - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence
    12/1/2012 - Paper - French - AFNOR
    Learn More
    €154.83

  • NF EN 60862-2, C93-631-2 (11/2012)

    Surface acoustic wave (SAW) filters of assessed quality - Part 2 : guidelines for the use - Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité
    11/1/2012 - Paper - French - AFNOR
    Learn More
    €143.80

  • UNE-EN 62575-2:2012

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in November of 2012.)
    11/1/2012 - PDF - English - AENOR
    Learn More
    €68.00

  • BS EN 62575-2:2012

    Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Guidelines for the use
    10/31/2012 - PDF - English - BSI
    Learn More
    €215.67

  • 12/30274095 DC:2012

    BS EN 60679-1 AMD1. Quartz crystal controlled oscillators of assessed quality. Part 1. Generic specification
    10/26/2012 - PDF - English - BSI
    Learn More
    €23.70

  • UNE-EN 61837-1:2012

    Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (Endorsed by AENOR in October of 2012.)
    10/1/2012 - PDF - English - AENOR
    Learn More
    €68.00

  • BS EN 61837-1:2012

    Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Plastic moulded enclosure
    9/30/2012 - PDF - English - BSI
    Learn More
    €215.67

  • UNE-EN 60862-2:2012

    Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in September of 2012.)
    9/1/2012 - PDF - English - AENOR
    Learn More
    €98.00

  • BS EN 60862-2:2012

    Surface acoustic wave (SAW) filters of assessed quality Guidelines for the use
    8/31/2012 - PDF - English - BSI
    Learn More
    €300.99

  • IEC 62575-2:2012

    IEC 62575-2:2012 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
    7/25/2012 - PDF - English, French - IEC
    Learn More
    €147.00

  • IEC 60862-2:2012

    IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
    5/7/2012 - PDF - English, French - IEC
    Learn More
    €315.00

  • DIN IEC/TS 61994-4-2 DIN SPEC 41994-4-2:2012-05

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics (IEC/TS 61994-4-2:2011)
    5/1/2012 - PDF - German - DIN
    Learn More
    €32.60

  • IEC 61837-1:2012

    IEC 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
    4/20/2012 - PDF - English, French - IEC
    Learn More
    €147.00

  • DIN IEC/TS 61994-2 DIN SPEC 41994-2:2012-04

    Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters (IEC/TS 61994-2:2011)
    4/1/2012 - PDF - German - DIN
    Learn More
    €60.30

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