31.080 : Semiconductor devices 31 : Electronics ICS, Published by: IEC

IEC 62047-43:2024

IEC 62047-43:2024 Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
3/19/2024 - PDF - English -
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€132.00

IEC 62047-44:2024

IEC 62047-44:2024 Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
2/22/2024 - PDF - English -
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€132.00

IEC 60749-5:2023

IEC 60749-5:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12/19/2023 - PDF - English, French -
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€46.00

IEC 60749-5:2023 + Redline

IEC 60749-5:2023 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12/19/2023 - PDF - English -
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€60.00

IEC 63287-2:2023

IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
3/29/2023 - PDF - English, French -
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€92.00

IEC 60747-5-16:2023

IEC 60747-5-16:2023 Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
3/28/2023 - PDF - English -
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€132.00

IEC 60747-18-5:2023

IEC 60747-18-5:2023 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
3/16/2023 - PDF - English -
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€92.00

IEC 60747-18-4:2023

IEC 60747-18-4:2023 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
3/16/2023 - PDF - English -
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€92.00

IEC 62951-8:2023

IEC 62951-8:2023 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
1/19/2023 - PDF - English -
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€92.00

IEC 62951-9:2022

IEC 62951-9:2022 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
12/14/2022 - PDF - English -
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€132.00

IEC 63364-1:2022

IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
12/14/2022 - PDF - English, French -
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€92.00

IEC 60747-16-7:2022

IEC 60747-16-7:2022 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
11/29/2022 - PDF - English, French -
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€311.00

IEC 60747-16-8:2022

IEC 60747-16-8:2022 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
11/29/2022 - PDF - English, French -
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€270.00

IEC 61975:2010+AMD1:2016+AMD2:2022 Edition 1.2

IEC 61975:2010+AMD1:2016+AMD2:2022 (Consolidated version) High-voltage direct current (HVDC) installations - System tests
10/24/2022 - PDF - English, French -
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€690.00

IEC 61975:2010/AMD2:2022

IEC 61975:2010/AMD2:2022 Amendment 2 - High-voltage direct current (HVDC) installations - System tests
10/24/2022 - PDF - English, French -
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€23.00

IEC 60749-37:2022

IEC 60749-37:2022 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
10/12/2022 - PDF - English, French -
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€173.00

IEC 60749-37:2022 + Redline

IEC 60749-37:2022 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
10/12/2022 - PDF - English -
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€224.00

IEC TR 63357:2022

IEC TR 63357:2022 Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
10/11/2022 - PDF - English -
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€92.00

IEC 62007-1:2015/AMD1:2022

IEC 62007-1:2015/AMD1:2022 Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
9/22/2022 - PDF - English, French -
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€12.00

IEC 62007-1:2015+AMD1:2022 Edition 3.1

IEC 62007-1:2015+AMD1:2022 (Consolidated version) Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
9/22/2022 - PDF - English, French -
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€385.00

IEC 62047-42:2022

IEC 62047-42:2022 Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
9/16/2022 - PDF - English -
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€173.00

IEC 63068-4:2022

IEC 63068-4:2022 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
7/27/2022 - PDF - English -
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€173.00

IEC 63275-2:2022

IEC 63275-2:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation
5/11/2022 - PDF - English, French -
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€46.00

IEC 60747-5-4:2022

IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
4/27/2022 - PDF - English -
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€270.00

IEC 60749-10:2022

IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
4/27/2022 - PDF - English, French -
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€92.00

IEC 63275-1:2022

IEC 63275-1:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
4/21/2022 - PDF - English, French -
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€92.00

IEC 63284:2022

IEC 63284:2022 Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
4/21/2022 - PDF - English, French -
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€92.00

IEC 60747-5-14:2022

IEC 60747-5-14:2022 Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
3/4/2022 - PDF - English -
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€173.00

IEC 60749-28:2022

IEC 60749-28:2022 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
3/1/2022 - PDF - English, French -
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€311.00

IEC 60749-28:2022 + Redline

IEC 60749-28:2022 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
3/1/2022 - PDF - English -
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€404.00

IEC 63373:2022

IEC 63373:2022 Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
2/10/2022 - PDF - English, French -
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€92.00

IEC 60747-5-15:2022

IEC 60747-5-15:2022 Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy
1/7/2022 - PDF - English -
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€92.00

IEC TR 63378-1:2021

IEC TR 63378-1:2021 Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
12/14/2021 - PDF - English -
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€132.00

IEC 60749-39:2021

IEC 60749-39:2021 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
11/29/2021 - PDF - English, French -
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€92.00

IEC 60749-39:2021 + Redline

IEC 60749-39:2021 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
11/29/2021 - PDF - English -
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€120.00

IEC 62830-8:2021

IEC 62830-8:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
10/22/2021 - PDF - English -
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€270.00

IEC TR 60747-5-12:2021

IEC TR 60747-5-12:2021 Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies
10/13/2021 - PDF - English -
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€397.00

IEC 61954:2021

IEC 61954:2021 Static VAR compensators (SVC) - Testing of thyristor valves
10/4/2021 - PDF - English, French -
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€311.00

IEC 61954:2021 + Redline

IEC 61954:2021 (Redline version) Static VAR compensators (SVC) - Testing of thyristor valves
10/4/2021 - PDF - English -
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€404.00

IEC 63244-1:2021

IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
9/14/2021 - PDF - English, French -
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€270.00

IEC 62047-40:2021

IEC 62047-40:2021 Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
9/3/2021 - PDF - English -
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€46.00

IEC 63287-1:2021

IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
8/25/2021 - PDF - English, French -
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€311.00

IEC 62899-503-3:2021

IEC 62899-503-3:2021 Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
8/24/2021 - PDF - English -
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€92.00

IEC 60747-5-6:2021 + Redline

IEC 60747-5-6:2021 (Redline version) Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
7/6/2021 - PDF - English -
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€561.00

IEC 60747-5-6:2021

IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
7/6/2021 - PDF - English -
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€431.00

IEC 60747-8:2010/AMD1:2021

IEC 60747-8:2010/AMD1:2021 Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
6/25/2021 - PDF - English -
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€46.00

IEC 60747-8:2010+AMD1:2021 Edition 3.1

IEC 60747-8:2010+AMD1:2021 (Consolidated version) Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
6/25/2021 - PDF - English -
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€558.00

IEC 62047-38:2021

IEC 62047-38:2021 Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection
6/23/2021 - PDF - English -
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€92.00

IEC 62047-41:2021

IEC 62047-41:2021 Semiconductor devices - Micro-electromechanical devices - Part 41: RF MEMS circulators and isolators
6/15/2021 - PDF - English, French -
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€270.00

IEC 60747-5-13:2021

IEC 60747-5-13:2021 Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
6/15/2021 - PDF - English -
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€132.00

IEC TS 60747-19-2:2021

IEC TS 60747-19-2:2021 Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
5/21/2021 - PDF - English -
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€132.00

IEC 63229:2021

IEC 63229:2021 Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
4/7/2021 - PDF - English -
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€173.00

IEC 62830-7:2021

IEC 62830-7:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 7: Linear sliding mode triboelectric energy harvesting
3/3/2021 - PDF - English, French -
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€270.00

IEC 60747-14-11:2021

IEC 60747-14-11:2021 Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
3/3/2021 - PDF - English -
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€173.00

IEC 62830-5:2021

IEC 62830-5:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
1/21/2021 - PDF - English, French -
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€92.00

IEC 60747-17:2020

IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
9/21/2020 - PDF - English -
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€345.00

IEC 60747-17:2020

IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
9/21/2020 - PDF - English, French -
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€345.00

IEC 60749-20:2020 + Redline

IEC 60749-20:2020 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
8/31/2020 - PDF - English -
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€284.00

IEC 60749-20:2020

IEC 60749-20:2020 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
8/31/2020 - PDF - English, French -
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€219.00

IEC 60749-30:2020

IEC 60749-30:2020 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
8/17/2020 - PDF - English, French -
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€92.00

IEC 60749-30:2020 + Redline

IEC 60749-30:2020 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
8/17/2020 - PDF - English -
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€120.00

IEC 60749-41:2020

IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
7/22/2020 - PDF - English, French -
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€173.00

IEC 60747-5-5:2020

IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
7/20/2020 - PDF - English, French -
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€345.00

IEC 60747-5-5:2020

IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
7/20/2020 - PDF - English -
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€345.00

IEC 62373-1:2020

IEC 62373-1:2020 Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
7/15/2020 - PDF - English, French -
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€173.00

IEC 60747-16-5:2013+AMD1:2020 Edition 1.1

IEC 60747-16-5:2013+AMD1:2020 (Consolidated version) Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English, French -
Learn More

€443.00

IEC 60747-16-5:2013+AMD1:2020 Edition 1.1

IEC 60747-16-5:2013+AMD1:2020 (Consolidated version) Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English -
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€443.00

IEC 60749-15:2020

IEC 60749-15:2020 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
7/14/2020 - PDF - English, French -
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€46.00

IEC 60749-15:2020 + Redline

IEC 60749-15:2020 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
7/14/2020 - PDF - English -
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€60.00

IEC 60747-16-5:2013/AMD1:2020

IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English, French -
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€23.00

IEC 60747-16-5:2013/AMD1:2020

IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English -
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€23.00

IEC 63068-3:2020

IEC 63068-3:2020 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
7/13/2020 - PDF - English, French -
Learn More

€219.00

IEC 62899-503-1:2020

IEC 62899-503-1:2020 Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
5/27/2020 - PDF - English -
Learn More

€92.00

IEC 62384:2020

IEC 62384:2020 DC or AC supplied electronic controlgear for LED modules - Performance requirements
5/13/2020 - PDF - English, French -
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€92.00

IEC 61643-341:2020

IEC 61643-341:2020 Components for low-voltage surge protection - Part 341: Performance requirements and test circuits for thyristor surge suppressors (TSS)
5/13/2020 - PDF - English, French -
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€397.00

IEC 62384:2020 + Redline

IEC 62384:2020 (Redline version) DC or AC supplied electronic controlgear for LED modules - Performance requirements
5/13/2020 - PDF - English -
Learn More

€120.00

IEC 62047-37:2020

IEC 62047-37:2020 Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
4/28/2020 - PDF - English, French -
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€132.00

IEC 60191-2:1966/AMD21:2020

IEC 60191-2:1966/AMD21:2020 Amendment 21 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
2/13/2020 - PDF - English -
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€46.00

IEC 60747-18-2:2020

IEC 60747-18-2:2020 Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
2/7/2020 - PDF - English -
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€132.00

IEC 62779-4:2020

IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
2/7/2020 - PDF - English, French -
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€132.00

IEC 60747-5-11:2019

IEC 60747-5-11:2019 Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
12/11/2019 - PDF - English -
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€92.00

IEC 60747-5-10:2019

IEC 60747-5-10:2019 Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
12/11/2019 - PDF - English -
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€92.00

IEC 60747-18-3:2019

IEC 60747-18-3:2019 Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
12/11/2019 - PDF - English -
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€173.00

IEC 60747-5-9:2019

IEC 60747-5-9:2019 Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
12/11/2019 - PDF - English -
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€132.00

IEC 62047-35:2019

IEC 62047-35:2019 Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices
11/22/2019 - PDF - English, French -
Learn More

€173.00

IEC 60747-19-1:2019

IEC 60747-19-1:2019 Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors
11/22/2019 - PDF - English -
Learn More

€173.00

IEC 60747-14-10:2019

IEC 60747-14-10:2019 Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
11/13/2019 - PDF - English, French -
Learn More

€270.00

IEC 60747-9:2019

IEC 60747-9:2019 Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
11/13/2019 - PDF - English, French -
Learn More

€397.00

IEC 60747-5-8:2019

IEC 60747-5-8:2019 Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
11/13/2019 - PDF - English, French -
Learn More

€132.00

IEC 60050-523:2018/AMD1:2019

IEC 60050-523:2018/AMD1:2019 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical systems (MEMS)
10/17/2019 - PDF - English, French -
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€12.00

IEC 60747-7:2010+AMD1:2019 Edition 3.1

IEC 60747-7:2010+AMD1:2019 (Consolidated version) Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
9/23/2019 - PDF - English, French -
Learn More

€558.00

IEC 60747-7:2010/AMD1:2019

IEC 60747-7:2010/AMD1:2019 Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
9/23/2019 - PDF - English, French -
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€12.00

IEC 62830-6:2019

IEC 62830-6:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
7/25/2019 - PDF - English -
Learn More

€173.00

IEC 60749-20-1:2019 + Redline

IEC 60749-20-1:2019 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
6/26/2019 - PDF - English -
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€404.00

IEC 60749-20-1:2019

IEC 60749-20-1:2019 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
6/26/2019 - PDF - English, French -
Learn More

€311.00

IEC 60747-16-6:2019

IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
6/26/2019 - PDF - English, French -
Learn More

€173.00

IEC 60747-18-1:2019

IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
5/20/2019 - PDF - English -
Learn More

€219.00

IEC 63150-1:2019

IEC 63150-1:2019 Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
5/10/2019 - PDF - English, French -
Learn More

€270.00

IEC 62951-6:2019

IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
5/6/2019 - PDF - English, French -
Learn More

€173.00

IEC 62951-2:2019

IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
4/17/2019 - PDF - English, French -
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€46.00

IEC 60749-18:2019 + Redline

IEC 60749-18:2019 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
4/10/2019 - PDF - English -
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€224.00

IEC 60749-18:2019

IEC 60749-18:2019 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
4/10/2019 - PDF - English, French -
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€173.00

IEC 62047-33:2019

IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
4/5/2019 - PDF - English -
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€173.00

IEC 62047-34:2019

IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
4/5/2019 - PDF - English -
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€92.00

IEC 62047-31:2019

IEC 62047-31:2019 Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
4/5/2019 - PDF - English -
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€92.00

IEC 62047-36:2019

IEC 62047-36:2019 Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
4/5/2019 - PDF - English -
Learn More

€92.00

IEC 60749-17:2019

IEC 60749-17:2019 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
3/28/2019 - PDF - English, French -
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€46.00

IEC 62951-7:2019

IEC 62951-7:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
2/27/2019 - PDF - English, French -
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€92.00

IEC 62951-4:2019

IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
2/27/2019 - PDF - English, French -
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€92.00

IEC 62951-5:2019

IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
2/27/2019 - PDF - English, French -
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€132.00

IEC 62830-4:2019

IEC 62830-4:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
2/27/2019 - PDF - English, French -
Learn More

€270.00

IEC 63068-2:2019

IEC 63068-2:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
1/30/2019 - PDF - English -
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€173.00

IEC 63068-1:2019

IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
1/30/2019 - PDF - English -
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€173.00

IEC 62047-32:2019

IEC 62047-32:2019 Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
1/24/2019 - PDF - English, French -
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€132.00

IEC 60050-521:2002/AMD2:2018

IEC 60050-521:2002/AMD2:2018 Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
12/6/2018 - PDF - English, French -
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€12.00

IEC 60050-523:2018

IEC 60050-523:2018 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
12/6/2018 - PDF - English, French -
Learn More

€173.00

IEC 62951-3:2018

IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
11/7/2018 - PDF - English -
Learn More

€173.00

IEC 62969-4:2018

IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
6/18/2018 - PDF - English, French -
Learn More

€132.00

IEC 62969-3:2018

IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
5/7/2018 - PDF - English, French -
Learn More

€173.00

IEC 60191-2:1966/AMD20:2018

IEC 60191-2:1966/AMD20:2018 Amendment 20 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
4/12/2018 - PDF - English -
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€92.00

IEC 60191-4:2013/AMD1:2018

IEC 60191-4:2013/AMD1:2018 Amendment 1 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
3/27/2018 - PDF - English, French -
Learn More

€92.00

IEC 60191-4:2013+AMD1:2018 Edition 3.1

IEC 60191-4:2013+AMD1:2018 (Consolidated version) Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
3/27/2018 - PDF - English, French -
Learn More

€345.00

IEC 62031:2018 + Redline

IEC 62031:2018 (Redline version) LED modules for general lighting - Safety specifications
3/8/2018 - PDF - English -
Learn More

€224.00

IEC 62969-2:2018

IEC 62969-2:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
3/8/2018 - PDF - English, French -
Learn More

€46.00

IEC 62031:2018

IEC 62031:2018 LED modules for general lighting - Safety specifications
3/8/2018 - PDF - English, French -
Learn More

€173.00

IEC 60749-13:2018

IEC 60749-13:2018 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
2/15/2018 - PDF - English, French -
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€92.00

IEC 60191-1:2018

IEC 60191-1:2018 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
1/23/2018 - PDF - English, French -
Learn More

€270.00

IEC 60191-1:2018

IEC 60191-1:2018 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
1/23/2018 - PDF - English -
Learn More

€270.00

IEC 60749-26:2018

IEC 60749-26:2018 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
1/15/2018 - PDF - English, French -
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€345.00

IEC 60749-12:2017

IEC 60749-12:2017 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
12/13/2017 - PDF - English, French -
Learn More

€23.00

IEC 62969-1:2017

IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
12/13/2017 - PDF - English -
Learn More

€92.00

IEC 62969-1:2017

IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
12/13/2017 - PDF - English, French -
Learn More

€92.00

IEC 62047-29:2017

IEC 62047-29:2017 Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
11/22/2017 - PDF - English -
Learn More

€92.00

IEC TR 63133:2017

IEC TR 63133:2017 Semiconductor devices - Scan based ageing level estimation for semiconductor devices
10/11/2017 - PDF - English -
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€132.00

IEC 62047-30:2017

IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
9/15/2017 - PDF - English -
Learn More

€132.00

IEC 60050-521:2002/AMD1:2017

IEC 60050-521:2002/AMD1:2017 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
8/30/2017 - PDF - English, French -
Learn More

€12.00

IEC 62880-1:2017

IEC 62880-1:2017 Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
8/23/2017 - PDF - English -
Learn More

€173.00

IEC 60747-16-3:2002/AMD2:2017

IEC 60747-16-3:2002/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English, French -
Learn More

€12.00

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English -
Learn More

€385.00

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English, French -
Learn More

€345.00

IEC 60747-16-4:2004/AMD2:2017

IEC 60747-16-4:2004/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English, French -
Learn More

€12.00

IEC 60747-16-4:2004/AMD2:2017

IEC 60747-16-4:2004/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English -
Learn More

€12.00

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English, French -
Learn More

€385.00

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English -
Learn More

€345.00

IEC 60747-16-3:2002/AMD2:2017

IEC 60747-16-3:2002/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English -
Learn More

€12.00

IEC 62951-1:2017

IEC 62951-1:2017 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
4/10/2017 - PDF - English -
Learn More

€92.00

IEC 62830-3:2017

IEC 62830-3:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
3/28/2017 - PDF - English, French -
Learn More

€173.00

IEC 60749-9:2017

IEC 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
3/3/2017 - PDF - English -
Learn More

€46.00

IEC 60749-4:2017

IEC 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
3/3/2017 - PDF - English -
Learn More

€46.00

IEC 60749-6:2017

IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
3/3/2017 - PDF - English, French -
Learn More

€23.00

IEC 62830-1:2017

IEC 62830-1:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
3/3/2017 - PDF - English, French -
Learn More

€173.00

IEC 60749-3:2017

IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
3/3/2017 - PDF - English, French -
Learn More

€46.00

IEC 60749-6:2017

IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
3/3/2017 - PDF - English -
Learn More

€23.00

IEC 60749-4:2017

IEC 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
3/3/2017 - PDF - English, French -
Learn More

€46.00

IEC 60749-3:2017

IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
3/3/2017 - PDF - English -
Learn More

€46.00

IEC 60749-9:2017

IEC 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
3/3/2017 - PDF - English, French -
Learn More

€46.00

IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 Edition 1.2

IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
2/15/2017 - PDF - English, French -
Learn More

€610.00

IEC 60747-16-1:2001/AMD2:2017

IEC 60747-16-1:2001/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
2/15/2017 - PDF - English, French -
Learn More

€23.00

IEC 60747-4:2007+AMD1:2017 Edition 2.1

IEC 60747-4:2007+AMD1:2017 (Consolidated version) Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
1/30/2017 - PDF - English, French -
Learn More

€610.00

IEC 60747-4:2007/AMD1:2017

IEC 60747-4:2007/AMD1:2017 Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
1/30/2017 - PDF - English, French -
Learn More

€23.00

IEC 62047-27:2017

IEC 62047-27:2017 Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
1/20/2017 - PDF - English -
Learn More

€92.00

IEC 62047-28:2017

IEC 62047-28:2017 Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
1/20/2017 - PDF - English -
Learn More

€132.00

IEC 62830-2:2017

IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
1/20/2017 - PDF - English, French -
Learn More

€92.00

IEC 60191-6-13:2016

IEC 60191-6-13:2016 Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)
9/27/2016 - PDF - English, French -
Learn More

€132.00

IEC 61975:2010+AMD1:2016 Edition 1.1

IEC 61975:2010+AMD1:2016 (Consolidated version) High-voltage direct current (HVDC) installations - System tests
9/12/2016 - PDF - English, French -
Learn More

€690.00

IEC 61975:2010/AMD1:2016

IEC 61975:2010/AMD1:2016 Amendment 1 - High-voltage direct current (HVDC) installations - System tests
9/12/2016 - PDF - English, French -
Learn More

€132.00

IEC 62047-25:2016

IEC 62047-25:2016 Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area
8/29/2016 - PDF - English, French -
Learn More

€173.00

IEC 60749-44:2016

IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
7/21/2016 - PDF - English, French -
Learn More

€173.00

IEC 62779-3:2016

IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
4/26/2016 - PDF - English, French -
Learn More

€92.00

IEC 60747-2:2016

IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
4/13/2016 - PDF - English, French -
Learn More

€311.00

IEC 60747-6:2016

IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
4/13/2016 - PDF - English, French -
Learn More

€460.00

IEC 60747-5-7:2016

IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
2/23/2016 - PDF - English, French -
Learn More

€173.00

IEC 62779-1:2016

IEC 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
2/18/2016 - PDF - English, French -
Learn More

€132.00

IEC 62779-2:2016

IEC 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
2/18/2016 - PDF - English, French -
Learn More

€132.00

IEC 62047-26:2016

IEC 62047-26:2016 Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
1/7/2016 - PDF - English, French -
Learn More

€219.00

IEC 62047-1:2016

IEC 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
1/6/2016 - PDF - English, French -
Learn More

€270.00

IEC 62007-1:2015

IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
3/30/2015 - PDF - English, French -
Learn More

€270.00

IEC 62047-17:2015

IEC 62047-17:2015 Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
3/5/2015 - PDF - English, French -
Learn More

€219.00

IEC 62047-16:2015

IEC 62047-16:2015 Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
3/5/2015 - PDF - English, French -
Learn More

€46.00

IEC 60749-42:2014

IEC 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
8/12/2014 - PDF - English, French -
Learn More

€23.00

IEC 62047-20:2014

IEC 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
6/26/2014 - PDF - English, French -
Learn More

€345.00

IEC 62047-22:2014

IEC 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
6/19/2014 - PDF - English, French -
Learn More

€46.00

IEC 62047-21:2014

IEC 62047-21:2014 Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
6/19/2014 - PDF - English, French -
Learn More

€92.00

IEC 60191-4:2013

IEC 60191-4:2013 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
10/10/2013 - PDF - English, French -
Learn More

€173.00

IEC 62483:2013

IEC 62483:2013 Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
9/25/2013 - PDF - English, French -
Learn More

€311.00

IEC 62047-18:2013

IEC 62047-18:2013 Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
7/17/2013 - PDF - English, French -
Learn More

€92.00

IEC 62047-11:2013

IEC 62047-11:2013 Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
7/17/2013 - PDF - English, French -
Learn More

€132.00

IEC 62047-19:2013

IEC 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
7/17/2013 - PDF - English, French -
Learn More

€219.00

IEC 60747-3:2013

IEC 60747-3:2013 Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes
7/9/2013 - PDF - English, French -
Learn More

€270.00

IEC 60747-16-5:2013

IEC 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
6/19/2013 - PDF - English, French -
Learn More

€311.00

IEC 60191-6-22:2012

IEC 60191-6-22:2012 Mechanical standardization of semiconductor devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silicon Fine-pitch Land Grid Array (S-FBGA and S-FLGA)
12/11/2012 - PDF - English, French -
Learn More

€132.00