31.080.99 : Other semiconductor devices

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  • DIN EN IEC 60747-16-8:2024-04

    Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (IEC 60747-16-8:2022), German version EN IEC 60747-16-8:2023
    4/1/2024 - PDF - German - DIN
    Learn More
    €120.84

  • DIN EN IEC 60747-16-7:2024-04

    Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 60747-16-7:2022), German version EN IEC 60747-16-7:2023
    4/1/2024 - PDF - German - DIN
    Learn More
    €131.96

  • BS IEC 62047-43:2024

    Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical
    3/22/2024 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62047-44:2024

    Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive
    2/29/2024 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62047-44:2024

    IEC 62047-44:2024 Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
    2/22/2024 - PDF - English - IEC
    Learn More
    €132.00

  • BS IEC 63229:2021

    Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
    8/31/2023 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 62830-7:2021

    Semiconductor devices. devices for energy harvesting and generation Linear sliding mode triboelectric
    7/7/2023 - PDF - English - BSI
    Learn More
    €293.00

  • BS EN IEC 60747-16-7:2022

    Semiconductor devices Microwave integrated circuits. Attenuators
    5/25/2023 - PDF - English - BSI
    Learn More
    €331.00

  • BS EN IEC 60747-16-8:2022

    Semiconductor devices Microwave integrated circuits. Limiters
    5/25/2023 - PDF - English - BSI
    Learn More
    €293.00

  • BS EN IEC 63287-2:2023

    Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
    5/23/2023 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 63150-1:2019

    Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary random mechanical vibrations
    4/13/2023 - PDF - English - BSI
    Learn More
    €293.00

  • BS IEC 62047-37:2020

    Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
    4/5/2023 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 60747-5-16:2023

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage GaN-based light diodes based on photocurrent spectroscopy
    4/5/2023 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 60747-5-16:2023

    IEC 60747-5-16:2023 Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
    3/28/2023 - PDF - English - IEC
    Learn More
    €132.00

  • BS IEC 60747-18-4:2023

    Semiconductor devices bio sensors. Evaluation method of noise characteristics lens-free CMOS photonic array sensors
    3/27/2023 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 60747-18-5:2023

    Semiconductor devices bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle
    3/23/2023 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 60747-18-4:2023

    IEC 60747-18-4:2023 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
    3/16/2023 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 60747-18-5:2023

    IEC 60747-18-5:2023 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
    3/16/2023 - PDF - English - IEC
    Learn More
    €92.00

  • BS EN IEC 63364-1:2022

    Semiconductor devices. devices for IoT system Test method of sound variation detection
    2/2/2023 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62951-8:2023

    Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, stability of flexible resistive memory
    1/24/2023 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62951-8:2023

    IEC 62951-8:2023 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
    1/19/2023 - PDF - English - IEC
    Learn More
    €92.00

  • NF EN IEC 60747-16-7, C96-016-7 (01/2023)

    Dispositifs à semiconducteurs - Partie 16-7 : circuits intégrés hyperfréquences - Atténuateurs
    1/1/2023 - Paper - French - AFNOR
    Learn More
    €141.33

  • NF EN IEC 60747-16-8, C96-016-8 (01/2023)

    Dispositifs à semiconducteurs - Partie 16-8 : circuits intégrés hyperfréquences - Limiteurs
    1/1/2023 - Paper - French - AFNOR
    Learn More
    €127.67

  • BS IEC 62951-9:2022

    Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor resistor (1T1R) resistive memory cells
    12/20/2022 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 63364-1:2022

    IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
    12/14/2022 - PDF - English, French - IEC
    Learn More
    €92.00

  • IEC 62951-9:2022

    IEC 62951-9:2022 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
    12/14/2022 - PDF - English - IEC
    Learn More
    €132.00

  • IEC 60747-16-7:2022

    IEC 60747-16-7:2022 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
    11/29/2022 - PDF - English, French - IEC
    Learn More
    €311.00

  • IEC 60747-16-8:2022

    IEC 60747-16-8:2022 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
    11/29/2022 - PDF - English, French - IEC
    Learn More
    €270.00

  • BS IEC 63284:2022

    Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
    11/11/2022 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62047-42:2022

    Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics piezoelectric MEMS cantilever
    10/24/2022 - PDF - English - BSI
    Learn More
    €250.00

  • UNE-EN IEC 60747-16-7:2023

    Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (Endorsed by Asociación Española de Normalización in February of 2023.)
    10/12/2022 - PDF - English - AENOR
    Learn More
    €81.00

  • UNE-EN IEC 60747-16-8:2023

    Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)
    10/12/2022 - PDF - English - AENOR
    Learn More
    €76.00

  • UNE-EN IEC 63364-1:2023

    Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
    10/12/2022 - PDF - English - AENOR
    Learn More
    €60.00

  • IEC TR 63357:2022

    IEC TR 63357:2022 Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
    10/11/2022 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 62047-42:2022

    IEC 62047-42:2022 Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
    9/16/2022 - PDF - English - IEC
    Learn More
    €173.00

  • BS IEC 63068-4:2022

    Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure identifying and evaluating using a combined method optical inspection photoluminescence
    9/7/2022 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 63068-4:2022

    IEC 63068-4:2022 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
    7/27/2022 - PDF - English - IEC
    Learn More
    €173.00

  • BS IEC 60747-5-15:2022

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on electroreflectance spectroscopy
    7/19/2022 - PDF - English - BSI
    Learn More
    €180.00

  • BS EN IEC 63373:2022

    Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
    6/17/2022 - PDF - English - BSI
    Learn More
    €180.00

  • UNE-EN IEC 63373:2022

    Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (Endorsed by Asociación Española de Normalización in May of 2022.)
    5/1/2022 - PDF - English - AENOR
    Learn More
    €64.00

  • BS EN IEC 62031:2020+A11:2021

    LED modules for general lighting. Safety specifications
    3/31/2022 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 60747-5-14:2022

    IEC 60747-5-14:2022 Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
    3/4/2022 - PDF - English - IEC
    Learn More
    €173.00

  • IEC 63373:2022

    IEC 63373:2022 Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
    2/10/2022 - PDF - English, French - IEC
    Learn More
    €92.00

  • IEC 60747-5-15:2022

    IEC 60747-5-15:2022 Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy
    1/7/2022 - PDF - English - IEC
    Learn More
    €92.00

  • UNE-EN IEC 63244-1:2021

    Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications (Endorsed by Asociación Española de Normalización in December of 2021.)
    12/1/2021 - PDF - English - AENOR
    Learn More
    €76.00

  • PD IEC TR 60747-5-12:2021

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
    11/19/2021 - PDF - English - BSI
    Learn More
    €377.00

  • BS EN IEC 63244-1:2021

    Semiconductor devices. devices for wireless power transfer and charging General requirements specifications
    11/5/2021 - PDF - English - BSI
    Learn More
    €293.00

  • BS IEC 62830-8:2021

    Semiconductor devices. devices for energy harvesting and generation Test evaluation methods of flexible stretchable supercapacitors use in low power electronics
    11/4/2021 - PDF - English - BSI
    Learn More
    €293.00

  • IEC 62830-8:2021

    IEC 62830-8:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
    10/22/2021 - PDF - English - IEC
    Learn More
    €270.00

  • IEC TR 60747-5-12:2021

    IEC TR 60747-5-12:2021 Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies
    10/13/2021 - PDF - English - IEC
    Learn More
    €397.00

  • BS IEC 62047-40:2021

    Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
    9/14/2021 - PDF - English - BSI
    Learn More
    €151.00

  • IEC 63244-1:2021

    IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
    9/14/2021 - PDF - English, French - IEC
    Learn More
    €270.00

  • IEC 62047-40:2021

    IEC 62047-40:2021 Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
    9/3/2021 - PDF - English - IEC
    Learn More
    €46.00

  • DIN EN IEC 60747-16-6:2021-08

    Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 60747-16-6:2019), German version EN IEC 60747-16-6:2019
    8/1/2021 - PDF - German - DIN
    Learn More
    €110.00

  • DIN EN 60747-16-5:2021-08

    Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013 + A1:2020 + COR1:2020), German version EN 60747-16-5:2013 + A1:2020.
    8/1/2021 - PDF - German - DIN
    Learn More
    €131.96

  • BS IEC 62047-38:2021

    Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
    7/7/2021 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 60747-5-6:2021

    IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
    7/6/2021 - PDF - English - IEC
    Learn More
    €431.00

  • IEC 60747-5-6:2021 + Redline

    IEC 60747-5-6:2021 (Redline version) Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
    7/6/2021 - PDF - English - IEC
    Learn More
    €561.00

  • PD IEC TS 60747-19-2:2021

    Semiconductor devices Smart sensors. Indication of specifications sensors and power supplies to drive smart for low operation
    7/2/2021 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 60747-5-13:2021

    Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
    6/28/2021 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62047-41:2021

    Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
    6/28/2021 - PDF - English - BSI
    Learn More
    €293.00

  • IEC 62047-38:2021

    IEC 62047-38:2021 Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection
    6/23/2021 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 62047-41:2021

    IEC 62047-41:2021 Semiconductor devices - Micro-electromechanical devices - Part 41: RF MEMS circulators and isolators
    6/15/2021 - PDF - English, French - IEC
    Learn More
    €270.00

  • IEC 60747-5-13:2021

    IEC 60747-5-13:2021 Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
    6/15/2021 - PDF - English - IEC
    Learn More
    €132.00

  • IEC TS 60747-19-2:2021

    IEC TS 60747-19-2:2021 Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
    5/21/2021 - PDF - English - IEC
    Learn More
    €132.00

  • BS IEC 62047-35:2019

    Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical
    4/20/2021 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 63229:2021

    IEC 63229:2021 Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
    4/7/2021 - PDF - English - IEC
    Learn More
    €173.00

  • IEC 62830-7:2021

    IEC 62830-7:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 7: Linear sliding mode triboelectric energy harvesting
    3/3/2021 - PDF - English, French - IEC
    Learn More
    €270.00

  • BS IEC 62830-5:2021

    Semiconductor devices. devices for energy harvesting and generation Test method measuring generated power from flexible thermoelectric
    2/3/2021 - PDF - English - BSI
    Learn More
    €180.00

  • BS EN IEC 60747-17:2020

    Semiconductor devices Magnetic and capacitive coupler for basic reinforced insulation
    2/3/2021 - PDF - English - BSI
    Learn More
    €348.00

  • IEC 62830-5:2021

    IEC 62830-5:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
    1/21/2021 - PDF - English, French - IEC
    Learn More
    €92.00

  • UNE-EN IEC 60747-17:2020

    Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in January of 2021.)
    1/1/2021 - PDF - English - AENOR
    Learn More
    €95.00

  • NF EN IEC 60747-17, C96-047 (11/2020)

    Semiconductor devices - Part 17 : magnetic and capacitive coupler for basic and reinforced insulation
    11/1/2020 - Paper - French - AFNOR
    Learn More
    €153.67

  • BS EN IEC 60904-4:2020

    Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
    10/19/2020 - PDF - English - BSI
    Learn More
    €293.00

  • UNE-EN IEC 62384:2020

    DC or AC supplied electronic controlgear for LED modules - Performance requirements
    10/7/2020 - PDF - Spanish - AENOR
    Learn More
    €68.00

  • UNE-EN IEC 62384:2020

    DC or AC supplied electronic controlgear for LED modules - Performance requirements
    10/7/2020 - PDF - English - AENOR
    Learn More
    €81.60

  • UNE-EN IEC 60747-5-5:2020

    Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
    10/1/2020 - PDF - English - AENOR
    Learn More
    €96.00

  • BS EN 60747-16-5:2013+A1:2020

    Semiconductor devices Microwave integrated circuits. Oscillators
    9/24/2020 - PDF - English - BSI
    Learn More
    €331.00

  • IEC 60747-17:2020

    IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
    9/21/2020 - PDF - English - IEC
    Learn More
    €345.00

  • IEC 60747-17:2020

    IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
    9/21/2020 - PDF - English, French - IEC
    Learn More
    €345.00

  • BS IEC 63068-3:2020

    Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using photoluminescence
    7/24/2020 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 62047-27:2017

    Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
    7/22/2020 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62047-28:2017

    Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting
    7/22/2020 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62830-1:2017

    Semiconductor devices. devices for energy harvesting and generation Vibration based piezoelectric
    7/21/2020 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 60747-16-5:2013+AMD1:2020 Edition 1.1

    IEC 60747-16-5:2013+AMD1:2020 (Consolidated version) Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
    7/14/2020 - PDF - English - IEC
    Learn More
    €443.00

  • IEC 60747-16-5:2013+AMD1:2020 Edition 1.1

    IEC 60747-16-5:2013+AMD1:2020 (Consolidated version) Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
    7/14/2020 - PDF - English, French - IEC
    Learn More
    €443.00

  • BS EN IEC 62384:2020

    DC or AC supplied electronic controlgear for LED modules. Performance requirements
    7/13/2020 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 63068-3:2020

    IEC 63068-3:2020 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
    7/13/2020 - PDF - English, French - IEC
    Learn More
    €219.00

  • UNE-EN IEC 62031:2020

    LED modules for general lighting - Safety specifications
    6/24/2020 - PDF - Spanish - AENOR
    Learn More
    €73.00

  • UNE-EN IEC 62031:2020

    LED modules for general lighting - Safety specifications
    6/24/2020 - PDF - English - AENOR
    Learn More
    €87.60

  • IEC 62384:2020

    IEC 62384:2020 DC or AC supplied electronic controlgear for LED modules - Performance requirements
    5/13/2020 - PDF - English, French - IEC
    Learn More
    €92.00

  • IEC 62384:2020 + Redline

    IEC 62384:2020 (Redline version) DC or AC supplied electronic controlgear for LED modules - Performance requirements
    5/13/2020 - PDF - English - IEC
    Learn More
    €120.00

  • IEC 62047-37:2020

    IEC 62047-37:2020 Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
    4/28/2020 - PDF - English, French - IEC
    Learn More
    €132.00

  • BS EN IEC 62031:2020

    LED modules for general lighting. Safety specifications
    3/19/2020 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 60747-18-3:2019

    Semiconductor devices bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
    1/14/2020 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 60747-5-11:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents light diodes
    1/14/2020 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 60747-5-10:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on room-temperature reference point
    1/14/2020 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 60747-5-9:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on temperature-dependent electroluminescence
    1/14/2020 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 60747-5-10:2019

    IEC 60747-5-10:2019 Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
    12/11/2019 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 60747-5-9:2019

    IEC 60747-5-9:2019 Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
    12/11/2019 - PDF - English - IEC
    Learn More
    €132.00

  • IEC 60747-5-11:2019

    IEC 60747-5-11:2019 Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
    12/11/2019 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 60747-18-3:2019

    IEC 60747-18-3:2019 Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
    12/11/2019 - PDF - English - IEC
    Learn More
    €173.00

  • BS IEC 60747-19-1:2019

    Semiconductor devices Smart sensors. Control scheme of smart sensors
    11/29/2019 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 60747-5-8:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies light diodes
    11/27/2019 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62047-35:2019

    IEC 62047-35:2019 Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices
    11/22/2019 - PDF - English, French - IEC
    Learn More
    €173.00

  • IEC 60747-19-1:2019

    IEC 60747-19-1:2019 Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors
    11/22/2019 - PDF - English - IEC
    Learn More
    €173.00

  • IEC 60747-5-8:2019

    IEC 60747-5-8:2019 Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
    11/13/2019 - PDF - English, French - IEC
    Learn More
    €132.00

  • UNE-EN IEC 60747-16-6:2019

    Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)
    10/1/2019 - PDF - English - AENOR
    Learn More
    €72.00

  • BS EN IEC 60747-16-6:2019

    Semiconductor devices Microwave integrated circuits. Frequency multipliers
    9/2/2019 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 62830-6:2019

    Semiconductor devices. devices for energy harvesting and generation Test evaluation methods vertical contact mode triboelectric
    8/7/2019 - PDF - English - BSI
    Learn More
    €250.00

  • NF EN IEC 60747-16-6, C96-016-6 (08/2019)

    Semiconductor devices - Part 16-6 : microwave integrated circuits - Frequency multipliers
    8/1/2019 - Paper - French - AFNOR
    Learn More
    €116.50

  • IEC 62830-6:2019

    IEC 62830-6:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
    7/25/2019 - PDF - English - IEC
    Learn More
    €173.00

  • IEC 60747-16-6:2019

    IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
    6/26/2019 - PDF - English, French - IEC
    Learn More
    €173.00

  • BS IEC 60747-18-1:2019

    Semiconductor devices bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
    6/7/2019 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 60747-18-1:2019

    IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
    5/20/2019 - PDF - English - IEC
    Learn More
    €219.00

  • BS IEC 62951-6:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
    5/15/2019 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 63068-1:2019

    Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification
    5/10/2019 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 63150-1:2019

    IEC 63150-1:2019 Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
    5/10/2019 - PDF - English, French - IEC
    Learn More
    €270.00

  • IEC 62951-6:2019

    IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
    5/6/2019 - PDF - English, French - IEC
    Learn More
    €173.00

  • BS IEC 62951-2:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation method for electron mobility, sub-threshold swing, threshold voltage of flexible
    4/30/2019 - PDF - English - BSI
    Learn More
    €151.00

  • BS IEC 62047-36:2019

    Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    4/24/2019 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62047-33:2019

    Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
    4/18/2019 - PDF - English - BSI
    Learn More
    €250.00

  • BS IEC 62047-31:2019

    Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
    4/17/2019 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62951-2:2019

    IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
    4/17/2019 - PDF - English, French - IEC
    Learn More
    €46.00

  • BS IEC 62047-34:2019

    Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    4/16/2019 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62047-31:2019

    IEC 62047-31:2019 Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
    4/5/2019 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 62047-33:2019

    IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
    4/5/2019 - PDF - English - IEC
    Learn More
    €173.00

  • IEC 62047-34:2019

    IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    4/5/2019 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 62047-36:2019

    IEC 62047-36:2019 Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    4/5/2019 - PDF - English - IEC
    Learn More
    €92.00

  • BS IEC 62951-7:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Test method for characterizing the barrier performance of thin film encapsulation flexible organic
    3/6/2019 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62951-5:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
    3/5/2019 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62951-4:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Fatigue evaluation for flexible conductive thin film on the substrate
    3/5/2019 - PDF - English - BSI
    Learn More
    €180.00

  • BS IEC 62830-4:2019

    Semiconductor devices. devices for energy harvesting and generation Test evaluation methods flexible piezoelectric
    3/5/2019 - PDF - English - BSI
    Learn More
    €293.00

  • IEC 62830-4:2019

    IEC 62830-4:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €270.00

  • IEC 62951-4:2019

    IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €92.00

  • IEC 62951-5:2019

    IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €132.00

  • IEC 62951-7:2019

    IEC 62951-7:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €92.00

  • BS IEC 63068-2:2019

    Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using optical inspection
    2/8/2019 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 63068-1:2019

    IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
    1/30/2019 - PDF - English - IEC
    Learn More
    €173.00

  • IEC 63068-2:2019

    IEC 63068-2:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
    1/30/2019 - PDF - English - IEC
    Learn More
    €173.00

  • BS IEC 62047-32:2019

    Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
    1/29/2019 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62047-32:2019

    IEC 62047-32:2019 Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
    1/24/2019 - PDF - English, French - IEC
    Learn More
    €132.00

  • IEC 60050-523:2018

    IEC 60050-523:2018 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
    12/6/2018 - PDF - English, French - IEC
    Learn More
    €173.00

  • BS IEC 62951-3:2018

    Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
    11/15/2018 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 62951-3:2018

    IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
    11/7/2018 - PDF - English - IEC
    Learn More
    €173.00

  • UNE-EN IEC 62969-4:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)
    10/1/2018 - PDF - English - AENOR
    Learn More
    €68.00

  • BS EN IEC 62969-4:2018

    Semiconductor devices. interface for automotive vehicles Evaluation method of data vehicle sensors
    8/30/2018 - PDF - English - BSI
    Learn More
    €250.00

  • UNE-EN IEC 62969-3:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in August of 2018.)
    8/1/2018 - PDF - English - AENOR
    Learn More
    €71.00

  • BS EN IEC 62969-3:2018

    Semiconductor devices. interface for automotive vehicles Shock driven piezoelectric energy harvesting vehicle sensors
    6/28/2018 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 62969-4:2018

    IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
    6/18/2018 - PDF - English, French - IEC
    Learn More
    €132.00

  • UNE-EN IEC 62969-2:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (Endorsed by Asociación Española de Normalización in June of 2018.)
    6/1/2018 - PDF - English - AENOR
    Learn More
    €62.00

  • IEC 62969-3:2018

    IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
    5/7/2018 - PDF - English, French - IEC
    Learn More
    €173.00

  • BS IEC 62951-1:2017

    Semiconductor devices. Flexible and stretchable semiconductor devices Bending test method for conductive thin films on flexible substrates
    5/4/2018 - PDF - English - BSI
    Learn More
    €180.00

  • BS EN IEC 62969-2:2018

    Semiconductor devices. interface for automotive vehicles Efficiency evaluation methods of wireless power transmission using resonance sensors
    5/2/2018 - PDF - English - BSI
    Learn More
    €180.00

  • BS EN 60747-16-1:2002+A2:2017

    Semiconductor devices Microwave integrated circuits. Amplifiers
    4/10/2018 - PDF - English - BSI
    Learn More
    €377.00

  • DIN EN 60747-16-4:2018-04

    Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009 + A2:2017), German version EN 60747-16-4:2004 + A1:2011 + A2:2017.
    4/1/2018 - PDF - German - DIN
    Learn More
    €110.00

  • DIN EN 60747-16-3:2018-04

    Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017), German version EN 60747-16-3:2002 + A1:2009 + A2:2017.
    4/1/2018 - PDF - German - DIN
    Learn More
    €136.82

  • BS EN 60747-16-4:2004+A2:2017

    Semiconductor devices Microwave integrated circuits. Switches
    3/16/2018 - PDF - English - BSI
    Learn More
    €331.00

  • BS IEC 62047-29:2017

    Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
    3/15/2018 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62031:2018

    IEC 62031:2018 LED modules for general lighting - Safety specifications
    3/8/2018 - PDF - English, French - IEC
    Learn More
    €173.00

  • IEC 62969-2:2018

    IEC 62969-2:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
    3/8/2018 - PDF - English, French - IEC
    Learn More
    €46.00

  • IEC 62031:2018 + Redline

    IEC 62031:2018 (Redline version) LED modules for general lighting - Safety specifications
    3/8/2018 - PDF - English - IEC
    Learn More
    €224.00

  • UNE-EN IEC 62969-1:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in March of 2018.)
    3/1/2018 - PDF - English - AENOR
    Learn More
    €63.00

  • BS EN 60747-16-3:2002+A2:2017

    Semiconductor devices Microwave integrated circuits. Frequency converters
    2/23/2018 - PDF - English - BSI
    Learn More
    €348.00

  • BS EN IEC 62969-1:2018

    Semiconductor devices. interface for automotive vehicles General requirements of power vehicle sensors
    2/22/2018 - PDF - English - BSI
    Learn More
    €180.00

  • IEC 62969-1:2017

    IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
    12/13/2017 - PDF - English - IEC
    Learn More
    €92.00

  • IEC 62969-1:2017

    IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
    12/13/2017 - PDF - English, French - IEC
    Learn More
    €92.00

  • IEC 62047-29:2017

    IEC 62047-29:2017 Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
    11/22/2017 - PDF - English - IEC
    Learn More
    €92.00

  • BS IEC 62047-30:2017

    Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics MEMS piezoelectric thin film
    10/9/2017 - PDF - English - BSI
    Learn More
    €250.00

  • DIN EN 60747-16-1:2017-10

    Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 - A1:2007 - A2:2017), German version EN 60747-16-1:2002 + A1:2007 + A2:2017.
    10/1/2017 - PDF - German - DIN
    Learn More
    €158.04

  • DIN EN 62477-1 VDE 0558-477-1:2017-10

    Safety requirements for power electronic converter systems and equipment - Part 1: General (IEC 62477-1:2012 + A1:2016), German version EN 62477-1:2012 + A11:2014 + A1:2017
    10/1/2017 - Paper - German - VDE
    Learn More
    €268.93

  • IEC 62047-30:2017

    IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
    9/15/2017 - PDF - English - IEC
    Learn More
    €132.00

  • IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 Edition 1.2

    IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
    8/16/2017 - PDF - English, French - IEC
    Learn More
    €385.00

  • IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 Edition 1.2

    IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
    8/16/2017 - PDF - English - IEC
    Learn More
    €385.00

  • IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 Edition 1.2

    IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
    8/16/2017 - PDF - English - IEC
    Learn More
    €345.00

  • IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 Edition 1.2

    IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
    8/16/2017 - PDF - English, French - IEC
    Learn More
    €345.00

  • BS IEC 62830-2:2017

    Semiconductor devices. devices for energy harvesting and generation Thermo power based thermoelectric
    8/10/2017 - PDF - English - BSI
    Learn More
    €180.00

  • BS EN 62830-3:2017

    Semiconductor devices. devices for energy harvesting and generation Vibration based electromagnetic
    4/30/2017 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 62951-1:2017

    IEC 62951-1:2017 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
    4/10/2017 - PDF - English - IEC
    Learn More
    €92.00

  • DIN EN 62047-25:2017-04

    Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (IEC 62047-25:2016), German version EN 62047-25:2016
    4/1/2017 - PDF - German - DIN
    Learn More
    €99.35

  • IEC 62830-3:2017

    IEC 62830-3:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
    3/28/2017 - PDF - English, French - IEC
    Learn More
    €173.00

  • JIS C 5630-1:2017

    Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
    3/21/2017 - PDF - Japanese - JSA
    Learn More
    €41.86

  • IEC 62830-1:2017

    IEC 62830-1:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
    3/3/2017 - PDF - English, French - IEC
    Learn More
    €173.00

  • IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 Edition 1.2

    IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
    2/15/2017 - PDF - English, French - IEC
    Learn More
    €610.00

  • IEC 62830-2:2017

    IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
    1/20/2017 - PDF - English, French - IEC
    Learn More
    €92.00

  • IEC 62047-28:2017

    IEC 62047-28:2017 Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
    1/20/2017 - PDF - English - IEC
    Learn More
    €132.00

  • IEC 62047-27:2017

    IEC 62047-27:2017 Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
    1/20/2017 - PDF - English - IEC
    Learn More
    €92.00

  • DIN VDE V 0884-11 VDE V 0884-11:2017-01

    Semiconductor devices - Part 11: Magnetic and capacitive coupler for basic and reinforced isolation
    1/1/2017 - Paper - German - VDE
    Learn More
    €104.79

  • UNE-EN 62047-25:2016

    Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (Endorsed by Asociación Española de Normalización in January of 2017.)
    1/1/2017 - PDF - English - AENOR
    Learn More
    €68.00

  • NF EN 62047-25, C96-050-25 (12/2016)

    Semiconductor devices - Micro-electromechanical devices - Part 25 : silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area
    12/1/2016 - Paper - French - AFNOR
    Learn More
    €103.33

  • BS EN 62047-25:2016

    Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength micro bonding area
    11/30/2016 - PDF - English - BSI
    Learn More
    €250.00

  • IEC 62047-25:2016

    IEC 62047-25:2016 Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area
    8/29/2016 - PDF - English, French - IEC
    Learn More
    €173.00

  • UNE-EN 62047-26:2016

    Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (Endorsed by AENOR in June of 2016.)
    6/1/2016 - PDF - English - AENOR
    Learn More
    €71.00

  • BS EN 62047-26:2016

    Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench needle structures
    5/31/2016 - PDF - English - BSI
    Learn More
    €293.00

  • UNE-EN 62047-1:2016

    Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (Endorsed by AENOR in May of 2016.)
    5/1/2016 - PDF - English - AENOR
    Learn More
    €74.00

  • BS EN 62047-1:2016

    Semiconductor devices. Micro-electromechanical devices Terms and definitions
    4/30/2016 - PDF - English - BSI
    Learn More
    €293.00

  • JIS C 6790:2016

    Load test of a bolt-clamped Langevin vibrator using wattmeter method
    3/22/2016 - PDF - Japanese - JSA
    Learn More
    €25.00

  • IEC 60747-5-7:2016

    IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
    2/23/2016 - PDF - English, French - IEC
    Learn More
    €173.00

  • IEC 62047-26:2016

    IEC 62047-26:2016 Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
    1/7/2016 - PDF - English, French - IEC
    Learn More
    €219.00

  • IEC 62047-1:2016

    IEC 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
    1/6/2016 - PDF - English, French - IEC
    Learn More
    €270.00

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