31.080.99 : Other semiconductor devices 31.080 : Semiconductor devices 31 : Electronics ICS, Published by: IEC

IEC 62047-43:2024

IEC 62047-43:2024 Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
3/19/2024 - PDF - English -
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€132.00

IEC 62047-44:2024

IEC 62047-44:2024 Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
2/22/2024 - PDF - English -
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€132.00

IEC 60747-5-16:2023

IEC 60747-5-16:2023 Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
3/28/2023 - PDF - English -
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€132.00

IEC 60747-18-4:2023

IEC 60747-18-4:2023 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
3/16/2023 - PDF - English -
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€92.00

IEC 60747-18-5:2023

IEC 60747-18-5:2023 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
3/16/2023 - PDF - English -
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€92.00

IEC 62951-8:2023

IEC 62951-8:2023 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
1/19/2023 - PDF - English -
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€92.00

IEC 63364-1:2022

IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
12/14/2022 - PDF - English, French -
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€92.00

IEC 62951-9:2022

IEC 62951-9:2022 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
12/14/2022 - PDF - English -
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€132.00

IEC 60747-16-8:2022

IEC 60747-16-8:2022 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
11/29/2022 - PDF - English, French -
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€270.00

IEC 60747-16-7:2022

IEC 60747-16-7:2022 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
11/29/2022 - PDF - English, French -
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€311.00

IEC TR 63357:2022

IEC TR 63357:2022 Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
10/11/2022 - PDF - English -
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€92.00

IEC 62047-42:2022

IEC 62047-42:2022 Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
9/16/2022 - PDF - English -
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€173.00

IEC 63068-4:2022

IEC 63068-4:2022 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
7/27/2022 - PDF - English -
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€173.00

IEC 60747-5-14:2022

IEC 60747-5-14:2022 Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
3/4/2022 - PDF - English -
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€173.00

IEC 63373:2022

IEC 63373:2022 Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
2/10/2022 - PDF - English, French -
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€92.00

IEC 60747-5-15:2022

IEC 60747-5-15:2022 Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy
1/7/2022 - PDF - English -
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€92.00

IEC 62830-8:2021

IEC 62830-8:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
10/22/2021 - PDF - English -
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€270.00

IEC TR 60747-5-12:2021

IEC TR 60747-5-12:2021 Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies
10/13/2021 - PDF - English -
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€397.00

IEC 63244-1:2021

IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
9/14/2021 - PDF - English, French -
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€270.00

IEC 62047-40:2021

IEC 62047-40:2021 Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
9/3/2021 - PDF - English -
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€46.00

IEC 60747-5-6:2021 + Redline

IEC 60747-5-6:2021 (Redline version) Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
7/6/2021 - PDF - English -
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€561.00

IEC 60747-5-6:2021

IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
7/6/2021 - PDF - English -
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€431.00

IEC 62047-38:2021

IEC 62047-38:2021 Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection
6/23/2021 - PDF - English -
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€92.00

IEC 62047-41:2021

IEC 62047-41:2021 Semiconductor devices - Micro-electromechanical devices - Part 41: RF MEMS circulators and isolators
6/15/2021 - PDF - English, French -
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€270.00

IEC 60747-5-13:2021

IEC 60747-5-13:2021 Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
6/15/2021 - PDF - English -
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€132.00

IEC TS 60747-19-2:2021

IEC TS 60747-19-2:2021 Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
5/21/2021 - PDF - English -
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€132.00

IEC 63229:2021

IEC 63229:2021 Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
4/7/2021 - PDF - English -
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€173.00

IEC 62830-7:2021

IEC 62830-7:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 7: Linear sliding mode triboelectric energy harvesting
3/3/2021 - PDF - English, French -
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€270.00

IEC 62830-5:2021

IEC 62830-5:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
1/21/2021 - PDF - English, French -
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€92.00

IEC 60747-17:2020

IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
9/21/2020 - PDF - English -
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€345.00

IEC 60747-17:2020

IEC 60747-17:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
9/21/2020 - PDF - English, French -
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€345.00

IEC 60747-16-5:2013/AMD1:2020

IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English, French -
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€23.00

IEC 60747-16-5:2013/AMD1:2020

IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English -
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€23.00

IEC 60747-16-5:2013+AMD1:2020 Edition 1.1

IEC 60747-16-5:2013+AMD1:2020 (Consolidated version) Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English, French -
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€443.00

IEC 60747-16-5:2013+AMD1:2020 Edition 1.1

IEC 60747-16-5:2013+AMD1:2020 (Consolidated version) Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
7/14/2020 - PDF - English -
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€443.00

IEC 63068-3:2020

IEC 63068-3:2020 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
7/13/2020 - PDF - English, French -
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€219.00

IEC 62384:2020 + Redline

IEC 62384:2020 (Redline version) DC or AC supplied electronic controlgear for LED modules - Performance requirements
5/13/2020 - PDF - English -
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€120.00

IEC 62384:2020

IEC 62384:2020 DC or AC supplied electronic controlgear for LED modules - Performance requirements
5/13/2020 - PDF - English, French -
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€92.00

IEC 62047-37:2020

IEC 62047-37:2020 Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
4/28/2020 - PDF - English, French -
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€132.00

IEC 60747-5-10:2019

IEC 60747-5-10:2019 Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
12/11/2019 - PDF - English -
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€92.00

IEC 60747-18-3:2019

IEC 60747-18-3:2019 Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
12/11/2019 - PDF - English -
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€173.00

IEC 60747-5-9:2019

IEC 60747-5-9:2019 Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
12/11/2019 - PDF - English -
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€132.00

IEC 60747-5-11:2019

IEC 60747-5-11:2019 Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
12/11/2019 - PDF - English -
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€92.00

IEC 60747-19-1:2019

IEC 60747-19-1:2019 Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors
11/22/2019 - PDF - English -
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€173.00

IEC 62047-35:2019

IEC 62047-35:2019 Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices
11/22/2019 - PDF - English, French -
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€173.00

IEC 60747-5-8:2019

IEC 60747-5-8:2019 Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
11/13/2019 - PDF - English, French -
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€132.00

IEC 60050-523:2018/AMD1:2019

IEC 60050-523:2018/AMD1:2019 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical systems (MEMS)
10/17/2019 - PDF - English, French -
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€12.00

IEC 62830-6:2019

IEC 62830-6:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
7/25/2019 - PDF - English -
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€173.00

IEC 60747-16-6:2019

IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
6/26/2019 - PDF - English, French -
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€173.00

IEC 60747-18-1:2019

IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
5/20/2019 - PDF - English -
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€219.00

IEC 63150-1:2019

IEC 63150-1:2019 Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
5/10/2019 - PDF - English, French -
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€270.00

IEC 62951-6:2019

IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
5/6/2019 - PDF - English, French -
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€173.00

IEC 62951-2:2019

IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
4/17/2019 - PDF - English, French -
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€46.00

IEC 62047-34:2019

IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
4/5/2019 - PDF - English -
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€92.00

IEC 62047-31:2019

IEC 62047-31:2019 Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
4/5/2019 - PDF - English -
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€92.00

IEC 62047-36:2019

IEC 62047-36:2019 Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
4/5/2019 - PDF - English -
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€92.00

IEC 62047-33:2019

IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
4/5/2019 - PDF - English -
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€173.00

IEC 62951-5:2019

IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
2/27/2019 - PDF - English, French -
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€132.00

IEC 62830-4:2019

IEC 62830-4:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
2/27/2019 - PDF - English, French -
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€270.00

IEC 62951-7:2019

IEC 62951-7:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
2/27/2019 - PDF - English, French -
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€92.00

IEC 62951-4:2019

IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
2/27/2019 - PDF - English, French -
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€92.00

IEC 63068-1:2019

IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
1/30/2019 - PDF - English -
Learn More

€173.00

IEC 63068-2:2019

IEC 63068-2:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
1/30/2019 - PDF - English -
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€173.00

IEC 62047-32:2019

IEC 62047-32:2019 Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
1/24/2019 - PDF - English, French -
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€132.00

IEC 60050-523:2018

IEC 60050-523:2018 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
12/6/2018 - PDF - English, French -
Learn More

€173.00

IEC 62951-3:2018

IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
11/7/2018 - PDF - English -
Learn More

€173.00

IEC 62969-4:2018

IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
6/18/2018 - PDF - English, French -
Learn More

€132.00

IEC 62969-3:2018

IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
5/7/2018 - PDF - English, French -
Learn More

€173.00

IEC 62031:2018

IEC 62031:2018 LED modules for general lighting - Safety specifications
3/8/2018 - PDF - English, French -
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€173.00

IEC 62031:2018 + Redline

IEC 62031:2018 (Redline version) LED modules for general lighting - Safety specifications
3/8/2018 - PDF - English -
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€224.00

IEC 62969-2:2018

IEC 62969-2:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
3/8/2018 - PDF - English, French -
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€46.00

IEC 62969-1:2017

IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
12/13/2017 - PDF - English -
Learn More

€92.00

IEC 62969-1:2017

IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
12/13/2017 - PDF - English, French -
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€92.00

IEC 62047-29:2017

IEC 62047-29:2017 Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
11/22/2017 - PDF - English -
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€92.00

IEC 62047-30:2017

IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
9/15/2017 - PDF - English -
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€132.00

IEC 60747-16-4:2004/AMD2:2017

IEC 60747-16-4:2004/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English, French -
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€12.00

IEC 60747-16-4:2004/AMD2:2017

IEC 60747-16-4:2004/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English -
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€12.00

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English, French -
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€385.00

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English -
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€345.00

IEC 60747-16-3:2002/AMD2:2017

IEC 60747-16-3:2002/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English -
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€12.00

IEC 60747-16-3:2002/AMD2:2017

IEC 60747-16-3:2002/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English, French -
Learn More

€12.00

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
8/16/2017 - PDF - English -
Learn More

€385.00

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 Edition 1.2

IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
8/16/2017 - PDF - English, French -
Learn More

€345.00

IEC 62951-1:2017

IEC 62951-1:2017 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
4/10/2017 - PDF - English -
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€92.00

IEC 62830-3:2017

IEC 62830-3:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
3/28/2017 - PDF - English, French -
Learn More

€173.00

IEC 62830-1:2017

IEC 62830-1:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
3/3/2017 - PDF - English, French -
Learn More

€173.00

IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 Edition 1.2

IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 (Consolidated version) Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
2/15/2017 - PDF - English, French -
Learn More

€610.00

IEC 60747-16-1:2001/AMD2:2017

IEC 60747-16-1:2001/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
2/15/2017 - PDF - English, French -
Learn More

€23.00

IEC 62047-28:2017

IEC 62047-28:2017 Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
1/20/2017 - PDF - English -
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€132.00

IEC 62830-2:2017

IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
1/20/2017 - PDF - English, French -
Learn More

€92.00

IEC 62047-27:2017

IEC 62047-27:2017 Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
1/20/2017 - PDF - English -
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€92.00

IEC 62047-25:2016

IEC 62047-25:2016 Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area
8/29/2016 - PDF - English, French -
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€173.00

IEC 60747-5-7:2016

IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
2/23/2016 - PDF - English, French -
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€173.00

IEC 62047-26:2016

IEC 62047-26:2016 Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
1/7/2016 - PDF - English, French -
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€219.00

IEC 62047-1:2016

IEC 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
1/6/2016 - PDF - English, French -
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€270.00

IEC 62047-17:2015

IEC 62047-17:2015 Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
3/5/2015 - PDF - English, French -
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€219.00

IEC 62047-16:2015

IEC 62047-16:2015 Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
3/5/2015 - PDF - English, French -
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€46.00

IEC 62047-20:2014

IEC 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
6/26/2014 - PDF - English, French -
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€345.00

IEC 62047-22:2014

IEC 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
6/19/2014 - PDF - English, French -
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€46.00

IEC 62047-21:2014

IEC 62047-21:2014 Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
6/19/2014 - PDF - English, French -
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€92.00

IEC 62047-18:2013

IEC 62047-18:2013 Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
7/17/2013 - PDF - English, French -
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€92.00

IEC 62047-11:2013

IEC 62047-11:2013 Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
7/17/2013 - PDF - English, French -
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€132.00