31.080.30 : Transistors
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IEEE/IEC 62860:2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
7/30/2013 - PDF - English - IEEE
Learn More€197.00 -
IEEE/IEC 62860:2013
IEC/IEEE Test methods for the characterization of organic transistors and materials
7/30/2013 - Paper - English - IEEE
Learn More€248.00 -
IEEE/IEC 62860-1:2013
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
7/30/2013 - PDF - English - IEEE
Learn More€139.00 -
IEEE/IEC 62860-1:2013
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
7/30/2013 - Paper - English - IEEE
Learn More€167.00