31.080.01 : Semiconductor devices in general
-
DIN EN IEC 60749-5:2024-04
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022), German and English version prEN IEC 60749-5:2022
4/1/2024 - PDF - English, German - DIN
Learn More€65.89 -
BS EN IEC 60749-5:2024 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
2/9/2024 - PDF - English - BSI
Learn More€235.00 -
BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
2/6/2024 - PDF - English - BSI
Learn More€180.00 -
PR NF EN IEC 62007-2, C93-801-2PR (02/2024)
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes fibroniques - Partie 2 : méthodes de mesure
2/1/2024 - Paper - English, French - AFNOR
Learn More€115.50 -
PR NF IEC 60749-34-1, C96-022-34-1PR (02/2024)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 34-1 : essai de cycles en puissance pour modules de puissance à semiconducteurs
2/1/2024 - Paper - English, French - AFNOR
Learn More€88.50 -
NF EN IEC 60749-5, C96-022-5 (01/2024)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5 : essai continu de durée de vie sous température et humidité avec polarisation
1/1/2024 - Paper - French - AFNOR
Learn More€72.00 -
IEC 60749-5:2023
IEC 60749-5:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12/19/2023 - PDF - English, French - IEC
Learn More€46.00 -
IEC 60749-5:2023 + Redline
IEC 60749-5:2023 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12/19/2023 - PDF - English - IEC
Learn More€60.00 -
DIN EN IEC 60749-37:2023-12
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022), German version EN IEC 60749-37:2022.
12/1/2023 - PDF - German - DIN
Learn More€99.35 -
DIN EN IEC 60749-10:2023-12
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022), German version EN IEC 60749-10:2022.
12/1/2023 - PDF - German - DIN
Learn More€85.79 -
NF EN IEC 63203-401-1, C90-901-401-1 (11/2023)
Technologies et dispositifs électroniques prêt-à-porter - Partie 401-1 : dispositifs et systèmes : éléments de fonctionnement - Méthode d'évaluation de la jauge de contrainte extensible de type résistif
11/1/2023 - Paper - French - AFNOR
Learn More€103.33 -
PR NF EN IEC 60749-20-1, C96-022-20-1PR (11/2023)
Dispositifs à semi-conducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20-1: Manipulation, emballage, étiquetage et transport des composants pour montage en surface sensibles à l'effet combiné de l'humidité et de la chaleur de brasage
11/1/2023 - Paper - English, French - AFNOR
Learn More€115.50 -
BS IEC 60747-5-4:2022 + Redline
Tracked Changes. Semiconductor devices Optoelectronic devices. lasers
10/31/2023 - PDF - English - BSI
Learn More€382.00 -
DIN EN IEC 63364-1:2023-10
Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021), German and English version prEN IEC 63364-1:2021
10/1/2023 - PDF - English, German - DIN
Learn More€79.72 -
PR NF EN IEC 60747-15, C96-015PR (10/2023)
Dispositifs à semiconducteurs - Dispositifs discrets - Partie 15 : dispositifs de puissance à semiconducteurs isolés
10/1/2023 - Paper - English, French - AFNOR
Learn More€138.50 -
DIN EN IEC 63287-1:2023-09
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021), German version EN IEC 63287-1:2021.
9/1/2023 - PDF - German - DIN
Learn More€136.82 -
BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
8/31/2023 - PDF - English - BSI
Learn More€250.00 -
23/30478757 DC:2023
BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines Part 3. Guidelines for reliability plans power module
8/17/2023 - PDF - English - BSI
Learn More€24.00 -
23/30477062 DC:2023
BS EN IEC 62007-2. Semiconductor optoelectronic devices for fibre optic system applications Part 2. Measuring methods
7/20/2023 - PDF - English - BSI
Learn More€24.00 -
DIN EN IEC 60749-20:2023-07
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020), German version EN IEC 60749-20:2020.
7/1/2023 - PDF - German - DIN
Learn More€110.00 -
UNE-EN IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)
6/3/2023 - PDF - English - AENOR
Learn More€64.00 -
BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
5/23/2023 - PDF - English - BSI
Learn More€180.00 -
23/30473272 DC:2023
BS IEC 60747-5-4 AMD 1. Semiconductor devices Part 5-4. Optoelectronic devices. lasers
4/26/2023 - PDF - English - BSI
Learn More€24.00 -
BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
4/5/2023 - PDF - English - BSI
Learn More€180.00 -
23/30472390 DC:2023
BS EN 60747-16-11 Semiconductor devices Part 16-11. Microwave integrated circuits - Power detectors
4/4/2023 - PDF - English - BSI
Learn More€24.00 -
IEC 63287-2:2023
IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
3/29/2023 - PDF - English, French - IEC
Learn More€92.00 -
BS IEC 60747-18-4:2023
Semiconductor devices bio sensors. Evaluation method of noise characteristics lens-free CMOS photonic array sensors
3/27/2023 - PDF - English - BSI
Learn More€180.00 -
DIN EN IEC 60749-41:2023-03
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020), German version EN IEC 60749-41:2020
3/1/2023 - PDF - German - DIN
Learn More€104.95 -
23/30469486 DC:2023
BS EN IEC 63378-2. Thermal standardization on semiconductor packages Part 2. 3D thermal simulation models of discrete for steady-state analysis
2/7/2023 - PDF - English - BSI
Learn More€24.00 -
23/30469010 DC:2023
BS EN IEC 63378-3. Thermal standardization on semiconductor packages Part 3. circuit simulation models of discrete for transient analysis
2/3/2023 - PDF - English - BSI
Learn More€24.00 -
BS EN IEC 63364-1:2022
Semiconductor devices. devices for IoT system Test method of sound variation detection
2/2/2023 - PDF - English - BSI
Learn More€180.00 -
DIN EN IEC 60749-30:2023-02
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020), German version EN IEC 60749-30:2020.
2/1/2023 - PDF - German - DIN
Learn More€92.62 -
BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, stability of flexible resistive memory
1/24/2023 - PDF - English - BSI
Learn More€180.00 -
NF EN IEC 63364-1, C96-364-1 (01/2023)
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1 : méthode d'essai de détection de variation acoustique
1/1/2023 - Paper - French - AFNOR
Learn More€54.67 -
BS EN IEC 60749-28:2022 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level
12/22/2022 - PDF - English - BSI
Learn More€454.00 -
BS IEC 62951-9:2022
Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor resistor (1T1R) resistive memory cells
12/20/2022 - PDF - English - BSI
Learn More€180.00 -
BS EN IEC 60749-37:2022 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
12/20/2022 - PDF - English - BSI
Learn More€326.00 -
BS EN 61975:2010+A2:2022
High-voltage direct current (HVDC) installations. System tests
12/12/2022 - PDF - English - BSI
Learn More€377.00 -
BS EN IEC 62007-1:2015+A1:2022
Semiconductor optoelectronic devices for fibre optic system applications Specification template essential ratings and characteristics
11/24/2022 - PDF - English - BSI
Learn More€293.00 -
BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
11/22/2022 - PDF - English - BSI
Learn More€250.00 -
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
11/11/2022 - PDF - English - BSI
Learn More€180.00 -
NF EN IEC 60749-37, C96-022-37 (11/2022)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 37 : Méthode d'essai de chute au niveau de la carte avec utilisation d'un accéléromètre
11/1/2022 - Paper - French - AFNOR
Learn More€103.33 -
IEC 61975:2010+AMD1:2016+AMD2:2022 Edition 1.2
IEC 61975:2010+AMD1:2016+AMD2:2022 (Consolidated version) High-voltage direct current (HVDC) installations - System tests
10/24/2022 - PDF - English, French - IEC
Learn More€690.00 -
IEC 61975:2010/AMD2:2022
IEC 61975:2010/AMD2:2022 Amendment 2 - High-voltage direct current (HVDC) installations - System tests
10/24/2022 - PDF - English, French - IEC
Learn More€23.00 -
IEC 60749-37:2022
IEC 60749-37:2022 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
10/12/2022 - PDF - English, French - IEC
Learn More€173.00 -
UNE-EN IEC 60749-10:2022
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)
10/12/2022 - PDF - English - AENOR
Learn More€60.00 -
UNE-EN 62007-1:2015/A1:2022
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (Endorsed by Asociación Española de Normalización in December of 2022.)
10/12/2022 - PDF - English - AENOR
Learn More€28.00 -
UNE-EN IEC 60749-37:2022
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Española de Normalización in January of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More€69.00 -
UNE-EN 61975:2010/A2:2022
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in January of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More€46.00 -
IEC 60749-37:2022 + Redline
IEC 60749-37:2022 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
10/12/2022 - PDF - English - IEC
Learn More€224.00 -
NF EN 62007-1/A1, C93-801-1/A1 (10/2022)
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 1 : Modèle de spécification relatif aux valeurs et caractéristiques essentielles
10/1/2022 - Paper - French - AFNOR
Learn More€54.50 -
IEC 62007-1:2015+AMD1:2022 Edition 3.1
IEC 62007-1:2015+AMD1:2022 (Consolidated version) Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
9/22/2022 - PDF - English, French - IEC
Learn More€385.00 -
IEC 62007-1:2015/AMD1:2022
IEC 62007-1:2015/AMD1:2022 Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
9/22/2022 - PDF - English, French - IEC
Learn More€12.00 -
BS EN IEC 60749-10:2022 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods shock. device subassembly
9/15/2022 - PDF - English - BSI
Learn More€235.00 -
BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level
9/6/2022 - PDF - English - BSI
Learn More€348.00 -
BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods shock. device subassembly
8/16/2022 - PDF - English - BSI
Learn More€180.00 -
MIL-STD-750-1B:2022 + CN1:2023 & C2:2023
Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999
8/15/2022 - PDF - English - DODNAV
Learn More€55.00 -
BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on electroreflectance spectroscopy
7/19/2022 - PDF - English - BSI
Learn More€180.00 -
MIL-STD-750-2B:2022 & C1:2023
Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 through 2999
6/22/2022 - PDF - English - DODNAV
Learn More€70.00 -
€293.00 -
NF EN IEC 60749-10, C96-022-10 (06/2022)
Semiconductor devices - Mechanical and climatic test methods - Part 10 : Mechanical shock - device and subassembly
6/1/2022 - Paper - French - AFNOR
Learn More€88.33 -
DIN EN IEC 63287-2:2022-06
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021), German and English version prEN IEC 63287-2:2021
6/1/2022 - PDF - English, German - DIN
Learn More€92.62 -
DIN EN IEC 60749-15:2022-05
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2020), German version EN IEC 60749-15:2020.
5/1/2022 - PDF - German - DIN
Learn More€72.80 -
UNE-EN IEC 60749-28:2022
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)
5/1/2022 - PDF - English - AENOR
Learn More€90.00 -
IEC 60749-10:2022
IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
4/27/2022 - PDF - English, French - IEC
Learn More€92.00 -
IEC 60747-5-4:2022
IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
4/27/2022 - PDF - English - IEC
Learn More€270.00 -
NF EN IEC 60749-28, C96-022-28 (04/2022)
Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 28 : Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de dispositif chargé (CDM) - niveau du dispositif
4/1/2022 - Paper - French - AFNOR
Learn More€141.33 -
22/30443678 DC:2022
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling for power semiconductor module
3/30/2022 - PDF - English - BSI
Learn More€24.00 -
BS EN IEC 60749-39:2022 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
3/17/2022 - PDF - English - BSI
Learn More€235.00 -
BS EN IEC 60749-39:2022
Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
3/7/2022 - PDF - English - BSI
Learn More€180.00 -
IEC 60749-28:2022
IEC 60749-28:2022 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
3/1/2022 - PDF - English, French - IEC
Learn More€311.00 -
PR NF EN IEC 63284, C96-284PR (03/2022)
Dispositifs à semiconducteurs - méthode d'essai de fiabilité par la commutation sur charge inductive pour les transistors au nitrure de gallium
3/1/2022 - Paper - English, French - AFNOR
Learn More€64.50 -
UNE-EN IEC 60749-39:2022
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Española de Normalización in March of 2022.)
3/1/2022 - PDF - English - AENOR
Learn More€64.00 -
IEC 60749-28:2022 + Redline
IEC 60749-28:2022 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
3/1/2022 - PDF - English - IEC
Learn More€404.00 -
22/30443234 DC:2022
BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. circuit simulation models of for transient analysis
1/24/2022 - PDF - English - BSI
Learn More€24.00 -
PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages resistance and thermal parameter of BGA, QFP type
1/11/2022 - PDF - English - BSI
Learn More€250.00 -
NF EN IEC 60749-39, C96-022-39 (01/2022)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 39 : mesure de la diffusivité d'humidité et de l'hydrosolubilité dans les matériaux organiques utilisés dans les composants à semiconducteurs
1/1/2022 - Paper - French - AFNOR
Learn More€88.33 -
ESD STM5.5.1:2022
Electrostatic Discharge Sensitivity Testing--Transmission Line Pulse (TLP)--Device Level
1/1/2022 - PDF - English - ESD
Learn More€144.00 -
IEC TR 63378-1:2021
IEC TR 63378-1:2021 Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
12/14/2021 - PDF - English - IEC
Learn More€132.00 -
BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability
11/30/2021 - PDF - English - BSI
Learn More€331.00 -
IEC 60749-39:2021
IEC 60749-39:2021 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
11/29/2021 - PDF - English, French - IEC
Learn More€92.00 -
IEC 60749-39:2021 + Redline
IEC 60749-39:2021 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
11/29/2021 - PDF - English - IEC
Learn More€120.00 -
BS EN IEC 63244-1:2021
Semiconductor devices. devices for wireless power transfer and charging General requirements specifications
11/5/2021 - PDF - English - BSI
Learn More€293.00 -
UNE-EN IEC 63287-1:2021
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
11/1/2021 - PDF - English - AENOR
Learn More€87.00 -
BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
10/11/2021 - PDF - English - BSI
Learn More€180.00 -
NF EN IEC 63244-1, C63-244-1 (10/2021)
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : General requirements and specifications
10/1/2021 - Paper - French - AFNOR
Learn More€127.67 -
NF EN IEC 62435-9, C96-435-9 (10/2021)
Electronic components - Long-term storage of electronic semiconductor devices - Part 9 : Special Cases
10/1/2021 - Paper - French - AFNOR
Learn More€88.33 -
€58.24 -
IEC 63287-1:2021
IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
8/25/2021 - PDF - English, French - IEC
Learn More€311.00 -
€58.24
-
JEDEC JESD89-2B:2021
Test Method for Alpha Source Accelerated Soft Error Rate
7/1/2021 - PDF - English - JEDEC
Learn More€58.24 -
ASTM E1161-21
Standard Practice for Radiographic Examination of Semiconductors and Electronic Components
6/1/2021 - PDF - English - ASTM
Learn More€57.00 -
ASTM E1161-21 + Redline
Standard Practice for Radiographic Examination of Semiconductors and Electronic Components
6/1/2021 - PDF - English - ASTM
Learn More€68.00 -
€180.00 -
BS IEC 60747-14-11:2021
Semiconductor devices sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
3/12/2021 - PDF - English - BSI
Learn More€250.00 -
IEC 60747-14-11:2021
IEC 60747-14-11:2021 Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
3/3/2021 - PDF - English - IEC
Learn More€173.00 -
UNE-EN IEC 60747-17:2020/AC:2021-02
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in March of 2021.)
3/1/2021 - PDF - English - AENOR
Learn More€0.00 -
BS IEC 62830-5:2021
Semiconductor devices. devices for energy harvesting and generation Test method measuring generated power from flexible thermoelectric
2/3/2021 - PDF - English - BSI
Learn More€180.00 -
NF EN IEC 62435-7, C96-435-7 (01/2021)
Electronic components - Long-term storage of electronic semiconductor devices - Part 7 : micro-electromechanical devices - Stockage de longue durée des composants électroniques - Partie 7 : Dispositifs microélectromécaniques
1/1/2021 - Paper - French - AFNOR
Learn More€103.33 -
UNE-EN IEC 60747-17:2020
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in January of 2021.)
1/1/2021 - PDF - English - AENOR
Learn More€95.00 -
BS EN IEC 60749-18:2019 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
11/3/2020 - PDF - English - BSI
Learn More€326.00 -
UNE-EN IEC 60749-15:2020
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (Endorsed by Asociación Española de Normalización in November of 2020.)
11/1/2020 - PDF - English - AENOR
Learn More€60.00 -
UNE-EN IEC 60749-30:2020
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)
11/1/2020 - PDF - English - AENOR
Learn More€64.00 -
UNE-EN IEC 60749-20:2020
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (Endorsed by Asociación Española de Normalización in November of 2020.)
11/1/2020 - PDF - English - AENOR
Learn More€74.00 -
BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat
10/14/2020 - PDF - English - BSI
Learn More€250.00 -
BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
10/1/2020 - PDF - English - BSI
Learn More€180.00 -
NF EN IEC 60749-20, C96-022-20 (10/2020)
Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20 : Résistances des CMS à boîtier plastique à l'effet combiné de l'humidité et de la chaleur de brasage
10/1/2020 - Paper - French - AFNOR
Learn More€116.33 -
UNE-EN IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
10/1/2020 - PDF - English - AENOR
Learn More€70.00 -
UNE-EN IEC 60747-5-5:2020
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
10/1/2020 - PDF - English - AENOR
Learn More€96.00 -
BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
9/30/2020 - PDF - English - BSI
Learn More€180.00 -
BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
9/17/2020 - PDF - English - BSI
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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing of non-volatile memory devices
9/9/2020 - PDF - English - BSI
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NF EN IEC 60749-41, C96-022-41 (09/2020)
Semiconductor devices - Mechanical and climatic test methods - Part 41 : standard reliability testing methods of non-volatile memory devices
9/1/2020 - Paper - French - AFNOR
Learn More€103.33 -
NF EN IEC 60749-30, C96-022-30 (09/2020)
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
9/1/2020 - Paper - French - AFNOR
Learn More€88.33 -
NF EN IEC 60749-15, C96-022-15 (09/2020)
Semiconductor devices - Mechanical and climatic test methods - Part 15 : resistance to soldering temperature for through-hole mounted devices
9/1/2020 - Paper - French - AFNOR
Learn More€72.00 -
IEC 60749-20:2020
IEC 60749-20:2020 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
8/31/2020 - PDF - English, French - IEC
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IEC 60749-20:2020 + Redline
IEC 60749-20:2020 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
8/31/2020 - PDF - English - IEC
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20/30422991 DC:2020
BS EN IEC 60747-5-14. Semiconductor devices Part 5-14. Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on thermoreflectance
8/28/2020 - PDF - English - BSI
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IEC 60749-30:2020
IEC 60749-30:2020 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
8/17/2020 - PDF - English, French - IEC
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IEC 60749-30:2020 + Redline
IEC 60749-30:2020 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
8/17/2020 - PDF - English - IEC
Learn More€120.00 -
NF EN IEC 62435-8, C96-435-8 (08/2020)
Electronic components - Long-term storage of electronic semiconductor devices - Part 8 : passive electronic devices
8/1/2020 - Paper - French - AFNOR
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BS IEC 63068-3:2020
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using photoluminescence
7/24/2020 - PDF - English - BSI
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IEC 60749-41:2020
IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
7/22/2020 - PDF - English, French - IEC
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BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress
7/21/2020 - PDF - English - BSI
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IEC 60747-5-5:2020
IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
7/20/2020 - PDF - English - IEC
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IEC 60747-5-5:2020
IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
7/20/2020 - PDF - English, French - IEC
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BS IEC 62779-4:2020
Semiconductor devices. interface for human body communication Capsule endoscope
7/17/2020 - PDF - English - BSI
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IEC 60749-15:2020
IEC 60749-15:2020 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
7/14/2020 - PDF - English, French - IEC
Learn More€46.00 -
IEC 60749-15:2020 + Redline
IEC 60749-15:2020 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
7/14/2020 - PDF - English - IEC
Learn More€60.00 -
BS IEC 60191-2:1966+A21:2020
Mechanical standardization of semiconductor devices Dimensions
4/2/2020 - PDF - English - BSI
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20/30406234 DC:2020
BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Part 2. Test bipolar degradation by body diode operating
4/1/2020 - PDF - English - BSI
Learn More€24.00 -
NF EN IEC 62435-3, C96-435-3 (04/2020)
Electronic components - Long-term storage of electronic semiconductor devices - Part 3 : data - Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 3 : Données.
4/1/2020 - Paper - French - AFNOR
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BS EN IEC 60749-26:2018 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
2/27/2020 - PDF - English - BSI
Learn More€454.00 -
BS EN IEC 60749-17:2019 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
2/24/2020 - PDF - English - BSI
Learn More€197.00 -
BS EN IEC 60749-18:2019 + Redline
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
2/24/2020 - PDF - English - BSI
Learn More€326.00 -
BS IEC 60747-18-2:2020
Semiconductor devices bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
2/21/2020 - PDF - English - BSI
Learn More€180.00 -
IEC 60191-2:1966/AMD21:2020
IEC 60191-2:1966/AMD21:2020 Amendment 21 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
2/13/2020 - PDF - English - IEC
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IEC 62779-4:2020
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
2/7/2020 - PDF - English, French - IEC
Learn More€132.00 -
IEC 60747-18-2:2020
IEC 60747-18-2:2020 Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
2/7/2020 - PDF - English - IEC
Learn More€132.00 -
DIN EN IEC 60749-18:2020-02
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019), German version EN IEC 60749-18:2019.
2/1/2020 - PDF - German - DIN
Learn More€104.95 -
BS IEC 60747-18-3:2019
Semiconductor devices bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
1/14/2020 - PDF - English - BSI
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BS IEC 60747-5-9:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on temperature-dependent electroluminescence
1/14/2020 - PDF - English - BSI
Learn More€180.00 -
VDA EOS-Electrical Overstress:2020-01
EOS-Electrical Overstress in the Automotive Industry, Dealing with semiconductor devices showing a signature of electrial overstress, Contents, documentations and explanations
1st Edition, January 2020
1/1/2020 - - - VDAQMC
Learn More€46.25 -
PR NF EN IEC 61643-322, C61-743-322PR (12/2019)
Composants pour parafoudres basse tension - Partie 322 : Principes de sélection et d'application pour les limiteurs de tension à jonction PN de semiconducteurs silicium
12/1/2019 - Paper - English, French - AFNOR
Learn More€115.50 -
BS IEC 60747-19-1:2019
Semiconductor devices Smart sensors. Control scheme of smart sensors
11/29/2019 - PDF - English - BSI
Learn More€250.00 -
BS IEC 60747-14-10:2019
Semiconductor devices sensors. Performance evaluation methods for wearable glucose sensors
11/22/2019 - PDF - English - BSI
Learn More€293.00 -
BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
11/22/2019 - PDF - English - BSI
Learn More€377.00 -
IEC 60747-14-10:2019
IEC 60747-14-10:2019 Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
11/13/2019 - PDF - English, French - IEC
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IEC 60747-9:2019
IEC 60747-9:2019 Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
11/13/2019 - PDF - English, French - IEC
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19/30404655 DC:2019
BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate
10/17/2019 - PDF - English - BSI
Learn More€24.00 -
ASTM E722-19
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
10/1/2019 - PDF - English - ASTM
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ASTM E722-19 + Redline
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
10/1/2019 - PDF - English - ASTM
Learn More€87.00 -
BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
9/2/2019 - PDF - English - BSI
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BS IEC 62830-6:2019
Semiconductor devices. devices for energy harvesting and generation Test evaluation methods vertical contact mode triboelectric
8/7/2019 - PDF - English - BSI
Learn More€250.00 -
UNE-EN IEC 60749-18:2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Española de Normalización in July of 2019.)
7/1/2019 - PDF - English - AENOR
Learn More€69.00 -
IEC 60749-20-1:2019
IEC 60749-20-1:2019 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
6/26/2019 - PDF - English, French - IEC
Learn More€311.00 -
IEC 60749-20-1:2019 + Redline
IEC 60749-20-1:2019 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
6/26/2019 - PDF - English - IEC
Learn More€404.00 -
BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
6/10/2019 - PDF - English - BSI
Learn More€250.00 -
UNE-EN IEC 60749-17:2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Española de Normalización in June of 2019.)
6/1/2019 - PDF - English - AENOR
Learn More€57.00 -
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
5/15/2019 - PDF - English - BSI
Learn More€151.00 -
NF EN IEC 60749-17, C96-022-17 (05/2019)
Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation
5/1/2019 - Paper - French - AFNOR
Learn More€72.00 -
NF EN IEC 60749-18, C96-022-18 (05/2019)
Semiconductor devices - Mechanical and climatic test methods - Part 18 : Ionizing radiation (total dose)
5/1/2019 - Paper - French - AFNOR
Learn More€103.00 -
IEC 60749-18:2019
IEC 60749-18:2019 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
4/10/2019 - PDF - English, French - IEC
Learn More€173.00 -
IEC 60749-18:2019 + Redline
IEC 60749-18:2019 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
4/10/2019 - PDF - English - IEC
Learn More€224.00 -
IEC 60749-17:2019
IEC 60749-17:2019 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
3/28/2019 - PDF - English, French - IEC
Learn More€46.00 -
BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
3/5/2019 - PDF - English - BSI
Learn More€180.00 -
SAE ARP 6338A:2019-02-08
Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits
2/8/2019 - PDF - English - SAE
Learn More€96.00 -
ESDA/JEDEC JS-002:2018
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
1/1/2019 - PDF - English - JEDEC
Learn More€186.76 -
18/30386543 DC:2018
BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
12/11/2018 - PDF - English - BSI
Learn More€24.00 -
IEC 60050-521:2002/AMD2:2018
IEC 60050-521:2002/AMD2:2018 Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
12/6/2018 - PDF - English, French - IEC
Learn More€12.00 -
18/30383935 DC:2018
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
12/4/2018 - PDF - English - BSI
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DIN EN IEC 62969-3 VDE 0884-69-3:2018-12
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (IEC 62969-3:2018), German version EN IEC 62969-3:2018
12/1/2018 - Paper - German - VDE
Learn More€74.10 -
DIN EN IEC 60749-20-1:2018-11
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018), German and English version prEN IEC 60749-20-1:2018
11/1/2018 - PDF - English, German - DIN
Learn More€141.96 -
DIN EN IEC 60749-26 VDE 0884-749-26:2018-10
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018), German version EN IEC 60749-26:2018
10/1/2018 - Paper - German - VDE
Learn More€121.28 -
DIN EN IEC 60749-13:2018-10
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018), German version EN IEC 60749-13:2018.
10/1/2018 - PDF - German - DIN
Learn More€85.79 -
DIN EN IEC 62969-2 VDE 0884-69-2:2018-09
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (IEC 62969-2:2018), German version EN IEC 62969-2:2018
9/1/2018 - Paper - German - VDE
Learn More€42.45 -
DIN EN IEC 62969-1 VDE 0884-69-1:2018-08
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (IEC 62969-1:2017), German version EN IEC 62969-1:2018
8/1/2018 - Paper - German - VDE
Learn More€65.60 -
NF EN IEC 62435-4, C96-435-4 (08/2018)
Electronic components - Long-term storage of electronic semiconductor devices - Part 4 : storage
8/1/2018 - Paper - French - AFNOR
Learn More€103.33 -
18/30375624 DC:2018
BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling shipping of surface-mount devices sensitive to the combined effect moisture soldering heat
7/13/2018 - PDF - English - BSI
Learn More€24.00 -
DIN EN 60749-17 VDE 0884-749-17:2018-07
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/2465/CDV:2018), German and English version prEN 60749-17:2018
7/1/2018 - Paper - German - VDE
Learn More€18.19 -
DIN EN IEC 60749-12:2018-07
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017), German version EN IEC 60749-12:2018.
7/1/2018 - PDF - German - DIN
Learn More€52.90 -
UNE-EN 60191-4:2014/A1:2018
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Endorsed by Asociación Española de Normalización in June of 2018.)
6/1/2018 - PDF - English - AENOR
Learn More€63.00 -
BS EN 60191-4:2014+A1:2018
Mechanical standardization of semiconductor devices Coding system and classification into forms package outlines for device packages
5/30/2018 - PDF - English - BSI
Learn More€293.00 -
NF EN 60191-4/A1, C96-013-4/A1 (05/2018)
Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
5/1/2018 - Paper - French - AFNOR
Learn More€88.00 -
UNE-EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (Endorsed by Asociación Española de Normalización in May of 2018.)
5/1/2018 - PDF - English - AENOR
Learn More€76.00 -
UNE-EN IEC 60749-26:2018
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
5/1/2018 - PDF - English - AENOR
Learn More€90.00 -
UNE-EN IEC 60749-13:2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
5/1/2018 - PDF - English - AENOR
Learn More€63.00 -
BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings discrete
4/30/2018 - PDF - English - BSI
Learn More€293.00 -
BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
4/30/2018 - PDF - English - BSI
Learn More€180.00 -
BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
4/30/2018 - PDF - English - BSI
Learn More€348.00 -
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
4/18/2018 - PDF - English - BSI
Learn More€151.00 -
IEC 60191-2:1966/AMD20:2018
IEC 60191-2:1966/AMD20:2018 Amendment 20 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
4/12/2018 - PDF - English - IEC
Learn More€92.00 -
NF EN IEC 60749-13, C96-022-13 (04/2018)
Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
4/1/2018 - Paper - French - AFNOR
Learn More€88.33 -
UNE-EN IEC 60749-12:2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
4/1/2018 - PDF - English - AENOR
Learn More€42.00 -
IEC 60191-4:2013+AMD1:2018 Edition 3.1
IEC 60191-4:2013+AMD1:2018 (Consolidated version) Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
3/27/2018 - PDF - English, French - IEC
Learn More€345.00 -
IEC 60191-4:2013/AMD1:2018
IEC 60191-4:2013/AMD1:2018 Amendment 1 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
3/27/2018 - PDF - English, French - IEC
Learn More€92.00 -
BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
3/15/2018 - PDF - English - BSI
Learn More€180.00 -
NF EN IEC 60749-12, C96-022-12 (03/2018)
Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency
3/1/2018 - Paper - French - AFNOR
Learn More€54.67 -
NF EN IEC 60749-26, C96-022-26 (03/2018)
Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
3/1/2018 - Paper - French - AFNOR
Learn More€153.67 -
NF EN IEC 60191-1, C96-013-1 (03/2018)
Normalisation mécanique des dispositifs à semi-conducteurs - Partie 1 : règles générales pour la préparation des dessins d'encombrement des dispositifs discrets
3/1/2018 - Paper - French - AFNOR
Learn More€127.67
