31.080 : Semiconductor devices

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  • IEC 61643-341:2020

    IEC 61643-341:2020 Components for low-voltage surge protection - Part 341: Performance requirements and test circuits for thyristor surge suppressors (TSS)
    5/13/2020 - PDF - English, French - IEC
    Learn More
    €315.00

  • IEC 62384:2020

    IEC 62384:2020 DC or AC supplied electronic controlgear for LED modules - Performance requirements
    5/13/2020 - PDF - English, French - IEC
    Learn More
    €71.00

  • IEC 62384:2020 + Redline

    IEC 62384:2020 (Redline version) DC or AC supplied electronic controlgear for LED modules - Performance requirements
    5/13/2020 - PDF - English - IEC
    Learn More
    €92.00

  • 20/30407343 DC:2020

    BS EN 60700-1 AMD1. Thyristor valves for high voltage direct current (HVDC) power transmission Part 1. Electrical testing
    5/8/2020 - PDF - English - BSI
    Learn More
    €23.70

  • PR NF EN IEC 62435-3, C96-435-3PR (05/2020)


    5/1/2020 - Paper - English, French - AFNOR
    Learn More
    €61.17

  • IEC 62047-37:2020

    IEC 62047-37:2020 Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
    4/28/2020 - PDF - English, French - IEC
    Learn More
    €107.00

  • BS IEC 60191-2:1966+A21:2020

    Mechanical standardization of semiconductor devices Dimensions
    4/2/2020 - PDF - English - BSI
    Learn More
    €613.83

  • 20/30409285 DC:2020

    BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors
    4/1/2020 - PDF - English - BSI
    Learn More
    €23.70

  • 20/30406234 DC:2020

    BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Part 2. Test bipolar degradation by body diode operating
    4/1/2020 - PDF - English - BSI
    Learn More
    €23.70

  • 20/30406230 DC:2020

    BS IEC 63275-1. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Part 1. Test bias temperature instability
    4/1/2020 - PDF - English - BSI
    Learn More
    €23.70

  • BS EN IEC 62031:2020

    LED modules for general lighting. Safety specifications
    3/19/2020 - PDF - English - BSI
    Learn More
    €215.67

  • 20/30410215 DC:2020

    BS EN IEC 63287-1. Semiconductor devices. Generic semiconductor qualification guidelines Part 1. Guidelines for LSI reliability
    3/6/2020 - PDF - English - BSI
    Learn More
    €23.70

  • 20/30404574 DC:2020

    BS EN IEC 62047-41. Semiconductor devices. Micro-electromechanical devices Part 41. RF MEMS Circulators and Isolators
    3/6/2020 - PDF - English - BSI
    Learn More
    €23.70

  • NF EN IEC 62031, C71-250 (03/2020)


    3/1/2020 - Paper - French - AFNOR
    Learn More
    €98.42

  • BS EN 60749-5:2017 + Redline

    Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
    2/27/2020 - PDF - English - BSI
    Learn More
    €200.27

  • BS EN IEC 60749-26:2018 + Redline

    Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
    2/27/2020 - PDF - English - BSI
    Learn More
    €391.29

  • BS IEC 60747-6:2016 + Redline

    Tracked Changes. Semiconductor devices Discrete devices. Thyristors
    2/27/2020 - PDF - English - BSI
    Learn More
    €483.72

  • BS EN IEC 60749-18:2019 + Redline

    Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
    2/24/2020 - PDF - English - BSI
    Learn More
    €280.37

  • BS EN IEC 60749-17:2019 + Redline

    Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
    2/24/2020 - PDF - English - BSI
    Learn More
    €169.46

  • BS IEC 60747-18-2:2020

    Semiconductor devices bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
    2/21/2020 - PDF - English - BSI
    Learn More
    €154.05

  • IEC 60191-2:1966/AMD21:2020

    IEC 60191-2:1966/AMD21:2020 Amendment 21 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
    2/13/2020 - PDF - English - IEC
    Learn More
    €41.00

  • IEC 60747-18-2:2020

    IEC 60747-18-2:2020 Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
    2/7/2020 - PDF - English - IEC
    Learn More
    €107.00

  • IEC 62779-4:2020

    IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
    2/7/2020 - PDF - English, French - IEC
    Learn More
    €107.00

  • 20/30404083 DC:2020

    BS IEC 62047-38. Semiconductor devices. Micro-electromechanical devices Part 38. Test method for adhesion strength of metal powder paste in MEMS interconnection
    2/7/2020 - PDF - English - BSI
    Learn More
    €23.70

  • BS IEC 60747-18-3:2019

    Semiconductor devices bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
    1/14/2020 - PDF - English - BSI
    Learn More
    €215.67

  • BS IEC 60747-5-9:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on temperature-dependent electroluminescence
    1/14/2020 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 60747-5-11:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents light diodes
    1/14/2020 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 60747-5-10:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on room-temperature reference point
    1/14/2020 - PDF - English - BSI
    Learn More
    €154.05

  • BS EN IEC 60904-4:2019

    Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
    1/9/2020 - PDF - English - BSI
    Learn More
    €253.59

  • PR NF EN IEC 62435-8, C96-435-8PR (01/2020)


    1/1/2020 - Paper - English, French - AFNOR
    Learn More
    €68.89

  • IEC 60747-18-3:2019

    IEC 60747-18-3:2019 Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
    12/11/2019 - PDF - English - IEC
    Learn More
    €147.00

  • IEC 60747-5-10:2019

    IEC 60747-5-10:2019 Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
    12/11/2019 - PDF - English - IEC
    Learn More
    €71.00

  • IEC 60747-5-9:2019

    IEC 60747-5-9:2019 Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
    12/11/2019 - PDF - English - IEC
    Learn More
    €107.00

  • IEC 60747-5-11:2019

    IEC 60747-5-11:2019 Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
    12/11/2019 - PDF - English - IEC
    Learn More
    €71.00

  • PR NF EN IEC 61643-322, C61-743-322PR (12/2019)


    12/1/2019 - Paper - English, French - AFNOR
    Learn More
    €108.39

  • BS IEC 60747-19-1:2019

    Semiconductor devices Smart sensors. Control scheme of smart sensors
    11/29/2019 - PDF - English - BSI
    Learn More
    €215.67

  • BS IEC 60747-5-8:2019

    Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies light diodes
    11/27/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 60747-14-10:2019

    Semiconductor devices sensors. Performance evaluation methods for wearable glucose sensors
    11/22/2019 - PDF - English - BSI
    Learn More
    €253.59

  • BS IEC 60747-9:2019

    Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
    11/22/2019 - PDF - English - BSI
    Learn More
    €324.69

  • IEC 60747-19-1:2019

    IEC 60747-19-1:2019 Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors
    11/22/2019 - PDF - English - IEC
    Learn More
    €147.00

  • IEC 62047-35:2019

    IEC 62047-35:2019 Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices
    11/22/2019 - PDF - English, French - IEC
    Learn More
    €147.00

  • IEC 60747-14-10:2019

    IEC 60747-14-10:2019 Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
    11/13/2019 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC 60747-9:2019

    IEC 60747-9:2019 Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
    11/13/2019 - PDF - English, French - IEC
    Learn More
    €315.00

  • IEC 60747-5-8:2019

    IEC 60747-5-8:2019 Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
    11/13/2019 - PDF - English, French - IEC
    Learn More
    €107.00

  • 19/30395503 DC:2019

    BS EN IEC 62830-8. Semiconductor devices. devices for energy harvesting and generation Part 8. Test evaluation methods of flexible stretchable supercapacitors use in low power electronics
    11/8/2019 - PDF - English - BSI
    Learn More
    €23.70

  • PR NF EN IEC 63203-402-1, C90-901-402-1PR (11/2019)


    11/1/2019 - Paper - English, French - AFNOR
    Learn More
    €75.51

  • 19/30404095 DC:2019

    BS EN IEC 60747-5-4. Semiconductor devices Part 5-4. Optoelectronic devices. lasers
    11/1/2019 - PDF - English - BSI
    Learn More
    €23.70

  • PR NF EN IEC 63203-401-1, C90-901-401-1PR (11/2019)


    11/1/2019 - Paper - English, French - AFNOR
    Learn More
    €75.51

  • PR NF EN 60747-16-5/A1, C96-016-5/A1PR (11/2019)


    11/1/2019 - Paper - English, French - AFNOR
    Learn More
    €42.59

  • IEEE C62.59:2019

    IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
    10/31/2019 - PDF - English - IEEE
    Learn More
    €59.22

  • IEEE C62.59:2019

    IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
    10/31/2019 - Paper - English - IEEE
    Learn More
    €74.26

  • BS IEC 60747-7:2010+A1:2019

    Semiconductor devices. Discrete devices Bipolar transistors
    10/23/2019 - PDF - English - BSI
    Learn More
    €346.02

  • 19/30404655 DC:2019

    BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate
    10/17/2019 - PDF - English - BSI
    Learn More
    €23.70

  • IEC 60050-523:2018/AMD1:2019

    IEC 60050-523:2018/AMD1:2019 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical systems (MEMS)
    10/17/2019 - PDF - English, French - IEC
    Learn More
    €10.00

  • ASTM E722-19

    Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
    10/1/2019 - PDF - English - ASTM
    Learn More
    €67.00

  • ASTM E722-19 + Redline

    Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
    10/1/2019 - PDF - English - ASTM
    Learn More
    €80.00

  • PR NF EN IEC 60749-41, C96-022-41PR (10/2019)


    10/1/2019 - Paper - English, French - AFNOR
    Learn More
    €75.51

  • PR NF EN IEC 62868-2-2, C71-868-2-2PR (10/2019)


    10/1/2019 - Paper - English, French - AFNOR
    Learn More
    €61.17

  • UNE-EN IEC 60747-16-6:2019

    Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)
    10/1/2019 - PDF - English - AENOR
    Learn More
    €72.00

  • IEC 60747-7:2010+AMD1:2019 Edition 3.1

    IEC 60747-7:2010+AMD1:2019 (Consolidated version) Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
    9/23/2019 - PDF - English, French - IEC
    Learn More
    €457.00

  • IEC 60747-7:2010/AMD1:2019

    IEC 60747-7:2010/AMD1:2019 Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
    9/23/2019 - PDF - English, French - IEC
    Learn More
    €10.00

  • 19/30394477 DC:2019

    BS EN IEC 63244-1. Semiconductor devices. devices for wireless power transfer and charging Part 1. General requirements specifications
    9/13/2019 - PDF - English - BSI
    Learn More
    €23.70

  • 19/30393894 DC:2019

    BS EN 60747-16-5 AMD1. Semiconductor devices Part 16-5. Microwave integrated circuits. Oscillators
    9/13/2019 - PDF - English - BSI
    Learn More
    €23.70

  • BS EN IEC 60747-16-6:2019

    Semiconductor devices Microwave integrated circuits. Frequency multipliers
    9/2/2019 - PDF - English - BSI
    Learn More
    €215.67

  • 19/30401940 DC:2019

    BS EN IEC 61643-321. Components for low-voltage surge protection Part 321. Performance requirements and test circuits silicon PN-junction voltage limiters
    8/30/2019 - PDF - English - BSI
    Learn More
    €23.70

  • 19/30350992 DC:2019

    BS EN IEC 60749-41. Semiconductor devices. Mechanical and climatic test methods Part 41. Standard reliability testing of non-volatile memory devices
    8/29/2019 - PDF - English - BSI
    Learn More
    €23.70

  • BS IEC 62830-6:2019

    Semiconductor devices. devices for energy harvesting and generation Test evaluation methods vertical contact mode triboelectric
    8/7/2019 - PDF - English - BSI
    Learn More
    €215.67

  • PR NF EN IEC 60749-15, C96-022-15PR (08/2019)

    Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 15 : Résistance à la température de brasage pour dispositifs par trous traversants
    8/1/2019 - Paper - English, French - AFNOR
    Learn More
    €52.27

  • PR NF EN IEC 60749-20, C96-022-20PR (08/2019)

    Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20 : Résistances des CMS à boîtier plastique à l'effet combiné de l'humidité et de la chaleur de brasage
    8/1/2019 - Paper - English, French - AFNOR
    Learn More
    €100.66

  • NF EN IEC 60747-16-6, C96-016-6 (08/2019)


    8/1/2019 - Paper - French - AFNOR
    Learn More
    €98.42

  • IEC 62830-6:2019

    IEC 62830-6:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
    7/25/2019 - PDF - English - IEC
    Learn More
    €147.00

  • 19/30389766 DC:2019

    BS IEC 60747-8 AMD1. Semiconductor devices. Discrete devices Part 8. Field-effect transistors
    7/24/2019 - PDF - English - BSI
    Learn More
    €23.70

  • 19/30395803 DC:2019

    BS EN 60749-15. Semiconductor devices. Mechanical and climatic test methods Part 15. Resistance to soldering temperature for through-hole mounted devices
    7/10/2019 - PDF - English - BSI
    Learn More
    €23.70

  • 19/30367984 DC:2019

    BS EN IEC 61189-5-504. Test methods for electrical materials, printed boards and other interconnection structures assemblies Part 5-504. General test materials assemblies. Process ionic contamination testing (PICT)
    7/9/2019 - PDF - English - BSI
    Learn More
    €23.70

  • PR NF EN IEC 62435-7, C96-435-7PR (07/2019)

    Stockage de longue durée des composants électroniques - Partie 7 : Dispositifs microélectromécaniques
    7/1/2019 - Paper - English, French - AFNOR
    Learn More
    €68.89

  • UNE-EN IEC 60749-18:2019

    Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Española de Normalización in July of 2019.)
    7/1/2019 - PDF - English - AENOR
    Learn More
    €69.00

  • PR NF EN IEC 60747-17, C96-017PR (07/2019)

    Dispositifs à semiconducteurs - Partie 17 : Coupleur magnétique et capacitif pour l'isolation principale et renforcée
    7/1/2019 - Paper - English, French - AFNOR
    Learn More
    €116.51

  • IEC 60749-20-1:2019 + Redline

    IEC 60749-20-1:2019 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
    6/26/2019 - PDF - English - IEC
    Learn More
    €324.00

  • IEC 60749-20-1:2019

    IEC 60749-20-1:2019 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
    6/26/2019 - PDF - English, French - IEC
    Learn More
    €249.00

  • IEC 60747-16-6:2019

    IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
    6/26/2019 - PDF - English, French - IEC
    Learn More
    €147.00

  • 19/30383607 DC:2019

    BS IEC 60747-5-13. Semiconductor devices Part 5-13. Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
    6/19/2019 - PDF - English - BSI
    Learn More
    €23.70

  • BS EN IEC 60749-18:2019

    Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
    6/10/2019 - PDF - English - BSI
    Learn More
    €215.67

  • BS IEC 60747-18-1:2019

    Semiconductor devices bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
    6/7/2019 - PDF - English - BSI
    Learn More
    €215.67

  • UNE-EN IEC 60749-17:2019

    Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Española de Normalización in June of 2019.)
    6/1/2019 - PDF - English - AENOR
    Learn More
    €57.00

  • 19/30394485 DC:2019

    BS EN IEC 60749-20. Semiconductor devices. Mechanical and climatic test methods Part 20. Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat
    5/29/2019 - PDF - English - BSI
    Learn More
    €23.70

  • 19/30394481 DC:2019

    BS EN IEC 60749-30. Semiconductor devices. Mechanical and climatic test methods Part 30. Preconditioning of non-hermetic surface mount devices prior to reliability testing
    5/28/2019 - PDF - English - BSI
    Learn More
    €23.70

  • IEC 60747-18-1:2019

    IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
    5/20/2019 - PDF - English - IEC
    Learn More
    €178.00

  • BS EN IEC 60749-17:2019

    Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
    5/15/2019 - PDF - English - BSI
    Learn More
    €130.35

  • BS IEC 62951-6:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
    5/15/2019 - PDF - English - BSI
    Learn More
    €215.67

  • BS IEC 63068-1:2019

    Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification
    5/10/2019 - PDF - English - BSI
    Learn More
    €215.67

  • IEC 63150-1:2019

    IEC 63150-1:2019 Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
    5/10/2019 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC 62951-6:2019

    IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
    5/6/2019 - PDF - English, French - IEC
    Learn More
    €147.00

  • NF EN IEC 60749-18, C96-022-18 (05/2019)


    5/1/2019 - Paper - French - AFNOR
    Learn More
    €87.39

  • PR NF EN IEC 60749-20-1, C96-022-20-1PR (05/2019)

    Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20-1 : Manipulation, emballage, étiquetage et transport des composants pour montage en surface sensibles à l'effet combiné de l'humidité et de la chaleur de brasage
    5/1/2019 - Paper - English, French - AFNOR
    Learn More
    €108.39

  • NF EN IEC 60749-17, C96-022-17 (05/2019)

    Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 17 : irradiation aux neutrons - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 17: Irradiation aux neutrons
    5/1/2019 - Paper - French - AFNOR
    Learn More
    €60.85

  • 19/30394501 DC:2019

    BS EN 61189-5-502. Test methods for electrical materials, printed boards and other interconnection structures assemblies Part 5-502. General test materials assemblies. Surface insulation resistance (SIR) testing of
    5/1/2019 - PDF - English - BSI
    Learn More
    €23.70

  • BS IEC 62951-2:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation method for electron mobility, sub-threshold swing, threshold voltage of flexible
    4/30/2019 - PDF - English - BSI
    Learn More
    €130.35

  • BS IEC 62047-36:2019

    Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    4/24/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 62047-33:2019

    Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
    4/18/2019 - PDF - English - BSI
    Learn More
    €215.67

  • BS IEC 62047-31:2019

    Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
    4/17/2019 - PDF - English - BSI
    Learn More
    €154.05

  • IEC 62951-2:2019

    IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
    4/17/2019 - PDF - English, French - IEC
    Learn More
    €41.00

  • BS EN 62612:2013+A2:2018

    Self-ballasted LED lamps for general lighting services with supply voltages > 50 V. Performance requirements
    4/16/2019 - PDF - English - BSI
    Learn More
    €300.99

  • BS IEC 62047-34:2019

    Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    4/16/2019 - PDF - English - BSI
    Learn More
    €154.05

  • IEC 60749-18:2019 + Redline

    IEC 60749-18:2019 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
    4/10/2019 - PDF - English - IEC
    Learn More
    €192.00

  • IEC 60749-18:2019

    IEC 60749-18:2019 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
    4/10/2019 - PDF - English, French - IEC
    Learn More
    €147.00

  • IEC 62047-31:2019

    IEC 62047-31:2019 Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
    4/5/2019 - PDF - English - IEC
    Learn More
    €71.00

  • IEC 62047-33:2019

    IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
    4/5/2019 - PDF - English - IEC
    Learn More
    €147.00

  • IEC 62047-34:2019

    IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
    4/5/2019 - PDF - English - IEC
    Learn More
    €71.00

  • IEC 62047-36:2019

    IEC 62047-36:2019 Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
    4/5/2019 - PDF - English - IEC
    Learn More
    €71.00

  • IEC 60749-17:2019

    IEC 60749-17:2019 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
    3/28/2019 - PDF - English, French - IEC
    Learn More
    €41.00

  • BS IEC 62951-7:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Test method for characterizing the barrier performance of thin film encapsulation flexible organic
    3/6/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 62951-5:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
    3/5/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 62951-4:2019

    Semiconductor devices. Flexible and stretchable semiconductor devices Fatigue evaluation for flexible conductive thin film on the substrate
    3/5/2019 - PDF - English - BSI
    Learn More
    €154.05

  • BS IEC 62830-4:2019

    Semiconductor devices. devices for energy harvesting and generation Test evaluation methods flexible piezoelectric
    3/5/2019 - PDF - English - BSI
    Learn More
    €253.59

  • IEC 62830-4:2019

    IEC 62830-4:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €208.00

  • IEC 62951-4:2019

    IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €71.00

  • IEC 62951-5:2019

    IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €107.00

  • IEC 62951-7:2019

    IEC 62951-7:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
    2/27/2019 - PDF - English, French - IEC
    Learn More
    €71.00

  • 19/30392174 DC:2019

    BS EN 60747-5-6. Semiconductor devices Part 5-6. Optoelectronic devices. Light emitting diodes
    2/21/2019 - PDF - English - BSI
    Learn More
    €23.70

  • SAE ARP 6338A:2019-02-08

    Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits
    2/8/2019 - PDF - English - SAE
    Learn More
    €77.00

  • BS IEC 63068-2:2019

    Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using optical inspection
    2/8/2019 - PDF - English - BSI
    Learn More
    €215.67

  • IEC 63068-1:2019

    IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
    1/30/2019 - PDF - English - IEC
    Learn More
    €147.00

  • IEC 63068-2:2019

    IEC 63068-2:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
    1/30/2019 - PDF - English - IEC
    Learn More
    €147.00

  • BS IEC 62047-32:2019

    Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
    1/29/2019 - PDF - English - BSI
    Learn More
    €154.05

  • IEC 62047-32:2019

    IEC 62047-32:2019 Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
    1/24/2019 - PDF - English, French - IEC
    Learn More
    €107.00

  • 19/30390371 DC:2019

    BS IEC 60747-14-11. Semiconductor devices Part 14-11. sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
    1/23/2019 - PDF - English - BSI
    Learn More
    €23.70

  • 19/30364443 DC:2019

    BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices Part 35. Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical
    1/4/2019 - PDF - English - BSI
    Learn More
    €23.70

  • ESDA/JEDEC JS-002:2018

    ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
    1/1/2019 - PDF - English - JEDEC
    Learn More
    €186.76

  • 18/30382424 DC:2018

    BS IEC 63068-3. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 3. Test method using photoluminescence
    12/12/2018 - PDF - English - BSI
    Learn More
    €23.70

  • 18/30386543 DC:2018

    BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
    12/11/2018 - PDF - English - BSI
    Learn More
    €23.70

  • IEC 60050-521:2002/AMD2:2018

    IEC 60050-521:2002/AMD2:2018 Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    12/6/2018 - PDF - English, French - IEC
    Learn More
    €10.00

  • 18/30380675 DC:2018

    BS EN IEC 62830-7. Semiconductor devices. devices for energy harvesting and generation Part 7. Linear sliding mode triboelectric
    12/6/2018 - PDF - English - BSI
    Learn More
    €23.70

  • IEC 60050-523:2018

    IEC 60050-523:2018 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
    12/6/2018 - PDF - English, French - IEC
    Learn More
    €147.00

  • 18/30383935 DC:2018

    BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
    12/4/2018 - PDF - English - BSI
    Learn More
    €23.70

  • DIN EN IEC 62969-3 VDE 0884-69-3:2018-12

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (IEC 62969-3:2018); German version EN IEC 62969-3:2018
    12/1/2018 - Paper - German - VDE
    Learn More
    €74.10

  • BS IEC 62951-3:2018

    Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
    11/15/2018 - PDF - English - BSI
    Learn More
    €215.67

  • IEC 62951-3:2018

    IEC 62951-3:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
    11/7/2018 - PDF - English - IEC
    Learn More
    €147.00

  • 18/30383125 DC:2018

    BS EN 61643-321. Components for low-voltage surge protective devices Part 321. Performance requirements and test circuits silicon PN-junction voltage limiters
    11/2/2018 - PDF - English - BSI
    Learn More
    €23.70

  • DIN EN IEC 60749-20-1:2018-11

    Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018
    11/1/2018 - PDF - English, German - DIN
    Learn More
    €147.20

  • 18/30336115 DC:2018

    BS EN 61643-341 Ed 2.0. Components for low-voltage surge protection Part 341. Performance requirements and test circuits thyristor suppressors (TSS)
    10/23/2018 - PDF - English - BSI
    Learn More
    €23.70

  • DIN EN IEC 60749-26 VDE 0884-749-26:2018-10

    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
    10/1/2018 - Paper - German - VDE
    Learn More
    €121.28

  • DIN EN IEC 60749-13:2018-10

    Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018
    10/1/2018 - PDF - German - DIN
    Learn More
    €89.00

  • DIN EN 60749-18:2018-10

    Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
    10/1/2018 - PDF - English, German - DIN
    Learn More
    €108.80

  • NF EN IEC 62435-6, C96-435-6 (10/2018)

    Electronic components - Long-term storage of electronic semiconductor devices - Part 6 : packaged or finished devices - Stockage de longue durée des composants électroniques - Partie 6: Dispositifs encapsulés ou finis
    10/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • UNE-EN IEC 62969-4:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)
    10/1/2018 - PDF - English - AENOR
    Learn More
    €68.00

  • DIN EN IEC 62969-2 VDE 0884-69-2:2018-09

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (IEC 62969-2:2018); German version EN IEC 62969-2:2018
    9/1/2018 - Paper - German - VDE
    Learn More
    €42.45

  • BS EN IEC 62969-4:2018

    Semiconductor devices. interface for automotive vehicles Evaluation method of data vehicle sensors
    8/30/2018 - PDF - English - BSI
    Learn More
    €215.67

  • 18/30381548 DC:2018

    BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
    8/3/2018 - PDF - English - BSI
    Learn More
    €23.70

  • DIN EN IEC 62969-1 VDE 0884-69-1:2018-08

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (IEC 62969-1:2017); German version EN IEC 62969-1:2018
    8/1/2018 - Paper - German - VDE
    Learn More
    €65.60

  • NF EN IEC 62435-4, C96-435-4 (08/2018)

    Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 4 : stockage - Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 4 : Stockage
    8/1/2018 - Paper - French - AFNOR
    Learn More
    €87.39

  • NF EN IEC 62969-4, C96-069-4 (08/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4 : evaluation method of data interface for automotive vehicle sensors - Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 4: Méthode d'évaluation de l'interface de données destinée aux capteurs de véhicules automobiles
    8/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • UNE-EN IEC 62969-3:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in August of 2018.)
    8/1/2018 - PDF - English - AENOR
    Learn More
    €71.00

  • BS IEC 60747-4:2007+A1:2017

    Semiconductor devices. Discrete devices Microwave diodes and transistors
    7/31/2018 - PDF - English - BSI
    Learn More
    €388.68

  • 18/30381200 DC:2018

    BS IEC 60747-17. Semiconductor devices Part 17. Magnetic and capacitive coupler for basic reinforced isolation
    7/20/2018 - PDF - English - BSI
    Learn More
    €23.70

  • 18/30375624 DC:2018

    BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling shipping of surface-mount devices sensitive to the combined effect moisture soldering heat
    7/13/2018 - PDF - English - BSI
    Learn More
    €23.70

  • MIL-PRF-19500/412:2018

    Transistor, NPN, Silicon, Power, Through-Hole Mount Package, Types 2N3846 and 2N3847, JAN, JANTX, JANTXV, and JANS
    7/12/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/552:2018

    Semiconductor Device, Diode, Silicon, Transient Voltage Suppressor, Types 1N6469 Through 1N6476, JAN, JANTX, and JANTXV
    7/5/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • DIN EN 60749-17 VDE 0884-749-17:2018-07

    Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/2465/CDV:2018); German and English version prEN 60749-17:2018
    7/1/2018 - Paper - German - VDE
    Learn More
    €18.19

  • DIN EN IEC 60749-12:2018-07

    Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018
    7/1/2018 - PDF - German - DIN
    Learn More
    €54.80

  • BS EN IEC 62969-3:2018

    Semiconductor devices. interface for automotive vehicles Shock driven piezoelectric energy harvesting vehicle sensors
    6/28/2018 - PDF - English - BSI
    Learn More
    €215.67

  • MIL-PRF-19500/562:2018

    Semiconductor Device, Field Effect Transistor, P-Channel, Silicon, Types 2N6804 and 2N6806 JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
    6/27/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/679:2018

    Semiconductor Device, Diode, Silicon, SCHOTTKY, Type 1N6844U3, JAN, JANTX, JANTXV, and JANS
    6/27/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/563:2018

    Transistor, Field Effect, P-Channel, Silicon, Types 2N6845 and 2N6847, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
    6/26/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • 18/30362458 DC:2018

    BS IEC 60747-14-11. Semiconductor devices Part 14-11. sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
    6/22/2018 - PDF - English - BSI
    Learn More
    €23.70

  • MIL-PRF-19500/366:2018

    Transistor, NPN, Radiation Hardened, Silicon, Amplifier, Types 2N3498, 2N3499, 2N3500, 2N3501, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
    6/21/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/371:2018

    Transistor, NPN, Silicon, High Power, Types 2N3902 and 2N5157, JAN, JANTX, and JANTXV
    6/18/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • IEC 62969-4:2018

    IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
    6/18/2018 - PDF - English, French - IEC
    Learn More
    €107.00

  • MIL-PRF-19500/127:2018

    Semiconductor Devices, Silicon, Voltage Regulator, Types 1N4370A-1 Through 1N4372A-1 and 1N746A-1 Through 1N759A-1, 1N4370AUR-1 Through 1N4372AUR-1 and 1N746AUR-1 Through 1N759AUR-1, 1N4370C-1 Through 1N4372C-1 and 1N746C-1 Through 1N759C-1, 1N4370CUR-1 Through 1N4372CUR-1 and 1N746CUR-1 Through 1N759CUR-1, 1N4370D-1 Through 1N4372D-1 and 1N746D-1 Through 1N759D-1, 1N4370DUR-1 Through 1N4372DUR-1 and 1N746DUR-1 Through 1N759DUR-1, JAN, JANTX, JANTXV, JANHC, and JANKC
    6/15/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/556:2018

    Transistor, Field Effect, N-Channel, Silicon, Types 2N6782, 2N6784, and 2N6786-, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
    6/7/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/676:2018

    Transistor, Field Effect Radiation Hardened, N-Channel, Silicon, Types 2N7465 and 2N7466, JANTXVR and JANSR
    6/7/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/642:2018

    Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Case Mount Through Hole Package, Standard and Reverse Polarity, Types 1N6762 Through 1N6765, Quality Levels JAN, JANTX, JANTXV, and JANS
    6/6/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/241:2018

    Diode, Silicon, Low Leakage, Controlled Forward Voltage, Types 1N3595, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
    6/4/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • MIL-PRF-19500/453:2018

    Transistor, NPN, Silicon, High-Frequency, Amplifier Type 2N5109 Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, JANKC
    6/4/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • NF EN IEC 62969-3, C96-069-3 (06/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3 : shock driven piezoelectric energy harvesting for automotive vehicle sensors - Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 3 : Récupération de l'énergie piézoélectrique produite par les chocs pour les capteurs de véhicules automobiles
    6/1/2018 - Paper - French - AFNOR
    Learn More
    €87.39

  • UNE-EN IEC 62969-2:2018

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (Endorsed by Asociación Española de Normalización in June of 2018.)
    6/1/2018 - PDF - English - AENOR
    Learn More
    €62.00

  • UNE-EN 60191-4:2014/A1:2018

    Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Endorsed by Asociación Española de Normalización in June of 2018.)
    6/1/2018 - PDF - English - AENOR
    Learn More
    €63.00

  • MIL-PRF-19500/565:2018

    Transistor, Field Effect, P-Channel, Silicon, Types 2N6895, 2N6896, 2N6897, and 2N6898, Quality Levels JAN, JANTX, JANTXV, and JANS
    5/31/2018 - PDF sécurisé - English - DODNAV
    Learn More
    €25.00

  • BS EN 60191-4:2014+A1:2018

    Mechanical standardization of semiconductor devices Coding system and classification into forms package outlines for device packages
    5/30/2018 - PDF - English - BSI
    Learn More
    €253.59

  • NF C96-013-4/A1, NF EN 60191-4/A1 (05/2018)

    Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
    5/18/2018 - PDF - English - UTE
    Learn More
    €77.83

  • IEC 62969-3:2018

    IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
    5/7/2018 - PDF - English, French - IEC
    Learn More
    €147.00

  • NF C71-504/A1, NF EN 62504/A1 (05/2018)

    General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
    5/4/2018 - PDF - English - UTE
    Learn More
    €35.75

  • BS IEC 62951-1:2017

    Semiconductor devices. Flexible and stretchable semiconductor devices Bending test method for conductive thin films on flexible substrates
    5/4/2018 - PDF - English - BSI
    Learn More
    €154.05

  • BS EN IEC 62969-2:2018

    Semiconductor devices. interface for automotive vehicles Efficiency evaluation methods of wireless power transmission using resonance sensors
    5/2/2018 - PDF - English - BSI
    Learn More
    €154.05

  • NF EN 60191-4/A1, C96-013-4/A1 (05/2018)

    Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages - Normalisation mécanique des dispositifs à semiconducteurs - Partie 4 : Système de codification et classification en formes des structures des boîtiers pour dispositifs à semiconducteurs
    5/1/2018 - Paper - French - AFNOR
    Learn More
    €74.67

  • DIN EN 60749-43:2018-05

    Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017
    5/1/2018 - PDF - German - DIN
    Learn More
    €125.30

  • UNE-EN IEC 60191-1:2018

    Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (Endorsed by Asociación Española de Normalización in May of 2018.)
    5/1/2018 - PDF - English - AENOR
    Learn More
    €76.00

  • UNE-EN IEC 60749-13:2018

    Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
    5/1/2018 - PDF - English - AENOR
    Learn More
    €63.00

  • UNE-EN IEC 60749-26:2018

    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
    5/1/2018 - PDF - English - AENOR
    Learn More
    €90.00

  • NF EN 62504/A1, C71-504/A1 (05/2018)

    General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions - Eclairage général - Produits à diode électroluminescente (LED) et équipements associés - Termes et définitions
    5/1/2018 - Paper - French - AFNOR
    Learn More
    €34.30

  • BS EN IEC 60191-1:2018

    Mechanical standardization of semiconductor devices General rules for the preparation outline drawings discrete
    4/30/2018 - PDF - English - BSI
    Learn More
    €253.59

  • BS EN IEC 60749-13:2018

    Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
    4/30/2018 - PDF - English - BSI
    Learn More
    €154.05

  • BS EN IEC 60749-26:2018

    Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
    4/30/2018 - PDF - English - BSI
    Learn More
    €300.99

  • PR NF C96-271-1, PR NF EN 63011-1 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 1: General conditions and definitions
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • PR NF C96-271-2, PR NF EN 63011-2 (04/2018)

    Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
    4/27/2018 - Paper - French - AFNOR
    Learn More
    €44.39

  • NF C96-069-2, NF EN IEC 62969-2 (04/2018)

    Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2 : efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
    4/27/2018 - PDF - English - UTE
    Learn More
    €63.42

  • BS EN IEC 60749-12:2018

    Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
    4/18/2018 - PDF - English - BSI
    Learn More
    €130.35

  • NF C96-022-13, NF EN IEC 60749-13 (04/2018)

    Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
    4/13/2018 - PDF - English - UTE
    Learn More
    €77.83

  • PR NF C96-014-1, PR NF EN 63150-1 (04/2018)

    Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
    4/13/2018 - Paper - French - AFNOR
    Learn More
    €71.80

  • IEC 60191-2:1966/AMD20:2018

    IEC 60191-2:1966/AMD20:2018 Amendment 20 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
    4/12/2018 - PDF - English - IEC
    Learn More
    €71.00

  • 18/30355426 DC:2018

    BS EN 62830-5. Semiconductor devices. devices for energy harvesting and generation Part 5. Test method measuring generated power from flexible thermoelectric
    4/10/2018 - PDF - English - BSI
    Learn More
    €23.70

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