31.020 : Electronic components in general
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ASTM E668-20
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
7/1/2020 - PDF - English - ASTM
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ASTM E668-20 + Redline
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
7/1/2020 - PDF - English - ASTM
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ASTM E1854-19
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
10/1/2019 - PDF - English - ASTM
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ASTM E1854-19 + Redline
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
10/1/2019 - PDF - English - ASTM
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ASTM F1190-18
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
3/1/2018 - PDF - English - ASTM
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ASTM F1190-18 + Redline
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
3/1/2018 - PDF - English - ASTM
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ASTM F1467-18
Standard Guide for Use of an X-Ray Tester (≈,10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
3/1/2018 - PDF - English - ASTM
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ASTM F1467-18 + Redline
Standard Guide for Use of an X-Ray Tester (≈,10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
3/1/2018 - PDF - English - ASTM
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ASTM E1250-15(2020)
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
1/1/2015 - PDF - English - ASTM
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ASTM E1250-15(2020) + Redline
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
1/1/2015 - PDF - English - ASTM
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ASTM F1263-11(2019)
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
1/1/2011 - PDF - English - ASTM
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ASTM F1263-11(2019) + Redline
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
1/1/2011 - PDF - English - ASTM
Learn More€57.00
