29.045 : Semiconducting materials
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JIS R 1650-1:2002 (R2016)
Testing method for fine ceramics thermoelectric materials Part 1: Thermoelectric power
3/20/2002 - PDF - Japanese - JSA
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JIS R 1650-2:2002 (R2016)
Testing method for fine ceramics thermoelectric materials Part 2: Resistivity
3/20/2002 - PDF - Japanese - JSA
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JIS R 1650-3:2002 (R2016)
Method for measurement of fine ceramics thermoelectric materials Part 3: Thermal diffusivity, specific heat capacity, and thermal conductivity
3/20/2002 - PDF - Japanese - JSA
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JIS R 1651:2002 (R2016)
Method for measurement of pyroelectric coefficient of fine ceramics
3/20/2002 - PDF - Japanese - JSA
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JIS R 1801:2002 (R2016)
Method of measuring spectral emissivity of ceramic radiating materials for infrared heaters by using FTIR
3/20/2002 - PDF - Japanese - JSA
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JIS H 0614:1996 (R2015)
Visual inspection for silicon wafers with specular surfaces
1/1/1996 - PDF - Japanese - JSA
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JIS H 0602:1995 (R2015)
Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
11/1/1995 - PDF - Japanese - JSA
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JIS H 0604:1995 (R2014)
Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method
7/1/1995 - PDF - Japanese - JSA
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JIS H 0611:1994 (R2015)
Methods of measurement of thickness, thickness variation and bow for silicon wafer
1/1/1994 - PDF - Japanese - JSA
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JIS H 0603:1978 (R2014)
Measurement of minority carrier life time in germanium by photoconductive decay method
3/1/1978 - PDF - Japanese - JSA
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JIS H 0607:1978 (R2014)
Determination of conductivity type in germanium by thermoelectromotive method
3/1/1978 - PDF - Japanese - JSA
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€25.00
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JIS H 0610:1966 (R2014)
Method of measurement of etch pit density of germanium crystal
12/1/1966 - PDF - Japanese - JSA
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€25.00
