29.045 : Semiconducting materials
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DIN 50451-4:2024-01
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
1/1/2024 - PDF - German - DIN
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DIN 50453-1:2023-08
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method
8/1/2023 - PDF - German - DIN
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DIN 50453-2:2023-08
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method
8/1/2023 - PDF - German - DIN
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DIN 50451-8:2022-08
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS
8/1/2022 - PDF - German - DIN
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DIN 50451-5:2022-08
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram
8/1/2022 - PDF - German - DIN
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DIN 50450-9:2021-07
Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C<(Index)1>-C<(Index)3>-hydrocarbons in gaseous hydrogen chloride by gaschromatography
7/1/2021 - PDF - German - DIN
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DIN 50451-7:2018-04
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
4/1/2018 - PDF - German - DIN
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DIN SPEC 1994:2017-02
Testing of materials for semiconductor technology - Determination of anions in weak acids
2/1/2017 - PDF - German - DIN
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DIN 50451-3:2014-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
11/1/2014 - PDF - German - DIN
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DIN 50451-6:2014-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH<(Index)4>F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
11/1/2014 - PDF - German - DIN
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DIN 50455-1:2009-10
Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods
10/1/2009 - PDF - German - DIN
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DIN 50452-2:2009-10
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
10/1/2009 - PDF - German - DIN
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DIN 50451-4:2007-02
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
2/1/2007 - PDF - German - DIN
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DIN 50455-2:1999-11
Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
11/1/1999 - PDF - German - DIN
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DIN 50455-2:1999-11
Characterization of photoresists used in semiconductor technology - Part 2: Determination of photosensitivity of positive photoresists
11/1/1999 - PDF - English - DIN
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DIN 50452-1:1995-11
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
11/1/1995 - PDF - German - DIN
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DIN 50452-1:1995-11
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
11/1/1995 - PDF - English - DIN
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DIN 50452-3:1995-10
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
10/1/1995 - PDF - German - DIN
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DIN 50452-3:1995-10
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
10/1/1995 - PDF - English - DIN
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DIN 50450-4:1993-09
Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C1-C3-hydrocarbons in nitrogen by gas-chromatography
9/1/1993 - PDF - German - DIN
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DIN 50450-2:1991-03
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N2, Ar, He, Ne and H2 by using a galvanic cell
3/1/1991 - PDF - German - DIN
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DIN 50450-1:1987-08
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell
8/1/1987 - PDF - German - DIN
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€45.98
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€57.57
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€32.34
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DIN 1715-2:1983-11
Thermostat metals, testing the specific thermal curvature
11/1/1983 - PDF - English - DIN
Learn More€40.56
