29.045 : Semiconducting materials
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ASTM F980-16(2024) + Redline
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
12/1/2016 - PDF - English -
Learn More€72.00 -
ASTM F980-16(2024)
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
12/1/2016 - PDF - English -
Learn More€60.00 -
ASTM D6095-12(2023)
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
11/1/2012 - PDF - English -
Learn More€48.00 -
ASTM D6095-12(2023) + Redline
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
1/1/2012 - PDF - English -
Learn More€57.00 -
ASTM E1438-11(2019)
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
1/1/2011 - PDF - English -
Learn More€46.00 -
ASTM E1438-11(2019) + Redline
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
1/1/2011 - PDF - English -
Learn More€53.00 -
ASTM D3004-08(2020)
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
1/1/2008 - PDF - English -
Learn More€46.00 -
ASTM D3004-08(2020) + Redline
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
1/1/2008 - PDF - English -
Learn More€53.00
