Name | Support | Language | Availability | Edition date | Price | ||
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PDF |
English |
Active |
1/1/2019 |
€186.76 |
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Details
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. To perform the tests, the devices must be assembled into a package similar to that expected in the final application.
Additional Info
Author | JEDEC Solid State Technology Association (JEDEC) |
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Published by | JEDEC |
Document type | Standard |
ICS | 31.080.01 : Semiconductor devices in general
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Number of pages | 40 |
Replace | ANSI/ESDA/JEDEC JS-002:2014 |
ANSI Approved |