31.200 : Integrated circuits. Microelectronics
-
BS IEC 61523-1:2023
Delay and power calculation standards Integrated Circuit (IC) Open Library Architecture (OLA)
2/12/2024 - PDF - English -
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€449.00
-
IEC 63055:2023
IEC 63055:2023 Format for LSI-Package-Board Interoperable design
10/11/2023 - PDF - English -
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IEEE 1241:2023
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
10/6/2023 - PDF - English -
Learn More€151.00 -
IEEE 1241:2023
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
10/6/2023 - Paper - English -
Learn More€188.00 -
€377.00
-
UNE-EN IEC 62228-3:2019/AC:2023-07
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in August of 2023.)
8/2/2023 - PDF - English -
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UNE-EN IEC 61967-8:2023
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)
7/26/2023 - PDF - English -
Learn More€65.00 -
BS EN IEC 61967-8:2023 + Redline
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions radiated emissions. IC stripline method
6/26/2023 - PDF - English -
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BS EN IEC 61967-8:2023
Integrated circuits. Measurement of electromagnetic emissions radiated emissions. IC stripline method
6/15/2023 - PDF - English -
Learn More€180.00 -
NF EN IEC 61967-8, C96-260-8 (06/2023)
Circuits intégrés - Mesure des émissions électromagnétiques - Partie 8 : mesure des émissions rayonnées - Méthode de la ligne TEM à plaques (stripline) pour circuit intégré
6/1/2023 - Paper - French -
Learn More€88.33 -
BS EN IEC 60747-16-7:2022
Semiconductor devices Microwave integrated circuits. Attenuators
5/25/2023 - PDF - English -
Learn More€331.00 -
BS EN IEC 60747-16-8:2022
Semiconductor devices Microwave integrated circuits. Limiters
5/25/2023 - PDF - English -
Learn More€293.00 -
IEC 61967-8:2023
IEC 61967-8:2023 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
5/3/2023 - PDF - English, French -
Learn More€132.00 -
IEC 61967-8:2023 + Redline
IEC 61967-8:2023 (Redline version) Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
5/3/2023 - PDF - English -
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PR NF EN IEC 60747-16-9, C96-016-9PR (05/2023)
Dispositifs à semiconducteurs - Partie 16-9 : circuits intégrés hyperfréquences - Déphaseurs
5/1/2023 - Paper - English, French -
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NF EN IEC 63287-2, C96-287-2 (05/2023)
Dispositifs à semiconducteurs - Lignes directrices concernant les plans de qualification de la fiabilité - Partie 2 : concept de profil de mission
5/1/2023 - Paper - French -
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UNE-EN 160000/A1:1995
GENERIC SPECIFICATION: MODULAR ELECTRONIC UNITS (Endorsed by AENOR in November of 1996.)
3/31/2023 - PDF - English -
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PR NF EN IEC 62228-5/A1, C96-228-5/A1PR (02/2023)
Amendement 1 - Circuits intégrés - Evaluation de la CEM des émetteurs-récepteurs - Partie 5 : emetteurs-récepteurs Ethernet
2/1/2023 - Paper - English, French -
Learn More€64.50 -
€120.00
-
€348.00
-
NF EN IEC 62228-6, C96-228-6 (12/2022)
Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 6 : émetteurs-récepteurs PSI5
12/1/2022 - Paper - French -
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IEC 62228-6:2022
IEC 62228-6:2022 Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
11/8/2022 - PDF - English, French -
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UNE-EN IEC 62228-6:2022
Integrated circuit - EMC Evaluation of transceivers - Part 6: PSI5 transceivers (Endorsed by Asociación Española de Normalización in January of 2023.)
10/12/2022 - PDF - English -
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IEEE 1500:2022
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
10/12/2022 - PDF - English -
Learn More€156.00 -
IEEE 1500:2022
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
10/12/2022 - Paper - English -
Learn More€194.00 -
BS EN IEC 62228-7:2022
Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
5/11/2022 - PDF - English -
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UNE-EN IEC 62228-7:2022
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers (Endorsed by Asociación Española de Normalización in May of 2022.)
5/1/2022 - PDF - English -
Learn More€90.00 -
NF EN IEC 62228-7, C96-228-7 (04/2022)
Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 7 : émetteurs-récepteurs CXPI
4/1/2022 - Paper - French -
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22/30447599 DC:2022
BS EN 62228-5 Amd.1 Ed.1.0. Integrated circuits. EMC evaluation of transceivers Part 5. Ethernet
3/29/2022 - PDF - English -
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IEC 62228-7:2022
IEC 62228-7:2022 Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
2/22/2022 - PDF - English, French -
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€120.00
-
€120.00
-
JEDEC JESD22-B118A:2021
SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
11/1/2021 - PDF - English -
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NF EN IEC 63287-1, C96-287-1 (10/2021)
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1 : Guidelines for LSI reliability qualification
10/1/2021 - Paper - French -
Learn More€141.33 -
€74.00
-
UNE-EN IEC 62228-5:2021
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers (Endorsed by Asociación Española de Normalización in July of 2021.)
7/1/2021 - PDF - English -
Learn More€143.00 -
€398.00
-
NF EN IEC 62228-5, C96-228-5 (06/2021)
Integrated circuits - EMC evaluation of transceivers - Part 5 : Ethernet transceivers
6/1/2021 - Paper - French -
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UNE-EN IEC 61967-4:2021
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method (Endorsed by Asociación Española de Normalización in June of 2021.)
6/1/2021 - PDF - English -
Learn More€87.00 -
BS EN IEC 61967-4:2021
Integrated circuits. Measurement of electromagnetic emissions conducted emissions. 1 O/150 O direct coupling method
5/6/2021 - PDF - English -
Learn More€331.00 -
IEC 62228-5:2021
IEC 62228-5:2021 Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
4/26/2021 - PDF - English -
Learn More€431.00 -
IEC 62228-5:2021
IEC 62228-5:2021 Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
4/26/2021 - PDF - English, French -
Learn More€431.00 -
NF EN IEC 61967-4, C96-260-4 (04/2021)
Integrated circuits - Measurement of electromagnetic emissions - Part 4 : measurement of conducted emissions - 1 omega/150 omega direct coupling method - Circuits intégrés - Mesure des émissions électromagnétiques - Partie 4 : Mesure des émissions conduites - Méthode par couplage direct 1 ohm/150 ohms
4/1/2021 - Paper - French -
Learn More€127.67 -
IEC 61967-4:2021 + Redline
IEC 61967-4:2021 (Redline version) Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
3/16/2021 - PDF - English -
Learn More€404.00 -
IEC 61967-4:2021
IEC 61967-4:2021 Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
3/16/2021 - PDF - English, French -
Learn More€311.00 -
21/30433680 DC:2021
BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
2/5/2021 - PDF - English -
Learn More€24.00 -
€30.00
-
UNE-EN IEC 62433-6:2020
EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) (Endorsed by Asociación Española de Normalización in January of 2021.)
1/1/2021 - PDF - English -
Learn More€98.00 -
BS EN IEC 62433-6:2020
EMC IC modelling Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Immunity (ICIM-CPI)
11/11/2020 - PDF - English -
Learn More€348.00 -
NF EN IEC 62433-6, C96-070-6 (11/2020)
EMC IC modelling - Part 6 : models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) - Modèles de circuits intégrés pour la CEM - Partie 6 : Modèles de circuits intégrés pour la simulation du comportement d'immunité aux impulsions - Modélisation de l'immunité aux impulsions conduite (ICIMCPI)
11/1/2020 - Paper - French -
Learn More€170.00 -
IEC 62433-6:2020
IEC 62433-6:2020 EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)
9/22/2020 - PDF - English, French -
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NF EN 60747-16-5/A1, C96-016-5/A1 (09/2020)
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
9/1/2020 - Paper - French -
Learn More€54.67 -
UNE-EN IEC 62433-1:2019/AC:2020-07
EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in September of 2020.)
9/1/2020 - PDF - English -
Learn More€0.00 -
20/30426553 DC:2020
BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
8/28/2020 - PDF - English -
Learn More€24.00 -
€348.00
-
IEEE 1481:2019
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - Paper - English -
Learn More€561.00 -
IEEE 1481:2019
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - PDF - English -
Learn More€345.00 -
IEEE 1838:2019
IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
3/13/2020 - PDF - English -
Learn More€99.00 -
IEEE 1481:2019 Redline
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
3/13/2020 - PDF - English -
Learn More€466.00 -
IEEE 1838:2019
IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
3/13/2020 - Paper - English -
Learn More€124.00 -
BS EN IEC 61967-1:2019 + Redline
Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
2/24/2020 - PDF - English -
Learn More€326.00 -
ASTM E1855-20
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
2/1/2020 - PDF - English -
Learn More€51.00 -
ASTM E1855-20 + Redline
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
2/1/2020 - PDF - English -
Learn More€61.00 -
IEEE 2401:2019
IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - PDF - English -
Learn More€194.00 -
IEEE 2401:2019 Redline
IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - PDF - English -
Learn More€271.00 -
IEEE 2401:2019
IEEE Standard Format for LSI-Package-Board Interoperable Design
1/27/2020 - Paper - English -
Learn More€326.00 -
€60.00
-
€60.00
-
MIL-STD-883-5:2019 & CN1:2021
Test Procedures for Microcircuits Part 5: Test Methods 5000-5999
9/16/2019 - PDF - English -
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MIL-STD-883-3:2019
Electrical Tests (Digital) for Microcircuits Part 3: Test Methods 3000-3999
9/16/2019 - PDF - English -
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MIL-STD-883-1:2019 & C1:2021
Environmental Test Methods for Microcircuits Part 1: Test Methods 1000-1999
9/16/2019 - PDF - English -
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MIL-STD-883-4:2019
Electrical Tests (Linear) for Microcircuits Part 4: Test Methods 4000-4999
9/16/2019 - PDF - English -
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MIL-STD-883-2:2019 & C1:2022
Mechanical Test Methods for Microcircuits Part 2: Test Methods 2000-2999
9/16/2019 - PDF - English -
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IEEE 2416:2019
IEEE Standard for Power Modeling to Enable System-Level Analysis
7/31/2019 - Paper - English -
Learn More€100.00 -
IEEE 2416:2019
IEEE Standard for Power Modeling to Enable System-Level Analysis
7/31/2019 - PDF - English -
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19/30376552 DC:2019
BS EN 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI
6/19/2019 - PDF - English -
Learn More€24.00 -
UNE-EN IEC 62433-1:2019
EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in June of 2019.)
6/1/2019 - PDF - English -
Learn More€72.00 -
UNE-EN IEC 62228-3:2019
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in June of 2019.)
6/1/2019 - PDF - English -
Learn More€116.00 -
NF EN IEC 62228-3, C96-228-3 (05/2019)
Integrated circuits - EMC evaluation of transceivers - Part 3 : CAN transceivers - Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3 : Émetteurs-récepteurs CAN
5/1/2019 - Paper - French -
Learn More€183.00 -
€170.00
-
IEEE 1801:2018
IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems
3/29/2019 - Paper - English -
Learn More€431.00 -
IEC 62228-3:2019
IEC 62228-3:2019 Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
3/11/2019 - PDF - English, French -
Learn More€397.00 -
IEC 62433-1:2019
IEC 62433-1:2019 EMC IC modelling - Part 1: General modelling framework
3/8/2019 - PDF - English -
Learn More€345.00 -
IEC 62433-1:2019
IEC 62433-1:2019 EMC IC modelling - Part 1: General modelling framework
3/8/2019 - PDF - English, French -
Learn More€345.00 -
UNE-EN IEC 61967-1:2019
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in March of 2019.)
3/1/2019 - PDF - English -
Learn More€71.00 -
BS EN IEC 61967-1:2019
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions
2/21/2019 - PDF - English -
Learn More€250.00 -
NF EN IEC 61967-1, C96-260-1 (02/2019)
Integrated circuits - Measurement of electromagnetic emissions - Part 1 : general conditions and definitions
2/1/2019 - Paper - French -
Learn More€116.33 -
BS IEC 63011-3:2018
Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via
1/24/2019 - PDF - English -
Learn More€180.00 -
BS IEC 63011-2:2018
Integrated circuits. Three dimensional integrated circuits Alignment of stacked dies having fine pitch interconnect
1/24/2019 - PDF - English -
Learn More€180.00 -
BS IEC 63011-1:2018
Integrated circuits. Three dimensional integrated circuits Terminology
1/24/2019 - PDF - English -
Learn More€180.00 -
IEC 61967-1:2018 + Redline
IEC 61967-1:2018 (Redline version) Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
12/12/2018 - PDF - English -
Learn More€284.00 -
IEC 61967-1:2018
IEC 61967-1:2018 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
12/12/2018 - PDF - English, French -
Learn More€219.00 -
DIN EN IEC 62228-1 VDE 0847-28-1:2018-12
Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 62228-1:2018), German version EN IEC 62228-1:2018
12/1/2018 - Paper - German -
Learn More€42.45 -
IEC 63011-2:2018
IEC 63011-2:2018 Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
11/28/2018 - PDF - English, French -
Learn More€92.00 -
IEC 63011-3:2018
IEC 63011-3:2018 Integrated circuits - Three dimensional integrated circuits - Part 3: Model and measurement conditions of through-silicon via
11/28/2018 - PDF - English, French -
Learn More€92.00 -
IEC 63011-1:2018
IEC 63011-1:2018 Integrated circuits - Three dimensional integrated circuits - Part 1: Terminology
11/28/2018 - PDF - English, French -
Learn More€92.00 -
UNE-EN IEC 62228-1:2018
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in July of 2018.)
7/1/2018 - PDF - English -
Learn More€58.00 -
BS EN IEC 62228-1:2018
Integrated circuits. EMC evaluation of transceivers General conditions and definitions
6/12/2018 - PDF - English -
Learn More€151.00 -
NF EN IEC 62228-1, C96-228-1 (06/2018)
Integrated circuits - EMC evaluation of transceivers - Part 1 : general conditions and definitions
6/1/2018 - Paper - French -
Learn More€88.33 -
BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers
4/10/2018 - PDF - English -
Learn More€377.00 -
DIN EN 60747-16-3:2018-04
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017), German version EN 60747-16-3:2002 + A1:2009 + A2:2017.
4/1/2018 - PDF - German -
Learn More€136.82 -
DIN EN 62435-3 VDE 0884-135-3:2018-02
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data (IEC 47/2430/CD:2017)
2/1/2018 - Paper - German -
Learn More€18.19 -
IEEE 1804:2017
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
1/31/2018 - PDF - English -
Learn More€54.00 -
IEEE 1804:2017
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
1/31/2018 - Paper - English -
Learn More€68.00 -
IEC 62228-1:2018
IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
1/9/2018 - PDF - English -
Learn More€23.00 -
IEC 62228-1:2018
IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
1/9/2018 - PDF - English, French -
Learn More€23.00 -
ANSI/VITA 46.9:2018
PMC/XMC Rear I/O Fabric Signal Mapping on 3U and 6U VPX Modules Standard
1/1/2018 - PDF - English -
Learn More€90.00 -
BS EN 62433-3:2017
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions (ICEM-RE)
12/13/2017 - PDF - English -
Learn More€377.00 -
DIN EN 62090:2017-12
Product package labels for electronic components using bar code and two- dimensional symbologies (IEC 62090:2017), German version EN 62090:2017.
12/1/2017 - PDF - German -
Learn More€115.33 -
BS EN 62433-2:2017
EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions (ICEM-CE)
11/14/2017 - PDF - English -
Learn More€398.00 -
DIN EN 62433-6 VDE 0847-33-6:2017-11
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)
11/1/2017 - Paper - German -
Learn More€53.63 -
NF EN 60747-16-4/A2, C96-016-4/A2 (11/2017)
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
11/1/2017 - Paper - French -
Learn More€54.50 -
DIN EN 61967-1 VDE 0847-21-1:2017-11
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 47A/1022/CD:2017)
11/1/2017 - Paper - German -
Learn More€29.12 -
DIN EN 62433-3 VDE 0847-33-3:2017-10
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (IEC 62433-3:2017), German version EN 62433-3:2017
10/1/2017 - Paper - German -
Learn More€169.34 -
DIN EN 62435-5 VDE 0884-135-5:2017-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017), German version EN 62435-5:2017
10/1/2017 - Paper - German -
Learn More€69.60 -
DIN EN 62435-1 VDE 0884-135-1:2017-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017), German version EN 62435-1:2017
10/1/2017 - Paper - German -
Learn More€91.70 -
DIN EN 62433-1 VDE 0847-33-1:2017-10
Integrated circuits - EMC IC modelling - Part 1: General modelling framework (IEC 47A/1011/CD:2017)
10/1/2017 - Paper - German -
Learn More€61.54 -
DIN EN 62433-2 VDE 0847-33-2:2017-10
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017), German version EN 62433-2:2017
10/1/2017 - Paper - German -
Learn More€192.57 -
DIN EN 62435-2 VDE 0884-135-2:2017-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017), German version EN 62435-2:2017
10/1/2017 - Paper - German -
Learn More€65.60 -
DIN EN 62228-2 VDE 0847-28-2:2017-09
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers (IEC 62228-2:2016), German version EN 62228-2:2017
9/1/2017 - Paper - German -
Learn More€104.79 -
UNE-EN 61967-4:2002/AC:2017-07
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by Asociación Española de Normalización in September of 2017.)
9/1/2017 - PDF - English -
Learn More€0.00 -
UNE-EN 62090:2017
Product package labels for electronic components using bar code and two- dimensional symbologies (Endorsed by Asociación Española de Normalización in August of 2017.)
8/1/2017 - PDF - English -
Learn More€72.00 -
BS EN 62090:2017
Product package labels for electronic components using bar code and two- dimensional symbologies
7/31/2017 - PDF - English -
Learn More€293.00 -
IEEE 1149.10:2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
7/28/2017 - PDF - English -
Learn More€99.00 -
IEEE 1149.10:2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
7/28/2017 - Paper - English -
Learn More€122.00 -
NF EN 62090, C90-530 (07/2017)
Product package labels for electronic components using bar code and two-dimensional symbologies
7/1/2017 - Paper - French -
Learn More€116.33 -
UNE-EN 62433-3:2017
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) (Endorsed by Asociación Española de Normalización in July of 2017.)
7/1/2017 - PDF - English -
Learn More€124.00 -
NF EN 62433-2, C96-070-2 (07/2017)
EMC IC modelling - Part 2 : models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
7/1/2017 - Paper - French -
Learn More€211.96 -
DIN EN 62228-3 VDE 0847-28-3:2017-06
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (IEC 47A/1004/CD:2017)
6/1/2017 - Paper - German -
Learn More€57.53 -
UNE-EN 62433-2:2017
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (Endorsed by Asociación Española de Normalización in June of 2017.)
6/1/2017 - PDF - English -
Learn More€137.00 -
DIN EN 62433-4 VDE 0847-33-4:2017-05
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) (IEC 62433-4:2016), German version EN 62433-4:2016
5/1/2017 - Paper - German -
Learn More€183.01 -
IEC 62090:2017
IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
4/11/2017 - PDF - English, French -
Learn More€270.00 -
IEC 62090:2017
IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
4/11/2017 - PDF - English -
Learn More€270.00 -
UNE-EN 62228-2:2017
Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers (Endorsed by Asociación Española de Normalización in March of 2017.)
3/1/2017 - PDF - English -
Learn More€78.00 -
€331.00
-
IEC 62433-3:2017
IEC 62433-3:2017 EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
1/27/2017 - PDF - English, French -
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IEC 62433-2:2017
IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
1/27/2017 - PDF - English, French -
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€30.00
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ANSI/VITA 68.1:2017 + Errata
VPX Compliance Channel - Fixed Signal Integrity Budget Standard
1/1/2017 - PDF - English -
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UNE-EN 62433-4:2016
EMC IC modelling - Part 4: Models of Integrated Circuits for RF Immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI) (Endorsed by AENOR in December of 2016.)
12/1/2016 - PDF - English -
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BS EN 62433-4:2016
EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted (ICIM-CI)
11/30/2016 - PDF - English -
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IEC 62228-2:2016
IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
11/18/2016 - PDF - English, French -
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DIN EN 62132-1 VDE 0847-22-1:2016-09
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 62132-1:2015), German version EN 62132-1:2016
9/1/2016 - Paper - German -
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IEC 62433-4:2016
IEC 62433-4:2016 EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
5/25/2016 - PDF - English, French -
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UNE-EN 62132-1:2016
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (Endorsed by AENOR in April of 2016.)
4/1/2016 - PDF - English -
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€168.00
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BS EN 62132-1:2016
Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
3/31/2016 - PDF - English -
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IEC 62132-1:2015
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
10/29/2015 - PDF - English, French -
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PD IEC/TR 61967-1-1:2015
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
9/30/2015 - PDF - English -
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IEC TR 61967-1-1:2015
IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
8/28/2015 - PDF - English -
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DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
8/1/2015 - Paper - German -
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DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
8/1/2015 - Paper - German -
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IEEE 1687:2014
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
12/5/2014 - Paper - English -
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IEEE 1687:2014
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
12/5/2014 - PDF - English -
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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity radiated immunity. Surface scan method
9/30/2014 - PDF - English -
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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions radiated emissions. Surface scan method
9/30/2014 - PDF - English -
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IEC TS 61967-3:2014
IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
8/25/2014 - PDF - English, French -
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IEC TS 62132-9:2014
IEC TS 62132-9:2014 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
8/21/2014 - PDF - English, French -
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14/30310478 DC:2014
BS EN 62433-3. EMC IC modelling. Part 3. Models of Integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
7/17/2014 - PDF - English -
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DIN EN 62215-3 VDE 0847-23-3:2014-04
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013), German version EN 62215-3:2013
4/1/2014 - Paper - German -
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NF EN 60747-16-5, C96-016-5 (02/2014)
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
2/1/2014 - Paper - French -
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EIA-944:2013
Surface Mount Ferrite Chip Bead Qualification Specification
12/1/2013 - PDF sécurisé - English -
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UNE-EN 62215-3:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (Endorsed by AENOR in November of 2013.)
11/1/2013 - PDF - English -
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BS EN 62215-3:2013
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
10/31/2013 - PDF - English -
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DIN 51456:2013-10
Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
10/1/2013 - PDF - German -
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IEC 62215-3:2013
IEC 62215-3:2013 Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
7/17/2013 - PDF - English, French -
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DIN EN 62132-8 VDE 0847-22-8:2013-03
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012), German version EN 62132-8:2012
3/1/2013 - Paper - German -
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€60.00
-
UNE-EN 62132-8:2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)
11/1/2012 - PDF - English -
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BS EN 62132-8:2012
Integrated circuits. Measurement of electromagnetic immunity radiated immunity. IC stripline method
10/31/2012 - PDF - English -
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IEC 62132-8:2012
IEC 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
7/6/2012 - PDF - English, French -
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NF EN 60747-16-4/A1, C96-016-4/A1 (07/2012)
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
7/1/2012 - Paper - French -
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DIN EN 61967-8 VDE 0847-21-8:2012-04
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011), German version EN 61967-8:2011
4/1/2012 - Paper - German -
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UNE-EN 61967-8:2011
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by AENOR in January of 2012.)
1/1/2012 - PDF - English -
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€60.00
-
€30.00
-
€30.00
-
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete and integrated circuits
7/31/2011 - PDF - English -
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BS IEC 60748-11:2000
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated excluding hybrid
7/31/2011 - PDF - English -
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UNE-EN 62132-2:2011
Integrated circuits - Measurement of electromagnetic immunity -- Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (Endorsed by AENOR in July of 2011.)
7/1/2011 - PDF - English -
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DIN EN 62132-2 VDE 0847-22-2:2011-07
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010), German version EN 62132-2:2011
7/1/2011 - Paper - German -
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BS EN 62132-2:2011
Integrated circuits. Measurement of electromagnetic immunity radiated immunity. TEM cell and wideband method
4/30/2011 - PDF - English -
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€250.00
-
DIN EN 61967-6 Berichtigung 1:2011-02
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008), German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10, (IEC-Cor. :2010 to IEC 61967-6:2002)
2/1/2011 - PDF - German -
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BS EN 61967-6:2002+A1:2008
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Magnetic probe method
12/31/2010 - PDF - English -
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DIN EN 62417:2010-12
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010), German version EN 62417:2010
12/1/2010 - PDF - German -
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IEC TR 62433-2-1:2010
IEC TR 62433-2-1:2010 EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
10/5/2010 - PDF - English, French -
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IEC 62132-2:2010
IEC 62132-2:2010 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
3/30/2010 - PDF - English, French -
Learn More€173.00 -
€60.00
-
DIN EN 61967-6:2008-10
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008), German version EN 61967-6:2002 + A1:2008.
10/1/2008 - PDF - German -
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BS IEC 60748-2-20:2008
Semiconductor devices. Integrated circuits Digital integrated circuits. Family specification. Low voltage
9/30/2008 - PDF - English -
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UNE-EN 61967-6:2002/A1:2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
9/1/2008 - PDF - English -
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IEC 61967-6:2002+AMD1:2008 Edition 1.1
IEC 61967-6:2002+AMD1:2008 (Consolidated version) Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
6/24/2008 - PDF - English, French -
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NF EN 61967-6/A1, C96-260-6/A1 (06/2008)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method - Circuits intégrés
6/1/2008 - Paper - French -
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DIN EN 62132-3:2008-04
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method (IEC 62132-3:2007); German version EN 62132-3:2007
4/1/2008 - PDF - German -
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IEC 61967-6:2002/AMD1:2008
IEC 61967-6:2002/AMD1:2008 Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
3/12/2008 - PDF - English, French -
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IEC 60748-2-20:2008
IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
2/27/2008 - PDF - English, French -
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BS IEC 62528:2007
Standard testability method for embedded core-based integrated circuits
12/31/2007 - PDF - English -
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BS EN 62132-3:2007
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
11/30/2007 - PDF - English -
Learn More€180.00