31.080 : Semiconductor devices 31 : Electronics ICS

DIN EN IEC 60749-5:2024-04

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022), German and English version prEN IEC 60749-5:2022
4/1/2024 - PDF - English, German - DIN
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€65.89

DIN EN IEC 60747-16-8:2024-04

Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (IEC 60747-16-8:2022), German version EN IEC 60747-16-8:2023
4/1/2024 - PDF - German - DIN
Learn More

€120.84

DIN EN IEC 60747-16-7:2024-04

Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 60747-16-7:2022), German version EN IEC 60747-16-7:2023
4/1/2024 - PDF - German - DIN
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€131.96

24/30490678 DC:2024

BS IEC 60747-5-18 Semiconductor devices Part 5-18: Optoelectronic - Light emitting diodes Test method light diodesof the macro photoluminescence for epitaxial wafers of micro
3/29/2024 - PDF - English - BSI
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€24.00

BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical
3/22/2024 - PDF - English - BSI
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€180.00

IEC 62047-43:2024

IEC 62047-43:2024 Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
3/19/2024 - PDF - English - IEC
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€132.00

24/30488515 DC:2024

BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
3/5/2024 - PDF - English - BSI
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€24.00

BS IEC 62047-44:2024

Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive
2/29/2024 - PDF - English - BSI
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€180.00

IEC 62047-44:2024

IEC 62047-44:2024 Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
2/22/2024 - PDF - English - IEC
Learn More

€132.00

BS EN IEC 60749-5:2024 + Redline

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
2/9/2024 - PDF - English - BSI
Learn More

€235.00

BS EN IEC 60749-5:2024

Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
2/6/2024 - PDF - English - BSI
Learn More

€180.00

PR NF EN IEC 62007-2, C93-801-2PR (02/2024)

Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes fibroniques - Partie 2 : méthodes de mesure
2/1/2024 - Paper - English, French - AFNOR
Learn More

€115.50

PR NF IEC 60749-34-1, C96-022-34-1PR (02/2024)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 34-1 : essai de cycles en puissance pour modules de puissance à semiconducteurs
2/1/2024 - Paper - English, French - AFNOR
Learn More

€88.50

24/30486622 DC:2024

BS EN IEC 62047-49. Semiconductor devices. Micro-electromechanical devices Part 49. Reliability test methods of electro-mechanical conversion characteristics piezoelectric MEMS cantilever
2/1/2024 - PDF - English - BSI
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€24.00

NF EN IEC 60749-5, C96-022-5 (01/2024)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5 : essai continu de durée de vie sous température et humidité avec polarisation
1/1/2024 - Paper - French - AFNOR
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€72.00

IEC 60749-5:2023

IEC 60749-5:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12/19/2023 - PDF - English, French - IEC
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€46.00

IEC 60749-5:2023 + Redline

IEC 60749-5:2023 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
12/19/2023 - PDF - English - IEC
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€60.00

DIN EN IEC 60749-37:2023-12

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022), German version EN IEC 60749-37:2022.
12/1/2023 - PDF - German - DIN
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€99.35

DIN EN IEC 60749-10:2023-12

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022), German version EN IEC 60749-10:2022.
12/1/2023 - PDF - German - DIN
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€85.79

NF EN IEC 63203-401-1, C90-901-401-1 (11/2023)

Technologies et dispositifs électroniques prêt-à-porter - Partie 401-1 : dispositifs et systèmes : éléments de fonctionnement - Méthode d'évaluation de la jauge de contrainte extensible de type résistif
11/1/2023 - Paper - French - AFNOR
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€103.33

PR NF EN IEC 60749-20-1, C96-022-20-1PR (11/2023)

Dispositifs à semi-conducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20-1: Manipulation, emballage, étiquetage et transport des composants pour montage en surface sensibles à l'effet combiné de l'humidité et de la chaleur de brasage
11/1/2023 - Paper - English, French - AFNOR
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€115.50

PR NF EN IEC 62868-2-2/A1, C71-868-2-2/A1PR (11/2023)

Amendement 1 - Sources lumineuses à diodes électroluminescentes organiques (OLED) destinées à l'éclairage général - Sécurité - Partie 2-2: Exigences particulières - Modules OLED intégrés
11/1/2023 - Paper - English, French - AFNOR
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€45.00

BS IEC 60747-5-4:2022 + Redline

Tracked Changes. Semiconductor devices Optoelectronic devices. lasers
10/31/2023 - PDF - English - BSI
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€382.00

23/30481371 DC:2023

BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
10/20/2023 - PDF - English - BSI
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€24.00

DIN EN IEC 63364-1:2023-10

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021), German and English version prEN IEC 63364-1:2021
10/1/2023 - PDF - English, German - DIN
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€79.72

PR NF EN IEC 60747-15, C96-015PR (10/2023)

Dispositifs à semiconducteurs - Dispositifs discrets - Partie 15 : dispositifs de puissance à semiconducteurs isolés
10/1/2023 - Paper - English, French - AFNOR
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€138.50

23/30479765 DC:2023

BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
9/25/2023 - PDF - English - BSI
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€24.00

DIN EN IEC 63287-1:2023-09

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021), German version EN IEC 63287-1:2021.
9/1/2023 - PDF - German - DIN
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€136.82

BS IEC 63229:2021

Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
8/31/2023 - PDF - English - BSI
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€250.00

23/30479181 DC:2023

BS IEC 62047-48. Semiconductor devices. Micro-electromechanical devices Part 48. Test method of determining solution concentration by optical absorption using MEMS fluidic device
8/25/2023 - PDF - English - BSI
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€24.00

23/30478757 DC:2023

BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines Part 3. Guidelines for reliability plans power module
8/17/2023 - PDF - English - BSI
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€24.00

DIN EN IEC 63373:2023-08

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (IEC 63373:2022), German version EN IEC 63373:2022
8/1/2023 - PDF - German - DIN
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€85.79

23/30477062 DC:2023

BS EN IEC 62007-2. Semiconductor optoelectronic devices for fibre optic system applications Part 2. Measuring methods
7/20/2023 - PDF - English - BSI
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€24.00

BS IEC 62830-7:2021

Semiconductor devices. devices for energy harvesting and generation Linear sliding mode triboelectric
7/7/2023 - PDF - English - BSI
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€293.00

23/30451654 DC:2023

BS EN IEC 60747-15. Semiconductor devices Part 15. Isolated power semiconductor devices. Discrete
7/5/2023 - PDF - English - BSI
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€24.00

23/30476409 DC:2023

BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
7/5/2023 - PDF - English - BSI
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€43.00

DIN EN IEC 60749-20:2023-07

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020), German version EN IEC 60749-20:2020.
7/1/2023 - PDF - German - DIN
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€110.00

23/30451646 DC:2023

BS EN IEC 60747-2. Semiconductor devices Part 2. Discrete devices. Rectifier diodes
6/21/2023 - PDF - English - BSI
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€24.00

23/30451650 DC:2023

BS EN IEC 60747-6. Semiconductor devices Part 6. Discrete devices. Thyristors
6/21/2023 - PDF - English - BSI
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€43.00

UNE-EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)
6/3/2023 - PDF - English - AENOR
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€64.00

BS EN IEC 60747-16-7:2022

Semiconductor devices Microwave integrated circuits. Attenuators
5/25/2023 - PDF - English - BSI
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€331.00

BS EN IEC 60747-16-8:2022

Semiconductor devices Microwave integrated circuits. Limiters
5/25/2023 - PDF - English - BSI
Learn More

€293.00

BS EN IEC 63287-2:2023

Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
5/23/2023 - PDF - English - BSI
Learn More

€180.00

PR NF EN IEC 60747-16-9, C96-016-9PR (05/2023)

Dispositifs à semiconducteurs - Partie 16-9 : circuits intégrés hyperfréquences - Déphaseurs
5/1/2023 - Paper - English, French - AFNOR
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€115.50

23/30473272 DC:2023

BS IEC 60747-5-4 AMD 1. Semiconductor devices Part 5-4. Optoelectronic devices. lasers
4/26/2023 - PDF - English - BSI
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€24.00

23/30454366 DC:2023

BS EN IEC 62047-45. Semiconductor devices. Micro-electromechanical devices Part 45. Silicon based MEMS fabrication technology. Measurement method of impact resistance nanostructures
4/20/2023 - PDF - English - BSI
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€24.00

23/30454374 DC:2023

BS EN IEC 62047-47. Semiconductor devices. Micro-electromechanical devices Part 47. Silicon based MEMS fabrication technology. Measurement method of bending strength microstructures
4/20/2023 - PDF - English - BSI
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€24.00

23/30454370 DC:2023

BS EN IEC 62047-46. Semiconductor devices. Micro-electromechanical devices Part 46. Silicon based MEMS fabrication technology. Measurement method of tensile strength nanoscale membrane
4/19/2023 - PDF - English - BSI
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€24.00

BS IEC 63150-1:2019

Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary random mechanical vibrations
4/13/2023 - PDF - English - BSI
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€293.00

BS IEC 62047-37:2020

Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
4/5/2023 - PDF - English - BSI
Learn More

€180.00

BS IEC 60747-5-16:2023

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage GaN-based light diodes based on photocurrent spectroscopy
4/5/2023 - PDF - English - BSI
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€180.00

23/30472390 DC:2023

BS EN 60747-16-11 Semiconductor devices Part 16-11. Microwave integrated circuits - Power detectors
4/4/2023 - PDF - English - BSI
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€24.00

BS IEC 62373-1:2020

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI MOSFET
3/30/2023 - PDF - English - BSI
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€250.00

IEC 63287-2:2023

IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
3/29/2023 - PDF - English, French - IEC
Learn More

€92.00

IEC 60747-5-16:2023

IEC 60747-5-16:2023 Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
3/28/2023 - PDF - English - IEC
Learn More

€132.00

BS IEC 60747-18-4:2023

Semiconductor devices bio sensors. Evaluation method of noise characteristics lens-free CMOS photonic array sensors
3/27/2023 - PDF - English - BSI
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€180.00

BS IEC 60747-18-5:2023

Semiconductor devices bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle
3/23/2023 - PDF - English - BSI
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€180.00

IEC 60747-18-4:2023

IEC 60747-18-4:2023 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
3/16/2023 - PDF - English - IEC
Learn More

€92.00

IEC 60747-18-5:2023

IEC 60747-18-5:2023 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
3/16/2023 - PDF - English - IEC
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€92.00

DIN EN IEC 60749-41:2023-03

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020), German version EN IEC 60749-41:2020
3/1/2023 - PDF - German - DIN
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€104.95

23/30469486 DC:2023

BS EN IEC 63378-2. Thermal standardization on semiconductor packages Part 2. 3D thermal simulation models of discrete for steady-state analysis
2/7/2023 - PDF - English - BSI
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€24.00

23/30469010 DC:2023

BS EN IEC 63378-3. Thermal standardization on semiconductor packages Part 3. circuit simulation models of discrete for transient analysis
2/3/2023 - PDF - English - BSI
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€24.00

BS EN IEC 63364-1:2022

Semiconductor devices. devices for IoT system Test method of sound variation detection
2/2/2023 - PDF - English - BSI
Learn More

€180.00

DIN EN IEC 60749-30:2023-02

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020), German version EN IEC 60749-30:2020.
2/1/2023 - PDF - German - DIN
Learn More

€92.62

DIN EN IEC 63203-402-3:2023-02

Wearable electronic devices and technologies - Part 402-3: Performance measurement method of wearables - Series 2: Accuracy of Heart Rate Determination (IEC 124/167/CD:2021), Text in German and English
2/1/2023 - PDF - English, German - DIN
Learn More

€92.62

BS IEC 62951-8:2023

Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, stability of flexible resistive memory
1/24/2023 - PDF - English - BSI
Learn More

€180.00

IEC 62951-8:2023

IEC 62951-8:2023 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
1/19/2023 - PDF - English - IEC
Learn More

€92.00

NF EN IEC 63364-1, C96-364-1 (01/2023)

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1 : méthode d'essai de détection de variation acoustique
1/1/2023 - Paper - French - AFNOR
Learn More

€54.67

NF EN IEC 60747-16-7, C96-016-7 (01/2023)

Dispositifs à semiconducteurs - Partie 16-7 : circuits intégrés hyperfréquences - Atténuateurs
1/1/2023 - Paper - French - AFNOR
Learn More

€141.33

NF EN IEC 60747-16-8, C96-016-8 (01/2023)

Dispositifs à semiconducteurs - Partie 16-8 : circuits intégrés hyperfréquences - Limiteurs
1/1/2023 - Paper - French - AFNOR
Learn More

€127.67

BS EN IEC 60749-28:2022 + Redline

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level
12/22/2022 - PDF - English - BSI
Learn More

€454.00

BS IEC 62951-9:2022

Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor resistor (1T1R) resistive memory cells
12/20/2022 - PDF - English - BSI
Learn More

€180.00

BS EN IEC 60749-37:2022 + Redline

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
12/20/2022 - PDF - English - BSI
Learn More

€326.00

IEC 63364-1:2022

IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
12/14/2022 - PDF - English, French - IEC
Learn More

€92.00

IEC 62951-9:2022

IEC 62951-9:2022 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
12/14/2022 - PDF - English - IEC
Learn More

€132.00

BS EN 61975:2010+A2:2022

High-voltage direct current (HVDC) installations. System tests
12/12/2022 - PDF - English - BSI
Learn More

€377.00

IEC 60747-16-7:2022

IEC 60747-16-7:2022 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
11/29/2022 - PDF - English, French - IEC
Learn More

€311.00

IEC 60747-16-8:2022

IEC 60747-16-8:2022 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
11/29/2022 - PDF - English, French - IEC
Learn More

€270.00

BS EN IEC 62007-1:2015+A1:2022

Semiconductor optoelectronic devices for fibre optic system applications Specification template essential ratings and characteristics
11/24/2022 - PDF - English - BSI
Learn More

€293.00

BS EN IEC 60749-37:2022

Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
11/22/2022 - PDF - English - BSI
Learn More

€250.00

BS IEC 63284:2022

Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
11/11/2022 - PDF - English - BSI
Learn More

€180.00

NF EN IEC 60749-37, C96-022-37 (11/2022)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 37 : Méthode d'essai de chute au niveau de la carte avec utilisation d'un accéléromètre
11/1/2022 - Paper - French - AFNOR
Learn More

€103.33

IEC 61975:2010+AMD1:2016+AMD2:2022 Edition 1.2

IEC 61975:2010+AMD1:2016+AMD2:2022 (Consolidated version) High-voltage direct current (HVDC) installations - System tests
10/24/2022 - PDF - English, French - IEC
Learn More

€690.00

IEC 61975:2010/AMD2:2022

IEC 61975:2010/AMD2:2022 Amendment 2 - High-voltage direct current (HVDC) installations - System tests
10/24/2022 - PDF - English, French - IEC
Learn More

€23.00

BS IEC 62047-42:2022

Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics piezoelectric MEMS cantilever
10/24/2022 - PDF - English - BSI
Learn More

€250.00

IEC 60749-37:2022

IEC 60749-37:2022 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
10/12/2022 - PDF - English, French - IEC
Learn More

€173.00

UNE-EN IEC 60749-10:2022

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)
10/12/2022 - PDF - English - AENOR
Learn More

€60.00

UNE-EN 62007-1:2015/A1:2022

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (Endorsed by Asociación Española de Normalización in December of 2022.)
10/12/2022 - PDF - English - AENOR
Learn More

€28.00

UNE-EN IEC 60749-37:2022

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Española de Normalización in January of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More

€69.00

UNE-EN 61975:2010/A2:2022

High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in January of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More

€46.00

IEC 60749-37:2022 + Redline

IEC 60749-37:2022 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
10/12/2022 - PDF - English - IEC
Learn More

€224.00

UNE-EN IEC 60700-3:2023

Thyristor valves for high voltage direct current (HVDC) power transmission - Part 3: Essential ratings (limiting values) and characteristics (Endorsed by Asociación Española de Normalización in February of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More

€76.00

UNE-EN IEC 60747-16-7:2023

Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (Endorsed by Asociación Española de Normalización in February of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More

€81.00

UNE-EN IEC 60747-16-8:2023

Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More

€76.00

UNE-EN IEC 63364-1:2023

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
10/12/2022 - PDF - English - AENOR
Learn More

€60.00

IEC TR 63357:2022

IEC TR 63357:2022 Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
10/11/2022 - PDF - English - IEC
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€92.00

BS IEC 63275-1:2022

Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Test bias temperature instability
10/5/2022 - PDF - English - BSI
Learn More

€180.00

NF EN 62007-1/A1, C93-801-1/A1 (10/2022)

Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 1 : Modèle de spécification relatif aux valeurs et caractéristiques essentielles
10/1/2022 - Paper - French - AFNOR
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€54.50

UNE-EN IEC 62031:2020/A11:2022

LED modules for general lighting - Safety specifications
9/28/2022 - PDF - Spanish - AENOR
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€34.00

UNE-EN IEC 62031:2020/A11:2022

LED modules for general lighting - Safety specifications
9/28/2022 - PDF - English - AENOR
Learn More

€40.80

IEC 62007-1:2015+AMD1:2022 Edition 3.1

IEC 62007-1:2015+AMD1:2022 (Consolidated version) Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
9/22/2022 - PDF - English, French - IEC
Learn More

€385.00

IEC 62007-1:2015/AMD1:2022

IEC 62007-1:2015/AMD1:2022 Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
9/22/2022 - PDF - English, French - IEC
Learn More

€12.00

IEC 62047-42:2022

IEC 62047-42:2022 Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
9/16/2022 - PDF - English - IEC
Learn More

€173.00

BS EN IEC 60749-10:2022 + Redline

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods shock. device subassembly
9/15/2022 - PDF - English - BSI
Learn More

€235.00

BS IEC 63068-4:2022

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure identifying and evaluating using a combined method optical inspection photoluminescence
9/7/2022 - PDF - English - BSI
Learn More

€250.00

BS EN IEC 60749-28:2022

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level
9/6/2022 - PDF - English - BSI
Learn More

€348.00

BS EN IEC 60749-10:2022

Semiconductor devices. Mechanical and climatic test methods shock. device subassembly
8/16/2022 - PDF - English - BSI
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€180.00

MIL-STD-750-1B:2022 + CN1:2023 & C2:2023

Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999
8/15/2022 - PDF - English - DODNAV
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€55.00

IEC 63068-4:2022

IEC 63068-4:2022 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
7/27/2022 - PDF - English - IEC
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€173.00

BS IEC 60747-5-15:2022

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on electroreflectance spectroscopy
7/19/2022 - PDF - English - BSI
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€180.00

MIL-STD-750-2B:2022 & C1:2023

Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 through 2999
6/22/2022 - PDF - English - DODNAV
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€70.00

BS IEC 60747-5-4:2022

Semiconductor devices Optoelectronic devices. lasers
6/20/2022 - PDF - English - BSI
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€293.00

BS EN IEC 63373:2022

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
6/17/2022 - PDF - English - BSI
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€180.00

NF EN IEC 60749-10, C96-022-10 (06/2022)

Semiconductor devices - Mechanical and climatic test methods - Part 10 : Mechanical shock - device and subassembly
6/1/2022 - Paper - French - AFNOR
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€88.33

DIN EN IEC 63287-2:2022-06

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021), German and English version prEN IEC 63287-2:2021
6/1/2022 - PDF - English, German - DIN
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€92.62

DIN EN IEC 60747-16-9:2022-06

Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021), Text in German and English
6/1/2022 - PDF - English, German - DIN
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€131.96

IEC 63275-2:2022

IEC 63275-2:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation
5/11/2022 - PDF - English, French - IEC
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€46.00

22/30430766 DC:2022

BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
5/5/2022 - PDF - English - BSI
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€43.00

DIN EN IEC 60749-15:2022-05

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2020), German version EN IEC 60749-15:2020.
5/1/2022 - PDF - German - DIN
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€72.80

UNE-EN IEC 60749-28:2022

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)
5/1/2022 - PDF - English - AENOR
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€90.00

UNE-EN IEC 63373:2022

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (Endorsed by Asociación Española de Normalización in May of 2022.)
5/1/2022 - PDF - English - AENOR
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€64.00

IEC 60749-10:2022

IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
4/27/2022 - PDF - English, French - IEC
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€92.00

IEC 60747-5-4:2022

IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
4/27/2022 - PDF - English - IEC
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€270.00

IEC 63275-1:2022

IEC 63275-1:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
4/21/2022 - PDF - English, French - IEC
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€92.00

IEC 63284:2022

IEC 63284:2022 Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
4/21/2022 - PDF - English, French - IEC
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€92.00

NF EN IEC 60749-28, C96-022-28 (04/2022)

Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 28 : Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de dispositif chargé (CDM) - niveau du dispositif
4/1/2022 - Paper - French - AFNOR
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€141.33

BS EN IEC 62031:2020+A11:2021

LED modules for general lighting. Safety specifications
3/31/2022 - PDF - English - BSI
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€250.00

22/30443678 DC:2022

BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling for power semiconductor module
3/30/2022 - PDF - English - BSI
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€24.00

22/30451588 DC:2022

BS EN 63150-3 Ed.1.0. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Part 3. Human foot impact motion
3/29/2022 - PDF - English - BSI
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€24.00

BS EN IEC 60749-39:2022 + Redline

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
3/17/2022 - PDF - English - BSI
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€235.00

BS EN IEC 60749-39:2022

Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
3/7/2022 - PDF - English - BSI
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€180.00

IEC 60747-5-14:2022

IEC 60747-5-14:2022 Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
3/4/2022 - PDF - English - IEC
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€173.00

IEC 60749-28:2022

IEC 60749-28:2022 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
3/1/2022 - PDF - English, French - IEC
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€311.00

PR NF EN IEC 63284, C96-284PR (03/2022)

Dispositifs à semiconducteurs - méthode d'essai de fiabilité par la commutation sur charge inductive pour les transistors au nitrure de gallium
3/1/2022 - Paper - English, French - AFNOR
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€64.50

UNE-EN IEC 60749-39:2022

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Española de Normalización in March of 2022.)
3/1/2022 - PDF - English - AENOR
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€64.00

IEC 60749-28:2022 + Redline

IEC 60749-28:2022 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
3/1/2022 - PDF - English - IEC
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€404.00

NF EN IEC 63373, C96-373 (03/2022)

Lignes directrices pour les méthodes d'essai de résistance dynamique à l'état passant des dispositifs de conversion de puissance fondés sur les HEMT en GaN
3/1/2022 - Paper - French - AFNOR
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€88.33

22/30437195 DC:2022

BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical
2/11/2022 - PDF - English - BSI
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€24.00

IEC 63373:2022

IEC 63373:2022 Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
2/10/2022 - PDF - English, French - IEC
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€92.00

22/30443234 DC:2022

BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. circuit simulation models of for transient analysis
1/24/2022 - PDF - English - BSI
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€24.00

PD IEC TR 63378-1:2021

Thermal standardization on semiconductor packages resistance and thermal parameter of BGA, QFP type
1/11/2022 - PDF - English - BSI
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€250.00

IEC 60747-5-15:2022

IEC 60747-5-15:2022 Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy
1/7/2022 - PDF - English - IEC
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€92.00

NF EN IEC 60749-39, C96-022-39 (01/2022)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 39 : mesure de la diffusivité d'humidité et de l'hydrosolubilité dans les matériaux organiques utilisés dans les composants à semiconducteurs
1/1/2022 - Paper - French - AFNOR
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€88.33

ESD STM5.5.1:2022

Electrostatic Discharge Sensitivity Testing--Transmission Line Pulse (TLP)--Device Level
1/1/2022 - PDF - English - ESD
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€144.00

IEC TR 63378-1:2021

IEC TR 63378-1:2021 Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
12/14/2021 - PDF - English - IEC
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€132.00

21/30440970 DC:2021

BS EN IEC 60747-5-16. Semiconductor devices Part 5-16. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on photocurrent spectroscopy
12/7/2021 - PDF - English - BSI
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€24.00

UNE-EN 60700-1:2015/A1:2021

Thyristor valves for high voltage direct current (HVDC) power transmission - Part 1: Electrical testing (Endorsed by Asociación Española de Normalización in December of 2021.)
12/1/2021 - PDF - English - AENOR
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€58.00

UNE-EN IEC 61954:2021

Static var compensators (SVC) - Testing of thyristor valves (Endorsed by Asociación Española de Normalización in December of 2021.)
12/1/2021 - PDF - English - AENOR
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€89.00

UNE-EN IEC 63244-1:2021

Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications (Endorsed by Asociación Española de Normalización in December of 2021.)
12/1/2021 - PDF - English - AENOR
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€76.00

BS EN IEC 63287-1:2021

Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability
11/30/2021 - PDF - English - BSI
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€331.00

IEC 60749-39:2021

IEC 60749-39:2021 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
11/29/2021 - PDF - English, French - IEC
Learn More

€92.00

IEC 60749-39:2021 + Redline

IEC 60749-39:2021 (Redline version) Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
11/29/2021 - PDF - English - IEC
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€120.00

BS EN IEC 61954:2021

Static VAR compensators (SVC). Testing of thyristor valves
11/25/2021 - PDF - English - BSI
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€348.00

PD IEC TR 60747-5-12:2021

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
11/19/2021 - PDF - English - BSI
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€377.00

BS EN IEC 63244-1:2021

Semiconductor devices. devices for wireless power transfer and charging General requirements specifications
11/5/2021 - PDF - English - BSI
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€293.00

BS IEC 62830-8:2021

Semiconductor devices. devices for energy harvesting and generation Test evaluation methods of flexible stretchable supercapacitors use in low power electronics
11/4/2021 - PDF - English - BSI
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€293.00

UNE-EN IEC 63287-1:2021

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
11/1/2021 - PDF - English - AENOR
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€87.00

NF EN IEC 62868-2-2, C71-868-2-2 (11/2021)

Organic Light Emitting Diode (OLED) light sources for general lighting - Safety - Part 2-2 : Particular requirements for integrated OLED modules
11/1/2021 - Paper - French - AFNOR
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€72.00

NF EN IEC 62031/A11, C71-250/A11 (11/2021)

Modules à LED pour éclairage général - Spécifications de sécurité
11/1/2021 - Paper - French - AFNOR
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€54.50

UNE-EN 60700-2:2016/A1:2021

Thyristor valves for high voltage direct current (HVDC) power transmission - Part 2: Terminology (Endorsed by Asociación Española de Normalización in November of 2021.)
11/1/2021 - PDF - English - AENOR
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€57.00

IEC 62830-8:2021

IEC 62830-8:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
10/22/2021 - PDF - English - IEC
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€270.00