31.140 : Piezoelectric devices
-
24/30490992 DC:2024
BS EN IEC 60444-11. Measurement of quartz crystal unit parameters Part 11. Standard method for the determination load resonance frequency fL and effective capacitance CLeff using automatic network analyzer techniques error correction
4/5/2024 - PDF - English -
Learn More€24.00 -
DIN EN IEC 62604-1:2024-03
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2022), German version EN IEC 62604-1:2022.
3/1/2024 - PDF - German -
Learn More€115.33 -
23/30484686 DC:2023
Draft BS EN IEC 60122-2 Quartz crystal units of assessed quality. Part 2. Guide to the use
12/18/2023 - PDF - English -
Learn More€24.00 -
DIN EN IEC 60444-6:2023-11
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2021), German version EN IEC 60444-6:2021.
11/1/2023 - PDF - German -
Learn More€99.35 -
IEC TS 61994-5:2023 + Redline
IEC TS 61994-5:2023 (Redline version) Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
9/15/2023 - PDF - English -
Learn More€60.00 -
IEC TS 61994-5:2023
IEC TS 61994-5:2023 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
9/15/2023 - PDF - English -
Learn More€46.00 -
DIN EN IEC 62276:2023-05
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022), Text in German and English
5/1/2023 - PDF - English, German -
Learn More€152.71 -
23/30472821 DC:2023
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
4/12/2023 - PDF - English -
Learn More€24.00 -
BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
4/5/2023 - PDF - English -
Learn More€180.00 -
DIN EN IEC 63041-1:2023-02
Piezoelectric sensors - Part 1: Generic specifications (IEC 63041-1:2021), German version EN IEC 63041-1:2021.
2/1/2023 - PDF - German -
Learn More€115.33 -
23/30468947 DC:2023
BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
1/30/2023 - PDF - English -
Learn More€24.00 -
BS EN IEC 62604-1:2022 + Redline
Tracked Changes. Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Generic specification
1/23/2023 - PDF - English -
Learn More€382.00 -
BS EN IEC 62604-2:2022 + Redline
Tracked Changes. Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Guidelines for the use
12/1/2022 - PDF - English -
Learn More€382.00 -
BS EN IEC 62604-1:2022
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Generic specification
11/11/2022 - PDF - English -
Learn More€293.00 -
BS EN IEC 62604-2:2022
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Guidelines for the use
10/31/2022 - PDF - English -
Learn More€293.00 -
UNE-EN IEC 62604-2:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (Endorsed by Asociación Española de Normalización in November of 2022.)
10/12/2022 - PDF - English -
Learn More€72.00 -
UNE-EN IEC 62604-1:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in October of 2022.)
10/12/2022 - PDF - English -
Learn More€75.00 -
NF EN IEC 62604-2, C93-604-2 (10/2022)
Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 2 : Lignes directrices d'utilisation
10/1/2022 - Paper - French -
Learn More€103.33 -
NF EN IEC 62604-1, C93-604-1 (09/2022)
Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 1 : Spécification générique
9/1/2022 - Paper - French -
Learn More€116.33 -
IEC 62604-2:2022
IEC 62604-2:2022 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
9/1/2022 - PDF - English, French -
Learn More€219.00 -
IEC 62604-2:2022 + Redline
IEC 62604-2:2022 (Redline version) Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
9/1/2022 - PDF - English -
Learn More€284.00 -
IEC 62604-1:2022
IEC 62604-1:2022 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
7/11/2022 - PDF - English, French -
Learn More€270.00 -
IEC 62604-1:2022 + Redline
IEC 62604-1:2022 (Redline version) Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
7/11/2022 - PDF - English -
Learn More€352.00 -
BS EN IEC 60444-6:2021 + Redline
Tracked Changes. Measurement of quartz crystal unit parameters drive level dependence (DLD)
5/18/2022 - PDF - English -
Learn More€326.00 -
€382.00
-
UNE-EN IEC 63041-1:2021
Piezoelectric sensors - Part 1: Generic specifications (Endorsed by Asociación Española de Normalización in December of 2021.)
12/1/2021 - PDF - English -
Learn More€75.00 -
€293.00
-
BS EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters drive level dependence (DLD)
11/5/2021 - PDF - English -
Learn More€250.00 -
UNE-EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by Asociación Española de Normalización in November of 2021.)
11/1/2021 - PDF - English -
Learn More€70.00 -
NF EN IEC 60444-6, C93-621-6 (10/2021)
Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependence (DLD)
10/1/2021 - Paper - French -
Learn More€103.33 -
NF EN IEC 63041-1, C93-041-1 (10/2021)
Capteurs piézoélectriques - Partie 1 : spécifications génériques
10/1/2021 - Paper - French -
Learn More€116.33 -
IEC 63041-1:2021 + Redline
IEC 63041-1:2021 (Redline version) Piezoelectric sensors - Part 1: Generic specifications
9/17/2021 - PDF - English -
Learn More€284.00 -
IEC 63041-1:2021
IEC 63041-1:2021 Piezoelectric sensors - Part 1: Generic specifications
9/17/2021 - PDF - English, French -
Learn More€219.00 -
IEC 60444-6:2021 + Redline
IEC 60444-6:2021 (Redline version) Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
9/1/2021 - PDF - English -
Learn More€224.00 -
IEC 60444-6:2021
IEC 60444-6:2021 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
9/1/2021 - PDF - English, French -
Learn More€173.00 -
IEC 60050-561:2014/AMD4:2021
IEC 60050-561:2014/AMD4:2021 Amendment 4 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
8/9/2021 - PDF - English, French -
Learn More€132.00 -
DIN EN IEC 63041-3:2021-07
Piezoelectric sensors - Part 3: Physical sensors (IEC 63041-3:2020), German version EN IEC 63041-3:2020
7/1/2021 - PDF - German -
Learn More€85.79 -
DIN EN IEC 63155:2021-07
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications (IEC 63155:2020), German version EN IEC 63155:2020
7/1/2021 - PDF - German -
Learn More€99.35 -
DIN EN IEC 62604-2:2021-06
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 49/1353/CD:2020), Text in English
6/1/2021 - PDF - English -
Learn More€104.95 -
IEC 60050-561:2014/AMD3:2021
IEC 60050-561:2014/AMD3:2021 Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
3/29/2021 - PDF - English, French -
Learn More€12.00 -
PD IEC TS 61994-3:2021
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary oscillators
2/9/2021 - PDF - English -
Learn More€180.00 -
IEC TS 61994-3:2021
IEC TS 61994-3:2021 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators
1/28/2021 - PDF - English -
Learn More€132.00 -
UNE-EN IEC 61837-2:2018/A1:2020
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by Asociación Española de Normalización in January of 2021.)
1/1/2021 - PDF - English -
Learn More€72.00 -
BS EN IEC 61837-2:2018+A1:2020
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Ceramic enclosures
11/13/2020 - PDF - English -
Learn More€398.00 -
NF EN IEC 61837-2/A1, C93-628-2/A1 (11/2020)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2 : ceramic enclosures - Amendement 1 - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence - Encombrements normalisés et connexions des sorties - Partie 2 : enveloppes en céramique.
11/1/2020 - Paper - French -
Learn More€103.33 -
UNE-EN IEC 63041-3:2020
Piezoelectric sensors - Part 3: Physical sensors (Endorsed by Asociación Española de Normalización in November of 2020.)
11/1/2020 - PDF - English -
Learn More€64.00 -
€180.00
-
IEC 61837-2:2018+AMD1:2020 Edition 3.1
IEC 61837-2:2018+AMD1:2020 (Consolidated version) Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
9/24/2020 - PDF - English, French -
Learn More€794.00 -
IEC 61837-2:2018+AMD1:2020 Edition 3.1
IEC 61837-2:2018+AMD1:2020 (Consolidated version) Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
9/24/2020 - PDF - English -
Learn More€794.00 -
IEC 61837-2:2018/AMD1:2020
IEC 61837-2:2018/AMD1:2020 Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
9/24/2020 - PDF - English, French -
Learn More€173.00 -
IEC 61837-2:2018/AMD1:2020
IEC 61837-2:2018/AMD1:2020 Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
9/24/2020 - PDF - English -
Learn More€173.00 -
€88.33
-
IEC 63041-3:2020
IEC 63041-3:2020 Piezoelectric sensors - Part 3: Physical sensors
8/12/2020 - PDF - English, French -
Learn More€92.00 -
UNE-EN IEC 63155:2020
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications (Endorsed by Asociación Española de Normalización in July of 2020.)
7/1/2020 - PDF - English -
Learn More€69.00 -
BS EN IEC 63155:2020
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
6/25/2020 - PDF - English -
Learn More€250.00 -
NF EN IEC 63155, C93-155 (06/2020)
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
6/1/2020 - Paper - French -
Learn More€103.33 -
IEC 60050-561:2014/AMD2:2020
IEC 60050-561:2014/AMD2:2020 Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
5/27/2020 - PDF - English, French -
Learn More€12.00 -
IEC 62047-37:2020
IEC 62047-37:2020 Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
4/28/2020 - PDF - English, French -
Learn More€132.00 -
IEC 63155:2020
IEC 63155:2020 Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
4/24/2020 - PDF - English, French -
Learn More€173.00 -
PD IEC TS 61994-4-1:2018 + Redline
Tracked Changes. Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Synthetic quartz crystal
2/27/2020 - PDF - English -
Learn More€197.00 -
PD IEC TS 61994-4-4:2018 + Redline
Tracked Changes. Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Single crystal wafers surface acoustic wave (SAW)
2/27/2020 - PDF - English -
Learn More€235.00 -
BS EN 60758:2016 + Redline
Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
2/26/2020 - PDF - English -
Learn More€454.00 -
BS EN 60793-1-33:2017 + Redline
Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
2/25/2020 - PDF - English -
Learn More€432.00 -
DIN EN IEC 62884-4:2020-02
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4: Short-term frequency stability test methods (IEC 62884-4:2019), German version EN IEC 62884-4:2019
2/1/2020 - PDF - German -
Learn More€104.95 -
DIN EN IEC 60122-4:2019-10
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019), German version EN IEC 60122-4:2019
10/1/2019 - PDF - German -
Learn More€92.62 -
UNE-EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (Endorsed by Asociación Española de Normalización in August of 2019.)
8/1/2019 - PDF - English -
Learn More€69.00 -
PD IEC TS 61994-5:2019
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric sensors
7/17/2019 - PDF - English -
Learn More€151.00 -
BS EN IEC 62884-4:2019
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
7/15/2019 - PDF - English -
Learn More€250.00 -
NF EN IEC 62884-4, C93-684-4 (07/2019)
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : short-term frequency stability test methods
7/1/2019 - Paper - French -
Learn More€88.33 -
IEC 62884-4:2019
IEC 62884-4:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods
5/6/2019 - PDF - English, French -
Learn More€132.00 -
UNE-EN IEC 60122-4:2019
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (Endorsed by Asociación Española de Normalización in May of 2019.)
5/1/2019 - PDF - English -
Learn More€64.00 -
BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
4/24/2019 - PDF - English -
Learn More€180.00 -
BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
4/18/2019 - PDF - English -
Learn More€250.00 -
BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
4/16/2019 - PDF - English -
Learn More€180.00 -
IEC 62047-34:2019
IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
4/5/2019 - PDF - English -
Learn More€92.00 -
IEC 62047-36:2019
IEC 62047-36:2019 Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
4/5/2019 - PDF - English -
Learn More€92.00 -
IEC 62047-33:2019
IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
4/5/2019 - PDF - English -
Learn More€173.00 -
BS EN IEC 60122-4:2019
Quartz crystal units of assessed quality Crystal with thermistors
3/28/2019 - PDF - English -
Learn More€180.00 -
NF EN IEC 60122-4, C93-618-4 (03/2019)
Quartz crystal units of assessed quality - Part 4 : crystal units with thermistors
3/1/2019 - Paper - French -
Learn More€88.33 -
IEC 60122-4:2019
IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
1/24/2019 - PDF - English, French -
Learn More€92.00 -
18/30383935 DC:2018
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
12/4/2018 - PDF - English -
Learn More€24.00 -
PD IEC TS 61994-4-4:2018
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Single crystal wafers surface acoustic wave (SAW)
11/22/2018 - PDF - English -
Learn More€180.00 -
PD IEC TS 61994-4-1:2018
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Synthetic quartz crystal
11/22/2018 - PDF - English -
Learn More€151.00 -
IEC TS 61994-4-1:2018
IEC TS 61994-4-1:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
11/16/2018 - PDF - English -
Learn More€46.00 -
IEC TS 61994-4-4:2018 + Redline
IEC TS 61994-4-4:2018 (Redline version) Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
11/16/2018 - PDF - English -
Learn More€120.00 -
IEC TS 61994-4-4:2018
IEC TS 61994-4-4:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
11/16/2018 - PDF - English -
Learn More€92.00 -
IEC TS 61994-4-1:2018 + Redline
IEC TS 61994-4-1:2018 (Redline version) Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
11/16/2018 - PDF - English -
Learn More€60.00 -
DIN EN IEC 62884-3:2018-10
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods (IEC 62884-3:2018), German version EN IEC 62884-3:2018
10/1/2018 - PDF - German -
Learn More€85.79 -
DIN EN IEC 62604-2:2018-08
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 62604-2:2017), German version EN IEC 62604-2:2018.
8/1/2018 - PDF - German -
Learn More€104.95 -
DIN EN 60122-1:2018-08
Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002 + A1:2017), German version EN 60122-1:2002 + A1:2018.
8/1/2018 - PDF - German -
Learn More€136.82 -
UNE-EN IEC 61837-2:2018
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by Asociación Española de Normalización in August of 2018.)
8/1/2018 - PDF - English -
Learn More€137.00 -
DIN EN IEC 63041-2:2018-08
Piezoelectric sensors - Part 2: Chemical and biochemical sensors (IEC 63041-2:2017), German version EN IEC 63041-2:2018
8/1/2018 - PDF - German -
Learn More€92.62 -
NF EN IEC 61837-2, C93-628-2 (07/2018)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2 : ceramic enclosures
7/1/2018 - Paper - French -
Learn More€197.00 -
NF EN 61240, C93-614 (06/2018)
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules - Dispositifs piézoélectriques - Préparation des dessins d'encombrement des dispositifs pour montage en surface pour la commande et le choix de la fréquence - Règles générales
6/1/2018 - Paper - French -
Learn More€85.42 -
NF EN 60758, C93-632 (06/2018)
Synthetic quartz crystal - Specifications and guidelines for use
6/1/2018 - Paper - French -
Learn More€148.69 -
UNE-EN IEC 62884-3:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods (Endorsed by Asociación Española de Normalización in June of 2018.)
6/1/2018 - PDF - English -
Learn More€64.00 -
NF EN 62276, C93-616 (06/2018)
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
6/1/2018 - Paper - French -
Learn More€123.39 -
BS EN IEC 62884-3:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
5/30/2018 - PDF - English -
Learn More€180.00 -
BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
5/21/2018 - PDF - English -
Learn More€331.00 -
IEC 61837-2:2018
IEC 61837-2:2018 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
5/8/2018 - PDF - English, French -
Learn More€431.00 -
IEC 61837-2:2018
IEC 61837-2:2018 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
5/8/2018 - PDF - English -
Learn More€431.00 -
DIN EN 62884-2:2018-05
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017), German version EN 62884-2:2017
5/1/2018 - PDF - German -
Learn More€104.95 -
UNE-EN 60122-1:2002/A1:2018
Quartz crystal units of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in May of 2018.)
5/1/2018 - PDF - English -
Learn More€60.00 -
UNE-EN IEC 63041-1:2018
Piezoelectric Sensors - Part 1: Generic Specifications (Endorsed by Asociación Española de Normalización in April of 2018.)
4/1/2018 - PDF - English -
Learn More€71.00 -
UNE-EN IEC 63041-2:2018
Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors (Endorsed by Asociación Española de Normalización in April of 2018.)
4/1/2018 - PDF - English -
Learn More€65.00 -
DIN EN 60679-1:2018-04
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2017), German version EN 60679-1:2017.
4/1/2018 - PDF - German -
Learn More€120.84 -
UNE-EN IEC 62604-2:2018
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (Endorsed by Asociación Española de Normalización in April of 2018.)
4/1/2018 - PDF - English -
Learn More€71.00 -
IEC 62884-3:2018
IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
3/22/2018 - PDF - English, French -
Learn More€92.00 -
IEC 62884-3:2018
IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
3/22/2018 - PDF - English -
Learn More€92.00 -
€180.00
-
€103.33
-
NF EN IEC 62604-2, C93-604-2 (03/2018)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2 : guidelines for the use
3/1/2018 - Paper - French -
Learn More€103.33 -
NF EN 60122-1/A1, C93-618-1/A1 (03/2018)
Quartz crystal units of assessed quality - Part 1 : generic specification
3/1/2018 - Paper - French -
Learn More€88.33 -
NF EN IEC 63041-2, C93-041-2 (03/2018)
Piezoelectric Sensors - Part 2 : chemical and biochemical Sensors
3/1/2018 - Paper - French -
Learn More€88.33 -
DIN EN 62884-1:2018-02
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017), German version EN 62884-1:2017
2/1/2018 - PDF - German -
Learn More€163.74 -
UNE-EN 62884-2:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (Endorsed by Asociación Española de Normalización in January of 2018.)
1/1/2018 - PDF - English -
Learn More€69.00 -
IEC 63041-2:2017
IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
12/13/2017 - PDF - English -
Learn More€92.00 -
BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
12/13/2017 - PDF - English -
Learn More€293.00 -
IEC 63041-2:2017
IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
12/13/2017 - PDF - English, French -
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IEC 60122-1:2002+AMD1:2017 Edition 3.1
IEC 60122-1:2002+AMD1:2017 (Consolidated version) Quartz crystal units of assessed quality - Part 1: Generic specification
12/8/2017 - PDF - English, French -
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BS EN 62884-2:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
12/8/2017 - PDF - English -
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IEC 60122-1:2002/AMD1:2017
IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
12/8/2017 - PDF - English -
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IEC 60122-1:2002+AMD1:2017 Edition 3.1
IEC 60122-1:2002+AMD1:2017 (Consolidated version) Quartz crystal units of assessed quality - Part 1: Generic specification
12/8/2017 - PDF - English -
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IEC 60122-1:2002/AMD1:2017
IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
12/8/2017 - PDF - English, French -
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BS EN 60793-1-33:2017
Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
12/7/2017 - PDF - English -
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UNE-EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in December of 2017.)
12/1/2017 - PDF - English -
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NF EN 62884-2, C93-684-2 (12/2017)
Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2 : phase jitter measurement method - Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 2 : méthode de mesure des gigues de phase
12/1/2017 - Paper - French -
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UNE-EN 62884-1:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (Endorsed by Asociación Española de Normalización in November of 2017.)
11/1/2017 - PDF - English -
Learn More€98.00 -
NF EN 60679-1, C93-620-1 (11/2017)
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : generic specification
11/1/2017 - Paper - French -
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DIN EN 60444-8:2017-11
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016), German version EN 60444-8:2017.
11/1/2017 - PDF - German -
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€50.18
-
BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics MEMS piezoelectric thin film
10/9/2017 - PDF - English -
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BS EN 62884-1:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
10/4/2017 - PDF - English -
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IEC 62047-30:2017
IEC 62047-30:2017 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
9/15/2017 - PDF - English -
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NF EN 62884-1, C93-684-1 (09/2017)
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1 : basic methods for the measurement
9/1/2017 - Paper - French -
Learn More€170.00 -
NF EN 60444-8, C93-621-8 (09/2017)
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
9/1/2017 - Paper - French -
Learn More€88.33 -
IEC 62884-2:2017
IEC 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
8/30/2017 - PDF - English -
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IEC 62884-2:2017
IEC 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
8/30/2017 - PDF - English, French -
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DIN EN 61240:2017-08
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2016), German version EN 61240:2017).
8/1/2017 - PDF - German -
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DIN EN 62276:2017-08
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016), German version EN 62276:2016.
8/1/2017 - PDF - German -
Learn More€136.82 -
IEC 60679-1:2017
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
7/26/2017 - PDF - English -
Learn More€270.00 -
IEC 60679-1:2017
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
7/26/2017 - PDF - English, French -
Learn More€270.00 -
IEC 62884-1:2017
IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
6/8/2017 - PDF - English, French -
Learn More€397.00 -
IEC 62884-1:2017
IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
6/8/2017 - PDF - English -
Learn More€397.00 -
BS EN 60444-8:2017
Measurement of quartz crystal unit parameters Test fixture for surface mounted units
5/26/2017 - PDF - English -
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UNE-EN 60444-8:2017
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)
5/1/2017 - PDF - English -
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DIN EN 60758:2017-04
Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016), German version EN 60758:2016.
4/1/2017 - PDF - German -
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UNE-EN 61240:2017
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (Endorsed by Asociación Española de Normalización in March of 2017.)
3/1/2017 - PDF - English -
Learn More€68.00 -
BS EN 61240:2017
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
1/31/2017 - PDF - English -
Learn More€250.00 -
UNE-EN 62276:2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)
1/1/2017 - PDF - English -
Learn More€76.00 -
BS EN 62276:2016
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
12/31/2016 - PDF - English -
Learn More€331.00 -
IEC 60050-561:2014/AMD1:2016
IEC 60050-561:2014/AMD1:2016 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
12/16/2016 - PDF - English, French -
Learn More€12.00 -
IEC 60444-8:2016
IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
12/15/2016 - PDF - English, French -
Learn More€92.00 -
IEC 60444-8:2016
IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
12/15/2016 - PDF - English -
Learn More€92.00 -
UNE-EN 60758:2016
Synthetic Quartz Crystal - Specifications and guidelines for use (Endorsed by AENOR in November of 2016.)
11/1/2016 - PDF - English -
Learn More€98.00 -
IEC 61240:2016
IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
10/24/2016 - PDF - English -
Learn More€132.00 -
IEC 61240:2016
IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
10/24/2016 - PDF - English, French -
Learn More€132.00 -
IEC 62276:2016
IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
10/24/2016 - PDF - English, French -
Learn More€270.00 -
IEC 62276:2016
IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
10/24/2016 - PDF - English -
Learn More€270.00 -
BS EN 60758:2016
Synthetic quartz crystal. Specifications and guidelines for use
9/30/2016 - PDF - English -
Learn More€348.00 -
DIN EN 62575-1:2016-09
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015), German version EN 62575-1:2016
9/1/2016 - PDF - German -
Learn More€120.84 -
IEC 60758:2016
IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
5/18/2016 - PDF - English, French -
Learn More€345.00 -
IEC 60758:2016
IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
5/18/2016 - PDF - English -
Learn More€345.00 -
UNE-EN 62575-1:2016
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in April of 2016.)
4/1/2016 - PDF - English -
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DIN EN 61338-1-5:2016-04
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015), German version EN 61338-1-5:2015
4/1/2016 - PDF - German -
Learn More€99.35 -
BS EN 62575-1:2016
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
3/31/2016 - PDF - English -
Learn More€293.00 -
UNE-EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures (Endorsed by AENOR in January of 2016.)
1/1/2016 - PDF - English -
Learn More€66.00 -
NF EN 61837-3, C93-628-3 (01/2016)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3 : metal enclosure - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence
1/1/2016 - Paper - French -
Learn More€96.59 -
UNE-EN 60862-1:2015
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in January of 2016.)
1/1/2016 - PDF - English -
Learn More€81.00 -
BS EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Metal enclosures
12/31/2015 - PDF - English -
Learn More€250.00 -
BS EN 60862-1:2015
Surface acoustic wave (SAW) filters of assessed quality Generic specification
11/30/2015 - PDF - English -
Learn More€348.00 -
IEC 62575-1:2015
IEC 62575-1:2015 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
10/29/2015 - PDF - English, French -
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UNE-EN 62604-1:2015
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (Endorsed by AENOR in October of 2015.)
10/1/2015 - PDF - English -
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UNE-EN 61338-1-5:2015
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Endorsed by AENOR in October of 2015.)
10/1/2015 - PDF - English -
Learn More€66.00 -
BS EN 61338-1-5:2015
Waveguide type dielectric resonators General information and test conditions. Measurement method of conductivity at interface between conductor layer substrate microwave frequency
9/30/2015 - PDF - English -
Learn More€250.00 -
IEC 60862-1:2015
IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
8/20/2015 - PDF - English, French -
Learn More€311.00 -
NF EN 61837-4, C93-628-4 (08/2015)
Surface mounted piezoelectric devices for frequency control and selection - Standard outline and terminal lead connections - Part 4 : hybrid enclosure outline - Dispositifs piezoélectriques à montage en surface pour la commande et le choix de la fréquence
8/1/2015 - Paper - French -
Learn More€82.53 -
IEC 61338-1-5:2015
IEC 61338-1-5:2015 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
6/25/2015 - PDF - English, French -
Learn More€132.00 -
UNE-EN 61837-4:2015
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines (Endorsed by AENOR in June of 2015.)
6/1/2015 - PDF - English -
Learn More€59.00 -
BS EN 61837-4:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Hybrid enclosure
5/31/2015 - PDF - English -
Learn More€180.00 -
IEC 61837-3:2015
IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
4/15/2015 - PDF - English, French -
Learn More€132.00 -
IEC 61837-4:2015
IEC 61837-4:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
3/27/2015 - PDF - English, French -
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DIN EN 62761:2014-12
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (IEC 62761:2014), German version EN 62761:2014
12/1/2014 - PDF - German -
Learn More€104.95 -
IEC 60050-561:2014
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
11/7/2014 - PDF - English, French -
Learn More€460.00 -
UNE-EN 62761:2014
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (Endorsed by AENOR in July of 2014.)
7/1/2014 - PDF - English -
Learn More€68.00 -
BS EN 62761:2014
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
6/30/2014 - PDF - English -
Learn More€250.00 -
JIS C 6760:2014
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
6/20/2014 - PDF - Japanese -
Learn More€41.86 -
NF EN 60444-9, C93-621-9 (05/2014)
Measurement of quartz crystal unit parameters - Part 9 : measurement of spurious resonances of piezoelectric crystal units
5/1/2014 - Paper - French -
Learn More€88.00 -
IEC 62761:2014
IEC 62761:2014 Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
2/19/2014 - PDF - English, French -
Learn More€173.00 -
DIN EN 60679-3:2014-01
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2012), German version EN 60679-3:2013.
1/1/2014 - PDF - German -
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UNE-EN 60444-6:2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by AENOR in November of 2013.)
11/1/2013 - PDF - English -
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BS EN 60444-6:2013
Measurement of quartz crystal unit parameters drive level dependence (DLD)
10/31/2013 - PDF - English -
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UNE-EN 60679-3:2013
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (Endorsed by AENOR in August of 2013.)
8/1/2013 - PDF - English -
Learn More€69.00 -
BS EN 60679-3:2013
Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections
7/31/2013 - PDF - English -
Learn More€250.00 -
IEC 60368-1:2000+AMD1:2004 Edition 4.1
IEC 60368-1:2000+AMD1:2004 (Consolidated version) Piezoelectric filters of assessed quality - Part 1: Genericspecification
5/28/2013 - PDF - English, French -
Learn More€385.00 -
DIN EN 62575-2:2013-05
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use (IEC 62575-2:2012), German version EN 62575-2:2012
5/1/2013 - PDF - German -
Learn More€99.35 -
IEC 60679-3:2012
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
12/14/2012 - PDF - English, French -
Learn More€173.00 -
UNE-EN 62575-2:2012
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in November of 2012.)
11/1/2012 - PDF - English -
Learn More€68.00 -
BS EN 62575-2:2012
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Guidelines for the use
10/31/2012 - PDF - English -
Learn More€250.00 -
12/30274095 DC:2012
BS EN 60679-1 AMD1. Quartz crystal controlled oscillators of assessed quality. Part 1. Generic specification
10/26/2012 - PDF - English -
Learn More€24.00