29.045 : Semiconducting materials
-
IEC 60146-1-1:2024 CMV
IEC 60146-1-1:2024 CMV Semiconductor converters - General requirements and line commutated converters - Part 1-1: Specification of basic requirements
3/19/2024 - PDF - English -
Learn More€863.00 -
IEC 60146-1-1:2024
IEC 60146-1-1:2024 Semiconductor converters - General requirements and line commutated converters - Part 1-1: Specification of basic requirements
3/19/2024 - PDF - English, French -
Learn More€431.00 -
DIN 50451-4:2024-01
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
1/1/2024 - PDF - German -
Learn More€65.89 -
23/30450091 DC:2023
BS IEC 62899-203-2 Printed electronics Materials - Semiconductor Ink- Space charge limited mobility measurement in printed organic semiconductive layers
12/1/2023 - PDF - English -
Learn More€24.00 -
DIN 50453-1:2023-08
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method
8/1/2023 - PDF - German -
Learn More€45.98 -
DIN 50453-2:2023-08
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method
8/1/2023 - PDF - German -
Learn More€45.98 -
DIN 50451-5:2022-08
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram
8/1/2022 - PDF - German -
Learn More€52.90 -
DIN 50451-8:2022-08
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS
8/1/2022 - PDF - German -
Learn More€52.90 -
22/30439670 DC:2021
BS EN IEC 60146-1-1. Semiconductor converters. General requirements and line commutated converters Part 1-1. Specification of basic
12/24/2021 - PDF - English -
Learn More€24.00 -
BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length
9/8/2021 - PDF - English -
Learn More€180.00 -
IEC 62899-503-3:2021
IEC 62899-503-3:2021 Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
8/24/2021 - PDF - English -
Learn More€92.00 -
21/30428334 DC:2021
BS EN IEC 62899-203. Printed electronics Part 203. Materials. Semiconductor ink
7/23/2021 - PDF - English -
Learn More€24.00 -
DIN 50450-9:2021-07
Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C<(Index)1>-C<(Index)3>-hydrocarbons in gaseous hydrogen chloride by gaschromatography
7/1/2021 - PDF - German -
Learn More€39.35 -
BS IEC 62899-503-1:2020
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
9/25/2020 - PDF - English -
Learn More€180.00 -
IEC 62899-503-1:2020
IEC 62899-503-1:2020 Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
5/27/2020 - PDF - English -
Learn More€92.00 -
PD IEC TR 60146-1-2:2019
Semiconductor converters. General requirements and line commutated converters Application guide
11/13/2019 - PDF - English -
Learn More€398.00 -
IEC TR 60146-1-2:2019
IEC TR 60146-1-2:2019 Semiconductor converters - General requirements and line commutated converters - Part 1-2: Application guidelines
10/22/2019 - PDF - English -
Learn More€431.00 -
IEC TR 60146-1-2:2019 + Redline
IEC TR 60146-1-2:2019 (Redline version) Semiconductor converters - General requirements and line commutated converters - Part 1-2: Application guidelines
10/22/2019 - PDF - English -
Learn More€561.00 -
€250.00 -
IEC 62899-203:2018
IEC 62899-203:2018 Printed electronics - Part 203: Materials - Semiconductor ink
9/28/2018 - PDF - English -
Learn More€173.00 -
DIN 50451-7:2018-04
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
4/1/2018 - PDF - German -
Learn More€59.63 -
DIN SPEC 1994:2017-02
Testing of materials for semiconductor technology - Determination of anions in weak acids
2/1/2017 - PDF - German -
Learn More€42.43 -
ASTM F980-16(2024)
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
12/1/2016 - PDF - English -
Learn More€60.00 -
ASTM F980-16(2024) + Redline
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
12/1/2016 - PDF - English -
Learn More€72.00 -
NF EN 62047-25, C96-050-25 (12/2016)
Semiconductor devices - Micro-electromechanical devices - Part 25 : silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area
12/1/2016 - Paper - French -
Learn More€103.33 -
NF EN 62047-22, C96-050-22 (12/2014)
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates - Dispositifs à semiconducteurs
12/1/2014 - Paper - French -
Learn More€72.00 -
DIN 50451-3:2014-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
11/1/2014 - PDF - German -
Learn More€72.80 -
DIN 50451-6:2014-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH<(Index)4>F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
11/1/2014 - PDF - German -
Learn More€59.63 -
NF EN 62047-11, C96-050-11 (03/2014)
Semiconductor devices - Micro-electromechanical devices - Part 11 : test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems - Dispositifs à semiconducteurs
3/1/2014 - Paper - French -
Learn More€103.33 -
NF EN 62047-18, C96-050-18 (02/2014)
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials - Dispositifs à semiconducteurs
2/1/2014 - Paper - French -
Learn More€88.33 -
ASTM D6095-12(2023)
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
11/1/2012 - PDF - English -
Learn More€48.00 -
NF EN 62047-9, C96-050-9 (04/2012)
Semiconductor devices - Micro-electromechanical devices - Part 9 : wafer to wafer bonding strength measurement for MEMS - Dispositifs à semiconducteurs
4/1/2012 - Paper - French -
Learn More€103.33 -
ASTM D6095-12(2023) + Redline
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
1/1/2012 - PDF - English -
Learn More€57.00 -
ASTM E1438-11(2019)
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
1/1/2011 - PDF - English -
Learn More€46.00 -
ASTM E1438-11(2019) + Redline
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
1/1/2011 - PDF - English -
Learn More€53.00 -
BS EN 60146-1-1:2010
Semiconductor converters. General requirements and line commutated converters Specification of basic
8/31/2010 - PDF - English -
Learn More€377.00 -
GB/T 1558-2009
Test method for substitutional atomic carbon concent of silicon by infrared absorption
10/30/2009 - PDF - English -
Learn More€165.00 -
DIN 50455-1:2009-10
Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods
10/1/2009 - PDF - German -
Learn More€39.35 -
DIN 50452-2:2009-10
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters
10/1/2009 - PDF - German -
Learn More€52.90 -
ASTM D3004-08(2020)
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
1/1/2008 - PDF - English -
Learn More€46.00 -
ASTM D3004-08(2020) + Redline
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials
1/1/2008 - PDF - English -
Learn More€53.00 -
DIN 50451-4:2007-02
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
2/1/2007 - PDF - German -
Learn More€59.63 -
BS EN 62226-2-1:2005
Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating current density internal field induced human body 2D models
2/11/2005 - PDF - English -
Learn More€348.00 -
JIS R 1650-2:2002 (R2016)
Testing method for fine ceramics thermoelectric materials Part 2: Resistivity
3/20/2002 - PDF - Japanese -
Learn More€25.00 -
JIS R 1801:2002 (R2016)
Method of measuring spectral emissivity of ceramic radiating materials for infrared heaters by using FTIR
3/20/2002 - PDF - Japanese -
Learn More€25.00 -
JIS R 1650-3:2002 (R2016)
Method for measurement of fine ceramics thermoelectric materials Part 3: Thermal diffusivity, specific heat capacity, and thermal conductivity
3/20/2002 - PDF - Japanese -
Learn More€25.00 -
JIS R 1651:2002 (R2016)
Method for measurement of pyroelectric coefficient of fine ceramics
3/20/2002 - PDF - Japanese -
Learn More€25.00 -
DIN 50455-2:1999-11
Characterization of photoresists used in semiconductor technology - Part 2: Determination of photosensitivity of positive photoresists
11/1/1999 - PDF - English -
Learn More€40.56 -
DIN 50455-2:1999-11
Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists
11/1/1999 - PDF - German -
Learn More€32.34 -
DIN 50452-1:1995-11
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
11/1/1995 - PDF - German -
Learn More€32.34 -
DIN 50452-1:1995-11
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles
11/1/1995 - PDF - English -
Learn More€40.56 -
DIN 50452-3:1995-10
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
10/1/1995 - PDF - German -
Learn More€39.35 -
DIN 50452-3:1995-10
Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters
10/1/1995 - PDF - English -
Learn More€49.16 -
DIN 50450-4:1993-09
Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C1-C3-hydrocarbons in nitrogen by gas-chromatography
9/1/1993 - PDF - German -
Learn More€32.34 -
DIN 50450-2:1991-03
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N2, Ar, He, Ne and H2 by using a galvanic cell
3/1/1991 - PDF - German -
Learn More€32.34 -
DIN 50450-1:1987-08
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell
8/1/1987 - PDF - German -
Learn More€32.34 -
€40.56
-
€57.57
-
€32.34
-
€45.98
