DIN EN IEC 60749-20-1:2018-11

DIN EN IEC 60749-20-1:2018-11

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018), German and English version prEN IEC 60749-20-1:2018

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Details

This part of series DIN EN 60749 applies to all devices subjected to bulk solder reflow processes during PCB assembly, including plastic encapsulated packages, process sensitive devices, and other moisture sensitive devices that are exposed to the ambient air. It provides standardized methods for handling, packing, shipping, and use of moisture/reflow sensitive SMDs which have been classified to the levels defined in IEC 60749-20.

Additional Info

Author Deutsche Institut für Normung e.V. (DIN)
Published by DIN
Document type Draft standard
ICS 31.080.01 : Semiconductor devices in general
Number of pages 79
Cross references prEN IEC 60749-20-1 (2018-07), IDT,IEC 47/2488/CDV (2018-07), IDT
Set MYSTD-20STD
Document history
Keyword DIN EN IEC 60749-20-1