| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
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PDF |
German |
Active |
10/1/2018 |
€85.79 |
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Details
This part of DIN EN 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.
Additional Info
| Author | Deutsche Institut für Normung e.V. (DIN) |
|---|---|
| Published by | DIN |
| Document type | Standard |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 15 |
| Cross references | EN IEC 60749-13 (2018-04), IDT,IEC 60749-13 (2018-02), IDT |
| Set | MYSTD-20STD |
| Document history | DIN EN IEC 60749-13 (2018-10),DIN EN 60749-13 (2017-07),DIN EN 60749-13 (2003-04),DIN EN 60749 (2002-09),DIN EN 60749 (2001-09),DIN EN 60749 (2000-02),DIN IEC 47/1425/CD (1998-11),DIN IEC 47/1390/CD (1996-02),DIN IEC 47(CO)1316 (1993-01),DIN IEC 47(Sec)12 |
| Keyword | DIN EN IEC 60749-13 |
