Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
Paper |
German |
Active |
10/1/2017 |
€65.60 |
|
Details
This part of DIN EN 62435 (VDE 0884-135) is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied.
Additional Info
Author | VDE |
---|---|
Document type | Standard |
ICS | 31.200 : Integrated circuits. Microelectronics
|
Number of pages | 23 |
Replace | DIN EN 62435-2 (2013-10) |
Cross references | EN 62435-2 (2017-04), IDT,IEC 62435-2 (2017-01), IDT |
Weight(kg.) | 0.1391 |
Document history | DIN EN 62435-2 (2017-10),DIN EN 62435-2 (2013-10) |
Keyword | DIN EN 62435,EN 62435,EN 62435-2,62435 |