DIN EN 62435-2 VDE 0884-135-2:2017-10

DIN EN 62435-2 VDE 0884-135-2:2017-10

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017), German version EN 62435-2:2017

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Details

This part of DIN EN 62435 (VDE 0884-135) is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied.

Additional Info

Author VDE
Document type Standard
ICS 31.200 : Integrated circuits. Microelectronics
Number of pages 23
Replace DIN EN 62435-2 (2013-10)
Cross references EN 62435-2 (2017-04), IDT,IEC 62435-2 (2017-01), IDT
Weight(kg.) 0.1391
Document history DIN EN 62435-2 (2017-10),DIN EN 62435-2 (2013-10)
Keyword DIN EN 62435,EN 62435,EN 62435-2,62435