| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
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PDF |
German |
Active |
12/1/2010 |
€72.80 |
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Details
This document describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Additional Info
| Author | Deutsche Institut für Normung e.V. (DIN) |
|---|---|
| Published by | DIN |
| Document type | Standard |
| ICS | 31.080.30 : Transistors
|
| Number of pages | 12 |
| Cross references | EN 62416 (2010-06), IDT,IEC 62416 (2010-04), IDT |
| Set | MYSTD-20STD |
| Document history | DIN EN 62416 (2010-12),DIN IEC 62416 (2007-08) |
| Keyword | DIN EN 62416 |
