| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
|
PDF |
German |
Active |
1/1/2007 |
€65.89 |
|
||
Details
This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).
Additional Info
| Author | Deutsche Institut für Normung e.V. (DIN) |
|---|---|
| Published by | DIN |
| Document type | Standard |
| ICS | 31.080.30 : Transistors
|
| Number of pages | 14 |
| Cross references | EN 62373 (2006-08), IDT,IEC 62373 (2006-07), IDT |
| Set | MYSTD-20STD |
| Document history | DIN EN 62373 (2007-01),DIN IEC 62373 (2004-09) |
| Keyword | DIN EN 62373 |
