| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
|
Paper |
German |
Available |
12/1/2016 |
€29.12 |
|
||
Details
This part of IEC 61788 describes a test method to determine the retained critical current after the double bending at room temperature. The test methods are intended for use with short and straight Ag and/or Ag alloy-sheathed Bi-2223 superconducting wires that have a monolithic structure and a shape of flat or square tape containing mono- or multicores of oxides.
Additional Info
| Author | VDE |
|---|---|
| Document type | Draft standard |
| ICS | 29.050 : Superconductivity and conducting materials
|
| Number of pages | 25 |
| Cross references | IEC 90/368/CD (2016-06), IDT |
| Weight(kg.) | 0.1425 |
| Document history | |
| Keyword | DIN EN 61788,EN 61788,EN 61788-24,61788 |
