Name | Support | Language | Availability | Edition date | Price | ||
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Paper |
German |
Active |
9/1/2016 |
€121.28 |
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Details
Dynamic stress tests on connector as defined in sub-clause 8.5 - Arrangement for dynamic stress tests are carried out according to IEC 60512, tests 6c and 6d. The device under test consists of the connector assembled to a printed board. The printed board under test usually contains the connector but no additional components.
Additional Info
Author | VDE |
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Document type | Standard |
ICS | 31.220.10 : Plug-and-socket devices. Connectors
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Number of pages | 59 |
Replace | DIN EN 61076-4-116 (2012-11),DIN EN 61076-4-116/A1 (2013-05) |
Cross references | EN 61076-4-116 (2012-06), IDT,EN 61076-4-116/A1 (2016-03), IDT,IEC 61076-4-116 (2012-04), IDT,IEC 61076-4-116 AMD 1 (2015-11), IDT |
Weight(kg.) | 0.2003 |
Document history | DIN EN 61076-4-116 (2016-09),DIN EN 61076-4-116/A1 (2013-05),DIN EN 61076-4-116 (2012-11),DIN EN 61076-4-116 (2010-08) |
Keyword | DIN EN 61076,DIN EN 61076-4,EN 61076,EN 61076-4,EN 61076-4-116,61076 |