Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
PDF |
English |
Active |
5/31/2009 |
€180.00 |
|
Details
Testing conditions,Resistors,Quality control,Assessed quality,Specification (approval),Thermistors,Semiconductor resistors,Acceptance (approval),Detail specification,Metal oxide semiconductors,Inspection,Electronic equipment and components,Temperature coefficient of resistance,Semiconductor devices
Additional Info
Author | British Standards Institution (BSI) |
---|---|
Committee | W/- - SPSC |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 580 64286 9 |
ICS | 31.040.30 : Thermistors
|
Number of pages | 16 |
Cross references | IEC/PAS 60539-1-1:2008 |
Keyword | DD IEC/PAS 60539-1-1:2008 |