BS ISO 14606:2022

BS ISO 14606:2022

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

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Details

X-ray photoelectron spectroscopy,Photoelectron spectroscopy,X-rays,Spectroscopy,Depth,Chemical analysis and testing

Additional Info

Author British Standards Institution (BSI)
Committee CII/60 - Materials
Published by BSI
Document type Standard
EAN ISBN 978 0 539 18359 7
ICS 71.040.40 : Chemical analysis
Number of pages 26
Replace BS ISO 14606:2015
Keyword BS ISO 14606:2022