BS IEC 62047-35:2019

BS IEC 62047-35:2019

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical

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Details

Semiconductor technology,Electromechanical devices,Deformation,Test methods,Semiconductor devices

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Standard
EAN ISBN 978 0 580 99495 1
ICS 31.080.99 : Other semiconductor devices
Number of pages 24
Keyword BS IEC 62047-35:2019