Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
PDF |
English |
Active |
3/15/2018 |
€180.00 |
|
Details
Analysis,Test methods,Electromechanical devices,Semiconductor devices,Thin films
Additional Info
Author | British Standards Institution (BSI) |
---|---|
Committee | EPL/47 - Electrical |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 580 94013 2 |
ICS | 31.080.01 : Semiconductor devices in general
31.080.99 : Other semiconductor devices |
Number of pages | 16 |
Cross references | IEC 62047-29:2017 |
Keyword | BS IEC 62047-29:2017 |