BS IEC 62047-29:2017

BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

€180.00

Details

Analysis,Test methods,Electromechanical devices,Semiconductor devices,Thin films

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Standard
EAN ISBN 978 0 580 94013 2
ICS 31.080.01 : Semiconductor devices in general
31.080.99 : Other semiconductor devices
Number of pages 16
Cross references IEC 62047-29:2017
Keyword BS IEC 62047-29:2017