Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
PDF |
English |
Active |
11/30/2021 |
€331.00 |
|
Details
Semiconductor devices,Reliability,Electrical failure,Tests,Test methods
Additional Info
Author | British Standards Institution (BSI) |
---|---|
Committee | EPL/47 - Electrical |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 539 12723 2 |
ICS | 31.080.01 : Semiconductor devices in general
|
Number of pages | 50 |
Replace | BS EN 60749-43:2017 |
Keyword | BS EN IEC 63287-1:2021 |