Name | Support | Language | Availability | Edition date | Price | ||
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PDF |
English |
Active |
2/21/2019 |
€250.00 |
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PDF |
English |
Active |
2/24/2020 |
€326.00 |
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Details
Integrated circuits,Electromagnetic radiation,Electromagnetic tests,Radio disturbances,Test equipment,Electronic equipment and components,Noise (spurious signals),Radiofrequencies,Electrical testing,Circuits,Electromagnetic fields,Testing conditions
Additional Info
Author | British Standards Institution (BSI) |
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Committee | EPL/47 - Electrical |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 580 98989 6 |
ICS | 31.200 : Integrated circuits. Microelectronics
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Number of pages | 32 |
Replace | BS EN 61967-1:2002 |
Cross references | EN IEC 61967-1:2019,IEC 61967-1:2018 |
Keyword | BS EN IEC 61967-1:2019 |