BS EN IEC 60749-41:2020

BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods Standard reliability testing of non-volatile memory devices

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Details

Flammability,Moisture measurement,Defects,Solderability testing,Storage,Testing conditions,Visual inspection (testing),Marking,Stress,Fire tests,Test equipment,Vibration testing,Temperature measurement,Specimen preparation,Semiconductor devices,Accelerated testing,Bonding,Electric terminals,Electrical testing,Endurance testing,Test specimens,Thermal-shock tests,Environmental testing,Strength of materials,Mass spectrometry,Classification systems,Integrated circuits,Damp-heat tests,Shear testing,Low-pressure tests,Thermal testing,Mechanical testing,Leak tests,Radioactive tracer methods,Electronic equipment and components,Pull-out tests,Dimensional measurement,Torsion testing

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Standard
EAN ISBN 978 0 580 96287 5
ICS 31.080.01 : Semiconductor devices in general
Number of pages 26
Cross references EN 60749-41,IEC 60749-41
Keyword BS EN IEC 60749-41:2020