Name | Support | Language | Availability | Edition date | Price | ||
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PDF |
English |
Active |
9/9/2020 |
€250.00 |
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Details
Flammability,Moisture measurement,Defects,Solderability testing,Storage,Testing conditions,Visual inspection (testing),Marking,Stress,Fire tests,Test equipment,Vibration testing,Temperature measurement,Specimen preparation,Semiconductor devices,Accelerated testing,Bonding,Electric terminals,Electrical testing,Endurance testing,Test specimens,Thermal-shock tests,Environmental testing,Strength of materials,Mass spectrometry,Classification systems,Integrated circuits,Damp-heat tests,Shear testing,Low-pressure tests,Thermal testing,Mechanical testing,Leak tests,Radioactive tracer methods,Electronic equipment and components,Pull-out tests,Dimensional measurement,Torsion testing
Additional Info
Author | British Standards Institution (BSI) |
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Committee | EPL/47 - Electrical |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 580 96287 5 |
ICS | 31.080.01 : Semiconductor devices in general
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Number of pages | 26 |
Cross references | EN 60749-41,IEC 60749-41 |
Keyword | BS EN IEC 60749-41:2020 |