BS EN IEC 60749-37:2022 + Redline

BS EN IEC 60749-37:2022 + Redline

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer

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Details

Accelerometers,Reports,Testing,Electrical failure,Failure analysis,Printed-circuit boards,Electronic components,Semiconductor devices,Semiconductors

Additional Info

Author British Standards Institution (BSI)
Committee EPL/47 - Electrical
Published by BSI
Document type Standard
EAN ISBN 978 0 539 25325 2
ICS 31.080.01 : Semiconductor devices in general
Number of pages 60
Keyword BS EN IEC 60749-37:2022 - TC