Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
PDF |
English |
Active |
4/18/2018 |
€151.00 |
|
Details
Climate,Frequencies,Mechanical testing,Electronic equipment and components,Environmental testing,Vibration testing,Destructive testing,Integrated circuits,Semiconductor devices,Variable
Additional Info
Author | British Standards Institution (BSI) |
---|---|
Committee | EPL/47 - Electrical |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 580 98682 6 |
ICS | 31.080.01 : Semiconductor devices in general
|
Number of pages | 12 |
Replace | BS EN 60749-12:2002 |
Cross references | IEC 60749-12:2017,EN IEC 60749-12:2018 |
Keyword | BS EN IEC 60749-12:2018 |