| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
|
PDF |
English |
Active |
9/29/2006 |
€180.00 |
|
||
Details
Semiconductors,Semiconductor devices,Testing conditions,Transistors,Metal oxide semiconductors,Temperature,Voltage measurement,Electronic equipment and components
Additional Info
| Author | British Standards Institution (BSI) |
|---|---|
| Committee | EPL/47 - Electrical |
| Published by | BSI |
| Document type | Standard |
| EAN ISBN | 0 580 49255 9 |
| ICS | 31.080.30 : Transistors
|
| Number of pages | 16 |
| Cross references | EN 62373:2006,IEC 62373:2006 |
| Keyword | BS EN 62373:2006 |
