Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
PDF |
English |
Active |
11/30/2016 |
€250.00 |
|
Details
Semiconductor technology,Integrated circuits,Electronic equipment and components,Resonance,Electromechanical devices,Thin-film devices,Bend testing,Vibration,Test specimens,Fatigue testing,Test equipment,Semiconductor devices
Additional Info
Author | British Standards Institution (BSI) |
---|---|
Committee | EPL/47 - Electrical |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 580 85615 0 |
ICS | 31.080.99 : Other semiconductor devices
|
Number of pages | 28 |
Cross references | IEC 62047-25:2016,EN 60745-2-8:2003/A11:2007,EN 62047-25:2016 |
Keyword | BS EN 62047-25:2016 |