| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
|
PDF |
English |
Active |
10/31/2014 |
€180.00 |
|
||
Details
Vibration,Semiconductor technology,Fatigue testing,Test specimens,Semiconductor devices,Resonance,Electronic equipment and components,Test equipment,Thin-film devices,Bend testing,Electromechanical devices,Integrated circuits
Additional Info
| Author | British Standards Institution (BSI) |
|---|---|
| Committee | EPL/47 - Electrical |
| Published by | BSI |
| Document type | Standard |
| EAN ISBN | 978 0 580 77554 3 |
| ICS | 31.080.99 : Other semiconductor devices
|
| Number of pages | 18 |
| Cross references | EN 62047-21:2014,IEC 62047-21:2014 |
| Keyword | BS EN 62047-21:2014 |
