Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
PDF |
English |
Active |
10/31/2014 |
€348.00 |
|
Details
Vibration,Integrated circuits,Test equipment,Electronic equipment and components,Electromechanical devices,Test specimens,Thin-film devices,Semiconductor technology,Fatigue testing,Semiconductor devices,Resonance,Bend testing
Additional Info
Author | British Standards Institution (BSI) |
---|---|
Committee | EPL/47 - Electrical |
Published by | BSI |
Document type | Standard |
EAN ISBN | 978 0 580 77433 1 |
ICS | 31.080.99 : Other semiconductor devices
|
Number of pages | 56 |
Cross references | EN 62047-20:2014,IEC 62047-20:2014 |
Keyword | BS EN 62047-20:2014 |